We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Test Systems.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Test Systems Product List and Ranking from 38 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  3. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  4. 4 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社 Tokyo//Testing, Analysis and Measurement
  5. 5 ディ・アイジャパン Tokyo//Electronic Components and Semiconductors
Go to Company Ranking

Test Systems Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Tabletop Gross Leak Test System | MSA-0101 series フクダ
  2. sCT9002 Silicon Photonics Wafer Test System Semi Next 本社、三重事業所
  3. Druck 『ADTS 405 MkII』 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社
  4. Test Burn-In Tester ディ・アイジャパン
  5. 4 Automatic Glove Leak Test System "AGLTS" ジャパンマシナリー

Test Systems Product List

46～60 item / All 93 items

Displayed results
NI (National Instruments) "5G Test Solution"

NI (National Instruments) "5G Test Solution"

Accelerating the testing of 5G devices. Capable of building a highly reliable testing environment for millimeter wave frequency tests and OTA tests.

With the full-scale launch of communication services utilizing 5G, the development of 5G-compatible devices requires conducting a large number of tests in a short period of time. Our company offers NI's "5G Test Solutions," contributing to the establishment of a high-efficiency and high-reliability testing environment. [Examples of Solutions] ■ "5G mmWave Test System" Combining signal transmission and reception modules compatible with millimeter waves and switches, we build test systems tailored to your needs. It enables high-speed generation and analysis of 5G signals. ■ "OTA Validation Reference System" A test system that leverages the high-speed bus of PXI to accelerate OTA testing. We have a track record of completing tests approximately six times faster than before. ■ Utilization of Developed Software We offer a variety of pre-developed measurement and control software, as well as data analysis software. This significantly shortens the development period for the testing environment. ■ Hardware We provide customizable platform-based test solutions from the PXI series. This allows for smooth integration of multiple testing equipment environments, making it easy to test complex 5G environments.

  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
NAVI Coordinated Control Test System NAVI Turn Table

NAVI Coordinated Control Test System NAVI Turn Table

You can obtain output data from the gyro sensor installed in the NAVI system!

The "NAVI Turn Table" is a test system for cooperative control that utilizes navigation information, which is increasingly being adopted to improve fuel efficiency. By inputting the calculated yaw and pitch angles of the NAVI installation position based on customer simulations, it is possible to simulate the yawing and pitching behavior of the NAVI system in real-time during actual driving. Output data from the gyro sensor installed within the NAVI system can be obtained, allowing for the creation of a virtual test environment for NAVI cooperative control. 【Features】 ■ Ability to create a virtual test environment for the development of NAVI cooperative control ■ Reproduces the yawing and pitching behavior of the NAVI unit while driving, and acquires gyro sensor output data from within the NAVI in real-time ■ Yaw range (standard) = ±360 [deg], maximum angular velocity = 30 [deg/s] ■ Pitch range (standard) = ±15 [deg], maximum angular velocity = 30 [deg/s] ■ Compatible with 1DIN/2DIN in-dash type NAVIs *For more details, please refer to the PDF materials or feel free to contact us.

  • Company：AZAPA
  • Price：Other
  • Instrumentation and Control Systems
  • Other information systems

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Laser Diode Test System

Laser Diode Test System

We can perform I-L/I-V measurements, FFP (Far Field Pattern) measurements, and polarization ratio measurements.

Introducing the "Laser Diode Test System" handled by Fukuhara System. This product is capable of performing I-L/I-V measurements, spectrum measurements, FFP (Far Field Pattern) measurements, polarization ratio measurements, and more. The operation is interactive with a menu-based system. Additionally, the display section features a 5.6-inch LCD. 【The following measurements are possible】 (1) I-L/I-V measurement (2) FFP (Far Field Pattern) measurement (3) Spectrum measurement *Requires an optical spectrum analyzer (4) Polarization ratio measurement (5) Temperature dependence evaluation for (1) to (4) (6) Light output/driving current dependence evaluation for (2), (3), and (4) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Laser Diode Bar Test System

Laser Diode Bar Test System

For I-L/I-V measurements and wavelength measurements! It automatically measures the LD chip on the bar with simple positioning operations.

