Analytical Equipment Product List and Ranking from 227 Manufacturers, Suppliers and Companies

Rapid Microbial Identification "MALDI Biotyper"

Identification of bacteria, rapid, low cost, high precision

■ Low cost per sample, around several dozen yen ■ 7854 types. Original library can be expanded and shared ■ Identification of 1 sample in 11 minutes, 96 samples in 100 minutes using the smear method (※standard case) ■ Samples: bacteria, yeast, molds, etc. ■ Established protocols for filamentous fungi and acid-fast bacteria ■ Equipment used: microflex LT, microflex LT smart MALDI-TOF mass spectrometer

Company：ブルカージャパンダルトニクス事業部　微生物同定・菌株識別
Price：Other

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[Information] History of MALDI Biotyper (White Paper)

From materials to microorganisms! A powerful technology that can identify down to the species level has been born.

This document explains the birth of MALDI-TOF MS, the development of the MALDI Biotyper, and the expansion of its applications. It reflects on the history of MALDI-TOF MS, the early role of scientists at Bruker in the manufacturing of commercial MALDI-TOF MS systems, and the impact of the widespread adoption of this technology. We encourage you to read it. 【Contents (partial)】 ■ Introduction ■ The birth of MALDI and the history of its early days ■ Bruker's first commercial MALDI-TOF MS system ■ Early applications of MALDI-TOF MS ■ Improvements in the usability of MALDI-TOF MS systems *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンダルトニクス事業部　微生物同定・菌株識別
Price：Other

Other physicochemical equipment
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Zeeman correction atomic absorption spectrometer ZEEnit series

The third generation Zeeman correction enables measurement of samples with a wide range of concentrations!

The magnetic field strength can be variably set up to a maximum of 1.0 Tesla to perform optimal corrections. In addition to the conventional Zeeman correction (2-field mode; on, off), a 3-field mode (off, medium, high magnetic field) is now possible, expanding the measurement concentration range to the mg/L order and significantly broadening the application areas. 【Features】 ■ Improved sample processing capability with an 8-lamp changer ■ Switchable between single and double beam ■ D2 background correction, third-generation Zeeman background correction ■ Equipped with RFID tool for coded lamps ■ Direct measurement of solid samples as well as liquid samples is possible ■ Unique cross-heating graphite furnace achieves ideal atomization ■ Optimal atomization and ashing temperatures, 2-field/3-field background correction enable ideal measurements ■ Unique variable magnetic field 3-field mode extends the linearity range of the calibration curve ■ Built-in camera allows observation of sample injection and drying within the graphite tube ■ Automatic burner height adjustment function ensures optimal frame measurement

Company：アナリティクイエナジャパン
Price：Other

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Total Organic Carbon Analyzer (TOC) "multi N/C Series"

For TOC measurement of environmental water, drinking water, and wastewater! Reduces time and costs with high quality and ease of use.

The "multi N/C x300 series" is an analytical device that is easy to use and capable of providing highly reliable measurements across various fields. With intuitive user guidance and a robust design, it is well-suited for routine measurements. It also excels in durability due to high-quality materials and durable components. Thanks to the versatility of the modules, it can accommodate various applications, from surface water and wastewater in the environmental sector to ultrapure water measurements in semiconductors and power plants. 【Features】 ■ The beam focus NDIR detector has a high radiation light density, offering high sensitivity and precision. ■ Guarantees stable measurements over long periods. ■ Easy creation of calibration curves from a single standard. ■ Fewer consumable parts, making replacements simple. *For more details, please feel free to contact us.

Company：アナリティクイエナジャパン
Price：Other

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Sulfur and Nitrogen Analysis Device 'compEAct'

Make lab life easier and safer! It has a low detection limit and complies with various standards and regulations.

The 『compEAct』 is a device that provides rapid and cost-effective measurement of sulfur and nitrogen in liquid, gas, and LPG samples for refineries, QC, and contract laboratories. Despite its small size, it delivers high performance, contributing to cost reduction and increased productivity through high throughput, fast analysis times, and user-friendly software. By saving time and simplifying workflows, it meets the requirements of the oil and gas industry, which is facing increased regulations and skill shortages. It is also suitable for quality control in chemicals and polymers. 【Features】 ■ Economical and efficient ■ User-friendly and functional ■ Safety and compliance ■ Accurate and highly sensitive *For more details, please refer to the PDF document or feel free to contact us.

