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Probe - メーカー・企業152社の業務用製品ランキング | イプロスものづくり

更新日： 集計期間:Apr 08, 2026～May 05, 2026
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Probeのメーカー・企業ランキング

更新日： 集計期間:Apr 08, 2026～May 05, 2026
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  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. Sankotsusho Tokyo//Industrial Electrical Equipment
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 日本オートマティック・コントロール 電子システム部 Tokyo//Industrial Electrical Equipment
企業ランキングへ

Probeの製品ランキング

更新日： 集計期間:Apr 08, 2026～May 05, 2026
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  1. Connection terminal TA series サンケイエンジニアリング 本社
  2. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  3. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社

Probeの製品一覧

241～270 件を表示 ／ 全 722 件

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Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle Probe [For Printed Circuit Boards and Semiconductor Package Continuity Testing Tool!]

Needle probes suitable for continuity testing fixtures for substrates (printed circuit boards and semiconductor packages)! Precision machining with a focus on quality!

The "NP (Needle Probe)" is a probe used for continuity testing fixtures of substrates (printed circuit boards and semiconductor packages). We offer a wide variety of tip shapes backed by reliable processing technology. Additionally, we have applied a plating treatment that is resistant to peeling. 【Features】 ■ Meticulous fine processing ■ Sharp edges ■ Step coating that pursues uniqueness (optional) *For more details, please request our materials or view the PDF data available for download.

  • probe
  • Probe

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NMR probe for narrow gaps 'EFM-150P/EFS-150F'

NMR probe for narrow gaps 'EFM-150P/EFS-150F'

A product that allows for the absolute measurement of magnetic field strength using proton solid samples!

The "EFM-150P/EFS-150F" is an ultra-thin NMR probe designed for narrow gaps, achieving a thickness of 1.5mm using a newly developed ultra-flat sensor coil. It enables NMR measurements in gaps that were previously difficult to insert into. By inserting it into a small gap, measurements can be taken in areas with good magnetic field uniformity, significantly improving measurement accuracy and stability. Additionally, it can be combined with general-purpose magnetic field measuring instruments (Tesla meters and Gauss meters) such as the EFM-2000AX and EFM-3000AX, as well as the EFS-800 NMR sensor. 【Features】 ■ Newly developed ultra-flat sensor coil ■ Can be inserted into narrow magnetic pole gaps ■ Can be inserted into areas with good magnetic field uniformity ■ Measures absolute magnetic field using proton samples ■ Compatible with various NMR magnetic field measuring instruments (Tesla meters and Gauss meters) *For more details, please download the PDF or feel free to contact us.

  • 超薄型狭隙間用NMRプローブ『EFM-150PEFS-150F』2.JPG
  • probe
  • Probe

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Optional probe for magnetic field measuring device

Optional probe for magnetic field measuring device

With a thickness of 6mm at the tip, it is suitable for cases where the gap for inserting the probe is narrow!

This product is an optional probe for magnetic field measurement devices (teslameters and gaussmeters) consisting of a transmission amplifier, a sample coil, and a modulation coil. The modulation coil is arranged to generate a modulation magnetic field parallel to the measured magnetic field. The sample coil is fixed in a direction that generates a high-frequency magnetic field orthogonal to this. The modulation coil comes in standard and axial types depending on the orientation, while the sample coil is available in a single-coil type and a multi-coil type arranged in proximity with 2 to 4 coils. 【Lineup (excerpt)】 ■ Standard probe EFM-1P ■ Thin probe EFM-2P ■ Low magnetic field probe EFM-20P ■ High magnetic field probe EFM-30P ■ Axial measurement probe EFM-10P *For more details, please download the PDF or feel free to contact us.

  • 磁場測定器用オプションプローブ2.JPG
  • 磁場測定器用オプションプローブ3.JPG
  • 磁場測定器用オプションプローブ4.JPG
  • 磁場測定器用オプションプローブ5.JPG
  • 磁場測定器用オプションプローブ6.JPG
  • 磁場測定器用オプションプローブ7.JPG
  • probe
  • Probe

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Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe
  • Probe

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Vane-type wind speed smart probe 'testo410i' [Rental]

Vane-type wind speed smart probe 'testo410i' [Rental]

Wireless probe capable of measuring and recording wind speed and temperature via Bluetooth communication.