We would like to introduce the "Laser Diode Bar Test System" handled by Fukuhara System. With simple positioning operations, it is possible to automatically measure the LD chip on the bar. The display section consists of a 7-segment LED and an LCD, and the operation is interactive through a menu system. For further details, please feel free to contact us. 【The following measurements necessary for the characterization of Laser Diodes (LD) are possible】 (1) I-L/I-V measurement (2) Wavelength measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Light output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
HTOL system

HTOL system

Supports various levels of integration! Saves customers' costs and time with efficient solutions.

To effectively conduct HTOL testing, it is desirable to test a large number of units simultaneously. This requires a system capable of delivering test signals to multiple channels using high-power signal sources that are employed to overcome significant splitter losses. Our company owns a number of high-power amplifiers and can provide customers with an "HTOL System." We support various levels of integration, from components to complete integrated rack systems, and by proposing efficient solutions, we help customers save on costs and time. 【Features】 - Capable of supporting various levels of integration from components to complete integrated rack systems - A lineup of products that can be addressed with off-the-shelf solutions - Proposing efficient solutions to save on costs and time - Providing strong support *For more details, please refer to the PDF materials or feel free to contact us.

  • Other electronic parts

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Helium Leak Test System | HES-2000 series

Helium Leak Test System | HES-2000 series

"Helium Leak Test System" optimal for high-precision and high-pressure measurements, featuring two measurement methods: vacuum chamber method and atmospheric pressure chamber method / gas leak.

By providing a helium inspection device designed as a dedicated machine as a highly flexible standard system, we keep costs down. You can choose from two measurement methods: vacuum chamber method and atmospheric pressure chamber method. Standardization of the main unit makes it easier to select specifications compared to fully customized products. We propose a gas recovery unit that suppresses and controls helium gas consumption. It is also possible to combine a blender that allows inspection with diluted helium gas and a pressurization unit for high-pressure measurements. By combining air leak testing with the helium leak test system, we can significantly improve the accuracy of the large leak confirmation process, which puts a burden on the helium detector and is one of the causes of line stoppages. 【Features】 ■ Supports various workpieces and specifications ■ High precision and fast measurement due to chamber design for workpiece shapes ■ Compatible with diluted helium gas ■ Helium gas recovery pressurization unit available (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Leak Testing Equipment
  • Gas recovery/treatment equipment
  • Gas Detection Sensor

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Bombing Gloss Finely Leak Test System | MSX-7000

Bombing Gloss Finely Leak Test System | MSX-7000

This is a leak testing device compatible with ultra-small packages measuring 1.0 × 0.8 mm and 1.2 × 1.0 mm.

The "MSX-7000 series" is a leak testing device for sealed package products such as small electronic components, crystal oscillators, MEMS and optical devices, and various sensors. With a new mechanism, it has achieved inspection of sizes as small as 1.0 × 0.8 mm for the first time, and the transport accuracy has improved through position correction using image processing. It can perform both bomb testing and gross/fine leak testing in a single unit. 【Features】 ■ Achieved inspection of sizes as small as 1.0 × 0.8 mm for the first time with a new mechanism ■ Improved transport accuracy through position correction using image processing ■ Enhanced gross leak sensitivity to 8.5×10⁻⁸Pa·m³/s *For more details, please refer to the PDF document or feel free to contact us.

  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Bombing Gloss Finely Leak Test System | MSX-7003

Bombing Gloss Finely Leak Test System | MSX-7003

Fully automatic airtight inspection device for relatively large electronic devices such as LEDs, optical devices, high-frequency devices, power semiconductors, and IR sensors.

