List of Measurement and Analysis products
- classification:Measurement and Analysis
1531~1575 item / All 55013 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
Basic knowledge and analysis examples of TEM (Transmission Electron Microscopy) used in a wide range of research and development fields such as polymers and semiconductors.
- Other microscopes
It is possible to efficiently propose candidates for new materials using a data-driven approach.
- Contract Analysis
We support the sales application for functional foods in three steps!
- Contract measurement
Various physical property information such as point defect formation energy, charge, and optical transitions can be obtained.
- Contract Analysis
Quantum chemistry calculation
- Contract Analysis
Detailed information such as atomic arrangements within the crystal can be obtained from the analysis of measurement data like XRD.
- Contract Analysis
Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).
- Contract Analysis
- Contract measurement
- Contract Inspection
This is a method for inorganic element analysis using inductively coupled plasma (ICP) as the excitation source.
- Contract Analysis
- Contract measurement
- Contract Inspection
FIB: Focused Ion Beam Processing
- Contract Analysis
SIMS: Secondary Ion Mass Spectrometry
- Contract Analysis
By rapid freezing and SEM observation, the dispersion of particles was confirmed through images! ★Data displayed at the 25th Interphex Japan★
- Contract Analysis
Notice of Participation in the 25th INTERPHEX Japan
Interfex Japan is an international specialized exhibition where all the equipment, systems, and technologies necessary for the manufacturing and research and development of pharmaceuticals, cosmetics, and detergents are showcased together. MST will propose solutions using analysis in the research and development and manufacturing sites of pharmaceuticals and cosmetics. We sincerely look forward to your visit. ● Event Dates June 27 (Wednesday) to June 29 (Friday), 2012, 10:00 AM to 6:00 PM [Only on the final day, June 29 (Friday), it will end at 5:00 PM] ● Venue and Booth Tokyo Big Sight, East Hall 5, Booth 45-18 ● Exhibition Content We will introduce analysis case studies on panels. Specialized analysis staff will be stationed at the booth to provide consultations on analysis and introduce methods. 【Main Content】 - Evaluation of the structure and dispersion of fine particles in liquid using Cryo-SEM - Cross-sectional observation of enamel prisms in teeth using TEM - Analysis of odor components using GC/MS - Evaluation of the distribution of components in hair using TOF-SIMS - Radiation measurement We sincerely look forward to your visit.
It has become possible to analyze in depth without damaging organic components! The spatial resolution has also improved compared to conventional methods, allowing for evaluation in narrow areas.
- Contract Analysis
This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
- Contract Analysis
- Contract measurement
- Contract Inspection
EBSD: Electron Backscatter Diffraction
- Contract Analysis
X-ray photoelectron spectroscopy (XPS)
- Contract Analysis
IC: Ion Chromatography
- Contract Analysis
SRA: Spread Resistance Measurement Method
- Contract Analysis
SRA: Spread Resistance Measurement Method
- Contract Analysis
AES: Auger Electron Spectroscopy
- Contract Analysis
GC/MS: Gas Chromatography-Mass Spectrometry
- Contract Analysis
LC/MS/MS: Liquid Chromatography-Mass Spectrometry
- Contract Analysis
SIMS: Secondary Ion Mass Spectrometry
- Contract Analysis
GC/MS: Gas Chromatography-Mass Spectrometry
- Contract Analysis
- Memory
HPLC: High-Performance Liquid Chromatography
- Contract Analysis
AFM: Atomic Force Microscopy Method
- Contract Analysis
- Wafer
SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.
- Contract Analysis
- Other contract services
High-resolution and high-precision analysis is possible with the OrbitrTM mass spectrometer (HRMS).
- Contract measurement
NMR analysis of trace components is possible.
- Contract Analysis
- Contract measurement
Analyze the EVolution of EV development!
- Contract measurement
Analysis of halogens (F, Cl, Br) and sulfur is possible.
- Contract Analysis
- Contract measurement
Differences between LDI-MS and MALDI-MS
- Contract Analysis
- Contract measurement
The mass array method allows for the simultaneous analysis of multiple SNPs (single nucleotide polymorphisms).
- Contract Analysis
- Contract measurement
We aim to further improve our services for customers in the Hokkaido area, based at the Chitose Sales Office.
- Contract Analysis
MST [Chitose Sales Office] OPEN!!
We will open the Chitose Sales Office, the first in the Hokkaido area as MST. Based in the Chitose Sales Office, we aim to further improve our services for customers in the Hokkaido area. Additionally, we will achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (laboratory). Please look forward to it! Opening date: Thursday, April 11, 2024 Address: Room 160, Chitose Arcadia Plaza, 1-3-1 Kashiwadai Minami, Chitose City, Hokkaido *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-4001-1578 (Contact: Yanagimachi)
It is possible to evaluate the amount of impurities with high reproducibility.
- Contract Analysis
We have started a testing service to measure PFAS concentrations in blood starting from June 2024.
- Contract Inspection
- others
Capable of evaluating the distance between specific atoms with high precision.
- Contract measurement
- Contract Analysis
Non-contact three-dimensional measurement device
- Contract Inspection
- Contract measurement
Transient Thermal Resistance Measurement
- Contract Analysis
This is a method that allows simultaneous shape observation and elemental imaging of small areas using a FIB and a TOF mass spectrometer mounted on an SEM device.
- Contract measurement
By analyzing the characteristic X-rays generated when a finely focused electron beam is irradiated onto the surface of a solid sample in a vacuum, insights can be gained regarding the identification o...
- Contract measurement
Nuclear Magnetic Resonance
- Contract measurement
- Contract Analysis
It is a method for observing the light emitted when electrons, excited by the irradiation of light on a substance, return to the ground state.
- Contract measurement
HAXPES is an analytical method that uses hard X-rays as the excitation light for XPS (X-ray photoelectron spectroscopy).
- Contract measurement