Inline wafer measurement module
Inline full inspection and sorting of wafers/cells is possible.
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basic information
This is an inline fully automated wafer measurement module for quality control and manufacturing yield improvement of crystalline solar cells. It measures lifetime, resistivity/thickness, and sheet resistance continuously on a conveyor belt.
Price information
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Delivery Time
Applications/Examples of results
Pre-shipment inspection and acceptance inspection of crystalline solar cell wafers, including sheet resistance measurement after diffusion, etc.
Company information
Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.
