Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.
121～135 item / All 211 items
We will custom-build an automatic measurement system tailored to your needs.
It is a device for automatically measuring the electroluminescent characteristics (IVL characteristics) of organic EL devices.
Standard model with high evaluation in the field of material assessment.
This is a device aimed at the automatic measurement of the durability lifespan of organic EL elements.
The LED driving circuit can control 4 channels! We will design the LED substrate to match the TEG.
The "PAS-100" is a durability evaluation device for perovskite solar cells that employs a Peltier element-based temperature control mechanism for each device, allowing for individual temperature control. It measures and calculates Voc, Isc, IV curves, Jsc, Pmax, FF, Rs, and Rsh, and outputs graphs and CSV files. This device enables multi-channel characterization and durability evaluation of perovskite solar cells, accelerating material research and development. 【Features】 - Long-duration continuous evaluation equivalent to 1 SUN using an LED light source - Individual temperature control for each device and temperature step function - High expandability and space-saving design with a pull-out drawer *For more details, please download the PDF or feel free to contact us.
We aim to provide evaluation devices and technologies that meet customer needs in the vibrant advanced electronic device industry!
This catalog is our Product Catalog featuring our jig design technology, software, and more. We introduce the "EAS-10 Series Device-Specific Temperature Control Type," which allows for high-precision temperature control of each device individually, and the "EAS-62 Series Temperature Control-Free Cassette Type," known for its expandability and space-saving features. Additionally, we also cover organic EL lifespan evaluation equipment and EMC countermeasure technology. We invite you to read it. [Contents (partial)] ■ One-stop service ■ Main activity areas ■ Software ■ Jig design technology ■ High-precision measurement unaffected by environmental temperature *For more details, please download the PDF or feel free to contact us.
Numerous delivery achievements to major U.S. companies! High-speed inspection of display characteristics for mobile and smartphone LCD/OLED displays, starting from display evaluation.
- Brightness - Contrast - Chromaticity - Color gamut - Gamma - Crosstalk - Uniformity - Response speed - Flicker - Voltage and current measurement (optional) - Transmittance (optional) - Reflectance (optional)
Adopts an independent power supply with a maximum of 50 channels! Insulation reliability testing and evaluation testing equipment.
This is an evaluation testing device capable of performing insulation reliability tests at high voltages for up to 50 channels. ◆Features◆ ◇High voltage output up to 3000V Enables evaluation of high voltage devices. ◇Independent power supply Even if one sample shorts, other samples can continue testing. ◇Multi-channel, up to 50 units Allows evaluation of up to 50 samples in one housing, significantly improving the efficiency of device evaluation. ◇Special measurement cables resistant to harsh environments By using Teflon-coated cables, tests can be conducted by directly inserting the cables into a constant temperature and humidity chamber. *For more details, please inquire through a request for materials or download.
High-precision analog measurement circuits can detect minute changes from the early stages of the test cycle!
The "RTm-100 Series" is a device that measures the contact resistance of circuit patterns, solder joints, and more with high speed and high precision. The high-performance measurement circuit of this series accurately captures changes in contact resistance below a milliohm, and when combined with a heat shock chamber, allows for data measurement linked to temperature cycles. Furthermore, the high-speed scanning function using semiconductor relays can adequately follow tests with short cycle times, ensuring that the timing of measurements does not deviate for each cycle. 【Features】 ■ Achieves high-speed data measurement of up to 50 msec/CH ■ Improved measurement accuracy with the adoption of semiconductor relays ■ Noise reduction through dedicated measurement circuits and cables ■ AC/DC measurement with multi-current sources ■ Modular structure for easy maintenance * For more details, please refer to the PDF materials or feel free to contact us.
By analyzing the AE signals of each project, we can evaluate their failure behavior!
We would like to introduce "FRP Material Evaluation and Structural AE Diagnosis." By analyzing the AE signals (AE amplitude values and duration) of each process in material failure phenomena, we can evaluate the failure behavior. Please feel free to contact us if you need our services. *For more details, please refer to the related links page or feel free to contact us.
[Demo available] Evaluation of the composition ratio of compound semiconductor materials is also possible! Accurately measure the thickness of thin films, including epitaxial films, non-contact and non-destructively.