The 【MSX-7003 series】 is a leak testing device designed for relatively large electronic devices ranging from medium to large sizes. It is capable of performing leak tests on electronic devices smaller than 10 mm square, such as LEDs, optical devices, high-frequency devices, power semiconductors, IR sensors, gyro sensors, angular velocity sensors, and electrolytic capacitors. The 【MSX-7003 series】 is the top model in the series and is a composite leak testing device that automatically performs three processes: - Helium bombing - Gross leak test - Fine leak test It is also compatible with inline applications (the pass line height is 940 mm). Additionally, we offer a lineup tailored to customer needs, including: - The 【MSZ-7003 series】, designed solely for gross leak testing - The 【MHX-7003 series】, which performs bombing and fine leak testing - The 【MSH-7003 series】, which does not have a bombing device You can watch a video of the actual device in the YouTube link below.

  • kirinuki.jpg
  • 20230807_solid-0077T01.JPG
  • 20230807_solid-0079T01.JPG
  • 20230807_solid-0085T01.JPG
  • 20230807_solid-0086T01.JPG
  • 20230807_solid-0089T01.JPG
  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
[Development Case] RFID Test System - Solving UHF Band Null Points -

[Development Case] RFID Test System - Solving UHF Band Null Points -

[Development Case] NI Application Contest 2007 Excellence Award RFID Testing that Continues to Evolve by Sharing LabVIEW with Customers

RFID technology has rapidly spread not only in applications such as transportation cards and electronic money IC cards but also in areas like distribution and traceability. However, I heard from a representative of Company T that there is a challenge in finding systems to develop and measure this RFID technology.

  • IC tag
  • Analytical Equipment and Devices
  • Testing Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
AR/VR/MR Glass Performance Testing System

AR/VR/MR Glass Performance Testing System

AR/VR/MR Glass Performance Testing System

Non-contact measurement of how the position of the virtual world changes based on the position of the robot. Consistent testing of tracking and latency is possible.

  • Optical Measuring Instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Function Test System

Function Test System

Function Test System

We develop and manufacture customer-specific function testers using a PC or microcontroller. The system consists of three functions: control (power supply control, work state control), measurement (measurement and judgment of voltage, current, frequency, etc.), and communication (command transmission, response checking). Additionally, the editing function allows for quick responses to specification and design changes. Debugging has also become easier with standard software.

  • Testing Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Fogging Test System

Fogging Test System

Horizon Fog Testing System compatible with various methods in the automotive industry.

The "Horizon Fog Testing System" by ThermoFisher Scientific reproduces the phenomenon where volatile components emitted from automotive interior materials (rubber, plastic, textiles) and additives or adhesives used in building interior materials adhere to glass surfaces due to temperature differences, obstructing visibility. By measuring the amount of volatile substances and the reflection angles caused by their adhesion to glass, it is possible to evaluate interior materials.

  • Testing Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
High-Speed Pulse I-L Test System SEC-PL4000-800

High-Speed Pulse I-L Test System SEC-PL4000-800

High reproducibility and stability

This is a device for measuring I-L and I-Vf characteristics by driving a laser diode with high-speed pulsed operation.

  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Optimized DC Test System

Optimized DC Test System

Optimized DC Test System

Since the release of Japan's first linear tester in 1974, Shibasoku has consistently supplied IC testers that meet the needs of the times to semiconductor manufacturers both domestically and internationally. Today, it boasts a rich product lineup, including the WL25/WL27, which holds the top domestic market share for high-voltage and high-current devices such as linear ICs and automotive applications, as well as the S230, a PDP driver IC tester with the number one global market share. The WL05VZ, released in April 2007, is an innovative optimized DC test system developed by incorporating the latest hardware and software technologies that Shibasoku has cultivated over many years. Shibasoku aims to enter the volume zone IC market with the WL05VZ and achieve the goal of securing the number one market share in the world.

  • Tester
  • Semiconductor inspection/test equipment
  • Voltage Meter

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.