List of Distance Measuring Device products
- classification：Distance Measuring Device
211～225 item / All 966 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
The introduction of models with "photogrammetry functions" and "laser rangefinders" has expanded the scope of work for a single operator!
- others
- Distance measuring device
Catalog available! Non-contact displacement gauge that can measure in nanometers stably.
- Distance measuring device
High-precision measurement of tiny displacements and vibrations without contact! It handles display, analysis, and recording all in one device!
- Distance measuring device
- Vibration Testing
Achieving high stability, high resolution, and versatility for research purposes and system integration!
- Distance measuring device
New arrival! Response speed 5 times faster! Ideal capacitive displacement sensor for measuring the blur of rotating objects.
- Distance measuring device
No contact medium needed! Non-contact thickness measurement of the substrate from the coating.
- Distance measuring device
The measurement is based on ultrasonic waves transmitted from nearby objects and reflected back, providing high-precision distance measurement.
- Other measurement, recording and measuring instruments
- Distance measuring device
- Other security and surveillance systems
Affordable distance sensors for measuring film and coating thickness, as well as non-contact thickness measurement. Strong performance on slopes, achieving a distance direction resolution of 20nm!
- Distance measuring device
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor
Ideal for automatic inspection of vial shape and thickness - High-speed, high-precision optical sensor.
- Distance measuring device
Embedded optical sensor for high-precision and high-speed measurement of thickness and shape.
- Distance measuring device
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor