List of Microscopes products
- classification：Microscopes
91～135 item / All 1929 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
A belt grinding machine that has been in use for about 50 years since 1973. In addition to trust and proven results, the lineup is also extensive.
- Other machine tools
Belt grinding machine "Veda Machine" has high durability and a wide range of service parts.
The "Bader Machine" is our belt grinder that boasts excellent polishing performance for each individual unit. By selecting models and types according to the shape and size of the workpiece, and by equipping it with a polishing belt suitable for the task, it can flexibly accommodate a wide variety of items across various fields. Please make extensive use of it for high-efficiency polishing and grinding, reduction of work time, labor-saving, and standardization of tasks. 【Lineup】 ■ Portable type BP-K (air motor type) ■ Made-to-order machine PC-1 (wheel centerless), BC (standard dust cover) ■ Installed type BM (basic type), SBA-1, BH-2 ■ Wheel type SBD-4S, SBD-7, BWd *For more details, please download the PDF or contact us.
Thin long-stroke piezo Z nanopositioner for microscope specimens. Stroke up to 250μm (customizable up to 500μm).
- Other microscopes
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
- Other microscopes
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
It is possible to observe cross-sections while observing FIB processing in real time.
- Contract Analysis
- Other contract services
- Electron microscope
Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
Introducing examples of measurement cases for important management items in the production of lithium-ion batteries and all-solid-state batteries!
- Laser microscope
- Other measurement, recording and measuring instruments
Composition analysis of LIB cathode active materials by ICP luminescence analysis.
This presentation introduces the composition analysis of active materials in cathode materials using ICP emission analysis. The cathode material in lithium-ion batteries (LIB) is one of the important components that influence the battery's voltage and energy density, and the composition of the cathode material significantly affects the battery's performance. ICP emission analysis allows for qualitative and quantitative analysis of approximately 70 elements, primarily metal elements. In addition to composition analysis of LIB cathode materials, it can also be applied to various analyses, including qualitative and quantitative analysis of additives and impurities contained in samples, as well as quantitative analysis of substances regulated by the RoHS directive.
Improved resolution for TEM and STEM! Performance has been significantly enhanced, allowing for EDS analysis with four detectors.
- Other microscopes
- Transmission electron microscope
Announcement of the introduction of Talos F200E
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which accumulates multiple frames while correcting for drift.
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
- Electron microscope
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
- Electron microscope
- Contract Analysis
- Contract Inspection
A microscope allows you to observe tiny defects that cannot be seen with the naked eye!
- Microscope
- Other microscopes
- Contract measurement
Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!
- Other microscopes
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
![[Data] Cross-sectional observation ...](https://image.mono.ipros.com/public/product/image/5fd/2000561894/IPROS71970030245724406256.png?w=280&h=280){kind=small}
We have published cross-sectional observations in clear vision mode and normal/standard mode!
- Electron microscope
- Contract Analysis
- Contract Inspection
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
High-resolution imaging with a micro probe! Achieving nano-level structural analysis.
- Contract Analysis
- Contract measurement
- Other microscopes
This is the successor model of the popular gas pressure arm stand F10. It features a rotation mechanism for the optical tube, allowing for more flexible observation.
- Optical microscope
A unique microscope stand for observing samples from a horizontal direction.
- Optical microscope
Visualizing tiny, difficult-to-observe scratches on flat surfaces! Even scratches that are hard to identify in images can be distinguished by color.
- Other microscopes
It is a microscope stand that can be securely fastened to a table with screws.
- Other microscopes
4K camera, digital 3D microscope inspection platform "sinaSCOPE" with 3D display, manufactured by SOLECTRIX.
- 3D measuring device
- Electron microscope
- Electron microscope
It is a phase contrast microscope for counting dust, fibers, asbestos, etc. in the atmosphere.
- Optical microscope
Announcement of the successor product to "IF6PD4"! It will be purchased from Sherry Corporation.
- Microscope
- Other microscopes
Exclusive to customers who have upgraded from other companies' and our own old digital microscopes to the DSX2000!
- Microscope
- Microscope
Instantly detects defects and contributes to reduced analysis time. An all-in-one system that achieves overwhelming image quality, operability, and guaranteed measurement accuracy!
- Microscope
- Microscope
- Other microscopes
Not only direct visual observation but also an industrial rigid mirror that can be connected to a C-mount camera. *Product catalog is currently available.
- Other microscopes
- Microscope
- Microscope
Made of impact-resistant and bend-resistant image fiber! Suitable for visual inspection.
- Industrial Endoscope
- Endoscopes and fiberscopes
We are offering the 3D measurement laser microscope OLS5100 at a special price to customers who make a new contract by the end of December 2025!
- Laser microscope
The world's smallest class micro-Raman spectroscopic Raman sensor! Compatible with all microscopes regardless of the manufacturer!
- Other microscopes
Instantly convert your microscope into a Raman device! World-class smallest Raman sensor! Compatible with all upright microscopes, regardless of the manufacturer!
- Other microscopes
Introducing a compact and lightweight model! With a 360° rotating hinge bracket, you can observe the subject from any angle! Free demo units available for loan!
- Microscope
We provide clear images in Full HD resolution! Sharp close-up inspections are possible even at long distances.
- Industrial Endoscope
- Surveillance Cameras
Supports simple solutions! Faster, more accurate, and superior functionality for daily inspections! Now equipped with 3D stereo measurement capabilities!
- probe
- Other microscopes
- Industrial Endoscope
Introducing the addition of a 2.2mm side-view type industrial endoscope video scope, designed to discover inspections in narrow spaces that have been difficult to reach until now!
- Industrial Endoscope
- Other inspection equipment and devices
- Color camera
4K digital microscope for weld penetration inspection
- Optical microscope