List of probe products
- classification：probe
361～420 item / All 448 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
Providing precision probes, precision parts, and precision models (such as desktopZERO).
- probe
IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!
- Contract manufacturing
- probe
A unique structure of a sensitive probe that supports high-precision measurement!
- Contract manufacturing
- probe
Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!
- probe
From narrow pitch measurements of 0.05 mm to high current power semiconductors.
- probe
As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.
- probe
Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!
- probe
We are currently offering a guide that clearly explains the method for selecting probes with illustrations.
- probe
- Inspection fixture
- Processing Jig
A wide variety of probes in stock! Leave the selection of probes to us!
- probe
- Inspection fixture
- Processing Jig
It is possible to reduce high-frequency loss and direct current resistance values!
- probe
For partial electrode support such as probe cards!
- probe
Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!
- probe
Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!
- probe
Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!
- probe
Introducing contact probes compatible with a 2.54mm pitch, highly regarded worldwide!
- Processing Jig
- probe
A wide variety of highly rated contact probes from around the world! Over 3,000 types available!
- Processing Jig
- probe
Probes for bare board testers that can accommodate fine pitches! Achieves excellent durability due to its simple mechanism!
- Processing Jig
- probe
Design and manufacture centered on ultra-low temperature experimental equipment and vacuum application devices.
- Other physicochemical equipment
- Testing Equipment and Devices
- probe
We will assist you in the development of new products and the rationalization of production!
- Other machine elements
- Other molds
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1.91mm pitch, highly rated worldwide!
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1.27mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 1mm pitch! Highly rated worldwide.
- probe
Introducing contact probes compatible with a 0.7mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 0.6mm pitch, highly regarded worldwide!
- probe
Introducing contact probes compatible with a 0.5mm pitch, highly regarded worldwide!
- probe
Introducing probe and electrode settings available for grand feed-through!
- Sealing
- probe
- Other electronic parts
A new shape that securely holds small chip components from size 0603!
- Other measurement, recording and measuring instruments
- Other electronic measuring instruments
- probe
Various materials, shapes, dimensions, etc., are available considering electrical characteristics.
- probe
Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm or more.
- probe
Multi-contact connection recruitment! A connector that can be pressed against the supply terminal for use.
- Other Connectors
- probe
The quality assurance department has been waiting! Voltage probes for oscilloscopes that can be used in a temperature range of -55°C to +155°C within a temperature-controlled chamber.
- oscilloscope
- probe
- Thermostatic chamber
Electrodes for trace sample applications in chemical analysis, scientific research, and pharmaceuticals.
- Other physicochemical equipment
- probe
A must-see for electronic component designers! A probe capable of probing waveforms in a constant temperature chamber with a temperature range of -55℃ to 155℃.
- oscilloscope
- probe
- Thermostatic chamber
Direct probing of the current waveform of the IC leads mounted on the substrate. Probing the current waveform flowing through a wide bus bar.
- oscilloscope
- Ammeter
- probe
We will be exhibiting at Measurement Exhibition 2015 TOKYO!
We are pleased to announce that our company will be exhibiting at Measurement Expo 2015 TOKYO. We sincerely invite you to visit us. ■ Dates: December 2 (Wed) - 4 (Fri), 2015 ■ Venue: Tokyo Big Sight, Booth No. M4-34 ■ Products to be exhibited: - Semiconductor Curve Tracer CS Series - 400MHz Wideband Differential Probe BumbleBee - Japanese-made Rogowski Coil Current Probe - SE-6000 Series Isolation Probe - PSM3750 Frequency Response & Impedance Analyzer (manufactured by Newtons4th, UK) - Small Signal Amplifier - and more.
Compatible with various precious metals! Probe pins that meet your needs.
- probe
Small-sized wideband high-voltage probe for 1kV to 6kV.
- Other cable related products
- oscilloscope
- probe
It enables high speed and high precision in all directional orientations.
- probe
Complex work, free-form surfaces, and contour measurement times will be extremely shortened.
- probe
Quickly and reliably detect processing defects through analog scanning of the work surface.
- probe
It is used for quick and accurate automatic tool setting and work measurement.
- probe
It is a probe that integrates all the advantages of the Shark 360 measurement mechanism.
- probe
Enables high-speed, high-precision automatic tool setting and breakage detection within composite processing machines.
- probe
Automatic centering of workpieces with high speed and high precision, as well as measurement of workpiece dimensions, is possible.
- probe
It features the proven shark360 mechanism, boasting precision and long lifespan.
- probe
Sturdy and economical. Reliability increases even in unfavorable environments.
- probe
Flexible Optical Technology Non-Contact Shaft Measurement System
- probe
Cable connection transmission type with built-in interface.
- probe
Flexible Optical Technology Non-Contact Shaft Measurement System
- probe
Prevents slight misalignment of devices, improving operability even when using high-magnification microscopes.
- Semiconductor inspection/test equipment
- Circuit Board Inspection Equipment
- probe
Achieving a 400MHz wide bandwidth! A differential probe that also features a high common mode signal rejection ratio.
- Voltage Meter
- probe
On January 20, 2015, Iwatsu Measurement began selling the wideband high-voltage differential probe "BumbleBee."
We will launch the wideband, high-voltage differential probe 'BumbleBee' manufactured by PMK in Germany. The release will start on January 20, 2015, with shipments expected to begin in mid-March of the same year. The price is 480,000 yen (excluding tax). Since 2004, we have been selling high-voltage probes from PMK, and among them, 'BumbleBee' is a product developed with the latest technology from PMK, achieving class-leading bandwidth and common-mode signal rejection ratio. In recent years, the emergence of devices using SiC (silicon carbide) and GaN (gallium nitride) in power semiconductors has led to advancements in high-frequency and high-voltage applications, making it increasingly difficult to measure with conventional differential probes. This device clears those issues at a high level, achieving a bandwidth of 400 MHz and a maximum differential input of 2000V, meeting many user needs.
Insulation design using optical fiber enables ultra-high voltage measurement! Supports remote measurement up to 200 meters.
- Voltage Meter
- probe
On January 14, 2015, Iwatou Measurement began selling the isolation probes 'SE-6000/SE-6010'.
We will launch the isolation probe 'SE-6000/SE-6010'. The release will start on January 14, 2015, with shipments expected to begin in mid-March of the same year. The price for the isolation amplifier SE-6000 is 480,000 yen (excluding tax), and the isolation unit SE-6010 is 980,000 yen (excluding tax). This device consists of a receiving amplifier (SE-6000) and a transmitting unit (SE-6010), allowing for voltage measurements in hazardous locations such as those with ultra-high voltage or strong electromagnetic fields, thanks to optical fiber insulation. It can also support remote measurements of up to 200 meters, demonstrating its effectiveness in applications such as inverter measurements for trains and lightning surge measurements for wind turbines. Additionally, it has significantly upgraded to meet modern needs with a frequency range of 30 MHz, continuous measurement time of 30 hours at room temperature, and a maximum cable length of 200 meters.
We handle everything from planning to design and production of products that meet your needs.
- Automotive Connectors
- cable
- probe
Universal infrared touch probe with multi-directional measurement mechanism characteristics.
- probe