List of Electromagnetic Analysis Equipment products

  • classification:Electromagnetic Analysis Equipment

16~30 item / All 66 items

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Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

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  • air conditioning

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For those considering the steps from biomarker discovery to clinical application.

  • Mass Spectrometer
  • DNA sequencer
  • Analysis and sequencing services

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Dynamically generate diffraction patterns in collaboration with CrystalMaker and SingleCrystal.

  • crystal
  • X-ray Diffraction Equipment
  • Other physical property measurements and component analysis

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Standard software in crystallography

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  • crystal
  • X-ray Diffraction Equipment
  • Other physical property measurements and component analysis

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Refinement of powder diffraction data using the Rietveld method "CrystalDiffract"

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  • crystal
  • X-ray Diffraction Equipment

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It is possible to estimate the cause of wafer contamination!

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  • Contract measurement
  • Contract Inspection
  • Time-of-flight mass spectrometer

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It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

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  • Contract measurement
  • Surface treatment contract service
  • Time-of-flight mass spectrometer

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It is possible to quantitatively evaluate impurity elements and assess film thickness.

  • img_C0733_1.jpg
  • Contract measurement
  • Contract Inspection
  • Mass Spectrometer

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It is possible to quantify the surface condition through surface analysis of animal fur (coat)!

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  • Contract measurement
  • Time-of-flight mass spectrometer
  • Contract Inspection

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Improved resolution for TEM and STEM! Performance significantly enhanced with the capability for EDS analysis using four detectors.

  • Other microscopes
  • Transmission electron microscope

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TEM_TalosF200E.jpg

Announcement of the introduction of Talos F200E

Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which accumulates multiple frames while correcting for drift.

Continuous bulk gas analysis ensures the purity standards required for QA/QC in semiconductor manufacturing processes.

  • Mass Spectrometer

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A tabletop X-ray diffractometer (XRD) with high precision and high reproducibility that strongly supports quality control and research and development.

  • X-ray Diffraction Equipment

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