Company：アナリティクイエナジャパン
Price：Other

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Total Organic Carbon Analyzer (TOC) multi N/C 3300

A versatile model that supports a wide range of applications.

The multi N/C 3300 is an all-around model optimized for a wide range of applications to achieve the highest throughput. It features high throughput in NPOC measurements through parallel purging, flow injection without carryover, and a wide-range NDIR detector with a long-term warranty, among various other functions. With a rich array of accessories and intuitive software, operational efficiency is enhanced, yielding results suitable for various applications. 【Features】 ■ High-efficiency and reliable sample oxidation ■ High productivity ■ Beam focus NDIR ■ Signal optimization (VITA technology - combining gas retention time and integration in TOC analysis) ■ Self-check system (SCS)

Company：アナリティクイエナジャパン
Price：Other

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Total Organic Carbon Analyzer (TOC) multiN/C 4300 UV

It is an organic carbon analysis device (TOC analyzer) that boasts outstanding sensitivity using a wet ultraviolet oxidation method.

This is a high-sensitivity TOC meter for detecting ultra-trace levels of TOC values. With a high-output UV reactor and a high-sensitivity wide-range NDIR, it can rapidly and completely decompose all carbon compounds even in challenging matrices such as electroplating baths. 【Features】 ■ Efficient and reliable sample oxidation ■ High productivity ■ Beam focus - NDIR detector ■ Signal optimization (VITA technology - combination of gas retention time and integration in TOC analysis) ■ High-temperature combustion (HTC) for solid TOC analysis ■ Self-check system (SCS) ■ FDA-compliant software

Company：アナリティクイエナジャパン
Price：Other

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Total Organic Carbon Analyzer (TOC) multi N/C 2300

A specialist for TOC/TNb analysis of samples with a high particle count and small volume.

The multi N/C 2300 is a space-saving TOC/TNb analysis device that particularly demonstrates its strengths in the field of environmental analysis. Equipped with VITA, a beam focus NDIR detector, and a catalytic high-temperature combustion function up to 950°C, the multi N/C 2300 employs an ideal injection technique suitable for samples containing particles. With direct syringe injection, the path the sample travels is short, making it a device that is less prone to carryover. Additionally, the injection volume starts from 10µL, allowing for measurements even when only small amounts of sample are available, making it specialized for cases with high levels of suspended matter or limited sample quantities. 【Features】 ■ Septum-free direct injection technology ■ Optimal for small sample sizes ■ Particle handling capability and effective cleaning ■ Space-saving design that allows integration of an auto-sampler ■ Optional double furnace enables analysis of both liquid and solid samples with a single unit

Company：アナリティクイエナジャパン
Price：Other

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Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES)

Compact Size. Peak Performance.

Thanks to its unique instrument design and stable plasma flame, the PlasmaQuant 9200 series offers not only the highest resolution and best detection limits for any sample type, but also the smallest instrument footprint. In combination with unmatched reliability and easy handling, Analytik Jena's new ICP-OES instrument will be the key for your successful labwork. 【Features】 - Unmatched resolution, best detection limits, long-term stability, and a wide spectral range - Flexible plasma view and up to 1,700W plasma output - Reduces laboratory space by over 40% compared to conventional ICP-OES - Device startup time is within 10 minutes An optical emission spectrophotometer that is designed for those who expect nothing less than the highest precision, reliability and sensitivity. Whether it is cutting edge research, finding every trace in quality control, or anything in between. The PlasmaQuant 9200 series is at your side. ●Analytical Excellence The PlasmaQuant 9200 series combines market-leading resolution with unsurpassed matrix tolerance – that way, your results meet the highest analytical standards. - With unparalleled resolution of 2 pm @ 200 nm, the peak is always in plain sight - Best detection limits with long-term stability for reliable results - Adapt to any challenge with the most extensive spectral range available – 160 to 900 nm for ultimate versatility ●Space-Saving Powerhouse Quick instrument start-up, robust plasma and the smallest footprint on the market – with the PlasmaQuant 9200 series you not only save time and money, but also valuable lab space. - We reduced the instrument size by more than 40 percent, making the PlasmaQuant 9200 the smallest instrument in its class, with only 60 cm width - Master any matrix with up to 1,700 Watt of plasma power - Save time and resources with quick boot-up time of less than 10 minutes ●Simply Reliable Effortless handling, easy consumable replacement, and long-term reliability. The PlasmaQuant 9200 series ensures carefree use, application safety, and full flexibility. - Mix and match your torch – Depending on your samples, use the material that fits best, with our completely modular solution - The Dual View PLUS allows to measure each sample with the optimum plasma observation modes to avoid repetitive sample measurements - With a tailor-made service contract, you are always on the safe side, be it for regular maintenance for more sustainability or quick help when you need it