Equipped with convenient calculation modes for various applications such as duct air volume measurement, it allows for easy input of duct information. 【Features】 ■ Displays measurement values on Android/iOS devices (smartphones and tablets) ■ Connects up to 6 probes with a single device for simultaneous measurements ■ Capable of graphing measurement data, saving (Android only), and sending via email ■ Easy setting of duct information in air volume calculation mode ■ Dedicated app available for download from Google Play and the App Store (free)

  • Wind Speed/Volume Meter
  • Probe

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Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]

Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]

This is an electromagnetic probe for SWT-8000-2, 9000, and 8200-2.

Measurement range: 0 to 20mm

  • Coating thickness gauge
  • Probe

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Contract assembly and processing of semiconductors: LED chip probe

Contract assembly and processing of semiconductors: LED chip probe

We measure electrical characteristics, brightness, wavelength, and ESD. Inspections are conducted in wafer and sheet states, accommodating various specifications such as top surfaces and upper and lower electrodes!

Measurement of electrical characteristics, brightness, wavelength, and ESD. Depending on the supply form, inspections can be conducted in wafer or sheet state, accommodating various specifications such as top surface and upper and lower electrodes. Additionally, if probe testing is required from mass production to small quantities of prototypes, please feel free to consult us. 【Overview】 ■ Top surface and upper/lower electrodes: 2 to 4 inches ■ Back surface: 2 to 4 inches ■ Integrating sphere: 2 to 4 inches *For more details, please refer to the PDF document or feel free to contact us.

  • Chip type LED
  • Probe

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Oscilloscope Probe OP-022 sets

Oscilloscope Probe OP-022 sets

It is a 10:1 passive voltage probe with a bandwidth of 100MHz.

It is a 10:1 passive voltage probe for 100MHz.

  • others
  • Probe

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

  • probe
  • Probe

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Special Probe "Sure Turn Probe"

Special Probe "Sure Turn Probe"

Solve issues such as variations in resistance values!

This is an original probe that utilizes innovative technology. Conventional general straight probes have a simple internal structure, which often leads to significant variations in resistance values during circuit measurements on printed circuit boards, and sometimes even causes momentary disconnections. It is said to be one of the causes of frequent troubles during tens of thousands or hundreds of thousands of tests. The SureTurn probe is a product developed to address this issue. *For more details, please download the PDF or contact us.

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  • Probe

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Special Probe "Zebra Type Probe"

Special Probe "Zebra Type Probe"

Revolutionary simple probe! Enables high-capacity device measurements at 20GHz!

This is an original probe that utilizes innovative technology. With the increase in signal capacity of electronic devices, it has become difficult to measure using conventional methods. By challenging this limitation and conducting extensive research, we have succeeded in bringing this product to market. Previously, when inspection jigs deteriorated or broke, they had to be disassembled and repaired. However, the zebra-type probe allows for easy extraction and replacement of the probe without disassembling fixtures, and it is a groundbreaking simple probe that enables 20GHz measurements for high-capacity signal devices. *For more details, please download the PDF or contact us.*

  • probe
  • Probe

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

  • probe
  • Probe

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

  • probe
  • Probe

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

  • probe
  • Probe

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Sensitive Probe (Series 16-300) *CAD data available

Sensitive Probe (Series 16-300) *CAD data available

A unique structure of a sensitive probe that supports high-precision measurement!

High-precision measurement compatible! A rich lineup of sensitive probes! This catalog features the unique structure of the "Sensitive Probe Series" designed for high-precision measurements. The coil spring is made of piano wire with gold plating, providing stable load and excellent durability, and is designed to apply moderate force to the tip of the plunger, ensuring the necessary contact force between the barrel inner wall and the plunger. Additionally, the resistance stabilizer (metal ball) is made of steel with gold plating, which, when pressure is applied to the plunger, adheres to the barrel inner wall, allowing current to flow through the barrel instead of the coil spring, resulting in stable contact resistance. [Contents] ■ Series 16 ■ Series 20 ■ Series 30 ■ Series 48 ■ Series 48A, etc. *For more details, please download the PDF or feel free to contact us.

