In-Situ Continuous Measurement Reliability Evaluation Testing Service
In-situ continuous measurement reliability evaluation tests involve applying stress while measuring characteristics to conduct reliability assessments. ● Accurate understanding of failure time is possible In a read-out method where samples are taken from a stress environment at a fixed time, failure can only be understood at the timing of the read-out, making it impossible to know the exact failure occurrence time. In-situ measurement allows for an accurate understanding of failure time. ● Detection of recoverable failures is possible Recoverable failures can cause significant issues in the market. In most cases, the read-out method makes it nearly impossible to detect these recoverable failures, whereas in-situ measurement enables the detection of recoverable failures, allowing for accurate judgment and assessment. ● Monitoring of stress application conditions on samples is possible The stress application status and measurement data can be confirmed in real-time.
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basic information
In-Situ continuous measurement reliability evaluation tests involve applying stress while measuring characteristics to conduct reliability assessments. ● Accurate understanding of failure time is possible In a read-out method where samples are taken from a stress environment at fixed times, failure can only be understood at the timing of the read-out, making it impossible to know the exact time of failure occurrence. In-Situ measurement allows for an accurate understanding of failure time. ● Detection of recoverable failures is possible Recoverable failures can cause significant issues in the market. In most cases, the read-out method makes it nearly impossible to detect these recoverable failures, but In-Situ measurement enables the detection of recoverable failures, allowing for accurate judgment/assessment. ● Monitoring of stress application conditions on samples is possible The stress application status and measurement data can be confirmed in real-time.
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Applications/Examples of results
■In-Situ HAST Test/In-Situ THB Test (High-Acceleration High-Temperature High-Humidity Bias Test) Features: Continuous measurement of insulation resistance during high-temperature high-humidity bias testing is possible. Target Products: Printed circuit boards, semiconductor packages, etc. Evaluation Targets: Ion migration, etc. ■In-Situ TC Test (Temperature Cycle Test) Features: Continuous measurement of small resistance values/temperature during temperature cycle testing is possible. Target Products: Semiconductor packages, mounted substrates. Evaluation Targets: Solder joints, etc. ■In-Situ EM Test (High-Temperature Current Injection Test) Features: Current injection/resistance measurement/temperature measurement using resistors is possible during high-temperature testing. Target Products: Semiconductor packages, IC chips. Evaluation Targets: Solder joints, wiring, etc.
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.