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Analytical Equipment Product List and Ranking from 264 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. エレメンター・ジャパン Kanagawa//others
  3. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  4. 4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  5. 5 ビーエルテック Tokyo//Testing, Analysis and Measurement
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Apr 08, 2026～May 05, 2026
This ranking is based on the number of page views on our site.

  1. Measurable organic element analysis device for up to 6 elements * <Magnet gift with estimate request> エレメンター・ジャパン
  2. Alcohol analysis device for sake Alcolyzer3001 SAKE
  3. Sake FT-IR component analysis device "OenoFoss2" FOSS JAPAN Co., Ltd.
  4. 4 iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  5. 5 Laser Ablation ICP-MS System サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.

Analytical Equipment Product List

601～630 item / All 1233 items

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Essential for Beverage Manufacturers! Preventing Concentration Issues and Ingredient Incompatibility!

Essential for Beverage Manufacturers! Preventing Concentration Issues and Ingredient Incompatibility!

We exhibited at JASIS. By conducting a final check of the ingredients just before bottling, we can immediately detect concentration issues and ingredient inadequacies!

The "MH-6000A" is a portable elemental analysis device recommended for timely management of liquid concentration changes and on-site analysis. It has received great acclaim at JASIS. ◇Application Examples◇ ◎Beverage Manufacturing ◎Non-Ferrous Metal Refining ◎Metal Surface Treatment ◎Hydroponics ◎Fermentation and Cultivation, etc... Its compact size and no installation requirements allow it to be placed wherever there is a need for analysis. It enables immediate analysis and contributes to digital transformation (DX). Additionally, it allows for adjustments in wavelength range and resolution, making it possible to measure alkaline solutions. There is no need for gas piping, exhaust ducts, dedicated power sources, or gas cylinder replacements, resulting in low running costs. 【Features】 ■Inorganic analysis of liquid samples is possible ■No installation work required, ultra-compact ■On-site analysis enables rapid data acquisition ⇒ Contributes to DX ■No need for high-pressure gases like argon *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Analytical Equipment

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Simple determination by fluorescence microscopy method.

Simple determination by fluorescence microscopy method.

The luminescence of asbestos fibers enables easier measurements.

The analysis method for asbestos using a fluorescence microscope is not very common in Japan, but it makes thin fibers, which are usually difficult to identify with standard methods, easier to see because the fibers appear to glow.

  • Contract measurement
  • Analytical Equipment

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A-03 Chromium Acid Analyzer

A-03 Chromium Acid Analyzer

Measurement of anhydrous chromic acid in chrome plating solution.

This is a notice from Yamamoto Plating Testing Equipment Co., Ltd. regarding the "A-03 Chromate Analyzer."

  • Testing Equipment and Devices
  • Analytical Equipment

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A-08 Nickel Analyzer

A-08 Nickel Analyzer

Measurement of the concentrations of nickel sulfate, nickel chloride, and boric acid in nickel plating solution.

This is a notice from Yamamoto Plating Testing Equipment Co., Ltd. regarding the "A-08 Nickel Analyzer."

  • Analytical Equipment and Devices
  • Analytical Equipment

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ICP mass spectrometer "Agilent 8900 Triple Quadrupole"

ICP mass spectrometer "Agilent 8900 Triple Quadrupole"

Achieving MS/MS functionality! A mass spectrometer capable of handling challenging applications.

The "Agilent 8900 Triple Quadrupole ICP-MS (ICP-QQQ)" is a device that has emerged as the high-end model of "Agilent ICP-MS." It combines the well-established features of ICP-MS with the unique power of MS/MS, making it a groundbreaking analytical instrument capable of handling very challenging applications. By eliminating spectral interferences, it fully utilizes the true potential of reaction chemistry, enhancing accuracy and reliability of analysis in complex sample matrices. 【Features】 ○ Realizes MS/MS functionality ○ Achieves ultra-high sensitivity and low background ○ Significantly reduces polyatomic ion interferences ○ Enables high-sensitivity analysis of S, P, and Cl ○ Achieves sub-ppt BEC for Ca, among others For more details, please contact us or download the catalog.

