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Analytical Equipment Product List and Ranking from 267 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ライフィクスアナリティカル Osaka//Pharmaceuticals and Biotechnology
  3. null/null
  4. 4 ビーエルテック Tokyo//Testing, Analysis and Measurement
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

  1. Nanoparticle analysis device "TaylorSizer" ライフィクスアナリティカル
  2. iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  3. Alcohol analysis device for sake Alcolyzer3001 SAKE
  4. 4 Sake FT-IR component analysis device "OenoFoss2"
  5. 5 Trace Sulfur Analysis Device (Old Type) 日東精工アナリテック

Analytical Equipment Product List

271～285 item / All 1223 items

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Reproducibility of SIMS analysis data

Reproducibility of SIMS analysis data

It is possible to evaluate the amount of impurities with high reproducibility.

In the manufacturing of semiconductor devices, the control of impurities such as dopants is a crucial process. When focusing on ion implantation, even slight differences can affect quality and performance, making precise control necessary. The high reproducibility of SIMS analysis is ideal for the development and maintenance of these processes.

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[Analysis Case] Structural Analysis of Fluoropolymer by LDI-MS

[Analysis Case] Structural Analysis of Fluoropolymer by LDI-MS

Structural analysis of fluorine-based grease, fluorine-based lubricants, and fluorine-based oils.

Fluoropolymer materials are chemically stable and possess various properties, making them widely used in industrial machinery, semiconductors, and electronics. LDI-MS (Laser Desorption Ionization Mass Spectrometry) is an analytical method that can ionize fluoropolymers with molecular weights of around several thousand while maintaining their molecular structure, allowing for the determination of the repeating units and molecular weights of fluoropolymers, as well as the estimation of end group compositions and structures. This document presents a case study on the structural analysis of perfluoropolyether (PFPE), which is used as a base oil in lubricants and heat transfer fluids. Measurement method: MALDI-MS Product field: Polymer materials Analysis purpose: Composition evaluation and identification, chemical bonding state evaluation For more details, please download the document or contact us.

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[Analysis Case] Organic Contamination Analysis of Materials

[Analysis Case] Organic Contamination Analysis of Materials

We will analyze trace amounts of organic contaminants adhered to the material using TD-GC/MS.

In precision machinery, vacuum devices, and semiconductor manufacturing equipment, contamination of the materials used can adversely affect product quality and the stable operation of the equipment. In this case, we handled glass components with disposable gloves of different types and analyzed the organic contamination adhered to the glass components using GC/MS analysis with a gas concentration device. By evaluating the contamination of the materials, it is possible to identify the components causing defects, eliminate the sources of material contamination, and consider changes to the materials.

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  • Semiconductor inspection/test equipment

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[Analysis Case] Analysis of the HTM Layer in Perovskite Solar Cells

[Analysis Case] Analysis of the HTM Layer in Perovskite Solar Cells

Evaluation of component and depth direction distribution is possible.

Perovskite solar cells have excellent conversion efficiency in a film form and can be manufactured at low cost, leading to active research and development towards practical application. TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is effective for component analysis of the HTM layer (hole transport layer), evaluation of main components, dopants, and the depth distribution of impurities. This document presents a case study of depth analysis from the HTM layer to the perovskite layer. Measurement method: TOF-SIMS Product field: Solar cells Analysis purpose: Identification, distribution evaluation For more details, please download the document or contact us.

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[O-PTIR] PTIR detection method submicron infrared spectroscopy

[O-PTIR] PTIR detection method submicron infrared spectroscopy

Infrared spectroscopy is a method for obtaining information about molecular structure by measuring the infrared absorption due to molecular vibrations.

O-PTIR has the following features: - It allows for spectral and image measurements in small areas due to its spatial resolution (maximum spatial resolution: less than 1μm). - No need for thin sectioning (effective for samples that are difficult to thin section, such as foreign materials). - Measurements can generally be performed non-destructively. - Similar analyses can be performed using the FT-IR library.

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Differentiation of mass spectrometry methods for solid sample surfaces

Differentiation of mass spectrometry methods for solid sample surfaces

It is effective to differentiate between the two methods according to the purpose components and the size of the imaging field.

TOF-SIMS and MALDI-MS, which are representative mass spectrometry methods for solid sample surfaces, both enable qualitative analysis and imaging analysis. TOF-SIMS, which utilizes hard ionization methods, can detect inorganic and organic components with masses up to several hundred with high sensitivity. On the other hand, MALDI-MS, which employs soft ionization methods, can detect polymers in the range of thousands to tens of thousands. Additionally, the spatial resolution of the images also varies depending on the diameter of the irradiation beam.

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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.

The segregation of components and the formation of films on the surface of the positive electrode of lithium-ion secondary batteries are factors that influence the electric capacity. We will introduce a case study on Li(NiCoMn)O2 (NCM), which is used as a positive electrode, where micro-region mapping was conducted using AES, and qualitative analysis of organic components (binder) and active material surface films was performed using XPS and TOF-SIMS. These methods allow for analysis with a series of treatments conducted under an Ar atmosphere, which helps to suppress the alteration of the sample.