Company：アナリティクイエナジャパン
Price：Other

Spectroscopic Analysis Equipment
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TMA (Thermomechanical Analysis)

Information on thermal expansion, thermal contraction, and glass transition temperature can be obtained in multiple measurement modes!

TMA (Thermomechanical Analysis) is a method that measures the dimensional changes of a sample while applying a constant load and varying the sample temperature. It provides information on thermal expansion, thermal contraction, glass transition temperature, and more. The temperature range is from -150 to 1000°C, with a maximum size of Φ10×25mm (compression mode, needle insertion mode) and a maximum size of 0.7mm×5mm×20mm (tensile mode) as measurable conditions. This document includes case studies of TMA analysis for semiconductor encapsulants. 【Features】 ■ Thermomechanical measurement ■ Applying a constant load to the sample while varying the sample temperature ■ Measuring the dimensional changes of the sample ■ Obtaining information on thermal expansion, thermal contraction, glass transition temperature, etc. ■ Multiple measurement modes *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

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State analysis using EPMA

Estimate bonding states by comparing with standard spectra! Introducing state analysis using EPMA.

In the state analysis using EPMA, changes (shifts and shapes) in the characteristic X-ray peak wavelengths due to differences in the chemical bonding states (ionic valence, crystal structure, coordination number) of oxides and silicates are utilized to estimate the bonding states by comparing with standard spectra. In the identification of two types of copper oxides, when distinguishing between black CuO and red Cu2O by color is difficult, especially for microscopic objects that require an electron microscope, it is possible to grasp the oxidation state using EPMA. Additionally, while XPS is effective for measuring thin oxide layers on aluminum surfaces, EPMA can be used to understand the oxidation state of small foreign particles, bulk materials, and composites. 【Device Specifications】 ■ Manufacturer: JEOL Ltd. Jeol-8200 ■ Analysis Method: Wavelength Dispersive X-ray Analysis (WDX) ■ Analyzable Elements: B to U ■ Energy Resolution: 20 eV (EDX is approximately 130 eV) ■ Detection Limit: 0.01% and above ■ Maximum Sample Size: 100x100 mm *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

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EPMA analysis

Supports 100×100mm size! The movable stage allows for extensive mapping.

EPMA analysis has good energy resolution and detection sensitivity, and is particularly excellent for quantitative analysis of trace components and map analysis. It can accommodate sizes of 100×100mm, allowing for extensive mapping. In the example of foreign substance analysis on indium-tin oxide thin films, it showed better energy resolution, detection limits, and PB ratio compared to SEM-EDX. Additionally, it enables the detection of trace elements and analyses that are difficult to perform with SEM-EDX. 【Features】 ■ Good energy resolution and detection sensitivity ■ Particularly excellent for quantitative analysis of trace components and map analysis ■ Wide-range mapping possible with movable stage ■ Compatible with sizes of 100×100mm *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

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Data: Outgassing analysis using headspace GC-MS analysis method.

Publication of headspace GC-MS analysis method and case study of outgassing component analysis of liquid crystal panel polarizers!

