List of probe products
- classification：probe
361～375 item / All 448 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
Providing precision probes, precision parts, and precision models (such as desktopZERO).
- probe
IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!
- Contract manufacturing
- probe
A unique structure of a sensitive probe that supports high-precision measurement!
- Contract manufacturing
- probe
Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!
- probe
From narrow pitch measurements of 0.05 mm to high current power semiconductors.
- probe
As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.
- probe
Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!
- probe
We are currently offering a guide that clearly explains the method for selecting probes with illustrations.
- probe
- Inspection fixture
- Processing Jig
A wide variety of probes in stock! Leave the selection of probes to us!
- probe
- Inspection fixture
- Processing Jig
It is possible to reduce high-frequency loss and direct current resistance values!
- probe
For partial electrode support such as probe cards!
- probe
Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!
- probe