  • Contract manufacturing
  • probe
  • Probe

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

  • probe
  • Probe

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Comparison of contact resistance values of sensitive probes with other companies.

Comparison of contact resistance values of sensitive probes with other companies.

We are introducing a comparison of contact resistance values between our products and overseas products from other companies.

Introduction to the comparison test of contact resistance values between Inks' IP130B-2C probe and probes from other manufacturers. The test conditions used the JCM GP035-50R contact resistance measurement device for both the IP probe and the other (overseas) probes, with an applied current of 5A and an application time of 0.1 seconds. The insertion depth was 5.2mm for the IP probe and 4.3mm for the other (overseas) probes. As a result, the IP probe exhibited a more stable contact resistance value within a narrower range. The average value was also lower, indicating very good performance. [Test Results (Partial)] ■ Contact Resistance Values (mΩ) *Measured 3000 times 　・IP Probe (Sample 1) 　　　Max: 11.6 　　　Min: 8.6 　　　Ave: 9.4 　・Other Manufacturer's Probe (Sample 1) 　　　Max: 200.4 　　　Min: 15.7 　　　Ave: 92.7 *For more details, please refer to the external link page or feel free to contact us.

  • probe
  • Probe

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Layered probe with stable contact resistance value.

Layered probe with stable contact resistance value.

A probe capable of achieving a stable contact resistance value according to the shape of the target object.

The "laminated probe" has been developed with innovative technology and possesses excellent features. Unlike conventional spring probes, which consist of multiple parts, it achieves a structurally stable contact resistance value through contact with a single metal plate. Even when the inspected object is not smooth, the spring properties of each probe allow it to conform to the shape of the object, enabling a stable contact resistance value. 【Features】 ■ Wiping action occurs due to the structure ■ Contact position is displaced ■ Contact can be made while removing oxide films and foreign substances from the object ■ Stable contact can be achieved *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Probe

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Probe

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Stable contact with BGA.

Stable contact with BGA.

Introducing examples of layered probes. Coating applied to the probe tip achieves extended lifespan.

We would like to introduce stable contact for BGA "laminated probes" handled by our company. For spherical BGA (solder), contact using needle-type probes, including spring probes, has resulted in slippage, making stable contact difficult. By using laminated probes for Kelvin contact, we achieve stable contact. Additionally, since BGA primarily consists of tin, applying a coating to the probe tip that suppresses tin transfer can also extend its lifespan. 【Features of Laminated Probes】 ■ Stable contact resistance values ■ Effective for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Probe

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Q&A on Layered Probes

Q&A on Layered Probes

We will answer five representative questions about layered probes.

In this document, we will introduce questions regarding the "stacked probe" of the probe business handled by Inks Corporation. Q: Is non-magnetic compatibility possible? A: Yes, it is possible. The probe is made of non-magnetic beryllium copper, and the holder that holds the probe can also be made of non-magnetic materials such as aluminum or resin. Additionally, we have experience with contacts to magnetic sensor packages. We have answered five questions, including the following: - Is non-magnetic compatibility possible? - Can it be used in the previous process (wafer inspection)? - I would like to install it on the machine I am currently using; is that possible? - How should maintenance be performed? - What would the estimated schedule be until delivery? *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Probe

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Layered Probe: Response to High Current and High Temperature

Layered Probe: Response to High Current and High Temperature

We have a track record of producing laminated probes compatible with 2000A! Introducing our solutions for handling high current and high temperatures.

The "laminated probe" does not use coil springs and instead utilizes the characteristics of leaf springs for contact, making it resistant to degradation of spring properties due to heat. The insulating film (polyimide) also has a heat resistance rating of 300°C for regular use and long-term heat resistance. It can accommodate measurement environments at high temperatures, allowing contact with power semiconductors including SiC. 【Features】 ■ Utilizes the characteristics of leaf springs ■ Resistant to degradation of spring properties due to heat ■ Can accommodate measurement environments at high temperatures ■ Allows contact with power semiconductors including SiC *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Probe

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Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Wavelength 1.1-17μm, fiber detachable ATR optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) The sterilizable ATR fiber probe is art's new product, FlexiSpec. This series is compatible with all types of ATR (Attenuated Total Reflection) elements and can be used with any FTIR spectrometer. The unique Shaft-in-Shaft design makes FlexiSpec the ideal tool for bioprocesses that require sterilization while taking advantage of the benefits of mid-infrared FTIR spectroscopy.

