Evaluation device SOFC-type fuel cell evaluation device
Measuring solid oxide fuel cells!
This is an announcement from Nishiyama Manufacturing Co., Ltd. regarding the "SOFC-type fuel cell evaluation device."
- Company:西山製作所
- Price:Other
Last Updated: Aggregation Period:Sep 24, 2025~Oct 21, 2025
This ranking is based on the number of page views on our site.
Last Updated: Aggregation Period:Sep 24, 2025~Oct 21, 2025
This ranking is based on the number of page views on our site.
Last Updated: Aggregation Period:Sep 24, 2025~Oct 21, 2025
This ranking is based on the number of page views on our site.
136~150 item / All 212 items
Measuring solid oxide fuel cells!
This is an announcement from Nishiyama Manufacturing Co., Ltd. regarding the "SOFC-type fuel cell evaluation device."
Easy collection of current with the electrode loading mechanism / Tube cell size can be changed arbitrarily.
The SOFC power generation evaluation device with load adjustment function has made current collection easier with its electrode load mechanism. It features a tapered guide link for easy centering. The load can be adjusted by turning the handle at the bottom, with an adjustment range of up to 50N. The SOFC power generation evaluation device for tube cells is designed to flow fuel inside the cell holding tube, allowing it to react with air on the outside of the cell. The tube cell size can be changed arbitrarily with a conversion adapter. For more details, please contact us or refer to the catalog.
By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.
This shows the results of extracting the qualitative spectra of each layer by performing cutting processing of organic EL devices under controlled atmosphere. By conducting the cutting process of the organic EL devices under atmosphere control, we were able to obtain spectra of each layer that are closer to the true state.
Quantitative evaluation of dopants and evaluation of carrier distribution.
This is an example of quantitatively evaluating the dopant concentration distribution directly beneath the electrode in back contact type crystalline silicon solar cells. Additionally, by evaluating the carrier distribution, it is possible to determine the polarity of p/n and visualize the depletion layer in the cross-sectional direction.
Evaluation of carrier diffusion layer uniformity in samples with surface roughness.
This is an introduction to a case where the carrier diffusion layer distribution of the surface textured part and the back surface field (BSF) part of BSF-type crystalline silicon solar cells was evaluated using SCM. In the textured part, the pn junction is formed along the surface irregularities, while in the BSF part, it can be confirmed that the carrier distribution is interrupted and uneven.
Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.
On the surface of cell culture dishes, treatments are performed to convert hydrophobic plastic surfaces to hydrophilic ones in order to enhance cell adhesion. In this study, the surfaces of dishes that underwent hydrophilic treatment were evaluated using XPS and TOF-SIMS, revealing an increase in OH and CHO groups. By conducting quantitative evaluations with XPS and qualitative evaluations with TOF-SIMS, it is possible to capture how the surface has changed.
Evaluation of the activation rate of the Dopant is possible.
SRA (Spreading Resistance Analysis) is a method that involves polishing a sample at an angle, making contact with two probes on the polished surface, and measuring the spreading resistance (Figure 1). By evaluating the carrier concentration distribution, it is possible to gain insights into the activation status of dopants. As an example, we present a case of SRA conducted on the central and outer regions of a diode chip surface after package opening (Figure 2).
Cross-sectional mapping allows for the evaluation of the crystal growth of GaN.
Gallium nitride (GaN) is used as a material for LEDs and power devices due to its high thermal conductivity and high breakdown voltage characteristics. In the manufacturing process of these products, it is essential to produce high-quality GaN crystals without crystal defects that can affect device characteristics. This document presents a case study evaluating the crystal state of samples in which c-GaN crystals were grown at high speed on c-plane GaN substrates (c-GaN substrates).
Evaluation of microscopic atomic structures is possible through computational simulation.
β-Ga2O3 has a wide band gap and is expected to be a promising material for next-generation power devices and oxide semiconductors in terms of excellent power transmission efficiency and cost reduction. In recent years, it has been reported that β-Ga2O3 can be n-doped with Si or Sn. In this study, we conducted structural optimization calculations for models of β-Ga2O3 doped with Si or Sn and evaluated which sites each dopant is more likely to occupy in the crystal. Subsequently, we calculated the density of states from the obtained structural models and investigated the changes in electronic states due to doping.
Evaluation indicators regarding passive film properties can be obtained through standardized testing!
