Standard equipment with all necessary components for probing! A probing system with excellent cost performance.
The "TB Series" is a model of probe that excels in cost performance and is suitable for various measurement purposes while saving space. Inside the compact shield box, standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table. Since the necessary components for the probe are included in advance, the initial setup cost is lower compared to building a new probing environment. 【Features】 ■ Standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table ■ Lower initial setup costs compared to building a new probing environment ■ A cost-effective probing system that can be widely used ■ Compact size allows for use in various applications and limited installation space ■ A wide range of optional items available, including hot chucks and probes with various tip diameters and materials *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Main Components】 ■ Prober with shield box ■ Positioner, cable, needle ■ Coaxial arm, coaxial cable ■ Sample stage for up to 4-inch size ■ Panel with relay connector, etc. *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Usage】 ■Various measurements *For more details, please refer to the PDF document or feel free to contact us.
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Yamato Corporation's Measurement Equipment Division manufactures and sells inspection, analysis, and evaluation devices necessary for research and development and production in the semiconductor, organic EL, liquid crystal, solar cell, and fuel cell industries. In particular, we specialize in developing devices used in research and development departments that require measurements under special environmental conditions, and we have numerous achievements in delivering to cutting-edge fields. Additionally, we are currently challenging ourselves to integrate conventional probing technology into applied technology fields, aiming to establish a system that can support inspection, analysis, and evaluation in all areas, including applied technologies centered around semiconductors in the future. 【Head Office and Branch Locations】 ◆ Kobe Head Office 〒650-0047 1-4-6 Minamimachi, Port Island, Chuo Ward, Kobe City TEL (078) 304-5178 (DI) FAX (078) 304-6087 ◆ Tokyo Branch 〒107-0062 1-15-9 Minami Aoyama, Minato Ward, Tokyo TEL (03) 3403-0771 FAX (03) 3403-0813 ◆ Nagoya Branch 〒460-0002 2-19-25 Marunouchi, Naka Ward, Nagoya City YH Marunouchi Building TEL (052) 212-4932 FAX (052) 212-4935