  • Other inspection equipment and devices
  • Analytical Equipment

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ICP mass spectrometer "Agilent 7900 ICP-MS"

ICP mass spectrometer "Agilent 7900 ICP-MS"

Powerful and highly flexible single quadrupole ICP-MS

The "Agilent 7900 Series ICP-MS" is a next-generation quadrupole ICP-MS that brings together innovative technology and achieves powerful automation. With matrix tolerance of several tens of % TDS, a dynamic range of up to 11 digits, and an effective helium collision mode, it accommodates all applications and enables highly accurate analysis. All components are designed to achieve excellent performance and reliability, enhancing analytical efficiency. 【Features】 ○ Powerful automation ○ Outstanding matrix tolerance ○ Exceptional dynamic range ○ Trace level detection ○ Suitable for all applications For more details, please contact us or download the catalog.

  • Analytical Equipment and Devices
  • Analytical Equipment

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ICP Mass Spectrometer "Agilent 7850 ICP-MS"

ICP Mass Spectrometer "Agilent 7850 ICP-MS"

It can detect a wide dynamic range from trace amounts to high concentrations, and it is easy to set conditions for high matrix samples and complex applications.

What if there were a way to conduct analyses more accurately and efficiently? If we could prevent wasting time, staff could focus on tasks that enhance lab results. The Agilent 7850 ICP-MS makes that possible. Daily operations become smoother, reducing staff stress. Additionally, productivity increases, and the reliability of analytical results improves.

  • Analytical Equipment and Devices
  • Analytical Equipment

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It is possible to identify and quickly evaluate the target compound using LC/Q-TOF.

It is possible to identify and quickly evaluate the target compound using LC/Q-TOF.

Identification based on solid evidence: Addressing future challenges with the new Revident quadrupole time-of-flight LC/MS system (LC/Q-TOF).

To maintain competitiveness and respond to the changing requirements of the industry, it is necessary to place advanced equipment at the core of workflow solutions to address current and future challenges. Additionally, we must ensure that laboratories can effectively deal with new and unexpected contaminants through broader screening and re-analysis of previously measured results. The Revident quadrupole time-of-flight LC/MS system (LC/Q-TOF), with its sophisticated equipment intelligence, significantly enhances uptime and productivity, providing a solution to these challenges. The Revident LC/Q-TOF, enhanced with multiple workflow capabilities, can identify and quickly assess target compounds. The combination of isotope ratio fidelity, mass accuracy, and dynamic range generates excellent spectra that serve as a foundation for reliable data. This establishes the core of the workflow, enabling the investigation of more compounds, verification of measurement results without repeated efforts, and compliance with regulations while maintaining evaluations.

  • Analytical Equipment and Devices
  • Separation device
  • Other inspection equipment and devices
  • Analytical Equipment

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Watch past semiconductor webinar videos and download materials!

Watch past semiconductor webinar videos and download materials!

Please take a look at the latest case studies and analytical know-how utilizing Agilent's technology.

Agilent's cutting-edge semiconductor and electronics analysis solutions You can view videos and download materials from past semiconductor webinars. Please take a look at the latest technology use cases and analysis know-how. <Please access the "Related Links" below for viewing and downloads!!> ＝＝＝＝＝＝＝＝＝＝＝＝＝ Webinar Videos Recent needs for trace metal impurity analysis in the semiconductor field Fundamentals for lowering DL and BEC of ICP-MS to the extreme Current status and challenges of trace Si analysis using ICP-MS Data integrity compliance and operational efficiency utilizing data management systems GC/MS solutions for the semiconductor industry Latest information on PFAS analysis in materials using LC/MS Introduction to Agilent's elemental analysis instrument portfolio ＝＝＝＝＝＝＝＝＝＝＝＝＝ PDF Materials OpenLab ECM XT addresses the challenges of "analytical work efficiency," "accuracy management," and "data tampering" in material analysis Tips for ICP-MS analysis that material manufacturers should know

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • Analytical Equipment

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ICP Mass Spectrometer NexION 2000 Series

ICP Mass Spectrometer NexION 2000 Series

The technological innovations of the NexION 2000 provide the best performance for every lab.

With the innovative ICP-MS NexION 1000 / 2000, users can achieve both the ultimate detection limits and unprecedented ease of use. The NexION 1000 / 2000, with its various unique technologies, excels in diversity and delivers top performance for any analytical challenge.

  • Water quality testing
  • Soil testing
  • Analytical Equipment

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Fourier Transform Infrared Spectroscopy Device Spectrum Two FTIR

Fourier Transform Infrared Spectroscopy Device Spectrum Two FTIR

Equipped with various functions, it can be measured by anyone! Analysis is possible not only in laboratories but also in outdoor field environments.