We offer the evaluation of stainless steel passive films in accordance with SEMI standards (C0612). Stainless steel exhibits excellent corrosion resistance due to the formation of a very thin, dense, and stable chromium oxide film (passive film) on its surface. The composition and film thickness of this passive film can be effectively evaluated using surface-sensitive techniques such as XPS and AES. [Measurement and Processing Methods] ■ [AES] Auger Electron Spectroscopy ■ [XPS] X-ray Photoelectron Spectroscopy ■ Others *For more details, please download the PDF or feel free to contact us.
Measure the conduction resistance of circuit patterns, solder joints, etc., quickly and accurately!
The "RTm-100 Series" is a multi-channel conductive communication reliability evaluation device manufactured by J-RAS Corporation. It measures contact resistance in circuit patterns, solder joints, and more with high speed and precision. With a scan processing time of 50 milliseconds per channel, it can keep up with high-speed cycle testing even for multi-channel measurements. It employs semiconductor relays for the four-terminal network switching in linked channel scans, significantly improving long-term reliability compared to mechanical relay systems. Additionally, the compact housing can be expanded to accommodate up to 240 channels, allowing for flexible installation and easy mobility. It can also connect thermocouples for temperature data display and recording (optional). 【Features】 ■ High precision and high-speed measurement ■ High-speed scanning at 50 msec/channel: follows high-speed heat shock chambers ■ High precision & low noise: reliable data output ■ Four-terminal measurement cables: twisted pair / color-coded by channel ■ High reliability: does not use mechanical relays *For more details, please refer to the PDF document or feel free to contact us.
High-speed detection circuits with a few tens of nsec installed in all channels! Tester capable of low-noise measurement.
The "HVUα Series" is a high-voltage insulation reliability evaluation device manufactured by J-RAS Corporation. It is equipped with high-speed detection circuits capable of operating in the tens of nanoseconds across all channels, enabling more advanced reliability testing. It can detect partial discharge with a high-speed event measurement function of less than 100 nanoseconds. Each channel has its own power supply and individual control, allowing for different applied voltage settings across all channels. There are no mechanical relay scans, so there are no failures or troubles during continuous testing. Active guarding with triaxial cables enables low-noise measurements. 【Features】 ■ Detects partial discharge with a high-speed event measurement function of less than 100 nanoseconds ■ Each channel has its own power supply and individual feedback for stable voltage application to each sample ■ Individual short-circuit detection circuits for each channel can respond to instantaneous sample short circuits ■ Dedicated software allows for graph display and data recording ■ The system can be configured in units of five channels according to demand *For more details, please refer to the PDF document or feel free to contact us.
The small processing characteristic evaluation machine has undergone a full model change and is now a tabletop type that can be installed on office desks and laboratory tables.
The Laboplast Mill Micro 4N100 is a tabletop mixing and extrusion evaluation device developed for the purpose of resin material screening and formulation assessment. While it is compatible with our Laboplast Mill S series, it is specialized for testing with smaller quantities, allowing for the evaluation of processing characteristics with sample amounts measured in grams. Additionally, by thoroughly reviewing the internal mechanisms from the conventional Laboplast Mill Micro, this new model achieves significant improvements in operability, torque detection accuracy, and safety. It enables accelerated development and high-precision evaluation in the field of material development, where small quantities and a variety of assessments are required.
Real-time observation of orientation changes during the stretching of polymer films! Quantitative evaluation is possible as an in-plane distribution.
We would like to introduce the combination of the stress loading testing machine 'ISL-T300' and the birefringence distribution evaluation device 'WPA-200'. The change in molecular orientation due to the stretching of polymer films can be optically evaluated by measuring birefringence. However, it has been difficult to evaluate birefringence while simultaneously applying tension, especially as surface distribution information. With the proposed combination of devices, it is possible to quantitatively evaluate the orientation changes as a surface distribution during the stretching process. 【Device Specifications】 <ISL-T300> ■ Maximum Load: 300N ■ Travel Distance: Up to 30mm ■ Testing Speed: 0.08 to 8mm/min ■ Chuck Spacing: 2 to 32mm ■ Sample Thickness: 1.5mm or less *For more details, please refer to the PDF document or feel free to contact us.
Easy to understand operations on a Windows computer.
It is ideal for evaluating the electrical characteristics of fuel cells, physical characteristics due to gas, and durability characteristics. Evaluation of the reformer is also possible. The supply humidifier unit is built-in (sold separately).