List of Measurement and Analysis products
- classification：Measurement and Analysis
7516～7530 item / All 55119 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
Achieving a high-speed, high-resolution 3D inspection system!
- Image Processing Equipment
- 3D measuring device
- Visual Inspection Equipment
We will detect black dots and stains on a continuously flowing plain sheet using image inspection!
- Visual Inspection Equipment
- Other image-related equipment
Introduction of case studies! Specializing in simulations of low-pressure plasma or low-temperature plasma.
- Other analyses
- Magnetic field analysis/electromagnetic wave analysis
- Contract Analysis
Pellet and powder foreign matter inspection device *Compatible with clean rooms and can be installed in factories, capable of detecting 9µm!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
It is possible to inspect appearance defects occurring in the wafer process and dicing process quickly and with high precision.
- Semiconductor inspection/test equipment
- Visual Inspection Equipment
Green Sheet Appearance Inspection Machine - Parallel Processing Type
- Image Processing Board
- Visual Inspection Equipment
Ideal for large volume work counting! High-speed, high-precision counting machine with space-saving design.
- Counting Machine
- counter
Detect foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
For inspecting electronic components like SMDs! It is possible to inspect individually for products that cannot use a parts feeder!
- Image Processing Equipment
- Visual Inspection Equipment
Newly developed! Capable of detecting fine scratches and surface defects on six sides (front and back + four sides) as well as measuring dimensions!
- Image Processing Equipment
- Visual Inspection Equipment
Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
Thanks to our unique technology, we can cancel out polycrystalline patterns and detect fine defects!
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
A group of engineers full of personality! We are always striving for a higher level of engineering expertise.
- Visual Inspection Equipment
- Other image-related equipment
Tabletop robot specifications! A low-cost, high-functionality tabletop appearance inspection machine.
- Other inspection equipment and devices
- Visual Inspection Equipment
Notice of Participation in SEMICON Japan 2018 (December 12-14, 2018)
Hubbrain Inc. will be exhibiting at SEMICON Japan 2018, which will be held at Tokyo Big Sight from December 12 (Wednesday) to 14 (Friday). This exhibition is an international trade show for the electronics manufacturing supply chain, covering all processes from the front-end to the back-end of semiconductor manufacturing, as well as SMART applications such as automotive and IoT devices. We will be showcasing compact inspection machines that enable diverse inspections with simple settings, as well as inspection equipment that utilizes a 2-megapixel color camera. <Exhibited Products> ■ Free-Angle Appearance Inspection Machine ■ Upper-Type Simple Inspection Machine ■ Wafer and Chip Appearance Inspection Equipment, etc. <Booth Number> ■ East 2 #2332 We sincerely look forward to your visit.