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Test Systems Product List and Ranking from 36 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  3. ヒューマネティクス・イノベーティブ・ソリューションズ・ジャパン Tokyo//Automobiles and Transportation Equipment
  4. 4 Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  5. 4 アルファクス Kanagawa//Industrial Electrical Equipment
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Test Systems Product ranking

Last Updated： Aggregation Period:Dec 24, 2025～Jan 20, 2026
This ranking is based on the number of page views on our site.

  1. Tabletop Gross Leak Test System | MSA-0101 series フクダ
  2. ITU-T P.1140 eCall Voice Quality Test Narrowband ヘッドアコースティクスジャパン
  3. sCT9002 Silicon Photonics Wafer Test System Semi Next 本社、三重事業所
  4. Head Impact Test System "E-Liner FMH NG" ヒューマネティクス・イノベーティブ・ソリューションズ・ジャパン
  5. 4 Helium Leak Test System | HES-2000 series フクダ

Test Systems Product List

16～30 item / All 91 items

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Automated Test System "PXI High-Power General-Purpose Switch Module"

Automated Test System "PXI High-Power General-Purpose Switch Module"

General-purpose switch compatible with eBIRST switching system test tools.

The "PXI High Power General Purpose Switch Module" from Pickering provides relays capable of handling high currents for high power applications. The low current version occupies one 3U size PXI slot, while the high current version occupies two slots. It can be used for switching large AC or DC loads and is ideal for automotive testing systems. Each module features connectors optimized for the application. 【Features】 ■ Mechanical relays and semiconductor relays with current ratings from 1.5A to 40A ■ Single pole single throw, single pole double throw, double pole single throw, and double pole double throw versions ■ High-capacity connectors ■ Module size occupies one or two 3U PXI slots ■ Simple and quick detection of relay anomalies on LXI or PXI switch systems Please contact us for more details.

  • relay

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Automated Test System "PXI High Voltage Switch Module"

Automated Test System "PXI High Voltage Switch Module"

High voltage switch compatible with eBIRST switching system test tool.

The "PXI High Voltage Switch Module" is a normally open relay switch module that can handle high voltages up to 1000VAC. Matrix and multiplexer configurations are also available. It is designed to withstand high common mode voltages and uses a protective safety cover to shield the switching components. All modules are equipped with high voltage D-type connectors. 【Features】 ■ Hot switching up to 750VDS or peak 750VAC ■ Cold switching up to 1000VDC or peak 1000VAC ■ Matrix and multiplexer configurations also available ■ Mechanical relay versions can handle up to 5A in hot or cold switching ■ High voltage D-type connectors For more details, please contact us.

  • relay

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Automated Test System "PXI Multiplexer Module"

Automated Test System "PXI Multiplexer Module"

PXI multiplexer modules with various performances tailored to customer requirements.

The "PXI Multiplexer Module" is a PXI solution module that combines the necessary functions compliant with the PXI standard to build an automatic measurement system. We offer various performance PXI Multiplexer (MUX) modules tailored to customer requirements. 【Features】 ■ PXI Multiplexer (MUX) modules with various performance levels ■ Support for assembling cables for wiring between Pickering modules ■ Pickering products come with a 3-year warranty ■ Pickering's High Power Multiplexer Model 40-651 is used in aircraft lightning protection tests Please contact us for more details.

  • switch

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Automated Test System "PXI Programmable Resistor Module"

Automated Test System "PXI Programmable Resistor Module"

Up to 18 channels! A module ideal for automotive testing.

The "PXI Programmable Resistor Module" is manufactured by Pickering and is an ideal module for testing in medical, aerospace, and automotive applications. It includes a lineup of products such as the "PXI General-Purpose Programmable Resistor" with a minimum resolution of 0.25Ω, the "PXI Selectable Resistor" for applications requiring specific resistance values, and the "PXI Programmable Load Resistor" capable of handling up to 15W. 【Features】 ■ Suitable for medical, aerospace, and automotive applications ■ Resistance range: 1Ω to 16MΩ ■ Up to 18 channels possible in a single PXI/PCI slot ■ Minimum resolution of 2mΩ: 0.03% accuracy ■ Compatible with both PXI chassis and Pickering's LXI chassis For more details, please contact us.