The "Spectrum Two FTIR" is a high-performance, user-friendly, compact, and durable Fourier Transform Infrared Spectroscopy device. Equipped with various functions, it allows anyone to perform measurements and also includes options for portable use. It enables ideal analysis not only in laboratories but also in outdoor field environments. The expertise in spectroscopy that PerkinElmer has accumulated over more than 75 years has been condensed into this device. Additionally, the "Spectrum Two N FT-NIR" offers a lineup of transmission systems, reflection systems, and remote fiber systems. 【Device Specifications (Excerpt)】 ■ Measurement Wavenumber Range: 8300-350 cm-1 ■ Maximum Resolution: 0.5 cm-1 ■ Optical System: OpticsGuard optical system ensuring long-term dryness ■ Light Source: Long-life stabilized light source ■ Beam Splitter: Wide-range KBr *For more details, please refer to the PDF document or feel free to contact us.

  • Spectroscopic Analysis Equipment
  • Analytical Equipment

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Near-infrared spectroscopic analysis device "SpectrumTwo N FT-NIR"

Near-infrared spectroscopic analysis device "SpectrumTwo N FT-NIR"

Intuitive operation with Touch software! Portable Fourier Transform Near-Infrared Spectroscopy device.

The "Spectrum Two N FT-NIR" is a Fourier Transform Near Infrared Spectroscopy device with a spacious sample chamber that accommodates a wide range of sampling accessories. It features an OpticsGuard optical system that ensures long-term dryness, with a tungsten halogen light source. The intuitive operation via Touch software allows for easy use, and the Plug&Play accessories require no alignment. 【Main Device Specifications (Excerpt)】 ■ Optical System: OpticsGuard optical system ensuring long-term dryness ■ Light Source: Tungsten halogen ■ Beam Splitter: CaF2 ■ Power Saving Mode: Standard ■ Size & Weight: 450 (W) × 300 (D) × 210 (H) mm; 13 kg *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • Analytical Equipment

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Fourier Transform Infrared Spectroscopy Device 'Spectrum 3NIR'

Fourier Transform Infrared Spectroscopy Device 'Spectrum 3NIR'

The detector is a FR-DTGS for near-infrared! A Fourier transform infrared spectrometer for high-performance near-infrared analysis.

The "Spectrum 3NIR" is a Fourier Transform Infrared Spectroscopy (FTIR) analysis device designed for high-performance near-infrared analysis. The detector is a FR-DTGS for near-infrared, the beam splitter (B/S) is made of CaF2, and the light source is a tungsten halogen. In addition, we also offer a full-featured FTIR system with advanced far-infrared capabilities, the "Spectrum 3 MIR/FIR FTIR," among other products. 【Product Lineup】 ■Spectrum 3 FTIR ■Spectrum 3 NIR ■Spectrum 3 MIR/NIR FTIR ■Spectrum 3 MIR/FIR FTIR ■Spectrum 3 NIR/MIR/FIR FTIR *For more details, please refer to the PDF materials or feel free to contact us.

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  • Analytical Equipment and Devices
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Spectrum 3MIR/FIR FTIR

Spectrum 3MIR/FIR FTIR

Advanced far-infrared capabilities! Introducing an FTIR system with a maximum resolution of 0.4 cm⁻¹ (mid-infrared, far-infrared).

The "Spectrum 3MIR/FIR FTIR" is a fully functional FTIR system equipped with advanced far-infrared capabilities. The beam splitter (B/S) can simultaneously accommodate two types: mid-infrared KBr/Ge and far-infrared Grid. In addition, we offer a lineup that includes the high-performance near-infrared analyzer "Spectrum 3 NIR" and the "Spectrum 3 NIR/MIR/FIR FTIR" that supports triple range. 【Product Lineup】 ■Spectrum 3 FTIR ■Spectrum 3 NIR ■Spectrum 3 MIR/NIR FTIR ■Spectrum 3 MIR/FIR FTIR ■Spectrum 3 NIR/MIR/FIR FTIR *For more details, please refer to the PDF materials or feel free to contact us.

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  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • Analytical Equipment

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Crystal defect analysis device (non-contact, non-destructive)

Crystal defect analysis device (non-contact, non-destructive)

Crystal defect analysis device (non-contact, non-destructive)

It is possible to measure without breaking the wafer.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Analytical Equipment

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Surface Charge Analysis Device SCA2011

Surface Charge Analysis Device SCA2011

Surface charge analysis device

The surface charge analysis device is ideal for monitoring contamination and damage that occur during processes such as semiconductor front-end management, particularly thermal oxidation films, CVD film formation, metallization, cleaning, and etching.

  • Other inspection equipment and devices
  • Analytical Equipment

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Particle Size Analyzer VASCO

Particle Size Analyzer VASCO

Innovative solutions for particle size analysis.

