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Inspection Equipment Product List and Ranking from 959 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Aug 19, 2026～Sep 15, 2026
This ranking is based on the number of page views on our site.

Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 19, 2026～Sep 15, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. 日本レーザー Tokyo//Electronic Components and Semiconductors
  3. タイムワールド Tokyo//others
  4. 4 ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所 Kyoto//Industrial Machinery
  5. 5 UHTテクノロジー Aichi//Other manufacturing
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Inspection Equipment Product ranking

Last Updated： Aggregation Period:Aug 19, 2026～Sep 15, 2026
This ranking is based on the number of page views on our site.

  1. Pellet and Powder Foreign Matter Inspection Device - High-Speed Evaluation of Particle Size, Color, and Shape 日本レーザー
  2. 気密検査装置（リークテスト装置） UHTテクノロジー
  3. Pressure-type seal inspection machine アイテックスズヨ
  4. 4 DORNIER RepRap Loom
  5. 5 Ultrasound scanning device エヌ・ケイ・システム

Inspection Equipment Product List

1801～1830 item / All 2914 items

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Electronic equipment business: "Assembly machines, transport machines, manual jigs"

Electronic equipment business: "Assembly machines, transport machines, manual jigs"

Introduction to Seiei Computer's electronic equipment business: "Assembly machines, transport machines, and manual jigs."

This is an introduction to the electronic equipment business of Seiei Computer, which develops and manufactures inspection and testing machines such as function test systems and labor-saving devices for mechatronics applications. We handle various products, including the "sandblasting trimming device" equipped with resistance value analysis processing functions, the maintenance-friendly "auto-loader for laser trimmers," and the "FPC automatic soldering device" that provides high-quality solder. 【Product Lineup】 ■ Sandblasting Trimming Device ■ Auto-Loader for Laser Trimmer ■ Ultra-Thin FPC Bonding Machine ■ FPC Automatic Soldering Device ■ PCB-ROM Writer Equipped *For more details, please feel free to contact us.

  • Assembly Machine
  • Other conveying machines
  • Strength Testing Equipment
  • Inspection Equipment

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Printing Inspection Machine "ProSilhouette"

Printing Inspection Machine "ProSilhouette"

A high-performance printing inspection device that can read unreadable prints! Leave printing accident measures to 'ProSilhouette'!

"ProSilhouette" is a high-performance printing inspection machine that can read unreadable prints. ~Did you know? The annual occurrence rate of printing accidents!~ In reality, nearly 200 printing accidents are confirmed each year. Once a recall occurs, it not only incurs enormous costs but also significantly impacts the trust that has been built over time. This product has been developed to prevent such printing accidents before they occur, and it is a next-generation printing inspection machine specialized for print inspection. 【Features】 ■ High-performance image processing that is less affected by halation ■ Multi-trigger function supporting up to 4 channels ■ Printing inspection machine that learns from daily inspections ■ Inspection can be performed at your desk using the network (optional) ■ Conveyor-integrated printing inspection machine (optional) ■ Dedicated discharge machine for printing inspection (optional) ■ Detection of double feeding in bagging machines (optional) *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Inspection Equipment

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Network

Network

New proposal for traceability! Total management through networking.

By managing the system we provide on your PC, you can grasp the situation on-site in real-time. Additionally, since inspection data is automatically managed, product traceability can be maintained at a high quality. In other words, it enables the "IOT" of inspection machines. Furthermore, by utilizing your own network or a dedicated network, you can manage the necessary data (including images) for "ProSilhouette" and "KoroScan" while sitting at your desk. *For more details, please feel free to contact us.

  • Other network tools
  • Server monitoring and network management tools
  • Inspection Equipment

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Qingye Computer Co., Ltd. "Company Profile"

Qingye Computer Co., Ltd. "Company Profile"

We provide products that can only be offered by Seiei Computer, built on the technology and experience accumulated since our founding!