  • Other electronic parts

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Automated Test System "PXI General-Purpose Programmable Resistor Module"

Automated Test System "PXI General-Purpose Programmable Resistor Module"

Minimum 0.25Ω resolution! A module ideal for sensor emulation applications.

The "PXI General-Purpose Programmable Resistor Module" features a fine-tuning function with a minimum resolution of 0.25Ω, providing programmable resistors and potentiometers necessary for sensor emulation. By combining two channels, it can be used for potentiometer emulation. We also offer assembly of cables for connecting between modules. 【Features】 ■ Minimum resolution of 0.25Ω, resistance range from 1Ω to 16 MΩ ■ Ideal for sensor emulation applications ■ Individual control of resistance values ■ Compatible with Visa kernel in PXI environment, supports both PXI and LXI chassis ■ Pickering products come with a 3-year warranty For more details, please contact us.

  • Other electronic parts

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Automated Test System "PXI High-Precision Programmable Resistor Module"

Automated Test System "PXI High-Precision Programmable Resistor Module"

Minimum 2mΩ resolution! A module with very high accuracy and stability of at least 0.03%.

The "PXI High-Precision Programmable Resistor Module" is manufactured by Pickering and is an ideal module for testing in medical, aerospace, and automotive applications. You can freely select resistance values from the range specified by the product using software. It is designed to easily connect a DMM for resistance verification and is less susceptible to thermal electromotive force effects. Modules that simulate RTDs (Resistance Temperature Detectors) and strain gauges are also available. 【Features】 ■ Extremely high accuracy and stability with a minimum of 0.03% ■ Minimum resolution of 2mΩ ■ Ideal for sensor emulation applications ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.

  • Other electronic parts

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[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

High-performance, high-quality measurement supported by JTAG boundary scan testing!

We would like to introduce a customer who has implemented "JTAG Boundary Scan Testing" for the inspection of LTE measurement devices. By adopting this product, it has become possible to reliably detect solder defects and pattern defects that cannot be identified through X-ray inspection using electrical testing. Additionally, systems that combine large-scale FPGAs and DDR memory were unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. However, by adopting this product, we were able to improve manufacturing quality. 【Case Study】 ■ Anritsu Corporation - Engaged in the field of information and communication, providing measurement solutions globally. ■ Challenges - Unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

Identify defective areas of BGA-mounted boards at the pin level to improve manufacturing quality!

We would like to introduce a customer who adopted "JTAG boundary scan testing" for failure analysis of BGA-mounted boards. After the introduction of our product, sufficient quality assurance can be achieved even for high-density printed circuit boards equipped with numerous BGA packages. 【Case Study】 ■ Saksa Tech Co., Ltd. Production Technology Department - Manufacturing focused on business phones and IC card reader-related products ■ Challenges - Unable to sufficiently establish test pins due to the large number of BGAs - Unable to adequately identify the cause of defects through functional testing - X-ray inspection cannot determine BGA open failures *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

JTAG boundary scan testing that improved reliability in the early stages of development!

We would like to introduce a case study of a customer who adopted "JTAG boundary scan testing" in the production line of their in-house developed products. For devices compatible with JTAG that are packaged in BGA format, the basic wiring checks are confirmed through JTAG testing before being handed over to the firmware team for boards that consist of DSP (CPU) + RAM + ROM. This approach eliminates wasted development time due to defects in board or component implementation, thereby improving development efficiency. [Case Study] ■ TEAC Corporation, Audio Equipment Division - Development and sales of audio equipment ■ JTAG testing is conducted from the prototype stage to enhance development efficiency. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

Feedback the statistical data of BGA defects to manufacturing!

