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  3. Measurement and Analysis
  4. Analytical Instruments
  5. Analytical Equipment and Devices
  6. 4-probe surface electrical characteristic measurement device

4-probe surface electrical characteristic measurement device

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UMP-1000-4P

last updated:Mar 26, 2026

ユニソク
ユニソク
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This stage is optimal for nano/micro manipulation and probing under scanning electron microscope (SEM) observation.

The UMP-1000-4P is a manipulator/prober capable of operating on the nanometer level in the XYZ3 axes. It consists of four standard XYZ3-axis piezo stages, one sample stage, and one stage controller.

    Glassware and containersAnalytical Equipment and Devicesothers
4NanoProbeSEM.jpg

4-probe surface electrical characteristic measurement device

4NanoProbeSEM.jpg
4NanoProbeSEM.jpg
  • Related Link - https://www.unisoku.co.jp/products/nanoprobeProber…

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basic information

It is compact and lightweight, and can be attached to commercially available SEMs (SEM: Scanning Electron Microscope). It can be easily operated using a laptop. Each probe can be controlled independently as actuators in all three axes (X, Y, Z) with nanometer-level precision. It can be used in ultra-high vacuum conditions. 【Features】 - Each probe can control the XYZ axes as actuators. - Ideal for measuring electrical characteristics at arbitrary positions on semiconductor surfaces. - Compact and lightweight, can be attached to commercially available SEMs. - Operates in ultra-high vacuum and ultra-low temperature environments. - Added contact detection function (optional setting, using piezoresistive cantilevers). - User-friendly interface: easy operation of XYZ movements for each probe using a laptop. - We are flexible in accommodating custom requests, so please feel free to consult us regarding: - Changing the number of probes - Scanning probe microscopy measurements - Others.

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Applications/Examples of results

Various customizations are possible. Addition of SPM functions (scanning tunneling microscope, atomic force microscope, etc.) - Stress testing (bending, tensile tests) - Addition of sample stage movement mechanisms, sample heating, sample cooling - Change in the number of probes (addition, reduction) - It is also possible to custom manufacture a multi-probe ultra-high vacuum system. [Usage examples] - Measurement of electrical characteristics, nano-manipulation

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ユニソク

ユニソク

Testing, Analysis and Measurement

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Unisoku was established in 1974 with the aim of becoming a creator of unique measuring instruments. It is a manufacturer that primarily develops and sells its own ultra-high vacuum scanning probe microscopes (SPM) to universities, public institutions, and private companies and research institutes. Over the years, it has developed and commercialized advanced measuring instruments such as high-speed spectroscopic measurement devices and scanning tunneling microscopes, delivering them to universities and research institutions both domestically and internationally, and its technological content has received high praise from researchers in the field of basic research. In recent years, scanning probe microscopes have significantly improved in performance and multifunctionality, particularly as a means of observing sample surfaces at the atomic level. Their applications are expanding mainly from the field of physics to chemistry and bio-related fields, making them indispensable tools in nanotechnology and nanoscience.

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