Measuring Instrument(co) - メーカー・企業と製品の一覧

RLC Series Reflective Off-Center Measurement Device

Ensure sufficient resolution and enable measurement. Eccentricity can be automatically measured at up to 20 measurement points.

The "RLC Series" is a reflection eccentricity measurement device that uses a Laser Auto Collimator. It is a reflection eccentricity measurement designed to improve the eccentricity accuracy during lens unit assembly, ensuring sufficient resolution for the required accuracy and enabling measurements. We provide support to adjust it suitably to the customer's assembly conditions. Additionally, we offer a measurement device for the eccentricity of individual aspheric lenses, which consists of a high-precision rotating spindle and a light source and detection optical system for observing reflected light. 【Features】 ■ Measurement lens diameter: φ1 to 40mm ■ Automatic measurement of eccentricity at up to 20 measurement points ■ Monitoring of Z stage movement on the measurement software ■ Automatic measurement of actual values of eccentricity (X-axis, Y-axis) ■ Automatic adjustment of shutter speed to ensure the spot peak value reaches the target brightness value *For more details, please refer to the PDF document or feel free to contact us.

企業：オプトデバイスコーポレーション
価格：Other

Other measurement, recording and measuring instruments

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Laser Flash Method Thermal Property Measurement Device 'DLF'

Measurable over a wide temperature range! A thermal property measurement device with excellent accuracy and precision.

The "DLF" is a laser flash method thermal property measurement device that can measure thermal diffusivity over a wide temperature range, allowing for the measurement of specific heat capacity and thermal conductivity of materials with a broad range of thermal characteristics. All systems include a multi-sample testing function that significantly improves productivity and enhances specific heat capacity measurements. With a modular structure, they offer high flexibility, allowing for the addition of other environmental modules or light source modules to adapt to changing needs. We offer a tabletop model "DLF 1200" capable of measuring samples up to 1200°C, and a standalone model "DLF 1600" capable of measuring samples up to 1600°C. 【Features】 ■ Measurement over a wide temperature range ■ High accuracy and precision ■ Easy operation ■ Generates collimated monochromatic energy pulses with pulse widths of 300μs to 400μs

企業：TA Instruments Japan （TAInstruments）
価格：Other

Analytical Equipment and Devices

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

企業：日本セミラボ新横浜本社
価格：Other

Other measurement, recording and measuring instruments
Semiconductor inspection/test equipment

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[Demo unit available for loan] Digital line width measurement device

Demo units available for loan! A new tool for measuring conductor width and insulation spacing of printed circuit boards!

The "AccuLine II" is a digital line width measurement device that can measure the conductor width (top and bottom) and insulation spacing of printed circuit boards. It can automatically measure conductor widths (maximum 900μm, minimum 30μm) in a standalone mode. Manual measurement of TH diameter (maximum 700μm) is also possible. Additionally, the operability, alignment with measurement targets, and memory functions have been significantly improved. There are three types available: "Advanced Type," "Basic Type," and "Manual Type," allowing customers to choose according to their needs. 【Features】 ■ Standalone ■ Capable of automatic and manual measurement ■ Simultaneous measurement of bottom and top widths of conductors ■ Equipped with a 3.5-inch color LCD ■ Pass/fail judgment display possible based on settings *For more details, please refer to the PDF document or feel free to contact us.

企業：伊原電子工業工場
価格：100,000 yen-500,000 yen

Other measurement, recording and measuring instruments

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RI moisture density meter ANDES SRDM-2SV rental

A source rod with a radioactive isotope chip is inserted into the soil, and the moisture content and density of the soil are determined from the attenuation rate of the radiation.

***Features*** - Soil field density moisture meter with built-in microcomputer (RI instrument). - Can determine compaction status on-site. - Capable of measuring any soil type. - Measures quickly in just 1 minute. - Safe due to low-level radiation source, and easy to use. - Equipped with computational functions for data analysis. - Comes with a printer for saving measurement data.

企業：レックス
価格：Other

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Positron annihilation lifetime measurement / Doppler broadening measurement device

High-efficiency digital measurement. Lifespan spectrum and waveform file storage are possible!

Integration of measurement and power supply equipment necessary for positron annihilation method measurements that can analyze molecular-level nanoscale spatial structures. Settings and data reading for each module are performed via a network from a dedicated application installed on a computer. PALS captures and calculates high-speed pulse signals from two BaF2 scintillation detectors using a 3 Gsps module. CDB takes coincidences from two germanium semiconductor detectors and generates a two-dimensional histogram from each of their pulse height values. Furthermore, the combination of these devices also enables the measurement of the correlation between lifetime and momentum using AMOC.

企業：テクノエーピー
価格：5 million yen-10 million yen

Other measurement, recording and measuring instruments

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Measuring Instrument(co) - メーカー・企業と製品の一覧

Measuring Instrumentの製品一覧

RLC Series Reflective Off-Center Measurement Device

Laser Flash Method Thermal Property Measurement Device 'DLF'

Non-contact sheet resistance measurement device "LEI-1510 Series"

[Demo unit available for loan] Digital line width measurement device

RI moisture density meter ANDES SRDM-2SV rental

Positron annihilation lifetime measurement / Doppler broadening measurement device

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