Our company develops and manufactures inspection and testing equipment such as function test systems, as well as labor-saving devices applied in mechatronics. We have received significant support primarily from the automotive, home appliance, and food industries, thanks to our reliable technology in fields such as magnetic and IC cards, automotive electronic devices, printed circuit board assembly, electronic components, and semiconductors. 【Business Overview】 ■ Food Machinery FA Business - We handle items that support the improvement of traceability through inspection machines and management systems on production lines for food products, cosmetics, and pharmaceuticals. ■ Electronic Equipment Business - We deal with FA equipment that contributes to quality improvement and functional testing in the manufacturing processes of major parts and electronic components used in automobiles and home appliances. ~ At Seiei Computer Co., Ltd... ~ ◇ Strict adherence to delivery deadlines through data-based scheduling ◇ - We digitize the orders received using our unique management system and thoroughly schedule from the order date to the delivery date! ◇ Integrated Production System ◇ Based on the applied technologies in electronics and mechanics that we have cultivated over many years, we handle everything in-house from development and design to manufacturing, finishing (post-processing), and maintenance! *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Testing Equipment and Devices
  • Inspection Equipment

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Waterproof Sheet ICT Pressure and Vacuum Testing Device 'QCsmart'

Waterproof Sheet ICT Pressure and Vacuum Testing Device 'QCsmart'

Automatically acquire data and simplify report creation! You will be freed from manual recording tasks such as visual checks and handwriting.

"QCsmart" is a product that allows you to obtain and store pressure and vacuum test data using a smartphone. The testing equipment and work processes remain the same. Simply connect the pressure hose branch to the recording device and tap the start button on your smartphone. It improves the accuracy of measurement data and report creation, while reducing the time needed for report preparation, freeing you from manual recording tasks. 【Features】 ■ Simple usage method ■ Pass/fail judgment function ■ Reflects photo data taken during testing in reports ■ Automatically acquires data, simplifying report creation ■ Supports both pressure and vacuum tests *For more details, please refer to the PDF document or feel free to contact us.

  • Other operation management software
  • Other inspection equipment and devices
  • Inspection Equipment

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Development support product: Custom inspection machine

Development support product: Custom inspection machine

Design considering ease of use and reduction of inspection costs, corresponding to the quality of mass-produced products.

Product Development Support - Specific design and commercialization from basic design - Redesign and commercialization through function addition - Proposal of a custom inspection system considering product quality assurance - Mechanical design - Circuit design - Software design - Inspection and evaluation ♦ Distribution Air Supply Unit Control Board Inspection Machine ♦ Camera Control Unit Inspection Device ♦ Electrical Box Function Confirmation Device

  • Other inspection equipment and devices
  • Inspection Equipment

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Appearance inspection device

Appearance inspection device

AI Visual Inspection Device Suitable for Small-Batch Production of Multiple Varieties

No positioning required, AI visual inspection device that can be installed on existing lines 【Features】 1. Small amount of learning 2. Space-saving 3. Low cost 【Applications】 - Detection of scratches, dents, and unevenness - Recognition of engravings and characters - Determination of presence/absence of parts and assembly status 【Benefits of Introduction】 1. High versatility for efficiency With AI that learns from a small amount of data, re-learning during product changes is shortened, minimizing line downtime. Additionally, the portable design allows for flexible installation, maximizing operational efficiency on-site. 2. Labor reduction for cost savings AI operating 24/7 achieves labor reduction in inspection tasks, mitigating the risk of rising labor costs. It can be introduced at a low price, allowing for cost savings while keeping initial costs down. 3. Reduced defect rates enhance customer trust AI inspection thoroughly eliminates human error. By saving all inspection data, reliable traceability is achieved, strengthening brand power through quality assurance based on objective data. *Please feel free to contact us for more details.

  • Visual Inspection Equipment
  • Inspection Equipment

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Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

  • Semiconductor inspection/test equipment
  • Inspection Equipment

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Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

  • Semiconductor inspection/test equipment
  • Inspection Equipment

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Wafer appearance inspection equipment (automatic visual inspection equipment)

Wafer appearance inspection equipment (automatic visual inspection equipment)

Automating visual inspection of wafer defects.

■This is a device that responds to the following requests and concerns! - We want to automate visual inspection of defects on wafers (substrates). - We want to reduce and prevent variability in pass/fail judgments among inspectors. - We want to save inspection data and trace quality. - We want to automatically discriminate defects. ■Features of the device - It can automatically detect, extract, and discriminate visually identifiable defects. - We can propose an optical system optimized for the types of defects. - We can suggest both manual and automatic transport (cassette to cassette). - It also implements AI functions, allowing for improved defect discrimination accuracy through ongoing learning.

  • Semiconductor inspection/test equipment
  • Inspection Equipment

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Tohoku University Technology: Biomarkers of Pathology for Irritable Bowel Syndrome: T13-074

Tohoku University Technology: Biomarkers of Pathology for Irritable Bowel Syndrome: T13-074

A biomarker in urine that allows for non-invasive, simple, rapid, and accurate diagnosis.

