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Probe×MSHシステムズ - メーカー・企業と製品の一覧

Probeの製品一覧

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[Long lifespan, high durability type] Diamond probe for AFM/SPM

[Long lifespan, high durability type] Diamond probe for AFM/SPM

AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. ● Diamond Coated Probes - DCP Series: Probes with conductivity due to nitrogen-doped diamond coating. - HA_DCP Series: Probes with cantilevers at both ends of the chip and two different diamond-coated tips. ● Single Crystal Diamond Probes - DEP Series: Probes with conductivity, treated with boron-doped diamond coating on single crystal diamond. - DRP Series, DPRS Series: Probes designed for applications involving high mechanical loads and scratch tests. - FD Series: Probes that are insensitive to static electricity on the sample surface, making them easy to approach and suitable for topography imaging.

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High-resolution type super sharp probe for AFM/SPM

High-resolution type super sharp probe for AFM/SPM

AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.

This is a probe for atomic force microscopy and scanning probe microscopy. We offer two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm. - Super Sharp DLC Probe: A probe equipped with a DLC tip at the tip's end that has a curvature radius of less than about 3 nm. Due to the DLC, it boasts high durability and long lifespan. - Super Sharp SS Probe: A probe with the tip's end sharpened to a curvature radius of about 2 nm.

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Colloidal probe for AFM/SPM with spherical tip type

Colloidal probe for AFM/SPM with spherical tip type

This is a probe equipped with colloidal spheres instead of a standard tip. Colloidal spheres can be selected from multiple sizes.

This is a probe for atomic force microscopy and scanning probe microscopy. It is a contact mode probe with spherical particles fixed to a chipless cantilever, used for studying colloidal interactions between two surfaces and quantifying interaction characteristics. ● Applications - Direct measurement of surface forces - Colloidal interactions at the single particle - particle level - Direct measurement of cellular mechanics - Adhesion force measurement - Study of colloidal interactions between particles and surfaces

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SNOM probe

SNOM probe

A SNOM measurement probe with a tiny aperture formed at the probe tip. Five types of transmission wavelengths are available, ranging from 400 to 1600 nm.

This is a SNOM-specific probe made from high-quality single-mode optical fiber. The probe tip is coated with aluminum and has a small aperture, allowing it to be used in all current modes of SNOM measurement (transmission, reflection, collection). We offer five types with different operating wavelength ranges within the wavelength range of 400 to 1600 nm. They are provided in sets of 10.

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[Standard Type] AFM/SPM Probe

[Standard Type] AFM/SPM Probe

High cost-performance AFM/SPM probes

This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.

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High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a long extra tip at the tip's end. It is effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure. - Whisker Probe: A probe with an extra tip that extends at an angle of 10° or 20° at the tip's end. The angle can be selected to be perpendicular to the sample. - PHA Probe: A probe with an elongated extra tip shaped like a drill.

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