Measuring the temperature of a high-reflective substrate from low temperature (50°C) to high temperature (500°C).
◆ The temperature of the high-reflective substrate after thin film coating can be measured from low temperature (50°C) to high temperature (500°C). ◆ There is no error up to an angular deviation of ±5 degrees. ◆ The measurement distance can be maintained between 80 to 110 mm.
Inquire About This Product
basic information
◆ The temperature of the high-reflective substrate after thin film coating can be measured from low temperature (50°C) to high temperature (500°C). ◆ There is no error up to an angle deviation of ±5 degrees. ◆ The measurement distance can be maintained between 80 to 110 mm.
Price information
-
Delivery Time
Applications/Examples of results
*For details, please check from "Download."
catalog（1）
Download All Catalogs
Company information
At Matsumoto Metal Industry Co., Ltd., we aim to be a company that can contribute to a prosperous future, starting from our commitment to joyfully respond to each user's needs.
![Radiation Thermometer TMHX-CFE [For Film Measurement] *Demo units available for free rental!](https://image.mono.ipros.com/public/product/image/6fc/2000732596/IPROS46853382508775550592.jpeg?w=280&h=280)
