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Measuring Instrument(ol) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
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Measuring Instrument Product List

61～75 item / All 108 items

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Wide-field 3D Measurement Device 'VYA-1'

Wide-field 3D Measurement Device 'VYA-1'

Achieve wide-field and high-resolution measurements with the combined function of segmented measurement!

Our company offers the wide-field 3D measurement device 'VYA-1', which utilizes multiple sensors and a split measurement integration function to achieve wide-field high-resolution 3D measurements. Additionally, it can import CAD data for matching and identification. It is also suitable for coplanarity inspection of various precision parts. 【Usage Examples】 ■ Measurement of products such as semiconductors and precision jigs ■ Shape measurement of flat substrates like OLEDs ■ Inspection of solder paste application ■ Shape inspection of various printing plates ■ Shape inspection of thin molds ■ Inspection of large PCB substrates *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices

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FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]

FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]

FPD Sheet Resistance Meter [NC-50/RG-1200S]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Automotive interior material permeability measurement device

Automotive interior material permeability measurement device

Automotive interior material permeability measurement device

Automotive interior material porosity measuring device, measuring automotive interior material porosity, permeability automotive interior materials, automobile interior material, air permeability measurement system Automotive interior material porosity measuring device is a car seat material PVE, form, leather, textiles, etc. Automotive interior material porosity measuring device is JIS P8117, ISO 9237, ISO 4638, ISO 5636 and other standards.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices

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Organic gas permeability measurement device

Organic gas permeability measurement device

Organic gas permeability measurement device

Organic vapor transmission rate measurement system, measurements of organic vapor transmission, gas transmission rate of organic transmission rate measurement system Organic vapor transmission rate measurement system films, foils, complex films, bottles and other materials like Purasuchikkufimuru sheet, bags, make quantitative measurements of organic vapor transmission rate of the finished product packing box containers.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices

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Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Non-contact optical surface roughness measuring instrument nanoCam

Non-contact optical surface roughness measuring instrument nanoCam

A vibration-resistant 3D roughness measuring instrument that is not affected by the size of the measurement object or the environment/location!

It is a roughness measurement device with a resolution of 0.1 angstroms and a repeatability of 1/1000 angstroms. It is fully compatible with Mountain Map, the most commonly used software in the industry, and measurements can be taken using the dedicated software 4Sight, which allows direct reading and writing of data formats such as MetroPro, CodeV, and Zemax, making it easy to integrate into your current measurement system.

  • 3D measuring device
  • Optical microscope
  • Visual Inspection Equipment

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Digital Capacity Meter / AE-365E

Digital Capacity Meter / AE-365E

Ultra-high speed, high precision, 120Hz/1kHz digital capacitance checker

Optimal for taping machines for chips, melph, radial, and axial capacitors.

  • Other electronic measuring instruments
  • LCR Meter

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PET Bottle & Preform Combined Mouth Dimension Measuring Device MTY-7000

PET Bottle & Preform Combined Mouth Dimension Measuring Device MTY-7000

Measurement time within 4 seconds! A semi-automatic measuring device that is easy to operate and allows for simple measurements.

The "MTY-7000" is a measuring device that measures the mouth dimensions compatible with both PET bottles and PET preforms. It measures the inner diameter (2 points), outer diameter, thread diameter, bead height, and neck support height of PCO1716, 1810, and 1881 type PETROL bottles using a linear gauge and a special measuring head. The set condition of the work (PET bottle & preform) can be confirmed with a small CCD camera. 【Features】 ■ Measurement time within 4 seconds ■ Measurement accuracy within 5μm ■ Repeatability within 4μm ■ Dedicated for mouth (inner diameter and outer diameter) *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments

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NDC Non-contact Near Infrared Thickness Gauge and Moisture Meter

NDC Non-contact Near Infrared Thickness Gauge and Moisture Meter

Contributes to the standardization of product quality and reduction of paint with WET measurement and DRY measurement support.

NDC Technologies' online near-infrared multi-component analyzer "Series 9" is a high-precision measuring instrument that enables non-contact measurement of moisture, oil/fat content, and protein simultaneously. It caters to diverse needs and measurement objects, such as the moisture content of coffee beans, the components of milk powder, and the moisture and oil content of potato chips. By thoroughly implementing quality control using the Series 9, it contributes to the stable production of high-quality products that meet manufacturing standards. With IP67 compliance for peace of mind in food factories, simultaneous measurement of moisture, oil/fat content, and protein: - Measurement contents: Simultaneous measurement of moisture, oil/fat content, protein, etc. - Safe for food manufacturing processes with SUS316L and IP67 compliance. - Immediate confirmation of measurement results enhances operational efficiency and increases production. - High-precision measurement of moisture and components improves product quality and reduces waste. - Long-term stability with very infrequent calibration frequency.

  • Coating thickness gauge

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Mercury Probe CV/IV Measurement Device "MCV Series"

Mercury Probe CV/IV Measurement Device "MCV Series"

No need for electrode formation with mercury probes! Provides reduced development time and lower costs in R&D.

The "MCV-530/530L/2200/2500" is a device that enables the evaluation of electrical characteristics of semiconductor silicon wafers and the characteristics of MOS device oxide films, among others. Traditionally, gate electrodes such as Poly-Si or Al were deposited on the wafer, and after forming MOS structures or Schottky structures, CV/IV characteristic evaluations were conducted. This product has its own gate electrode, allowing for the acquisition of electrical characteristics of oxide films and wafers without the need to create a metal gate. It provides quick feedback through process monitoring, reduces development time in R&D, and lowers costs. 【Features】 ■ No need for electrode formation due to the mercury probe ■ Excellent reproducibility ・Schottky: 0.3% (1σ) / MOS: 0.1% (1σ) ■ Mapping of the wafer surface is possible ■ Safe and easy mercury exchange enabled by a newly developed mercury exchange mechanism *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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