List of Semiconductor inspection/test equipment products

Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

• air conditioning

Crystal Defect Measurement Device (Light Scattering Tomography)

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Inline wafer measurement module

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

The PN determination of silicon wafers/blocks can be performed instantly.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Lifetime measurement device for single crystal silicon blocks

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Roll-to-roll spectral ellipsometer

• Semiconductor inspection/test equipment
• Distance measuring device
• Spectroscopic Analysis Equipment

Crystal defect analysis device (non-contact, non-destructive)

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Industry-specific catalog of a Taiwanese comprehensive electronic measuring instrument manufacturer with a 25% share of the global market!

• Semiconductor inspection/test equipment
• Power Supplies

CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.

• Semiconductor inspection/test equipment
• Other machine elements

A clear explanation of case studies related to semiconductor testing, divided into four sections: background, issues, implementation, and results!

• Other semiconductors
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Before overhaul, after overhaul

• Other conveying machines
• Other inspection equipment and devices
• Semiconductor inspection/test equipment

Leave electrical characteristic testing, laser trimming, reliability testing, and more to us!

• Other semiconductors
• Semiconductor inspection/test equipment