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Test Systems Product List and Ranking from 37 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. ヒューマネティクス・イノベーティブ・ソリューションズ・ジャパン Tokyo//Automobiles and Transportation Equipment
  3. Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  4. 4 アンドールシステムサポート 自動テストソリューション事業部 Tokyo//Industrial Electrical Equipment
  5. 5 ジャパンマシナリー Tokyo//Trading company/Wholesale
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Test Systems Product ranking

Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.

  1. Head Impact Test System "E-Liner FMH NG" ヒューマネティクス・イノベーティブ・ソリューションズ・ジャパン
  2. sCT9002 Silicon Photonics Wafer Test System Semi Next 本社、三重事業所
  3. Helium Leak Test System for Food Packaging HES-2000 フクダ
  4. 4 Automatic Glove Leak Test System "AGLTS" ジャパンマシナリー
  5. 4 Druck 『ADTS 405 MkII』 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社

Test Systems Product List

31～60 item / All 112 items

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Wireless Test System 'Model AMS-8700'

Wireless Test System 'Model AMS-8700'

Complete RF environment simulation! Introducing the MIMO OVER-THE-AIR (OTA) test system!

The "Model AMS-8700" is a wireless test system designed to measure the radiation performance of wireless devices in a highly reproducible simulated multipath environment. It uses a dual-polarization antenna array to connect communication test equipment for a specific technology via a spatial channel emulator within an anechoic chamber. The anechoic chamber isolates the test environment from interference and reflections that exist in the real-world environment, eliminating unwanted reflections in the testing environment. 【Features】 ■ Supports LTE and 802.11n MIMO testing ■ Receive diversity evaluation ■ Complete RF environment simulation ■ Supports single cluster, multi-cluster, and uniform models ■ Supports various AoA, Doppler, and delay spread *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Testing Equipment and Devices
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Wireless Test System 'MODEL AMS-7000'

Wireless Test System 'MODEL AMS-7000'

Accelerating exam time! Introduction of the Reverberation Chamber OVER-THE-AIR (OTA) test system.

The "MODEL AMS-7000" is a wireless test system that performs accurate and highly reproducible SISO TRP, TIS, and throughput measurements. It is controlled by EMQuest, an antenna measurement automation software, based on the SMART series and reverberation chamber technology that we have developed over many years. The overmode environment of the reverberation chamber means that precise placement of the DUT is not necessary for reproducibility and accurate measurements, resulting in reduced setup time. 【Features】 ■ Supports SISO TRP, TIS, and throughput measurements ■ Supports MIMO throughput measurements ■ Direct correlation with CATL labs ■ Accelerated testing time ■ Compatible with EMQuest antenna measurement software ■ Standalone and portable with a cart *For more details, please refer to the PDF document or feel free to contact us.

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  • Testing Equipment and Devices
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ESD Test System Model 58154

ESD Test System Model 58154

PXI/PCI tester ideal for electrostatic pulse testing of semiconductors and electronic components.

The 58154 is a PXI/PCI control module that simulates electrostatic discharge pulses during testing of semiconductor devices and electronic devices. It complies with ESD STM5.1-2001 Human Body Model (HBM) and ESD STM5.2-1999 Machine Model (MM), and can also be applied to domestic standards such as JEDEC and JEITA ED-4701. The system can be programmed and controlled via software, providing various functions necessary for testing. For example, it offers programmable and flexible features such as wafer sampling tests, ESD models, ESD pulse polarity, intervals between ESD pulses in a sequence, and automatic test functions. The 58154 consists of a control module and an external pulse output box. The high-voltage power supply unit (PSU) and pulse generation circuit produce pulse waveforms compliant with ESD STM. When used with other testers and probers, it serves as an optimal system for a total LED and laser diode testing solution on production lines.

  • Testing Equipment and Devices
  • Test Systems

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SoC/Analog Test System Model 3650-EX

SoC/Analog Test System Model 3650-EX

A cost-effective SoC/analog test system.

The 3650-EX is a tester specially designed to provide cost-effective solutions for fabless companies, IDMs, and test houses, featuring high throughput and extensive multi-site testing capabilities. With high functionality, precision, powerful software tools, and high reliability, the 3650-EX is an ideal tester for testing consumer devices, high-performance microcontrollers, and SoC devices.

