List of Testing Equipment and Devices products
- classification：Testing Equipment and Devices
91～105 item / All 4537 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
This is a test set that revolutionizes on-site testing, saving time and costs!
- Testing Equipment and Devices
Leave it to us for drone performance evaluation equipment (free flight testing)!
- Testing Equipment and Devices
- Wind Speed/Volume Meter
- Analytical Equipment and Devices
Supports a wide range from applications requiring high-speed responses to high-precision measurements!
- Testing Equipment and Devices
- Other inspection equipment and devices
- Other measurement, recording and measuring instruments
Supports a wide range from applications requiring high-speed responses to high-precision measurements!
- Testing Equipment and Devices
- Other inspection equipment and devices
- Other measurement, recording and measuring instruments
Equipped with a front-opening hydraulic chuck. It complies with JIS Z2241 "Method for tensile testing of metallic materials" and is capable of tensile, compression, and bending tests for various mater...
- Testing Equipment and Devices
The catalog has been updated! Compliant with 【JIS Z 2241】. Hydraulic universal testing machine 'AY-S6/D6' or 'YU-S6/D6' series.
- Testing Equipment and Devices
Supports ultra-high speed of 36,000 rpm! Cameras and various sensors can also be connected, enabling time-axis synchronized logging.
- Testing Equipment and Devices
Response to the Water Supply Act | Consolidating 2 water quality standard components and 8 components for consideration into one! Streamlining the preparation of standard solutions for PFAS analysis.
- Testing Equipment and Devices
- Analytical Equipment and Devices
- Other physicochemical equipment
Special public release of past seminar videos that are usually not available! JASIS 2026 'WebExpo'
This year, we are offering a special public release of previously unpublished seminar videos! We have included a wealth of content that will be useful for analysts, ranging from basic explanations to advanced techniques. You can also download technical materials. 【Videos】 Latest GC columns effective for trace analysis and MS application examples Extreme series: GC WAX column edition, medium polarity GC column edition, PLOT column edition, amine-specific GC column edition, and more. 【Materials】 Development of a simultaneous analysis method for 45 components of ultra-short to long-chain PFAS Newly developed! Evaluation of high-inert GC columns (SVOC analysis) Stability evaluation of PFAS standard solutions Development of an analysis method for 21 PFAS components in milk, and more. -------- 【Highlights of the Real Exhibition】 Booth No. 8B-605 In trace analysis, if you are experiencing "low sensitivity" or "the calibration curve bends on the low concentration side," the cause may be the column. Restek's proposed new technology, "RMX GC Column," suppresses adsorption loss in low concentration areas through its unique inertization treatment. It achieves good peak shape and high reproducibility even for compounds at the picogram level, which are difficult to detect with conventional columns. At the booth, we will provide technical explanations along with actual measurement data, and you can also consult about challenges in the analysis field.
A device for conducting stress durability tests on the bending characteristics of the IC module section of IC cards. Providing IC cards that withstand bending to the market!
- Testing Equipment and Devices
- IC tag
Durability tests of the 'ISO/IEC 10373-1, JIS X 6305-3 standards' for all types of cards.
- Testing Equipment and Devices
- IC tag
Durability tests of the "ISO/IEC 10373-1, JIS X 6305-1 standards" for all types of cards.
- Testing Equipment and Devices
- IC tag
Durability tests of the 'ISO/IEC 10373-1, JIS X 6305-1 standards' for all types of cards.
- Testing Equipment and Devices
- IC tag
Flexibility to test both legacy radios and advanced radios on a single platform!
- Testing Equipment and Devices
It illuminates the path to reliable microelectronics in the defense sector!
- Testing Equipment and Devices