Irritable Bowel Syndrome (IBS) is a stress-related gastrointestinal disorder triggered by strong tension, anxiety, and stress, and it is one of the diseases that has garnered attention in modern society, often referred to as a stress society. The symptoms of IBS include abdominal pain, abdominal discomfort, diarrhea or constipation, and bloating in the lower abdomen due to excessive gas. Detailed examinations often reveal no physical abnormalities, and diagnosis is typically made through neurological interviews, leading to variations in judgment among physicians. The present invention involves measuring urine samples from IBS patients and healthy individuals using LC/MS, and extracting significant peaks and ratios that meet the criteria of p < 0.05 through statistical analysis. As a result, a group of compounds was identified that showed values approximately 1.5 to 2 times higher in IBS patients compared to healthy individuals. These compounds are expected to be useful as biomarkers for IBS.

  • others
  • Inspection Equipment

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Tohoku Univ. Technology : Investigation method of breast disease : T11-183

Tohoku Univ. Technology : Investigation method of breast disease : T11-183

Cyclophilin A levels can be used to determine the likelihood of developing breast disease

　Mastitis in dairy cattle is considered to be one of the most intractable diseases in livestock, and it is known that it leads to a decrease in milk production and an increase in treatment costs, resulting in a large economic loss. In order to reduce the economic loss, early detection of mastitis is essential. However, the PL test, which is an existing mastitis detection method, does not lead to early detection because mastitis already showing degeneration is used as a sample. Therefore, a Chemical Luminescence measurement method is regarded as promising. However, a special apparatus is required to measure the Chemical Luminescence ability, and from the viewpoint of economy and difficulty, it is not suitable as a routine method for each dairy farmer. 　The present invention makes it possible to provide a method and a biomarker that contribute to the early detection of mastitis in a simple and rapid manner. The present invention is characterized by comprising a step of detecting cyclophilin A in milk collected from the udder of a subject and a step of determining the occurrence or possibility of occurrence of a mammary gland disease based on the amount of cyclophilin A. When the amount of cyclophilin A in milk is larger than that collected from a healthy udder, it is determined that a mammary gland disease has occurred or is likely to occur in the udder of the subject.

  • others
  • Inspection Equipment

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Power Module Inspection Device "NSAT Series"

Power Module Inspection Device "NSAT Series"

Wide bandgap measurement technology! Achieving high throughput inspection of up to 144 UPH.

We would like to introduce our IGBT/SiC power module testing equipment, the 'NSAT Series'. The "NATS-1000" is an automatic testing device for insulation/static characteristics/dynamic characteristics. It can be expanded for automatic lines and complies with IEC60747 measurements. The "NATS-1630/1730" is a manual testing device for dynamic characteristics, capable of interfacing with higher-level data management systems such as external PCs or the cloud. 【NATS-1000 Features】 ■ High-temperature testing up to 175℃ (up to 200℃) ■ High throughput of up to 144 UPH (25 seconds/unit) ■ Low LS of 4.5nH ■ Expandable for automatic lines ■ Complies with IEC60747 measurements ■ AOI/warp inspection/laser marking *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Inspection Equipment

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High-speed and high-precision inspection device for semiconductor packages 'GATS-7862'

High-speed and high-precision inspection device for semiconductor packages 'GATS-7862'

LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.

We would like to introduce our high-speed and high-precision inspection equipment for semiconductor packages, the 'GATS-7862'. The overall alignment accuracy is ±2.5μm, designed for inspection of half/quater panels. It supports large, multi-pin substrates such as chiplets. Please feel free to contact us if you have any inquiries. 【Features】 ■ High-precision inspection equipment for half/quater panels ■ Compatible with large, multi-pin substrates such as chiplets ■ Supports various automation requirements *For more details, please download the PDF or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Inspection Equipment

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Automatic Inspection Device for Printed Circuit Boards 'STAR REC V5III'

Automatic Inspection Device for Printed Circuit Boards 'STAR REC V5III'

Equipped with a dual-side alignment mechanism! Compatible with the inspection of miniaturized printed circuit boards.

The "STAR REC V5III" is a testing device for printed circuit boards that achieves compatibility with fixtures from the V3/V5 series and is equipped with advanced testing capabilities. It improves inspection accuracy and speed, accommodating the inspection of increasingly miniaturized printed circuit boards. Additionally, as an option, it can read 2D codes engraved on the boards, linking inspection results with 2D code information and outputting the data to an external PC in a specified format. Please feel free to contact us if you have any inquiries. 【Features】 ■ Provision of inspection solutions ■ 2D traceability support (optional) ■ Smart factory compatibility (optional) *For more details, please download the PDF or feel free to contact us.