If solvents, low molecular organic substances, or unreacted materials remain in the constituent materials, packaging materials, or cushioning materials of a product, they may outgas, diffuse, or permeate into the constituent materials, potentially affecting the product's lifespan, characteristics, and the environment or human health. The headspace method of GCMS is effective for qualitative and quantitative analysis of trace residual substances. This document presents a case study of the qualitative analysis of outgassing components from polarizers used in liquid crystal panels. We encourage you to read it. [Contents] ■ Headspace GC-MS analysis method ■ Analysis of outgassing components from polarizers in liquid crystal panels *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

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Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

Appropriate acceleration conditions for accurate analysis results! The detection depth of EDX changes with differences in acceleration voltage!

This presentation introduces the detection sensitivity related to differences in acceleration voltage during SEM-EDX analysis. When analyzing the gold-plated surface of a typical printed circuit board (PCB), there are instances where the underlying nickel is detected even though it is not exposed. This is related to the scattering depth of the electron beam, and it is essential to set appropriate acceleration conditions to obtain accurate analysis results. In this study, we conducted an examination of the EDX detection depth based on differences in acceleration voltage using Monte Carlo simulations. This is just one example, but it is important to consider how electrons scatter while setting the acceleration voltage to achieve accurate analysis results. [Test Board Overview] - The sample used is a gold-plated pad from a typical printed circuit board (PCB). - The layer structure consists of nickel plating and gold plating on copper wiring. - The thickness of the gold plating, as observed in cross-section, is 212 nm. *For more details, please refer to the PDF document or feel free to contact us.*

Company：アイテス
Price：Other

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Analysis of Polymer Structural Changes

Evaluate higher-order structures using analytical methods! Raman analysis is also effective for analyzing polymer structures.

I would like to introduce "Analysis of Polymer Structural Changes." This document includes "Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy" and "Structural Changes of Polymer Chains." The molecular structure of polymers affects their properties, influencing the physical characteristics of polymer products. We evaluated the higher-order structures formed by the aggregation of polymer chains using analytical methods. Please take a moment to read it. [Contents] ■ Evaluation of Polymer Higher-Order Structures by Raman Spectroscopy ■ Structural Changes of Polymer Chains *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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[Data] ICP Emission Spectroscopy Analysis (ICP-AES)

We will detect and analyze the atomic emission that occurs when an atom returns from an excited state to its ground state!

In ICP emission spectroscopic analysis, it is possible to detect multiple metal elements contained in a sample simultaneously. This document introduces examples of the analysis of trace metal elements contained in liquid crystals. It includes the principles and overview of ICP-AES analysis as well as measurement examples. Please feel free to contact us regarding the sample state or the elements to be analyzed. [Contents] ■ Principles and Overview of ICP-AES Analysis ■ Measurement Example: Qualitative Analysis of Metal Elements in Liquid Crystal Panels *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of issues are possible! We will introduce examples verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis via surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results by XPS (ESCA) ■ Bonding State Analysis Results by XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results by XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
Price：Other

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[Example of TOF-SIMS] Analysis of Li

It is possible to detect with high sensitivity! We will introduce a case comparing the analysis of Li using TOF-SIMS and SEM-EDX.

We will introduce a case comparing the analysis of lithium (Li) using TOF-SIMS and SEM-EDX. While SEM-EDX is used for the analysis of contamination and foreign substances, it is difficult to detect Li with general EDX, excluding windowless EDX. On the other hand, TOF-SIMS can detect Li with high sensitivity. Please feel free to contact us if you need assistance. 【Overview】 ■ Analysis of stains on copper plates ■ SEM-EDX analysis → Difficult to detect Li ■ TOF-SIMS analysis → Li detectable *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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[Data] Analysis of Polycarbonate Degradation by Reaction Thermal Decomposition

For material evaluation and defect analysis! We will discuss the applied load and degradation mechanisms based on the differences in decomposition products.

