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121～150 件を表示 ／ 全 232 件
For maintenance, monitoring, and performance evaluation devices for solar cells, choose Shin-Ei Electronic Measuring Instruments!!
This is an introduction to the "Solar Power Test Selection" catalog from Shin-Ei Electronic Measuring Instruments Co., Ltd., which creates measurement technology and human interfaces.
Measure 1 second! High-speed measurement of open circuit voltage and internal resistance! Usable with 1,000V megasolar.
The "PVR-1000" is a resistance checker that can detect faulty strings through the measurement of open circuit voltage (Voc) and internal resistance (Ω). It can be used for inputs from 1,000V mega solar to small-scale generation. Easy checks can be performed at the connection box. 【Features】 ■ Usable for 1,000V mega solar ■ Can store data for up to 1,000 entries ■ Easy data management via USB ■ Simultaneous measurement achieved in just 1 second ■ Capable of measuring even in large-scale power plants in a short period *For more details, please refer to the PDF document or feel free to contact us.
Measurement time is just 1 second! Discover string generation failures with open circuit voltage Voc and internal resistance measurement.
The "PVR-1500/1000" is a PV resistance checker that can quickly measure open circuit voltage and internal resistance. It achieves simultaneous measurement in just 1 second, allowing for quick measurements even in large power plants. It helps identify faulty strings through the measurement of open circuit voltage (Voc) and internal resistance (Ω). It can be used for everything from mega solar systems with a maximum input of 1,500V to small-scale generation. Please feel free to contact us if you have any inquiries. 【Features】 ■ Usable for everything from mega solar systems with a maximum input of 1,500V to small-scale generation ■ Easy checks with connection boxes ■ Identifies faulty strings through the measurement of open circuit voltage (Voc) and internal resistance (Ω) ■ Achieves simultaneous measurement in just 1 second, allowing for quick measurements even in large power plants *For more details, please download the PDF or feel free to contact us.
Seeing is believing. Experience the measurement and diagnosis of solar power generation capabilities for free!
To better understand solar cells, to learn about measurement methods, to acquire know-how related to measurements, and to actually try using measuring instruments, we have established the "PV Technical Center," which also serves as a showroom on our headquarters premises. This center provides support services in the measurement field of solar power generation, addressing various questions and requests from customers. At the PV Technical Center, we hold PV seminars (free of charge). We will adjust the detailed schedule separately, so please specify your desired dates in the application URL for more details and registration.
This is an IV curve tracer compatible with perovskite solar cells!
The IVCT series is a measurement device that can be widely used from operational verification in the development and production processes of solar modules to shipping inspections. It achieves high-precision I-V curve measurements over a wide range using an asymmetric bipolar power supply. 【Features】 - I-V curve measurement across the entire range with an asymmetric bipolar power supply Equipped with an asymmetric bipolar power supply that allows for high-precision control, enabling stable acquisition of a wide range of I-V characteristics. - Delay function for stable measurements By measuring when the module characteristics are stable due to the delay time, reliable data can be obtained. - Four models to choose from according to application (IVCT-150/200/300/500) A lineup with rated outputs from 150V/4A to 500V/1.25A, flexibly accommodating applications from research to mass production. (*Rated outputs can be customized) - Detailed measurements possible with dedicated application Measurement results of the I-V curve are displayed in graph form (results from three quadrants). Acquired Voc, Isc, Pmax, Vpm, Ipm, FF, and temperature (optional) can be logged and output in CSV format.
It is a catalyst evaluation device that can be customized to meet customer needs.
This is an evaluation device suitable for catalyst development experiments in various fields and applications, such as reforming and desulfurization for fuel cells, combustion exhaust gas purification, and organic synthesis. We provide technologies and products tailored to customer needs, including the setting of various catalyst reaction conditions, such as test gas supply and vapor supply of liquid materials, as well as data processing. The analysis of gas components before and after the reaction is conducted using gas analyzers like gas chromatographs, allowing for simultaneous intermittent continuous analysis of multi-component gases.
It is possible to measure the optical and electrical characteristics of LEDs.
The LED comprehensive evaluation device "ISD-300" is a device that can measure the optical and electrical characteristics of LEDs using a spherical integrator and a multi-channel spectrometer. It can simultaneously light up LEDs with up to three elements, allowing for real-time display of total luminous flux, XY chromaticity, correlated color temperature, color rendering index, and more. Additionally, temperature control is performed using a Peltier element, enabling the acquisition of optical and electrical characteristic data with temperature as a parameter. For more details, please download the catalog.
