List of Measurement and Analysis products
- classification：Measurement and Analysis
3901～3915 item / All 55139 items
High-performance and simple strip machine.
- Other processing machines
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Composite approach to the cross-sectional structure and surface shape of the negative electrode, as well as elemental mapping images of the active material cross-section!
- Secondary Cells/Batteries
- Contract measurement
Weight analysis
- Contract measurement
- wood
![[Analysis Case] Emission Analysis o...](https://image.mono.ipros.com/public/product/image/45e/2001523636/IPROS16582442900003718910.jpg?w=280&h=280){kind=small}
It is possible to evaluate the luminescent properties and degradation analysis of perovskite solar cells non-destructively.
- Contract measurement
![[Analysis Case] Three-Dimensional S...](https://image.mono.ipros.com/public/product/image/cda/2001528822/IPROS10800243479859845113.jpg?w=280&h=280){kind=small}
Evaluation and analysis of porous structures is possible using X-ray CT.
- Ceramics
- Contract Analysis
- X-ray inspection equipment
Completely custom-made! We extract valuable information tailored to your needs from the important data you have collected.
- Contract measurement
- Contract Analysis
- Image Processing Software
![[Analysis Case] Evaluation of Metal...](https://image.mono.ipros.com/public/product/image/19d/2001538620/IPROS12249256516974712398.jpg?w=280&h=280){kind=small}
Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.
- Wafer
- Contract measurement
- Other semiconductors
Capable of evaluating three-dimensional structural changes according to tensile stress.
- Contract measurement
- Contract Inspection
![[Analysis Case] Composition Analysi...](https://image.mono.ipros.com/public/default/object/noimage_l.gif?w=280&h=280){kind=small}
Shape observation and simple quantitative analysis using SEM-EDX.
- Contract Inspection
- Wafer
- Other semiconductor manufacturing equipment
![[Analysis Case] High-Sensitivity An...](https://image.mono.ipros.com/public/product/image/bff/2000026119/IPROS1320775171095140593.jpg?w=280&h=280){kind=small}
SIMS analysis allows for the evaluation of elements such as H, C, N, O, and F down to levels below 1 ppm.
- Contract Analysis
![[Analysis Case] Pyrolysis GC/MS Dou...](https://image.mono.ipros.com/public/product/image/45f/2000243780/IPROS3742277139022259586.jpg?w=280&h=280){kind=small}
Composite analysis using TG-DTA and GC/MS.
- Contract Analysis
![[Analysis Case] SIMS Measurement of...](https://image.mono.ipros.com/public/product/image/b05/2000245630/IPROS5786148276058024004.jpg?w=280&h=280){kind=small}
Analysis is possible even for special shapes through innovative fixing methods.
- Contract Analysis
![[Analysis Case] Diffusion Evaluatio...](https://image.mono.ipros.com/public/product/image/066/2000245635/IPROS76086819834464693.jpg?w=280&h=280){kind=small}
Measurement avoiding the influence of high concentration layers using SSDP-SIMS.
- Contract Analysis
![[Analysis Case] Evaluation of H Con...](https://image.mono.ipros.com/public/product/image/d52/2000246059/IPROS7663731616676873733.jpg?w=280&h=280){kind=small}
It is possible to evaluate the depth distribution of H in the IGZO film with high sensitivity.
- Contract Analysis
- Contract Inspection
![[Analysis Case] Evaluation of the C...](https://image.mono.ipros.com/public/product/image/521/2000246064/IPROS985011151973764319.jpg?w=280&h=280){kind=small}
Evaluation of bonding state and electronic state using XPS and UPS.
- Contract Analysis
- Contract Inspection
![[Analysis Case] Evaluation of Parti...](https://image.mono.ipros.com/public/product/image/dc5/2000246773/IPROS5195024640877014253.jpg?w=280&h=280){kind=small}
Evaluation of catalyst particles using STEM-EDX.
- Contract Analysis