  • probe
  • Probe

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Wavelength 0.19-2.2μm - Reflective optical fiber probe

Wavelength 0.19-2.2μm - Reflective optical fiber probe

Has a track record with companies such as Bayer, BASF, bp, Chevron, Dow, and Pfizer.

Manufacturer: art photonics (Germany) art photonics offers a variety of reflection and fluorescence probes. Based on a fiber branching structure, one leg transmits light from the light source to the sample for illumination, while the other leg transmits the reflected light to the spectrometer for reading. Unlike the previous "6+1" bundle configuration of reflection probes, art offers a "7+1" configuration, which dramatically improves the signal-to-noise ratio (SNR). For special applications, a "7+12" design is also available, consisting of 7 illumination fibers and 12 random reading fibers. Additionally, the illumination leg fibers are metal-coated, further enhancing the SNR compared to those with polymer coatings. Two models are available: "Round-to-Round (R/R)" design and "Round-to-Line (R/L)" design.

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World's longest 10m ATR fiber probe

World's longest 10m ATR fiber probe

We have manufactured an ATR fiber probe of unprecedented length in the mid-infrared range.

Manufacturer: art photonics (Germany) ATR spectroscopy in the mid-infrared spectral range (λ = 2~18 μm) is the most efficient method for remote inline monitoring of molecular composition in field labs. This is due to the deep relationship of many molecular vibrations with this spectral range. art photonics has developed the world's longest ATR fiber probe that corresponds to the wavelength range of 6~16 μm.

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Flat Chip Diamond ATR Fiber Probe

Flat Chip Diamond ATR Fiber Probe

The diamond ATR chip at the probe tip is flat, making contact measurement easy and cleaning simple.

Manufacturer: art photonics (Germany) The probe tip is a flat type diamond crystal. It can make firm contact with samples that have a flat surface. Cleaning is also easy. The mid-infrared fiber ATR probe can be used with all types of FTNIR, FTIR, and other infrared spectrometers, spectrophotometers, infrared LEDs, or sensors for quantum cascade lasers. ------------------------------------------------- Features ------------------------------------------------- The diamond ATR chip at the probe tip is flat High throughput across the near-infrared and mid-infrared range Compatible with all spectrometers and automatic process interfaces ------------------------------------------------- Probe Type ------------------------------------------------- Di-ATR (Diamond)

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Total cell density & biomass monitoring probe BioVIS

Total cell density & biomass monitoring probe BioVIS

Using the BioVIS probe, you can directly measure cell growth and total biomass from the bioreactor.

Since sampling is not required, contamination in cell culture can be avoided. At the same time, high-resolution information about the cell growth profile can be obtained, providing valuable insights that help optimize the cell culture process. The plug-and-play design of the probe is suitable for use in any bioreactor and can be used as a single portable unit. Therefore, it can be used in bioreactors ranging from small to large capacity, and with BioVIS multiplex, it can monitor total cell density in real-time across multiple bioreactors and all other parallel culture vessels. By using data log options, temperature and pH monitoring capabilities can be further integrated.

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コンタクトプローブ

コンタクトプローブ

高集積化に伴う狭ピッチ化やエリアアレイへの対応に優れたプローブピンをご紹介！

『コンタクトプローブ』は、狭ピッチ電極の電子部品検査に適した超極細径 のワイヤプローブです。 導体部には、パラジウム合金や、銅銀合金、タングステン、レニウムタング ステン、ベリリウム銅などを使用。 当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 境界面のシャープ化を実現しています。 【特長】 ■当社独自の製法により、極小部位への先端加工を実現 ■当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 　境界面のシャープ化を実現 ■特殊な表面処理により、絶縁コーティング表面の滑性を向上 ■パラジウム合金は、導体が酸化しにくい特長があり、接触抵抗の安定性が向上 ■酸化を嫌う半導体検査などに好適 ■30μmの極細径から対応可能 ※詳しくは外部リンクページをご覧いただくか、お気軽にお問い合わせ下さい。

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