Adoption of an integrating sphere and a calorimeter.
The lifespan evaluation device performs high-power long-term energization and is used to assess durability lifespan.
We will custom-build an automatic measurement system tailored to your needs.
It is a device for automatically measuring the electroluminescent characteristics (IVL characteristics) of organic EL devices.
Standard model with high evaluation in the field of material assessment.
This is a device aimed at the automatic measurement of the durability lifespan of organic EL elements.
The LED driving circuit can control 4 channels! We will design the LED substrate to match the TEG.
The "PAS-100" is a durability evaluation device for perovskite solar cells that employs a Peltier element-based temperature control mechanism for each device, allowing for individual temperature control. It measures and calculates Voc, Isc, IV curves, Jsc, Pmax, FF, Rs, and Rsh, and outputs graphs and CSV files. This device enables multi-channel characterization and durability evaluation of perovskite solar cells, accelerating material research and development. 【Features】 - Long-duration continuous evaluation equivalent to 1 SUN using an LED light source - Individual temperature control for each device and temperature step function - High expandability and space-saving design with a pull-out drawer *For more details, please download the PDF or feel free to contact us.
We aim to provide evaluation devices and technologies that meet customer needs in the vibrant advanced electronic device industry!
This catalog is our Product Catalog featuring our jig design technology, software, and more. We introduce the "EAS-10 Series Device-Specific Temperature Control Type," which allows for high-precision temperature control of each device individually, and the "EAS-62 Series Temperature Control-Free Cassette Type," known for its expandability and space-saving features. Additionally, we also cover organic EL lifespan evaluation equipment and EMC countermeasure technology. We invite you to read it. [Contents (partial)] ■ One-stop service ■ Main activity areas ■ Software ■ Jig design technology ■ High-precision measurement unaffected by environmental temperature *For more details, please download the PDF or feel free to contact us.
Numerous delivery achievements to major U.S. companies! High-speed inspection of display characteristics for mobile and smartphone LCD/OLED displays, starting from display evaluation.
- Brightness - Contrast - Chromaticity - Color gamut - Gamma - Crosstalk - Uniformity - Response speed - Flicker - Voltage and current measurement (optional) - Transmittance (optional) - Reflectance (optional)
Adopts an independent power supply with a maximum of 50 channels! Insulation reliability testing and evaluation testing equipment.
This is an evaluation testing device capable of performing insulation reliability tests at high voltages for up to 50 channels. ◆Features◆ ◇High voltage output up to 3000V Enables evaluation of high voltage devices. ◇Independent power supply Even if one sample shorts, other samples can continue testing. ◇Multi-channel, up to 50 units Allows evaluation of up to 50 samples in one housing, significantly improving the efficiency of device evaluation. ◇Special measurement cables resistant to harsh environments By using Teflon-coated cables, tests can be conducted by directly inserting the cables into a constant temperature and humidity chamber. *For more details, please inquire through a request for materials or download.
High-precision analog measurement circuits can detect minute changes from the early stages of the test cycle!
The "RTm-100 Series" is a device that measures the contact resistance of circuit patterns, solder joints, and more with high speed and high precision. The high-performance measurement circuit of this series accurately captures changes in contact resistance below a milliohm, and when combined with a heat shock chamber, allows for data measurement linked to temperature cycles. Furthermore, the high-speed scanning function using semiconductor relays can adequately follow tests with short cycle times, ensuring that the timing of measurements does not deviate for each cycle. 【Features】 ■ Achieves high-speed data measurement of up to 50 msec/CH ■ Improved measurement accuracy with the adoption of semiconductor relays ■ Noise reduction through dedicated measurement circuits and cables ■ AC/DC measurement with multi-current sources ■ Modular structure for easy maintenance * For more details, please refer to the PDF materials or feel free to contact us.
This is a PDF document on the recovery of rubber samples after compressive permanent deformation. Please download it for details.