  • Circuit Board Inspection Equipment
  • Inspection Equipment

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High-Speed OPEN/LEAK Tester "R-5940"

High-Speed OPEN/LEAK Tester "R-5940"

IC multi-function inspection support! Equipped with an LCR meter developed in-house.

The R-5940 is a super tester specialized for IC embedded substrates. It meets the diverse needs of high-precision IC testing with high-speed continuity and short-circuit measurements, μΩ accuracy, high-speed testing with four-terminal measurements, and all-CH LCR measurements. By connecting up to 16 SMUs as power supplies and electronic loads to the DUT, it enables the implementation of power ON/OFF sequences, allowing for DUT measurements with freely combined SMUs. 【Features】 ■ High-speed testing ■ High precision ■ Specialized for IC embedded *For more details, please download the PDF or feel free to contact us.

  • Tester
  • Inspection Equipment

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AC/DC MULTI TESTER "R-700 Series"

AC/DC MULTI TESTER "R-700 Series"

Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.

The "R-700 Series" is a compactly designed AC/DC MULTI TESTER that offers high speed and high precision. It can inspect various products such as thin-film RF filters, automotive DC modules, acceleration sensors, and MEMS devices. We offer a lineup including the "R-730 Standard," "R-780 High Insulation," and "R-770 AC Dynamic." 【Features】 ■ Ultra high insulation ■ High speed and high precision ■ Compact design ■ Maximum inspection points: 512 pins ■ High resolution for small capacitance measurement ■ 4W low resistance measurement: 0.1mΩ～ *For more details, please download the PDF or feel free to contact us.

  • Tester
  • Inspection Equipment

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3D Measurement Device "NSAT Series"

3D Measurement Device "NSAT Series"

Technology and reliability compatible with glass core! High-speed, high-precision 3D measurement device.

We would like to introduce our 3D measurement device compatible with glass substrates, the 'NSAT Series.' It supports a depth of 5μm and a line space of 2/2. It offers various measurement functions such as Trace, Anchor, Overlay, and Film. Please feel free to contact us if you have any inquiries. 【Features】 ■ Supports depth of 5μm and line space of 2/2 ■ Thickness measurement of SR and ABF using transmission measurement method ■ Technical capability and reliability compatible with glass cores *For more details, please download the PDF or feel free to contact us.

  • Circuit Board Inspection Equipment
  • Inspection Equipment

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IGBT/SiC Power Module Inspection Equipment "NATS Series"

IGBT/SiC Power Module Inspection Equipment "NATS Series"

Low LS 4.5nH! Introducing Nidec Advance Technology's inspection equipment.

We would like to introduce our IGBT/SiC power module testing equipment, the 'NATS Series'. We offer the automatic testing device "NATS-1000," which achieves low LS values and supports high-precision testing for insulation, static characteristics, and dynamic characteristics, as well as the manual testing device "NATS-1630/1730," which can be integrated with external PCs and upper data management systems such as the cloud. Please feel free to contact us when you need assistance. 【Features】 <NATS-1000> ■ Insulation testing (ISO) ■ Static characteristics testing (DC) ■ Dynamic characteristics testing (AC) ■ High-temperature testing up to 175°C (up to 200°C) ■ High throughput of up to 144 UPH (25 seconds/unit) *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Inspection Equipment

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TDAS Series <Performance Test/Durability Test>

TDAS Series <Performance Test/Durability Test>

Supports ultra-high speed of 36,000 rpm! Cameras and various sensors can also be connected, enabling time-axis synchronized logging.

The "TDAS-Series" is a device designed for performance and durability testing of onboard drive motors for EVs/HEVs, as well as E-Axles (integrated motor, inverter, and gear). With original measurement, control, and analysis software and GUI, it allows for simple operation to conduct various tests, including constant torque operation, constant speed operation, and tests tailored to driving patterns such as WLTC. Additionally, it enables real-time monitoring of images and data via a live camera, and remote monitoring through the TDAS monitoring system. 【Features】 ■ Capable of constructing 3-axis/4-axis test benches ■ Capable of constructing test benches for inverters ■ Measurement, control, and analysis possible with simple and easy operation ■ Compatible with TDAS remote monitoring system ■ Supports ultra-high speed of 36,000 rpm *For more details, please download the PDF or feel free to contact us.