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[Analysis Case] Evaluation of Curing Degree of UV-Cured Resin by FT-IR

[Analysis Case] Evaluation of Curing Degree of UV-Cured Resin by FT-IR

By capturing changes in functional groups, it is possible to evaluate the curing degree of UV-curable resins.

Resins that excel in chemical resistance and electrical insulation are used as insulators, coatings, and adhesives for various electronic components. FT-IR (Fourier Transform Infrared Spectroscopy) can investigate the causes of defects such as the degree of curing of resins, making it effective for product development. As an example, we will introduce a case where the degree of curing of UV-curable resins was evaluated. It is effective for examining the UV exposure time in adhesives and assessing the curing state when delamination occurs in products.

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[Analysis Case] Wide-area Quantitative Mapping using XPS

[Analysis Case] Wide-area Quantitative Mapping using XPS

It is possible to evaluate the composition distribution in an area of up to 70×70mm.

This is an example of wide-area quantitative mapping using XPS. We evaluated organic residue on silicon wafers using the following procedure. To graph the amount (atomic concentration) rather than peak intensity, it is less affected by sample roughness and allows for data acquisition over a wide area. It is suitable for investigating organic and inorganic contamination, discoloration, surface treatments, etc., as it enables an overview assessment of the compositional distribution on the sample surface.

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Quantification of cellulose, hemicellulose, and lignin in wood biomass.

Quantification of cellulose, hemicellulose, and lignin in wood biomass.

Weight analysis

The main components of wood biomass consist of cellulose, hemicellulose, and lignin, and their composition ratios vary depending on the plant species from which they originate. The composition ratios of these three components can be evaluated by applying specific chemical treatments such as the Klason method or the Wise method to the samples and measuring their weights. At MST, the proportion of the main components in wood biomass is calculated according to the following analysis flow.

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  • wood

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[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

Simultaneous measurement of inorganic and organic components in minute specific areas.

TOF-SIMS has features such as simultaneous evaluation of organic and inorganic materials, capability for micro-area analysis, and high sensitivity for analyzing the very surface, making it effective for residue investigation in cleaning processes. An example is presented where pure water was dried on a silicon wafer. Optical microscopy only reveals slight point-like foreign substances and cloudiness. However, the results measured by TOF-SIMS showed that in the contaminated areas, organic components such as hydrocarbons, PDMS, and amides, which tend to adsorb naturally, were aggregated.

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  • Wafer
  • Memory

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Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Capable of evaluating three-dimensional structural changes according to tensile stress.

In situ X-ray CT measurements allow for internal structure analysis under conditions where a load (tension or compression) is applied to the sample. In this document, in situ X-ray CT measurements were conducted using an aluminum plate as the sample, both in its normal state and in an extended state. We calculated the tensile stress applied to the sample and monitored the internal structural changes under each stress condition. By combining in situ X-ray CT measurements with image analysis technology, it is possible to evaluate under actual usage conditions, which was previously difficult, and assess the impact of stress on the product.

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[Analysis Case] Quantitative Analysis Using NMR 31P Nucleus (B0278)

[Analysis Case] Quantitative Analysis Using NMR 31P Nucleus (B0278)

It is possible to calculate the concentration of phosphorus-containing organic compounds using 31P nuclear magnetic resonance!

We offer NMR (Nuclear Magnetic Resonance Analysis) services. Since NMR directly observes nuclear spins, the area of the peaks of the measured nuclides obtained from the measurement is proportional to the number and concentration of the nuclides contained in the solution or solid being measured. Based on this principle, NMR allows for quantitative analysis without the need for a calibration curve. For example, using the integral value of the peak of the 31P nucleus, it is possible to determine the concentration of one component of a two-component mixture from the known concentration of the other component according to a relationship. [Measurement Method / Processing Method] ■ [NMR] Nuclear Magnetic Resonance Analysis *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst by in-situ XAFS

[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst by in-situ XAFS

Measurements can be made under specific gas atmosphere and temperature conditions! Ideal for evaluating the state in special environments such as catalysts.

We offer the evaluation of the chemical state of RuO2 catalysts using in-situ XAFS (C0456). Under controlled conditions with gas atmospheres and temperatures tailored to the sample environment, it is possible to assess the chemical bonding state and local atomic structure of the sample. Therefore, it is suitable for cases where state evaluation is required in special environments, such as catalysts. In a case where RuO2 powder was heated from room temperature to 400°C under a reducing atmosphere using in-situ XAFS, it was confirmed from the shape of the spectrum that RuO2 is reduced to Ru between 100°C and 200°C. [Measurement Method / Processing Method] ■ [XAFS] X-ray Absorption Fine Structure *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Imaging of the Cuticle

[Analysis Case] Imaging of the Cuticle

It is possible to evaluate the distribution of components in the hair cuticle!

Our organization offers imaging of cuticles. The evaluation of cuticles has been limited to structural observation using electron microscopy due to their fine structure, and detailed component distribution has remained unclear. By using TOF-SIMS, which can evaluate the distribution of inorganic and organic materials at the sub-micron level, it is possible to assess the distribution of various components within the cuticle. This document presents the results of evaluating hair and visualizing the component distribution within the cuticle. [Measurement and Processing Method] ■ [TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry *For more details, please download the PDF or feel free to contact us.

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