List of Testing Equipment and Devices products
- classification：Testing Equipment and Devices
3961～3975 item / All 7043 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Support from product planning to filling, processing, and shipping for additives, cleaning agents, chemicals, deodorizing and disinfecting agents, etc.! For those who have raw materials but no place t...
- Other consumables
- Processing Contract
Large hot air circulation constant temperature oven! Versatile with a temperature range of +15 to 300°C.
- Thermostatic chamber
Large hot air circulation constant temperature oven! Versatile with a temperature range of +15 to 300°C.
- Thermostatic chamber
Introducing a dry heat incubator with a maximum temperature specification of 260℃, capable of program operation and repeated operation!
- Thermostatic chamber
From thumb inspection to data verification! Accurate and fast welding strength evaluation equipment.
- Strength Testing Equipment
Laminated bent glass with PVB sandwiched between two pieces of bent glass.
- Strength Testing Equipment
It is used for cover glass of doll cases and heating devices in convenience stores.
- Vibration Testing
Instrumentation drop weight impact testing machine. It supports a wide range of tests from materials to components, including Charpy, Izod, punching, and CAI tests (compression after impact).
- Impact Test
(Free) Instron WEB Seminar Series: Not Just Punching Tests. New Applications of the Drop Weight Impact Testing Machine - Wedge Delamination Test & Tensile Impact Test
**Presenter:** Shimpei Yamashita, Instron Japan, Materials Testing Division When it comes to peel tests and tensile tests, many people may think of "static tests." While conducting tests at low speeds is common, in actual usage environments, instantaneous impacts occur, making evaluations through "dynamic tests" such as peeling or tensile tests important. This seminar will focus on peel impact tests and tensile impact tests conducted with a drop weight impact testing machine, and will introduce real-world examples of industries where these tests are performed. **Target Audience for the Seminar:** - Those who want to understand why dynamic peel impact tests and tensile impact tests are necessary. - Those who want to know what standards exist and under what testing conditions they are conducted. - Customers considering the Instron 9400 series and Bluehill Impact software.
This is a device that allows for reliability testing by setting arbitrary test conditions for prototype evaluation, mass production, etc.!
- Testing Equipment and Devices
We propose a system configuration tailored to CH numbers, FET packages, and testing conditions!
- Testing Equipment and Devices
![[Case Study] Semiconductor Bar Inse...](https://image.mono.ipros.com/public/product/image/99f/2000729396/IPROS82972656826360081802.png?w=280&h=280){kind=small}
Achieving a fixture that is difficult to oscillate! Full automation is possible from test condition setup, power-on testing, to data acquisition.
- Semiconductor inspection/test equipment
- Thermostatic chamber
[Case Study] Semiconductor Bar-In Equipment (RF/DC)
Achieving fixtures that are difficult to oscillate! Full automation is possible from test condition setting, current testing, to data acquisition. Our company has a long history of delivering high-frequency power FET current testing equipment to major semiconductor manufacturers in Japan. We provide custom solutions tailored to various functions based on customer applications, such as reliability testing for newly developed devices and use in production lines. Additionally, we leverage our expertise as a manufacturer of high-frequency components to design fixtures that accommodate increasingly smaller and more complex device packages, offering customized designs that consider high-frequency characteristics and long-term maintenance according to customer requests. 【Case Overview】 ■ Installation Site: FA (Semiconductor Testing Equipment) ■ Installed Product: Semiconductor Burn-In Equipment (RF/DC) *For more details, please refer to the related links or feel free to contact us.
You can create an electromagnetic wave shielded space anywhere with an easy assembly type.
- EMC Testing
Peace of mind and safety! This is a development service that offers non-destructive testing using magnetic particle inspection equipment.
- Flaw detection testing
You can create an electromagnetic wave shielded space anywhere with an easy assembly type.
- EMC Testing
Breaking the existing concepts of peel tests! Realizing a groundbreaking evaluation method.
- Testing Equipment and Devices
A new analysis method for tensile tests and universal tests, and the interfacial behavior and evaluation methods of adhesive surfaces.
"Universal Testing Machine: A Must-See for Those Involved in Tensile Testing and Adhesive Peel Analysis" Explaining new analysis methods for tensile testing and universal testing, as well as the interfacial behavior and evaluation methods of adhesive surfaces. ■ "I want to measure from various angles." ■ "I want to maintain a specified angle while measuring." ■ "I want to change the speed while pulling." ■ "I want to pull at high speed." ■ "I want to evaluate with light loads on the order of 10⁻²N." + ■ "I don't fully understand the relationship between adhesive surfaces and surface free energy." This seminar addresses such concerns! ★★★ Next-Generation Tensile Testing Seminar * A focused course that can be understood in half a day. * Two instructors: specialists in adhesion and peel analysis, and experienced in interfacial science analysis. * Small group format / We will respond carefully to customer questions! * Morning session 10:00 AM - 12:00 PM / Afternoon session 2:00 PM - 4:00 PM [Tokyo Venue] November 9, 2017 (Thursday) at the Chemical Society Hall (Tokyo, Ochanomizu) [Osaka Venue] November 16, 2017 (Thursday) at the Shin-Umeda Training Center (Osaka, Umeda) (Afternoon session in Tokyo venue fully booked)