List of Electronic Measuring Instruments products
- classification：Electronic Measuring Instruments
1～15 item / All 5147 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
It counts particles in gas in real time while simultaneously performing particle size classification. It is a continuously monitored measurement system that can be customized according to specific pur...
- Monochrome camera
- Optical Measuring Instruments
- Environmental Test Equipment
17th High-Performance Materials WEEK [Tokyo] We will be exhibiting a fine particle visualization system at the 17th High-Performance Film Exhibition. (September 30, 2026 (Wed) - October 2, 2026 (Fri) / Makuhari Messe, Hall 2)
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time visualization of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and providing evaluation services (such as investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, and proposing yield improvement measures) both domestically and internationally. We consistently support the identification of causes and the formulation of countermeasures by visualizing fine foreign substances, particle adhesion due to static electricity, and variations in cleanliness that are problematic in the film manufacturing process. The following are some examples of applications, but by utilizing our technology, we can strongly promote the resolution of various issues such as the deterioration of defect rates caused by fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization of foreign matter contamination and adhesion mechanisms in the coating and drying processes - Visualization of dust generation and re-adhesion during roll transportation and consideration of countermeasures - Evaluation of airflow and cleanliness within clean booths/clean rooms - Identification of dust sources within manufacturing equipment and promotion of cleanliness - Reduction of foreign matter adhesion risk on film surfaces and improvement of yield
Compact wavelength meter compatible with high-speed wavelength verification and multi-laser management.
- Optical Measuring Instruments
Wavelength meter achieving high-precision measurement and laser stabilization using the Fizeau interferometry method.
- Optical Measuring Instruments
Supports AOM control, laser stabilization, and quantum experiments with high-speed modulation up to 10 MHz and 2-channel high-output RF.
- Signal Generator