The compressive permanent deformation of materials, as defined in ASTM D395i, is the permanent change in shape that remains when the previously applied compressive load is removed. Rubber is subjected to significant compressive stress in a wide range of applications, such as mounting to machinery, vibration dampers, valves, faucets, and bearings, in media such as air or liquids. The ability to retain elastic properties after prolonged compressive stress is crucial for the quality and functionality of the service. For example, a compression faucet relies on a rubber washer to seal the valve seat. The elasticity of the rubber sealing washer ensures the proper functioning of the faucet. Leaks occur when the rubber washer, seal, or gasket in the valve assembly wears out and loses elasticity. Therefore, it is important to evaluate the compressive permanent deformation of rubber after prolonged compressive stress.
This is a PDF document on the "Nano-level Wear Test of Polymer Coating and Glass." Please download it for more details.
Due to new advancements in technology, the size of components and their surface characteristics are continuously evolving towards greater delicacy across virtually all industries. This is particularly evident in the components of biomedical and microelectronics, as well as in understanding their surface interactions. For industries that require precision in delicate surface structures, it is extremely important to understand changes in material surfaces and to provide the intended surface interactions. The delicacy of component surfaces and their sizes has made traditional tribological (friction-related) research challenging, creating a need for new and appropriate wear/friction results, not only for research but also for quality control purposes. Therefore, there is an increasing necessity to accurately measure surface interactions due to wear/friction under smaller loads and in smaller applications.
This is a PDF document for "Verification and Validation of CAD Models and Processed Products." Please download it for details.
The demand for precision machining to create shaped components with complex geometries has dramatically increased across various industries. For example, in aerospace, medical, automotive, technology parts, as well as machinery and instruments, the constant demand for innovation and precision is driving the evolution of new technologies. As a result, the establishment of advanced quality inspection techniques to rigorously examine processed products and ensure they meet design specifications has become essential.
This is a PDF document of the actual measurement of micro-sized 'spherical particles.' Please download it for details.
The term "micro-sphere" (micro-spherical particle) is widely used in various fields such as materials science and pharmacology, referring to spherical particles made from various natural and synthetic materials with diameters in the micrometer range (1μm to 1000μm (1mm)). Micro-spheres are produced in solid and hollow forms and are developed using diverse materials such as plastics and glass. Hollow micro-spheres are often used as additives to reduce the density of materials. Solid micro-spheres have numerous applications depending on their constituent materials and sizes. Micro-spheres are a type of fine particle.
This is a PDF document on the various properties of polycarbonate lenses. Please download it for more details.
Polycarbonate lenses are widely used in many optical applications. Their advantages, such as high impact resistance, lightweight, and low cost during mass production, make them more practical than traditional glass for various uses. Among these applications, there are standards that require safety (e.g., safety glasses), complexity (e.g., Fresnel lenses), and durability (e.g., traffic signal lenses), which can be difficult to meet without using plastic. The ability to meet many requirements at a low cost while maintaining sufficient optical properties distinguishes plastic lenses in this field. However, polycarbonate lenses also have limitations. The main concern for consumers is their susceptibility to scratches. To compensate for this, additional processing is done to apply scratch-resistant coatings. Nanobear utilizes our three measurement devices (profilometer, tribometer, indenter) to verify the important characteristics of polycarbonate lenses.
By analyzing the AE signals of each project, we can evaluate their failure behavior!
We would like to introduce "FRP Material Evaluation and Structural AE Diagnosis." By analyzing the AE signals (AE amplitude values and duration) of each process in material failure phenomena, we can evaluate the failure behavior. Please feel free to contact us if you need our services. *For more details, please refer to the related links page or feel free to contact us.
[Demo available] Evaluation of the composition ratio of compound semiconductor materials is also possible! Accurately measure the thickness of thin films, including epitaxial films, non-contact and non-destructively.
The "spectroscopic ellipsometer" is a thin film evaluation device that accurately measures the thickness, refractive index, and extinction coefficient of thin films, including epitaxial films, in a non-contact and non-destructive manner. It is also capable of evaluating the composition ratios of compound semiconductor materials. The main evaluation and measurement items are the "thickness of thin films," "epitaxial film thickness," "refractive index," "extinction coefficient," "composition ratio of compound semiconductors," and "dopant concentration." 【Main Evaluation and Measurement Items】 ■ Thickness of thin films ■ Epitaxial film thickness ■ Refractive index, extinction coefficient ■ Composition ratio of compound semiconductors ■ Dopant concentration Please feel free to contact us for information on the specifications and pricing of the device. *Demonstrations are also possible. If you wish to request a demonstration, please indicate "Request for Demo" using the contact button below.
8-inch wafer compatible type
This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, and the system allows for mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.