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High-Performance SoC/Analog Test System Model 3680

High-Performance SoC/Analog Test System Model 3680

High-performance SoC/Analog test system enables excellent multimedia audio/video chip testing.

Supports the implementation of 24 digital and analog measurement boards (flexible combinations) Maximum data rate of 150 Mbps Supports up to 512 parallel tests Up to 2048 digital I/O pins Up to 256 MW pattern memory (512 MW option) Up to 64-channel PMU (high-precision DC measurement) Timing measurement/DC measurement (PPMU)/frequency measurement equipped on all pins Maximum 8G/scan (16G option) Timing edge accuracy (EPA): ±150ps Up to 128-channel DPS (device power supply) HDADDA2 (digitizer/arbitrary waveform generator) option High power HCDPS analog option High-frequency measurement HDAVO option Multi-channel HDVI, HDRF analog options* Direct probing system* OS: Microsoft Windows 10 Programming language: C#.NET and GUI Operating system: CRISPro Program support from other testers Test board support for other testers Standard specification STDF support All functions implemented in the test head Space-saving, air-cooled system

  • Semiconductor inspection/test equipment
  • Test Systems

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Embedded Software Automated Testing System QualityCommander

Embedded Software Automated Testing System QualityCommander

Quality Commander, an embedded software test automation system that automatically operates touch panels and supports smartphone testing.

Quality Commander is a system that automates the testing of embedded software for mobile phones, car navigation systems, touch panels, and digital appliances, which was traditionally done manually. It automates manual operations through reliable robotic actions and accurate image judgments using cameras. Quality Commander features user-friendly operability from the perspective of test personnel, allowing even those without programming experience to easily create test scenarios. By eliminating waste in testing tasks through automated evaluation and preventing test omissions, it achieves "quality improvement," "cost reduction," and "time savings."

  • Testing Equipment and Devices
  • Embedded applications for mobile phones and PDAs
  • Development support tools (ICE, emulators, debuggers, etc.)
  • Test Systems

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Modular Surge Test System 'PSURGE 30.2'

Modular Surge Test System 'PSURGE 30.2'

Designed to generate various surge pulses! Enables efficient setup and operation.

The "PSURGE 30.2" is a modular surge testing system designed to perform high-energy surge tests. The four included impulse modules can be easily exchanged, allowing this product to be used in various applications. The type of pulse module is recognized by the system software. Additionally, the built-in microprocessor control unit functions as a user interface and controls all internal functions. 【Features】 ■ Modular system supporting up to 4 pulse formats ■ Pulse voltage up to 30kV, pulse current up to 30kA ■ Automatic polarity switching ■ Monitoring of peak voltage and peak current ■ Integrated large test cabin ■ Remote control option * You can download the German version of the catalog. * For more details, please feel free to contact us.

  • Testing Equipment and Devices
  • Test Systems

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In-Circuit Test System "i1000D"

In-Circuit Test System "i1000D"

You can easily conduct tests on digital devices at a low cost.

By using the Agilent Medalist i1000D In-Circuit Tester (ICT), you can easily and affordably test digital devices, achieving groundbreaking digital testing. 【Features】 ○ The Test Developer GUI is user-friendly, allowing even inexperienced users to create fixtures and programs in just a few days. ○ The graphical interface makes digital debugging simple. ○ Comes with the VTEP v2.0 Powered test suite. ○ Equipped with boundary scan test functionality. For more details, please contact us or download the catalog.

  • Circuit Board Inspection Equipment
  • Test Systems

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Laser Diode Test System [LD342L/S-LT/NT]

Laser Diode Test System [LD342L/S-LT/NT]

This is a desktop LD test system for research and development purposes that can semi-automatically measure the characteristics of laser diodes.

This is a desktop-type LD test system for research purposes. <Features> ■ Dedicated fixtures can be prepared according to the shape of the LD. ■ Measurement items (Front LIV, λ characteristics, FFP H, V) can be automatically measured for one element under specified temperature conditions. ■ There are LD342L for long wavelengths (1200-1650nm) and LD342S for short wavelengths (400-980nm). ■ Options are available for low temperature (from -40°C to +100°C) LT and room temperature (from 20°C to +100°C) NT. ■ The adoption of a focusing lens system eliminates the need for wavelength measurement alignment.