  • Testing Equipment and Devices
  • Inspection Equipment

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Analysis support tool "Pulse EYE"

Analysis support tool "Pulse EYE"

Instantly analyze desired characteristic results from R&D to mass production testing! Analysis of test data from other companies is also possible.

"Pulse EYE" is a support tool for the analysis of Power semiconductor testing and waveforms. It features various modes such as "Waveform Analyze," which allows for graph display and manipulation of arbitrary signals, cursor display, selection of analysis position display, and locus graph display functionality, as well as "Dual File View," which enables easy comparison display by overlaying graphs from two files. Please feel free to contact us if you have any inquiries. 【Features】 ■Improved work efficiency/time reduction ■Displays all waveforms in 2-3 seconds with one click ■Analysis position information display ■Comparison of multiple file displays ■Waveform display with black and white inversion *For more details, please download the PDF or feel free to contact us.

  • Other network tools
  • Inspection Equipment

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半導体分野向け　画像検査装置　※カタログ進呈

半導体分野向け　画像検査装置　※カタログ進呈

ウェハバンプや反り、表面欠陥などの自動検査に対応。ガラス基板向け検査装置もラインアップ

当社は、半導体パッケージおよびプリント基板の微細化や高密度化、 大型化、構造の三次元化に対応する画像検査装置を提供しています。 ウェハバンプ自動検査システム『RWi-300MK3』は、 様々な構造のバンプの形状や反り、平坦度などを高精度に測定可能。 全数量産検査への対応により、プロセス統合や完全自動化に向けたAFVI複合装置としても活用できます。 他にも、AI技術の活用により、ウエハや基板上のパターンや表面欠陥を検査するモデル、 最大□600mmのTGVの寸法計測、欠陥検出に対応したモデルなどをラインアップ。 目視検査プロセスの負担を軽減し、実装品質と検査効率の向上に貢献します。 【製品ラインアップ】 ■ウェハバンプ自動検査システム『RWi-300MK3』 ■AI活用型外観検査システム『AURCA-S series』 ■ガラス基板向けTGV検査装置 ■基盤バンプ・反り検査装置『RSH-Series』 ※詳しくは＜カタログをダウンロード＞より資料をご覧ください。

  • Other appearance and image inspection equipment
  • Inspection Equipment

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Conductive Inspection Device "STAR REC V6"

Conductive Inspection Device "STAR REC V6"

Large-scale / Multi-pin Board Continuity Insulation Testing Equipment

Introducing the "STAR REC V6" series, a conductive insulation testing device for large/multi-pin boards currently under development. The "STAR REC V6" is equipped with our latest high-precision, high-speed tester, achieving a comprehensive alignment accuracy of ±10μm. It also meets the inspection needs of larger and multi-point boards! If you are having trouble with stacking or handling large boards, we can accommodate the supply and discharge to board storage trays, as well as transportation with AGVs. Please feel free to consult with us!

  • Defect Inspection Equipment
  • Circuit Board Inspection Equipment
  • Other inspection equipment and devices
  • Inspection Equipment

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High-speed and high-precision inspection device for semiconductor packages 'GATS-7785'

High-speed and high-precision inspection device for semiconductor packages 'GATS-7785'

Full panel size support! A high-capacity, high-speed, and high-precision inspection solution compatible with a maximum point count of 24Kch.

We would like to introduce our high-speed and high-precision inspection equipment for semiconductor packages, the 'GATS-7885'. This electrical inspection system achieves high-speed and high-precision probing for electrical testing of FOPLP/RDL using glass carriers. 【Features】 ■ Capable of inspecting full panel size (510×515 mm) ■ Supports up to 24K channels on the upper side ■ Overall alignment accuracy of ±3.5 μm ■ Capable of two types of RSD inspections ■ Compliant with SEMI standards *For more details, please download the PDF or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Inspection Equipment

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TGV Through Hole Glass Substrate Inspection Device

TGV Through Hole Glass Substrate Inspection Device

The optimal imaging inspection device for TGV inspection has been completed!

By using high-resolution 2D and 3D cameras, and combining them with NIR (near-infrared), we have achieved the detection of all types of defects. In addition to conventional high-precision surface inspection, it is now possible to measure internal defects and depth using NIR. Furthermore, the range of compatible materials has expanded beyond just glass to include SiC/silicon wafers, ABF films, and more. Please feel free to contact us.

