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Measuring Instrument(co) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Dec 17, 2025～Jan 13, 2026
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Measuring Instrument Product List

286～300 item / All 475 items

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Laser Flash Method Thermal Property Measurement Device 'DLF'

Laser Flash Method Thermal Property Measurement Device 'DLF'

Measurable over a wide temperature range! A thermal property measurement device with excellent accuracy and precision.

The "DLF" is a laser flash method thermal property measurement device that can measure thermal diffusivity over a wide temperature range, allowing for the measurement of specific heat capacity and thermal conductivity of materials with a broad range of thermal characteristics. All systems include a multi-sample testing function that significantly improves productivity and enhances specific heat capacity measurements. With a modular structure, they offer high flexibility, allowing for the addition of other environmental modules or light source modules to adapt to changing needs. We offer a tabletop model "DLF 1200" capable of measuring samples up to 1200°C, and a standalone model "DLF 1600" capable of measuring samples up to 1600°C. 【Features】 ■ Measurement over a wide temperature range ■ High accuracy and precision ■ Easy operation ■ Generates collimated monochromatic energy pulses with pulse widths of 300μs to 400μs

  • 超高温セラミック.PNG
  • Analytical Equipment and Devices

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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[Demo unit available for loan] Digital line width measurement device

[Demo unit available for loan] Digital line width measurement device

Demo units available for loan! A new tool for measuring conductor width and insulation spacing of printed circuit boards!

The "AccuLine II" is a digital line width measurement device that can measure the conductor width (top and bottom) and insulation spacing of printed circuit boards. It can automatically measure conductor widths (maximum 900μm, minimum 30μm) in a standalone mode. Manual measurement of TH diameter (maximum 700μm) is also possible. Additionally, the operability, alignment with measurement targets, and memory functions have been significantly improved. There are three types available: "Advanced Type," "Basic Type," and "Manual Type," allowing customers to choose according to their needs. 【Features】 ■ Standalone ■ Capable of automatic and manual measurement ■ Simultaneous measurement of bottom and top widths of conductors ■ Equipped with a 3.5-inch color LCD ■ Pass/fail judgment display possible based on settings *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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RI moisture density meter ANDES SRDM-2SV rental

RI moisture density meter ANDES SRDM-2SV rental

A source rod with a radioactive isotope chip is inserted into the soil, and the moisture content and density of the soil are determined from the attenuation rate of the radiation.

***Features*** - Soil field density moisture meter with built-in microcomputer (RI instrument). - Can determine compaction status on-site. - Capable of measuring any soil type. - Measures quickly in just 1 minute. - Safe due to low-level radiation source, and easy to use. - Equipped with computational functions for data analysis. - Comes with a printer for saving measurement data.

  • others

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Positron annihilation lifetime measurement / Doppler broadening measurement device

Positron annihilation lifetime measurement / Doppler broadening measurement device

High-efficiency digital measurement. Lifespan spectrum and waveform file storage are possible!

Integration of measurement and power supply equipment necessary for positron annihilation method measurements that can analyze molecular-level nanoscale spatial structures. Settings and data reading for each module are performed via a network from a dedicated application installed on a computer. PALS captures and calculates high-speed pulse signals from two BaF2 scintillation detectors using a 3 Gsps module. CDB takes coincidences from two germanium semiconductor detectors and generates a two-dimensional histogram from each of their pulse height values. Furthermore, the combination of these devices also enables the measurement of the correlation between lifetime and momentum using AMOC.

  • Other measurement, recording and measuring instruments

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Phase difference, biological microscope [UT503-PH]

Phase difference, biological microscope [UT503-PH]

★High-performance phase contrast microscope. ★Plan achromatic objective lens ★Includes bright field, dark field, and polarized light observation, etc.

It is a phase contrast microscope. - High quality that withstands use for research and high-level amateurs. - Excellent optical and mechanical performance. - Options for bright field observation, dark field observation, and polarized observation are also available. - High cost performance. * The camera shown in the product photo (blue) is sold separately.

  • Company：誠報堂
  • Price：100,000 yen-500,000 yen
  • Other physicochemical equipment
  • Optical microscope

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Technical Data: Measurement and Correction of Rotating Body Imbalance

Technical Data: Measurement and Correction of Rotating Body Imbalance

Detailed information on static balance and points to note for dynamic balance correction.

This technical document introduces the measurement and correction of imbalance in rotating bodies. It explains the causes of imbalance, the three major causes of imbalance, and the definition of balancing accuracy, using diagrams and formulas over a total of 63 pages. 【Contents (partial)】 ■1. Introduction ■2. What is imbalance? ■3. Causes of imbalance ■4. Three major causes of imbalance ・4-1 Defects in design ・4-2 Defects in materials ・4-3 Defects during manufacturing or assembly *For more details, please refer to the PDF document or feel free to contact us.

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