It is now possible to conduct high voltage and high current dynamic characteristic tests on wafers!
The "Double Side Manual Prober WS51" is a manual operation type double side wafer prober. By simultaneously making Kelvin contacts on both sides of the wafer, it enables large current testing of power MOSFETs and other devices, which was previously impossible. Blade set replacement is one-touch, and it is equipped with a manipulator device (optional) for fine positional adjustments. Additionally, fine adjustments of the XY table using a micro-positioner facilitate easy alignment of the test chip and the probes. 【Features】 ■ Supports high voltage and large current measurements ■ Double side probing ■ Easy positional adjustments *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Specifications】 ■ 5in-8in ■ Voltage/Current: 1500V・DC200VA ■ Main Unit Dimensions: W550×D455×H643 ■ Main Unit Weight: 48kg ■ Options ・ 5 Micro Positioners ・ Spring Test Probe ・ Tungsten Needle ・ Probe Card ・ Heater Unit *For more details, please refer to the PDF document or feel free to contact us.
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Company information
Mikunas Fine Engineering has been driven by a passion to exceed customer expectations since its founding in 1949. We have continuously applied our ingenuity and creativity to meet various needs. We thoroughly respond to a wide range of requests, from precision parts processing to equipment assembly, and we support our customers in every aspect.