  • Printed Circuit Board
  • Semiconductor inspection/test equipment
  • Visual Inspection Equipment
  • Inspection Equipment

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Semiconductor package multi-surface full panel substrate inspection device

Semiconductor package multi-surface full panel substrate inspection device

Support for a total of 48K points in both vertical and horizontal directions! A high-speed inspection solution for multi-panel arrangements of large full-panel PCBs (500×620mm).

We would like to introduce our semiconductor package multi-site full panel substrate inspection equipment, the 'GATS-8370'. It is optimal for next-generation semiconductor packages with larger unit sizes and more pins. This high-precision electrical inspection device supports bulk and high-speed inspection of full panel substrates. It achieves efficient step-and-repeat inspection with a single shuttle, balancing quality improvement and reduced takt time. 【Features】 ■ Comprehensive inspection with a large capacity of 48K points (49,152p) ■ Bulk inspection of large unit products (up to 300mm) ■ Compatible with large full panel sizes (500mm × 620mm) *For more details, please download the PDF or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Circuit Board Inspection Equipment
  • Inspection Equipment

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High-precision inspection equipment for large individual semiconductor packages.

High-precision inspection equipment for large individual semiconductor packages.

Overall positioning accuracy ±2.5µm! A high-precision inspection device ideal for inspecting large, multi-pin semiconductor package substrates.

"GATS-7837" is a high-precision inspection device that achieves extremely high contact accuracy in the inspection of semiconductor package substrates, which are increasing in size and pin count. 【Features】 ■ Overall positioning accuracy ±2.5μm ■ Loader/unloader support for tray insertion/removal *For more details, please download the PDF or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices
  • Circuit Board Inspection Equipment
  • Inspection Equipment

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Inline Visual Inspection Device 'NVS400LM2'

Inline Visual Inspection Device 'NVS400LM2'

Inspection without handling is possible! Standard model of inline Neoview!

Standard model of tabletop visual inspection device! The 'NVS400LM2' utilizes a unique double camera system to inspect delicate defects from above and at an angle, recording all inspection images as part of the "Neoview series." The device automatically displays the areas where defects are detected, allowing inspectors to simply make judgments based on what appears on the screen. No complicated operations are required. Equipped with a shooting condition setting function. For each defect item, you can pre-set whether to capture images with the top or angled camera, as well as the camera rotation angle and lighting brightness, minimizing camera adjustments and leading to reduced inspection time. Additionally, by utilizing accumulated inspection results, you can quickly identify opportunities for quality improvement. 【Features】 ■ Displays defect locations without omission, preventing oversight ■ Traceability assurance with image-based inspection data ■ Multi-control function (optional) to increase inspection efficiency with fewer inspectors *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Inspection Equipment

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Inline Visual Inspection Device 'NVS500LM2'

Inline Visual Inspection Device 'NVS500LM2'

Equipped with a 5-megapixel camera, it thoroughly inspects the solder surface! It displays defective areas without missing any!

Standard model of tabletop visual inspection device! The 'NVS500LM2' utilizes a unique double-camera system to inspect delicate defects from above and at an angle, recording all inspection images as part of the "Neoview series." The appearance inspection device automatically displays the areas where defects are detected, allowing inspectors to simply judge the areas shown on the screen. No complicated operations are required. Equipped with a shooting condition setting function. For each defect item, you can pre-set whether to capture images with the upper or angled camera, as well as the camera rotation angle and lighting brightness, minimizing camera operation and leading to reduced inspection time. Additionally, by utilizing the accumulated inspection results, you can quickly identify opportunities for quality improvement. 【Features】 ■ Displays defect locations without omission, preventing oversight ■ Traceability assurance with image-based inspection data ■ Multi-control function (optional) to improve inspection efficiency with fewer inspectors *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Inspection Equipment

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Desktop Visual Inspection Device 'NVS400DM'

Desktop Visual Inspection Device 'NVS400DM'

Standard model of tabletop visual inspection device!

The "NVS400DM" features a unique dual-camera system that allows for flexible inspection of even the most delicate defects from above and at an angle, and it records all inspection images as part of the "Neoview series." The exterior inspection device automatically displays the areas where defects are detected, so inspectors only need to make judgments based on what is shown on the screen. No complicated operations are required. It is equipped with a shooting condition setting function. For each defect item, you can pre-set whether to capture images with the top or angled camera, as well as the camera's rotation angle and lighting brightness, minimizing camera operation and leading to reduced inspection time. Additionally, by utilizing the accumulated inspection results, you can quickly identify opportunities for quality improvement. 【Features】 ■ Displays defective areas without omission, preventing oversight ■ Ensures traceability with image-based inspection data *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Inspection Equipment

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