The "spectroscopic ellipsometer" is a thin film evaluation device that accurately measures the thickness, refractive index, and extinction coefficient of thin films, including epitaxial films, in a non-contact and non-destructive manner. It is also capable of evaluating the composition ratios of compound semiconductor materials. The main evaluation and measurement items are the "thickness of thin films," "epitaxial film thickness," "refractive index," "extinction coefficient," "composition ratio of compound semiconductors," and "dopant concentration." 【Main Evaluation and Measurement Items】 ■ Thickness of thin films ■ Epitaxial film thickness ■ Refractive index, extinction coefficient ■ Composition ratio of compound semiconductors ■ Dopant concentration Please feel free to contact us for information on the specifications and pricing of the device. *Demonstrations are also possible. If you wish to request a demonstration, please indicate "Request for Demo" using the contact button below.
8-inch wafer compatible type
This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, and the system allows for mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.
Organic OED production and evaluation device
Features - Small space, compact design - Up to 5 deposition cells can be installed - Wide selection of substrate sizes from 1 to 3 inches - Double shield structure to prevent contamination - Standard equipped with substrate heating heater control mechanism - Easy design for maintenance and cleaning
Observe the transition of current under pressure voltage with one click! The maximum power tracking function enhances the efficiency of next-generation solar cell development. Actively adopted in research fields [Demo units available].
The "PV Power Analyzer (VK-PA-300)" is a solar cell evaluation device that incorporates research and development functions for evaluating the current-voltage characteristics of solar power generation elements. It is compatible with modular solar power generation elements (10V/3A) and features a Maximum Power Point Tracking (MPPT) function, allowing observation of the process of reaching the maximum power point from different points (voltages) and directions. 【Features】 ■ Display of the transition of power/current/voltage/conversion efficiency after reaching the maximum power point ■ One-click measurement of "Open Circuit Voltage (Voc)" and "Short Circuit Current (Isc)" ■ Effective evaluation in a short time *Please contact us if you wish to request a demo loan. *For product details, please refer to the PDF.
Measuring interfacial shear strength and contact angle! Evaluation device for composite material interfacial properties using the micro droplet method.
The "MODEL HM410" is a composite interface property evaluation device that can measure the shear strength at the fiber-resin interface and contact angle using the microdroplet method. It adheres liquid resin to ultra-fine single transitions under any temperature environment, captures the shape, and calculates the contact angle from the image. At the same time, a pull-out test is conducted using the same sample, and the shear strength at the transition and resin interface is measured from the pull-out load at that time. 【Features】 ■ Evaluation device using the microdroplet method ■ Measurement of contact angle from images ■ Measurement of shear strength at the transition and resin interface from pull-out load *For more details, please refer to the PDF document or feel free to contact us.
We can perform good product characteristic measurements for performance verification, as well as defective characteristic measurements and reliability evaluations!
Our company can perform good product characteristic measurements, defective characteristic measurements, and reliability evaluations for specific TFTs in liquid crystal panels. In the "Electrical characteristic measurement of TFTs at various temperatures," we can disassemble the monitor in display mode and measure the electrical characteristics of the pixel TFTs within the panel. In the "DC bias stress test," we apply an arbitrary DC bias to the Gate and Drain and measure the Vth shift when stress is applied to the TFT, conducting reliability verification. 【Features】 - Electrical characteristic measurements can be performed on the pixel TFTs within the panel. - Measurements can be conducted before and after annealing, under light exposure, heating, or cooling conditions. - From the measurement results, indicators such as Ion, Ioff, Vth, and mobility can be calculated. - Verification of actual values in good product analysis and clarification of causes of defects can be performed. *For more details, please refer to the PDF document or feel free to contact us.
A must-see for researchers! The gap range of the evaluation cell has been expanded to 0.7 to 100 μm! [Over 10,000 types]
It is ideal for research tools for liquid crystal materials and other advanced materials. Thanks to our technological advancements, we have successfully expanded the gap range of evaluation cells! Until now, measurements could only be made in the range of 2 to 50 μm, but we are now able to measure 0.7 to 2 μm and 50 to 100 μm, which were considered difficult in the industry. Additionally, specifications of ±0.2 μm are now possible, allowing us to meet detailed needs. Our product classification encompasses over 10,000 types, and we can customize according to your needs. 【Contents】 - Explanation of display examples and display symbols - Orientation diagrams by type - Price list - Glass substrates ● For more details, please contact us or download the catalog.
