List of Wafer products
- classification：Wafer
76～90 item / All 347 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Analysis of gas flow under low pressure conditions; analysis software compatible with rarefied gases (rarefied fluids).
- Vacuum pump
- Vacuum Equipment
- Wafer
July 3 (Wed) - July 5 (Fri) [Exhibition Participation] Announcement of ISSP2024 Corporate Exhibition Corner Participation
The International Symposium on Sputtering and Plasma Processes 2024 (ISSP2024) will be held from July 3 (Wednesday) to July 5 (Friday), 2024, organized by the Surface Vacuum Society. Our company will be exhibiting at the corporate exhibition corner. ■ Exhibition Homepage https://www.issp-jvss.org/ ISSP is an international exhibition focused on sputtering and plasma process technology. This will be the first event in five years since ISSP2019 was held in 2019. Please be sure to stop by our exhibition corner. We will also be holding consultation sessions with our technical staff and demonstrating our developed software, such as Particle-PLUS and DSMC-Neutrals!! We sincerely look forward to your visit.
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that allows for the evaluation of cosmetic textures all in one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system for measuring cell characteristics at the nanoscale.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes it possible to evaluate coatings in the aerospace field all with one machine.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
Measuring the nano-mechanical properties of biomaterials with a single device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
A system that makes everything possible with just one device.
- Circuit Board Inspection Equipment
- Wafer
- Testing Equipment and Devices
Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.
- Other measurement, recording and measuring instruments
- Sensors
- Wafer
Notice of Participation in SEMICON JAPAN 2025
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)