Polycarbonate is a material that excels in impact resistance, weather resistance, and transparency, making it widely used in everything from industrial materials to everyday products. However, even polymers with excellent properties can undergo chemical changes, commonly referred to as degradation, due to the usage environment and the passage of time. This document presents examples of degradation analysis of polycarbonate materials subjected to UV irradiation and constant temperature and humidity testing. [Contents] ■ Thermal decomposition GC-MS analysis of polycarbonate *For more details, please refer to the PDF document or feel free to contact us.*

Company：アイテス
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[Analysis Example by EDS] Bonding Interface of Cu Pad

It is possible to view the distribution of each element in two dimensions! This can also be effective when analyzing multilayer samples.

We would like to introduce a case study of EDS analysis at the Cu pad interface. In qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds, the concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray. For intermetallic compounds, it is possible to estimate the formed compounds based on the calculated concentration ratios. Additionally, in line analysis, it is possible to profile the concentration distribution of each element along a specified line in the SEM image, allowing for the observation of changes in element concentration at the analysis location. 【Features of EDS Analysis】 ■ Qualitative analysis (point analysis) and semi-quantitative analysis of intermetallic compounds - Concentration of contained elements is calculated by examining the intensity (count numbers) of each characteristic X-ray - Intermetallic compounds can be estimated based on the calculated concentration ratios ■ Line analysis - Concentration distribution of each element along a specified line in the SEM image can be profiled - Changes in element concentration at the analysis location can be confirmed *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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[Data] Analysis and evaluation of organic materials and polymer materials.

Essential materials alongside metals and inorganic materials! Introducing examples of analysis and evaluation services for organic materials.

Organic materials such as solvents, additives, pharmaceuticals, and plastics are essential materials alongside metals and inorganic materials. They have a wide variety of types due to combinations of light elements, and their specificity arises from structures, intermolecular forces, and electron behavior. However, it seems that chemical instrumentation analysis and evaluation are necessary for a fundamental understanding of their properties. This document presents examples of analysis and evaluation services for organic materials. [Contents] ■ FT-IR analysis ■ GC-MS analysis ■ Molecular weight distribution evaluation by GPC (SEC) *For more details, please refer to the PDF document or feel free to contact us.

Company：アイテス
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Dynamic SIMS

Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!

"DYNAMIC SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company's facility). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material. 【Features】 ■ Automatic loading/unloading of samples, high throughput (24 samples/load) ■ Unmatched depth profiling capability and high depth resolution, wide dynamic range ■ Optimized for the analysis of glass, metals, ceramics, silicon, compound semiconductors, shallow implants, etc. ■ Highest detection limit: from ppm to ppb (10^-6 to 10^-9) *For more details, please refer to the PDF document or feel free to contact us.

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Component analysis of organic substances (FT-IR and GC/MS)

Introducing how to differentiate the use of FT-IR and GC/MS when conducting component analysis!

Our company's "Component Analysis of Organic Matter" often utilizes FT-IR and GC/MS. In FT-IR measurements, it is possible to analyze the main components of organic matter by comparing the IR spectrum of known substances. Additionally, if you want to analyze not only the main components of unknown substances but also trace amounts of organic matter such as additives, we recommend performing GC/MS measurements. 【Features】 <FT-IR Measurement> ■ Capable of analyzing the main components of organic matter ■ Can also analyze some inorganic substances *For more details, please download the PDF or feel free to contact us.

Company：アイテス
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Refrigerant Analyzer Checkmate

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Company：アサダ
Price：Other

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SIMS (Secondary Ion Mass Spectrometry)

This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.

When ions are incident on the sample surface, various particles such as electrons, neutral particles, and ions are emitted from the sample surface. SIMS is a technique that detects these ions and measures the detection quantity at each mass to perform qualitative and quantitative analysis of the components contained in the sample. - High sensitivity (ppb to ppm) - Analysis of all elements from H to U is possible - Wide detection concentration range (from major component elements to trace impurities) - Quantitative analysis using standard samples is possible - Depth direction analysis is possible - Evaluation with depth direction resolution of a few to several tens of nm is possible - Measurement of micro-regions up to a few micrometers in size is possible - Isotope analysis is possible - Destructive analysis

Company：一般財団法人材料科学技術振興財団　MST
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Analytical Equipment Product List and Ranking from 227 Manufacturers, Suppliers and Companies | IPROS GMS

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