We would like to introduce a case study of a customer who identified defective areas on a BGA implementation board using "JTAG boundary scan testing." By utilizing this product, it became possible to pinpoint the locations of BGA implementation defects at the pin level. A cross-sectional analysis conducted with a microscope on the pins where defects occurred revealed that the cause of the implementation defects was due to the soldering areas being exposed to high temperatures for an extended period. Additionally, by reviewing the temperature management of the solder reflow process, we were able to improve the implementation quality of the board. [Case Study] ■ Oki Electric Communication Systems Co., Ltd. - Mechatronics and electronics design and production contract services ■ Quality assurance of BGA implementation using JTAG testing *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Example] ECU Failure Simulation

[Example] ECU Failure Simulation

Conducting tests to improve the safety of automotive equipment with the "PXI automatic test solution"!

We would like to introduce a case where a French automotive testing equipment system integrator adopted the "PXI Automatic Test Solution." This solution allows for the easy construction of HILS testing systems, simulating system failures to achieve design and functional evaluations of ECUs. The company has successfully automated the testing of in-vehicle devices, resulting in the miniaturization of traditional large-scale equipment and cost reduction. 【Automation of In-Vehicle Device Testing】 ■ Engine Control Unit ■ Powertrain Control Module ■ Engine Control Module ■ Body Control Unit ■ Battery Management Unit *For more details, please refer to the PDF document or feel free to contact us.

  • Other network tools

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PXI & LXI Automated Test Learning Center (Seminar)

PXI & LXI Automated Test Learning Center (Seminar)

This is a series of seminars introducing an overview and application examples of automatic measurement, which is gaining attention in fields such as the automotive industry, aerospace, RF, and HIL testing.

We will introduce a method to "automate" verification tasks using PXI & LXI, which are widely used to automate measurements and tests performed "manually" in the field of hardware and software development of overseas electronic devices. It is available for viewing on demand, so you can watch it immediately.

  • Other electronic measuring instruments

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Supports boards with BGA! 【JTAG Test Application Case Collection】

Supports boards with BGA! 【JTAG Test Application Case Collection】

This is a collection of case studies on JTAG testing that led to improvements in quality and enhancements in testing scope.

JTAG boundary scan is a testing method that allows for easy implementation testing of boards with BGA components. It has various advantages, and I believe we can gain insights from the case studies. [Case Studies] - Azbil Corporation: Reduced untested areas with JTAG testing, providing peace of mind to customers! - Anritsu Corporation: JTAG testing supports high-performance and high-quality measurements! - Oki Electric Communication Systems: Achieved BGA implementation assurance through JTAG testing. - Konica Minolta Electronics: Established a consistent and advanced inspection system for high-density implementations. - Saksa Tech: Improved manufacturing quality by pinpointing defects on BGA boards at the pin level. - TEAC Corporation: Enhanced reliability in the early stages of development with JTAG testing. *The company names mentioned in the case studies are as they were at the time permission was granted for the introduction.*

  • Circuit Board Inspection Equipment

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Wireless Test System 'Model AMS-8700'

Wireless Test System 'Model AMS-8700'

Complete RF environment simulation! Introducing the MIMO OVER-THE-AIR (OTA) test system!

The "Model AMS-8700" is a wireless test system designed to measure the radiation performance of wireless devices in a highly reproducible simulated multipath environment. It uses a dual-polarization antenna array to connect communication test equipment for a specific technology via a spatial channel emulator within an anechoic chamber. The anechoic chamber isolates the test environment from interference and reflections that exist in the real-world environment, eliminating unwanted reflections in the testing environment. 【Features】 ■ Supports LTE and 802.11n MIMO testing ■ Receive diversity evaluation ■ Complete RF environment simulation ■ Supports single cluster, multi-cluster, and uniform models ■ Supports various AoA, Doppler, and delay spread *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Testing Equipment and Devices
  • Other information systems

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