PN Tester [PN-1S]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![1_PN-1S[イプロス].jpg](https://image.mono.ipros.com/public/product/image/4e1/215440018/IPROS_12142490032261693000.jpg?w=280&h=280)
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basic information
【Contact-type PN Detector Capable of Speedy Measurement】 ◆ Detection Method: Rectified Power Method ◆ Compatible with most samples (silicon wafers, bulk, ingots) (Note: Samples with oxidized surfaces cannot be measured) ◆ Simply place on the measurement stage and lightly contact the two thin probes (0.2mm) for instant measurement ◆ Can be integrated for use with automatic wafer transport systems (PN-1S/B) ● Applicable Wafer Sizes: From 2 inches to 12 inches (Note: For further details, please contact us.)
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Applications/Examples of results
Silicon wafers [wrap, etched, polished, mirror], bulk, ingot (samples with oxidized surfaces cannot be assessed)
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Company information
We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.