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Analytical Equipment Product List and Ranking from 267 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ライフィクスアナリティカル Osaka//Pharmaceuticals and Biotechnology
  3. null/null
  4. 4 ビーエルテック Tokyo//Testing, Analysis and Measurement
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

  1. Nanoparticle analysis device "TaylorSizer" ライフィクスアナリティカル
  2. iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  3. Alcohol analysis device for sake Alcolyzer3001 SAKE
  4. 4 Sake FT-IR component analysis device "OenoFoss2"
  5. 5 Trace Sulfur Analysis Device (Old Type) 日東精工アナリテック

Analytical Equipment Product List

256～270 item / All 1223 items

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Regarding interface and depth direction resolution

Regarding interface and depth direction resolution

SIMS: Secondary Ion Mass Spectrometry

The SIMS analysis profile of the interface between different materials changes with a certain width in the depth direction. This is due to the characteristics of SIMS analysis, which are influenced by ion beam mixing and the roughness of the sputtered surface. The detected impurities represent averaged information up to the mixed depth, detecting ions from regions with a width in the depth direction. Therefore, the interface position is generally defined as the location where the ion intensity of the main constituent elements reaches 50%.

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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

Depth direction analysis will be conducted to a depth of several micrometers.

XPS is a surface-sensitive technique widely used for evaluating sample surfaces, but when combined with ion etching, it allows for depth analysis. In addition to the compositional distribution in the depth direction, XPS also enables the assessment of bonding states, making it suitable for investigating the causes of discoloration on the surfaces of device components. This document presents a case study evaluated by XPS regarding the discoloration of the blades of a turbo molecular pump.

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  • Contract manufacturing

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[Analysis Case] Analysis of Hydrogen Desorption from Stainless Steel by TDS

[Analysis Case] Analysis of Hydrogen Desorption from Stainless Steel by TDS

It is possible to evaluate the amount of hydrogen released from metals using TDS (Thermogravimetric Desorption Gas Analysis).

Many metallic materials, such as steel, are known to deteriorate (hydrogen embrittlement) due to diffusible hydrogen that diffuses within the crystal lattice at room temperature. This time, we present an example of evaluating the amount of hydrogen desorption from stainless steel plates (SUS316L) with added hydrogen using TDS. A desorption peak, thought to be diffusible hydrogen, was observed in the low-temperature range around 150°C.

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  • Other metal materials
  • Steel

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Analysis case: Metal content analysis in a solution

Analysis case: Metal content analysis in a solution

High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.

ICP-MS can sensitively analyze the metal content in solutions, such as the metal amounts in the cleaning solution used in the wafer cleaning process and the metal amounts in the pure water flowing through the pipes installed in the equipment and buildings. It can accommodate various types of solutions, including pure water, acids, and alkalis, and can analyze metal element concentrations ranging from ppt levels to major component levels. This document presents case studies investigating the metal content in commercially available solutions.

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  • Wafer
  • Water quality testing

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[Analysis Case] Simultaneous Heating Analysis of Copper Plates and Solder by TDS

[Analysis Case] Simultaneous Heating Analysis of Copper Plates and Solder by TDS

It is possible to evaluate degassing in an environment close to the actual process by bringing the materials into contact with each other.

Soldering of metals is one of the essential processes in the field of electronics. It is known that the outgassing that occurs when metal and solder are heated in contact can lead to voids. Below, we introduce a case where TDS analysis (Thermal Desorption Spectroscopy) was performed with solder placed on a copper plate. TDS can evaluate the outgassing associated with the heating of materials. By bringing the copper plate and solder into contact and heating them simultaneously within the TDS apparatus, we were able to capture outgassing in an environment close to the actual process.

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  • Non-ferrous metals
  • Solder

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[Analysis Case] Quantitative Analysis of Low Molecular Weight Siloxanes

[Analysis Case] Quantitative Analysis of Low Molecular Weight Siloxanes

We will quantify the siloxanes in the exhaust gas at the ng level.

The siloxane that is emitted as outgassing from silicone products is a component that is volatile and tends to adhere to substrates. It is known that when siloxane adheres, it can cause adverse effects such as fogging of optical system lenses, delamination or poor adhesion of films, and contact failures in relay circuits, making it important to investigate the amount of siloxane outgassing. This document presents a case study on the amount of cyclic dimethylsiloxane generated when heating silicone tubes at 200°C.

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The Kumamoto Sales Office opened on April 15, 2022 (Friday) MST!

The Kumamoto Sales Office opened on April 15, 2022 (Friday) MST!

We will base our operations at the Kumamoto Sales Office and aim to further improve our services for customers in the Kyushu region.

The first Kumamoto sales office in the Kyushu region has opened. Based in the Kumamoto sales office, we aim to further enhance our services for customers in the Kyushu area. Meetings can be held by visiting your company, and consultations on analysis can also be conducted at the sales office. We will achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (laboratory). Please look forward to it. Opening date: April 15, 2022 (Friday) Address: 161-1 Muro, Otsu Town, Kikuchi District, Kumamoto Prefecture, Station M 102 *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-7017-3882 (Contact: Takeda)

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[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

From the analysis of the Cu2p3/2 spectrum and Cu Auger spectrum, it is possible to evaluate the bonding state, quantitative assessment, and film thickness of the Cu surface. Major application examples include the evaluation of CMP processing and cleaning of Cu wiring, as well as the investigation of rust and discoloration of Cu electrodes. We will summarize the surface states of Cu treated with various processes and the thickness of the oxide film. (Measurements can be conducted immediately after treatment in a clean room environment.)

