List of Measurement and Analysis products

  • classification:Measurement and Analysis

9136~9180 item / All 55008 items

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Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

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  • air conditioning

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Just connect it to the water pipe between the temperature control unit and the mold! Eliminate the chance of forgetting to open the cooling water valve.

  • Flow Meter
  • Sensors

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We are presenting a technical report on mirror-cooled dew point meters useful for quality control!

  • Temperature and humidity measuring instruments
  • Other temperature and humidity measuring instruments
  • Thermo-hygrometer

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Improvement of business efficiency! Display inspection results on the computer screen and save them as a CSV file on the computer!

  • Testing Equipment and Devices

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Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.

  • 3D measuring device

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2026 OPIE Exhibition Information

We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.

12" wafer full inspection accelerated, can also be used for full inspection of wafers.

  • Coating thickness gauge

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2026 OPIE Exhibition Information

We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.

Capable of measuring the total thickness of 12-inch wafers. High-speed measurement without the influence of vibrations, without a scanning stage. Suitable for online, offline, and wafer inspection app...

  • Coating thickness gauge
  • 3D measuring device

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2026 OPIE Exhibition Information

We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.

High-speed opaque film thickness mapping and area detection of internal defects using a laser photothermal sensor.

  • Defect Inspection Equipment

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Semicon Japan 2024

We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor

Accurate judgment by measuring thickness continuously! It can operate automatically, eliminating the need for manual measurements!

  • Testing Equipment and Devices

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Efficient because multiple tests can be conducted at once! It is safe as there is no contact with moving parts or high-voltage circuits.

  • Testing Equipment and Devices

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By overlaying with past data, it can be utilized for product evaluation and analysis of test results!

  • Other measurement, recording and measuring instruments

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Prevent operator mistakes during testing! Improve testing quality through consistently stable tests!

  • Testing Equipment and Devices

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You can evaluate malfunctions and degradation! By using G-TEMCELL, testing can be safely conducted even without an anechoic chamber.

  • Testing Equipment and Devices

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Measure various data! You can achieve benefits such as improved operational efficiency and reduced workload!

  • Testing Equipment and Devices

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It is being introduced for purposes such as reducing operator workload, increasing equipment utilization rates, and data storage!

  • Testing Equipment and Devices

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Realizing various functions! The applications are diverse when combined with other measurement system applications!

  • Testing Equipment and Devices

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Efficient operation of equipment! A system that automates measurement with a PC and allows for centralized data management.

  • Testing Equipment and Devices

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Rapid and easy measurement of cannabinoid content using near-infrared analysis (NIR)!

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  • Spectroscopic Analysis Equipment
  • Analytical Equipment
  • Near-infrared spectrophotometer

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Application for measuring nitrate in plating baths using ion chromatography.

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  • Analytical Equipment and Devices
  • Plating Equipment
  • Ion Chromatography

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If you are looking for mid-infrared region PD, LMS is the place to go!!

  • Optical Measuring Instruments

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Accurate measurement of trace metals containing rare metals in solution at ppt to ppb levels.

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  • Polarograph
  • Analytical Equipment and Devices
  • Rare metals

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Rapid management of cetane index, flash point, CFPP, D95, and viscosity of diesel oil using near-infrared analyzer (NIR).

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  • Spectroscopic Analysis Equipment
  • Fuel system parts
  • Near-infrared spectrophotometer

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Measurement of fluoride, glycolic acid, monochloroacetic acid, and chloride in surfactant solutions by ion chromatography.

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  • Analytical Equipment and Devices
  • Ion Chromatography
  • Pharmaceutical and cosmetic cleaners

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We will accelerate the business of light through the effective use of optical and lighting simulations.

  • Contract measurement

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