List of Other inspection equipment and devices products
- classification：Other inspection equipment and devices
1366～1380 item / All 5021 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
Equipped with a newly developed "image sharpening function." Even beginners can easily perform detailed analysis. Enhances quality control and improves research and development efficiency. Suitable fo...
- X-ray inspection equipment
- Other inspection equipment and devices
[Online Examination Available] A must-see for quality control personnel in food manufacturers! Foreign matter inspection often relies on the knowledge and experience of inspectors. Skill certification...
- Distance learning/E-learning
- Other inspection equipment and devices
Keywords: Air pollution, PM2.5, ultrafine particles, ultrasound, vacuum ultraviolet, reactive species, air purification.
- Other inspection equipment and devices
Capable of high-speed and high-precision analysis! An analytical device that requires minimal maintenance work.
- Analytical Equipment and Devices
- Other inspection equipment and devices
- Testing Equipment and Devices
Leap into the 21st century with comprehensive engineering in mechatronics.
- Other inspection equipment and devices
- Other semiconductor manufacturing equipment
- Other assembly machines
We have established multiple inspection processes and are striving for manufacturing and quality management that does not produce defects.
- Other inspection equipment and devices
Measuring the flow rate of all gases, from compressed air to ultra-high purity gases.
- Other inspection equipment and devices
Standard probe using thin film aluminum oxide sensor.
- Other measurement, recording and measuring instruments
- Other inspection equipment and devices
- Analytical Equipment and Devices
Measure the dew point or ppm in the gas at line pressure or atmospheric pressure.
- Other inspection equipment and devices
- Analytical Equipment and Devices
Wall-mounted NEMA 4X waterproof package! You can check all values through the transparent door.
- Other measurement, recording and measuring instruments
- Other inspection equipment and devices
- Analytical Equipment and Devices
Building image inspection systems tailored to needs and targets. Comprehensive support including both software and hardware. Free sample evaluation currently available.
- Other inspection equipment and devices
September 13 Event | Introduction of Existing Appearance Inspection and Challenges and Expansion~~ Inspecting Internal Defects, Distinguishing Fine Defects, Further Automating and Improving Efficiency ~ | Ube Information System
Introducing appearance inspection equipment contributes to stabilizing inspection levels and improving operational efficiency. Moreover, having invested in appearance inspection and experienced its convenience, you may be exploring the possibilities of further automation and labor reduction. In this seminar, based on the latest case studies we have implemented, we will introduce what aspects can be automated and streamlined. - What is internal defect inspection using ultrasound? - How can we distinguish fine defects? - How can we conduct inspections with minimal human intervention? From in-house development of inspection software to the design, assembly, and delivery of inspection equipment, we will share the technologies we have cultivated through our comprehensive approach. This seminar is beneficial not only for companies that have already implemented appearance inspection but also for those that have not yet done so, as you will gain an understanding of the extent to which automation and labor reduction can be achieved. Since this is an online seminar, please feel free to participate.
By linking with production information, it is easy to refer to past inspection history data.
- Other inspection equipment and devices
September 13 Event | Introduction of Existing Appearance Inspection and Challenges and Expansion~~ Inspecting Internal Defects, Distinguishing Fine Defects, Further Automating and Improving Efficiency ~ | Ube Information System
Introducing appearance inspection equipment contributes to stabilizing inspection levels and improving operational efficiency. Moreover, having invested in appearance inspection and experienced its convenience, you may be exploring the possibilities of further automation and labor reduction. In this seminar, based on the latest case studies we have implemented, we will introduce what aspects can be automated and streamlined. - What is internal defect inspection using ultrasound? - How can we distinguish fine defects? - How can we conduct inspections with minimal human intervention? From in-house development of inspection software to the design, assembly, and delivery of inspection equipment, we will share the technologies we have cultivated through our comprehensive approach. This seminar is beneficial not only for companies that have already implemented appearance inspection but also for those that have not yet done so, as you will gain an understanding of the extent to which automation and labor reduction can be achieved. Since this is an online seminar, please feel free to participate.
Non-contact optical thickness measurement. Applicable even for thickness measurements of semiconductor wafers where high precision is required.
- Other inspection equipment and devices
- Coating thickness gauge
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor
Customizable Wavelength Range: 200nm - 5nu Compatible Wafer Mapping Device Wafer PL Photoluminescence Multifunctional
- Other inspection equipment and devices