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[Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding

[Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding

Qualitative and distribution evaluation of optical fiber materials is possible using TOF-SIMS.

Optical fibers have a structure that consists of a core with a high refractive index surrounded by a cladding layer with a low refractive index. Due to the difference in refractive indices, light is totally internally reflected at the boundary and transmitted. Therefore, it is important to analyze the selection of materials, the presence of impurities, adhesion, coating conditions, and contaminants. Optical fibers can be broadly classified into two types: plastic and quartz. This document presents a case study in which the materials of the core and cladding were identified by analyzing the cross-section of plastic optical fibers using TOF-SIMS. Measurement method: TOF-SIMS Product field: Optical fibers, electronic components Analysis purpose: Qualitative evaluation, organic matter evaluation, composition distribution evaluation "For more details, please download the document or contact us."

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[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

To determine impurity concentrations using SIMS analysis, it is necessary to use a standard sample with the same composition as the analysis sample. By preparing various Al compositions of AlGaN standard samples for AlGaN used in ultraviolet LEDs and power devices, MST can achieve more accurate quantification of impurities. We will introduce a case where, after disassembling a commercially available deep ultraviolet LED, SIMS analysis was conducted to determine the concentration of the dopant Mg and the distribution of the main component Al composition. Measurement method: SIMS Product fields: Lighting, power devices, optical devices Analysis purposes: Trace concentration evaluation, impurity evaluation, distribution evaluation, product investigation For more details, please download the materials or contact us.

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[Analysis Case] Molecular Structure Analysis of Liquid Crystal Materials

[Analysis Case] Molecular Structure Analysis of Liquid Crystal Materials

It is possible to estimate the structure of liquid crystal molecules in liquid crystal displays using GC/TOFMS.

The response speed, driving voltage, and reliability characteristics of liquid crystal panels are attributed to the molecular structure of the liquid crystals. Therefore, analyzing the details of the molecular structure is essential for controlling the display characteristics of liquid crystal panels. Here, we introduce a case where the liquid components in commercially available panels were extracted and structurally estimated using GC/TOFMS. Approximately 10 components, including liquid crystal materials that exhibit negative dielectric anisotropy, were estimated from precise mass information. Measurement method: GC/MS Product fields: Displays, televisions, projectors Analysis objectives: Market research, molecular structure evaluation, degradation investigation For more details, please download the materials or contact us.

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[Analysis Case] Investigation of Adhering Components Before and After Cleaning of Mechanical Parts

[Analysis Case] Investigation of Adhering Components Before and After Cleaning of Mechanical Parts

It is possible to evaluate cleaning effectiveness and identify contaminants.

When overhauling mechanical parts such as pumps and engines, there are cases where parts are cleaned and reused. If the cleaning does not sufficiently remove dirt, there is a risk of malfunctions occurring in the assembled machinery. To investigate the presence of dirt or to analyze the components that are attached, thermal desorption gas chromatography/mass spectrometry (TD-GC/MS) is effective. By heating the sample at a high temperature (up to 350°C), the attached organic substances can be volatilized and measured using GC/MS. This method is useful for identifying the attached components, comparing the amount of attachment before and after cleaning, and assessing the degree of cleaning based on different cleaning methods. Measurement method: GC/MS Product field: Manufacturing equipment and parts Analysis purpose: Composition evaluation and identification For more details, please download the materials or contact us.

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Overview and characteristics of LDI-MS (Laser Desorption Ionization Mass Spectrometry)

Overview and characteristics of LDI-MS (Laser Desorption Ionization Mass Spectrometry)

Differences between LDI-MS and MALDI-MS

LDI (Laser Desorption Ionization) is a method that uses only the energy of ultraviolet lasers to sublime and ionize molecules. On the other hand, MALDI (Matrix-Assisted Laser Desorption Ionization) is a method that sublimates and ionizes molecules by exposing a sample mixed with a matrix to ultraviolet lasers.

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[Analysis Case] Evaluation of Discoloration Causes in Ceramics

[Analysis Case] Evaluation of Discoloration Causes in Ceramics

TOF-SIMS enables imaging of the discoloration causes of inorganic materials.

Ceramics are inorganic compound materials widely used in everyday goods and electronic components. For evaluating the discoloration of ceramics caused by impurities and adherents, TOF-SIMS analysis, which allows for imaging analysis of trace components regardless of organic or inorganic substances at the focus area, is effective. This document presents a case study where the discoloration of aluminum oxide ceramics was analyzed using TOF-SIMS, demonstrating the cause of discoloration through ion images and line profiles. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Composition distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

It is possible to visualize the distribution of cleaning components and evaluate the distribution in the depth direction.

Ceramics are inorganic compound materials widely used in everyday items and electronic components. Their surface condition significantly affects the properties and performance of materials such as everyday items and electronic components. Therefore, it is important to properly evaluate the surface condition when assessing the functionality of ceramics. This document introduces a case study evaluating the cleaning components that contribute to the wettability of ceramic surfaces made of zirconium oxide, using TOF-SIMS to assess surface distribution and depth distribution. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Qualitative and distribution evaluation For more details, please download the document or contact us.

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