List of Measurement and Analysis products

High-performance and simple strip machine.

• Other processing machines

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Structural analysis of lamellae and similar structures is possible! Similar evaluations can be performed using WAXS (Wide-Angle X-ray Scattering).

• Contract Analysis

By combining actual measurements and simulations, detailed peak attribution is possible!

• Contract Analysis

You can obtain various physical property information such as point defect formation energy, charge, and optical transitions!

• Contract Analysis

Effective for understanding surface reactions at the atomic level in the etching process.

• Contract measurement
• Contract Analysis
• simulator

Evaluation of modified layers and altered layers through surface treatment is possible!

• Contract measurement
• Contract Inspection

It is possible to estimate the cause of wafer contamination!

• Contract measurement
• Contract Inspection
• Time-of-flight mass spectrometer

It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

• Contract measurement
• Surface treatment contract service
• Time-of-flight mass spectrometer

Evaluation of component distribution in hair cross-sections using TOF-SIMS analysis.

• Contract Analysis

Visualizing the differences in penetrating ingredients and their distribution based on the type of hair care products used.

• Contract Analysis

By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

• Contract Analysis

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

• Contract Analysis

TOF-SIMS component analysis of slope-polished organic multilayer structure samples.

• Contract Analysis

It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.

• Contract Analysis

It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.

• Contract Analysis

It is possible to obtain the dopant concentration profile from the SiC substrate side.

• Contract Analysis