Innovative ultra-thin layer technology: Dual thickness controller By using a 90-degree prism, we have eliminated the need for measurement cuvette cells, enabling a highly flexible and effective measurement system. The sample layer can be reduced from 2mm to 200um. The dual thickness controller prevents issues caused by multiple scattering and localized heating, ensuring reliable measurements even in dark media or at high particle concentrations. Air bubbles and dust within the sample can be removed with a simple pre-measurement cleaning (flushing).

  • Other photoanalytical instruments
  • Analytical Equipment

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Nanoparticle Analyzer MAGELLAN

Nanoparticle Analyzer MAGELLAN

Ultimate nanoparticle analyzer for water quality characteristic evaluation.

MAGELLAN is a unique nanoparticle analyzer based on a patented innovative technology called Laser-Induced Breakdown Detection (LIBD). MAGELLAN measures particle size distribution and elucidates the concentration of nanoparticles in water with unprecedented sensitivity and resolution. MAGELLAN is the result of a joint development between CORDOUAN Technologies and the Karlsruhe Institute of Technology (KIT) in Germany.

  • Other water quality analysis
  • Analytical Equipment

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Sulfur Carbon Analyzer Model SC832

Sulfur Carbon Analyzer Model SC832

Sulfur Carbon Analyzer Model SC832

An analytical device for the rapid quantification of sulfur and carbon in coal, coke, cement, petroleum products, ores, soil, catalysts, rubber, etc. ■□■Features■□■ ■The unique horizontal furnace from LECO can be set up to a maximum of 1550°C and employs a lance system that directly blows oxygen onto the sample, enabling rapid complete combustion and full recovery of carbon and sulfur. ■Analysis is completed in approximately 2 minutes per sample. ■The new furnace design, isolated from the atmosphere, allows for reduced blank values and improved analytical accuracy. ■It significantly reduces power consumption and waste heat, drastically lowering operational costs. ■For more details, please contact us.

  • Analytical Equipment and Devices
  • Analytical Equipment

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Diffusion/Non-diffusion Hydrogen Analysis Device Model DH603

Diffusion/Non-diffusion Hydrogen Analysis Device Model DH603

Diffusion/Non-Diffusion Hydrogen Analysis Device Model DH603

A device for high-speed, high-precision analysis of non-diffusible and diffusible hydrogen in steel and iron-based samples. ■□■Features■□■ ■An optional piercing unit is used for diffusible hydrogen analysis. ■Non-diffusible hydrogen analysis is conducted using a hot extraction method with a tubular furnace. ■Designed with safety and robustness in mind. ■Analysis range (sample weight 1g): 0.1 to 2500 ppm ■Analysis accuracy (sample weight 1g): 0.02 ppm or 2% RSD ■Sample size: 23mm × 102mm or smaller ■Detection method: Thermal conductivity method ■Operating system: Windows OS ■For more details, please contact us.

  • Analytical Equipment and Devices
  • Analytical Equipment

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Rapid aroma analysis evaluation using GC×GC-TOFMS

Rapid aroma analysis evaluation using GC×GC-TOFMS

This is a special report on rapid aroma analysis evaluation using GC×GC-TOFMS.

At LECO Japan, we will pick up samples that are expected to enhance the precision, efficiency, and safety of your analysis operations using LECO's analytical instruments, and we will present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Analytical Equipment

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Automatic peak identification by TSD using GC-MS

Automatic peak identification by TSD using GC-MS

This is a special report on automatic peak identification by TSD using GC-MS.

At LECO Japan, we will pick up samples that are expected to enhance the accuracy, efficiency, and safety of your analysis operations using LECO's analytical instruments, and we will present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Analytical Equipment

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「Arochlor 1260 GC-TOFMS」

「Arochlor 1260 GC-TOFMS」

This is a special report on Arochlor 1260 GC-TOFMS.

At LECO Japan, we will pick up samples that are expected to enhance the precision, efficiency, and safety of your analysis operations using LECO's analytical instruments, and present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
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「Analysis of Biodiesel」

「Analysis of Biodiesel」

This is a special report on the "Analysis of Biodiesel."

At LECO Japan, we will pick up samples that are expected to enhance the precision, efficiency, and safety of your analysis operations using LECO's analytical instruments, and present them as a special report. Please take a look. If you would like to know whether similar samples can be applied, please feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Analytical Equipment

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Carbon and Sulfur Simultaneous Analysis Device CS844

Carbon and Sulfur Simultaneous Analysis Device CS844

Measurement of carbon and sulfur in inorganic materials such as metals, ores, and ceramics by combustion method.

