List of Optical Analysis Equipment products
- classification：Optical Analysis Equipment
136～150 item / All 189 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
High-throughput dynamic and static light scattering (DLS/SLS) measurements using commercially available microplates - Reducing time and running costs.
- Light Scattering Photometer
[Web demo in progress] Things that are invisible become visible! Visualizing particles and airflow in clean rooms and manufacturing equipment.
- UV/visible spectrophotometer
- Analytical Equipment and Devices
- air conditioning
Maintenance Resilience 2026: We will exhibit a fine particle visualization system at the 52nd Plant Maintenance Show. (July 15 (Wed) - July 17 (Fri), 2026 / Tokyo Big Sight, East Hall 1, 1-H12)
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can lead to quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that causes yield reduction
A low-cost model has been released! It is a system that spectrally identifies wavelengths by scanning micro-mirrors.
- Near-infrared spectrophotometer
The patented modulation three-dimensional cross-correlation technology enables high-precision DLS measurements by suppressing multiple scattering noise.
- Analytical Equipment
- Analytical Equipment and Devices
- Light Scattering Photometer
Measure ultra-micro samples with confidence! Easy operation with a touch screen.
- UV/visible spectrophotometer
Automatic data transfer to Excel via connection to a PC! Easy operation with soft keys.
- Luminometer
Excellent fluorescent sensitivity and high-speed operation.
- UV/visible spectrophotometer
Raman spectroscopy might finally be within reach.
- Raman Spectrophotometer
Easy-to-use dynamic/static light scattering (DLS/SLS) measuring instrument - Conveniently and quickly measures particle size distribution, particle concentration, stability, and molecular weight.
- Light Scattering Photometer
This single device supports dynamic, static, and electrophoretic light scattering (DLS/SLS/ELS) measurements - providing reliable measurement results even with a small sample volume.
- Light Scattering Photometer