Organic OED production and evaluation device
Features - Small space, compact design - Up to 5 deposition cells can be installed - Wide selection of substrate sizes from 1 to 3 inches - Double shield structure to prevent contamination - Standard equipped with substrate heating heater control mechanism - Easy design for maintenance and cleaning
Observe the transition of current under pressure voltage with one click! The maximum power tracking function enhances the efficiency of next-generation solar cell development. Actively adopted in research fields [Demo units available].
The "PV Power Analyzer (VK-PA-300)" is a solar cell evaluation device that incorporates research and development functions for evaluating the current-voltage characteristics of solar power generation elements. It is compatible with modular solar power generation elements (10V/3A) and features a Maximum Power Point Tracking (MPPT) function, allowing observation of the process of reaching the maximum power point from different points (voltages) and directions. 【Features】 ■ Display of the transition of power/current/voltage/conversion efficiency after reaching the maximum power point ■ One-click measurement of "Open Circuit Voltage (Voc)" and "Short Circuit Current (Isc)" ■ Effective evaluation in a short time *Please contact us if you wish to request a demo loan. *For product details, please refer to the PDF.
Measuring interfacial shear strength and contact angle! Evaluation device for composite material interfacial properties using the micro droplet method.
The "MODEL HM410" is a composite interface property evaluation device that can measure the shear strength at the fiber-resin interface and contact angle using the microdroplet method. It adheres liquid resin to ultra-fine single transitions under any temperature environment, captures the shape, and calculates the contact angle from the image. At the same time, a pull-out test is conducted using the same sample, and the shear strength at the transition and resin interface is measured from the pull-out load at that time. 【Features】 ■ Evaluation device using the microdroplet method ■ Measurement of contact angle from images ■ Measurement of shear strength at the transition and resin interface from pull-out load *For more details, please refer to the PDF document or feel free to contact us.
We can perform good product characteristic measurements for performance verification, as well as defective characteristic measurements and reliability evaluations!
Our company can perform good product characteristic measurements, defective characteristic measurements, and reliability evaluations for specific TFTs in liquid crystal panels. In the "Electrical characteristic measurement of TFTs at various temperatures," we can disassemble the monitor in display mode and measure the electrical characteristics of the pixel TFTs within the panel. In the "DC bias stress test," we apply an arbitrary DC bias to the Gate and Drain and measure the Vth shift when stress is applied to the TFT, conducting reliability verification. 【Features】 - Electrical characteristic measurements can be performed on the pixel TFTs within the panel. - Measurements can be conducted before and after annealing, under light exposure, heating, or cooling conditions. - From the measurement results, indicators such as Ion, Ioff, Vth, and mobility can be calculated. - Verification of actual values in good product analysis and clarification of causes of defects can be performed. *For more details, please refer to the PDF document or feel free to contact us.
A must-see for researchers! The gap range of the evaluation cell has been expanded to 0.7 to 100 μm! [Over 10,000 types]
It is ideal for research tools for liquid crystal materials and other advanced materials. Thanks to our technological advancements, we have successfully expanded the gap range of evaluation cells! Until now, measurements could only be made in the range of 2 to 50 μm, but we are now able to measure 0.7 to 2 μm and 50 to 100 μm, which were considered difficult in the industry. Additionally, specifications of ±0.2 μm are now possible, allowing us to meet detailed needs. Our product classification encompasses over 10,000 types, and we can customize according to your needs. 【Contents】 - Explanation of display examples and display symbols - Orientation diagrams by type - Price list - Glass substrates ● For more details, please contact us or download the catalog.
This is an evaluation device that allows organic EL display devices to emit light under constant temperature and humidity conditions, conducting accelerated tests on brightness and emitted screen images, with the capability of CSV output.
The ELS-100A is a device that efficiently conducts environmental testing and evaluation of organic EL devices. An OLED device's light-emitting unit is installed inside a constant temperature and humidity chamber, and automatic measurements are taken through the high-transparency glass on the top of the environmental control unit. The standard specification is 4 channels, and the fixture is compatible with both bottom-emission and top-emission OLED devices. With a proven constant current control system and a reliable luminance meter, it performs accelerated testing for temperature and humidity, as well as recording the light-emitting state, with CSV file output.
Measuring solid oxide fuel cells!
This is an announcement from Nishiyama Manufacturing Co., Ltd. regarding the "SOFC-type fuel cell evaluation device."