The CS844 is a wide-range carbon and sulfur analysis device that has realized customer feedback and requests spanning over 80 years using cutting-edge technology. It measures carbon and sulfur in inorganic materials such as metals, ores, and ceramics through combustion methods. All operations, including device control, setting analysis conditions, diagnostics, and report printing, are performed via a Windows-based touchscreen interface mounted on a flexible arm, ensuring that valuable workspace is not wasted. For more details, please contact us or refer to the catalog.

  • Analytical Equipment and Devices
  • Analytical Equipment

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Oxygen/Nitrogen/Hydrogen Analyzer ONH836

Oxygen/Nitrogen/Hydrogen Analyzer ONH836

Measurement of oxygen, nitrogen, and hydrogen in inorganic substances using the inert gas fusion method.

The ONH836 is a wide-range oxygen, nitrogen, and hydrogen analysis device that has realized customer feedback and requests accumulated over 80 years using cutting-edge technology. It measures the oxygen, nitrogen, and hydrogen content of inorganic materials such as steel, non-ferrous metals, high-melting-point metals, and ceramics using an inert gas fusion method. All operations, including device control, setting of analysis conditions, diagnostics, and report printing, are conducted through a Windows-based touchscreen interface mounted on a flexible arm, ensuring that valuable workspace is not wasted. For more details, please contact us or refer to the catalog.

  • Analytical Equipment and Devices
  • Analytical Equipment

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Pegasus GC-HRT+ Ultra-High Resolution Time-of-Flight Mass Spectrometer

Pegasus GC-HRT+ Ultra-High Resolution Time-of-Flight Mass Spectrometer

High-speed precision mass-type GC-TOFMS with overwhelming mass resolution.

The "Pegasus(R) GC-HRT+" is a newly designed high-resolution TOFMS equipped with LECO's new Fold Flight Pass (FFP) technology, enabling a maximum resolution of 50,000 FWHM. With a maximum spectral acquisition speed of 200 Hz and stable mass accuracy within 1 ppm, it allows for rapid and reliable peak identification. By using the dedicated software ChromaTOF HRT, it is possible to conduct identification analysis of unknown components leveraging ultra-high resolution, including library searches and compositional analysis through precise mass measurements. For more details, please contact us or refer to the catalog.

  • Analytical Equipment and Devices
  • Analytical Equipment

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Collection of Analysis Examples for Mass Spectrometry Devices in Life Sciences

Collection of Analysis Examples for Mass Spectrometry Devices in Life Sciences

Analysis case presentation! Mass spectrometry equipment suitable for complex sample analysis such as food, petroleum, and materials science.

LECO's high-performance mass spectrometry equipment is a newly designed device developed without any compromise in data acquisition speed, mass accuracy, isotope abundance ratio, mass resolution, and dynamic range. It is used worldwide for the analysis of very complex samples. Certified to ISO-9001:2008, its quality is recognized globally. We provide equipment configurations tailored to your needs for sample analysis in various fields, including food, fragrances, petroleum, environmental issues, scientific investigation, materials science, and metabolomics. [Published Examples] - Comparative analysis methods between samples in aroma component analysis - Analysis methods for differences between samples in polymer materials - Metabolome analysis methods - Approaches to the identification of unknown compounds *You can view analysis examples for free from the "Download" section below!

  • Analytical Equipment and Devices
  • Food Testing/Analysis/Measuring Equipment
  • Analytical Equipment

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Silicon wafer dedicated oxygen analysis device 'O836Si'

Silicon wafer dedicated oxygen analysis device 'O836Si'

Introducing a high-precision oxygen analysis device that adopts a non-dispersive infrared detection method!

The "O836Si" is an oxygen analysis device specifically designed for silicon wafers, developed to meet the demand for low concentration and high precision oxygen analysis in the silicon industry. It enables accurate and high-precision oxygen analysis through the combination of a highly precise non-dispersive infrared detector, the latest sample loading system, and a programmable impulse furnace. Additionally, it adopts a Windows-based system, achieving high operability. 【Features】 ■ High-precision solid-state infrared detector for low concentrations ■ Low system blank and loading head design for wafer measurement ■ Measurement results can also be displayed in ppma ■ Windows-based operating system ■ Capable of analyzing metals such as silicon wafers and steel *For more details, please feel free to contact us.

  • Analytical Equipment and Devices
  • Analytical Equipment

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