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Measuring Instrument(ol) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
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Measuring Instrument Product List

46～60 item / All 108 items

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Stitching Interference (SSI) Measurement Device

Stitching Interference (SSI) Measurement Device

A stitching interferometer for measuring aspheres with high precision and speed without using null optical systems.

Using a sub-aperture, the surface of the test object is measured under optimal conditions for each part, and the measurement results of each part are combined to calculate the overall surface shape of the test object. Compared to conventional Fizeau interferometers, it becomes possible to measure a wider range of shapes with higher precision. [Product Lineup] 1. ASI(Q) - Can measure flat, spherical, and aspherical shapes up to 300mm in diameter. (Support for larger diameters is also possible) - Can measure a 90° slope (a completely hemispherical surface). - Capable of measuring aspheres with 1000λ. - Achieves high measurement accuracy and high lateral resolution. 2. QIS Interferometer - High slope measurement capability, providing fast and high precision results. - Can measure small radius test surfaces with a wide focus range. - Dramatically improves spot measurement capability in MRF.

  • Optical Measuring Instruments

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Digital Capacity Meter / AE-381A

Digital Capacity Meter / AE-381A

Achieving MLCC measurement from small capacitance to large capacitance (measurement frequencies of 1 MHz / 1 kHz / 120 Hz)

High-speed measurement of MLCCs from small to large capacitance is achieved. (Measuring frequencies: 1MHz / 1kHz / 120Hz) It is optimal as a measuring instrument for the taping process. 【Features】 ■ Ultra-fast: 0.5msec [1MHz], 1msec [1kHz], 8.34msec [120Hz] (FAST measurement time) ■ Abnormal detection of measurement values allows for detection of probe contact failure even during two-terminal measurements ■ Four-terminal contact check possible ■ Measuring frequencies: 1MHz / 1kHz / 120Hz ±0.1% (sine wave) ■ Switchable between series equivalent circuit and parallel equivalent circuit ■ Constant voltage measurement (some ranges are not supported) ■ tanδ: 0 to 50.00%, Q measurement possible ■ Capacitance measurement: 41/2 digits (15000) digital display, built-in comparator function for HI/GO/LO output ■ RS-232C interface, printer output (Centronics compliant standard equipment) (GP-IB is optional) ■ Intermittent application of measurement current to reduce wear on probe contacts ■ During measurement, output measurement values, statistical values, date, time, etc. to the printer *For more details, please contact us or download the catalog.

  • LCR Meter
  • Other electronic measuring instruments

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Digital Capacity Meter / AE-363D

Digital Capacity Meter / AE-363D

Ultra-high-speed, high-precision 1kHz digital capacitance checker

Optimal for taping machines for chips, melph, radial, and axial capacitors.

  • Other electronic measuring instruments
  • LCR Meter

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Water vapor permeability measurement device

Water vapor permeability measurement device

Water vapor permeability measurement device

Water vapor transmission rate measuring equipment, plastic film to measure the water vapor transmission rate of various materials in the medical field and health barrier and laminated packaging materials. The water vapor transmission rate measuring device complies with standards such as JIS Z0208, JIS K7129, ASTM E96, ASTM D1653, ASTM F1249, ASTM E398, ASTM F372, ISO 2528, ISO 15106-1, ISO 15106-2, and ISO 15106-3.

  • Other inspection equipment and devices
  • Analytical Equipment and Devices

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Discussion on Inspection and Measurement: Roundness and Roundness Measuring Instruments

Discussion on Inspection and Measurement: Roundness and Roundness Measuring Instruments

Introduction to inspection and measurement, including 2-point and 3-point measurements for elliptical shapes and rice ball shapes (triangular)!

Roundness is one of the geometric tolerances applied to a single shape, referring to "the magnitude of deviation from the geometric circle of the circular part." Methods for measuring roundness include roundness measuring machines (such as Roncom), reading methods using center support, and three-dimensional measuring machines. A practical measurement method involves measuring the diameter with a dial gauge, and the Kensatools roundness measuring device falls into this category. [Contents] ■ About Roundness 1) Definition and illustrated examples 2) Tolerance zone (allowable range) 3) Measurement methods ■ Two-point and three-point measurements for elliptical shapes and onigiri shapes (triangular) *For detailed content of the article, please refer to the related links. For more information, feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

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Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Popular-type phosphorescence lifetime measurement device LSP-1000

Popular-type phosphorescence lifetime measurement device LSP-1000

Simple measurement of lifetimes of prompt and delayed fluorescence in the range of 10 ns to μs to ms to s.

- Real-time measurement using high-speed optical detectors and oscilloscopes - Compact design using a small pulse laser - Capable of near-infrared emission - Spectrometer option

  • Spectroscopic Analysis Equipment

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Radiation and radioactivity measuring instrument 'APV85G4'

Radiation and radioactivity measuring instrument 'APV85G4'

High time resolution! High throughput!

The "APV85G4" is a time analysis spectrum meter that employs high-speed 5GHz ADC for each channel. It integrates the functions of multiple radiation measurement modules that were previously necessary for time analysis, such as Differenia CFD, Dday, TAC, and MCA. The analysis modes include pulse height, time difference, waveform, and (optional) pulse shape. We invite you to try our products at least once. 【Features】 ■ Integration of radiation measurement module functions ■ High temporal resolution ■ High throughput *For more details, please refer to the catalog or feel free to contact us.

  • Radiation detector

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