  • Analytical Equipment and Devices
  • Test Systems

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Laser Diode Test System [LD2920MTB]

Laser Diode Test System [LD2920MTB]

Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state, allowing for high-speed automatic measurement.

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (optical communication) laser diode bare chips at high speed. <Features> ■ LD chips adhered to a blue sheet are supplied and automatically transported at high speed from gripping ring state to measurement and classification. ■ Measurement items (front/back LIV, λ characteristics) can be measured as standard items under two temperature environments. ■ Measurement sorting can be performed at any temperature from -40°C to +95°C. ■ Simultaneous IL measurement of FRONT light and BACK light is possible. ■ The SH gauging method is adopted for chip positioning. ■ The use of a focusing lens system has eliminated the alignment time for wavelength measurement. ■ Up to 13 cameras monitor the presence and condition of LD chips at each position, making it easy to understand operating conditions and adjust various parts. *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices
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Head Impact Test System "E-Liner FMH NG"

Head Impact Test System "E-Liner FMH NG"

It can meet a speed accuracy of +/-0.1 km/h without a preliminary test!

The FronTone E-Liner FMH NG is a head impact system for electronically driven vehicle interiors. <Features> ■ Continuously adjustable up to a test speed of 24.5 km/h ■ Accurate targeting through non-forceful acceleration ■ No test matrix required ■ No preliminary testing required ■ No floor connections needed ■ Convenient and precise positioning using a 6-axis industrial robot ■ Ready for trial in one day (in case of rental) ■ Essentially maintenance-free thanks to a frictionless drive unit ■ No pressure vessel required ■ Safe rebound due to the quick pullback of the head acceleration bar For more details, please contact us or download the catalog.

  • Testing Equipment and Devices
  • Test Systems

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Electronic Drive Test System "E-Liner PED HEAD"

Electronic Drive Test System "E-Liner PED HEAD"

It can meet the speed condition of accuracy +/-0.1 km/h without a preliminary test.

The FronTone E-Liner PED HEAD is an electronic drive test system for mobile vehicle safety testing performance. It can meet test speed conditions with an accuracy of +/-0.1 km/h without preliminary testing. <Features> ■ No test matrix required ■ No preliminary testing needed ■ Comfortable testing method ■ Easy-to-use operating interface ■ Essentially maintenance-free thanks to a frictionless drive unit ■ Portable ■ Ideal for indoor installation (0℃ to +60℃) ■ Continuously adjustable test speeds from 1 to 42.0 km/h ■ Highest accuracy during dynamic pedestrian protection tests (airbag tests, active hood tests) ■ Trigger accuracy <1ms ■ No pressure vessel required For more details, please contact us or download the catalog.

  • Testing Equipment and Devices
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Test System "E-Liner UNIVERSAL M"

Test System "E-Liner UNIVERSAL M"

E-Liner: The world's first electronic drive test system for mobile vehicle performance testing.

Only Frontone's E-Liner system can meet the test speed condition of accuracy +/-0.1 km/h without a preliminary test.

  • Testing Equipment and Devices
  • Test Systems

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Reliability Testing System

Reliability Testing System

Semiconductor Test Architects

Semicondcutor Reliability Test, Advanced Device Reliability, Power Device Reliability

  • Other semiconductors
  • Test Systems

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ITU-T P.1140 eCall Voice Quality Test Narrowband

ITU-T P.1140 eCall Voice Quality Test Narrowband

ITU-T P.1140 is a voice quality testing system for emergency call (eCall) devices (narrowband).

In the event of a car accident, the emergency call system will automatically dial the emergency call center hands-free. To ensure optimal call quality between the car and the response service, the ITU-T specifies a comprehensive testing method for hands-free emergency calls initiated from the car in ITU-T Recommendation P.1140. HEAD acoustics has commercialized tests for narrowband (NB) calls as ACQUA standard P.1140-NB. The ACQUA standard encompasses the narrowband part of ITU-T Recommendation P.1140 (07/2022) and refers to UNECE AECS-02-02-Rev.8, which includes ITU-T Recommendation P.1140 (06/2015).

  • Other measurement, recording and measuring instruments
  • Acoustic Analysis
  • Test Systems

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NI (National Instruments) "5G Test Solution"

NI (National Instruments) "5G Test Solution"

Accelerating the testing of 5G devices. Capable of building a highly reliable testing environment for millimeter wave frequency tests and OTA tests.

With the full-scale launch of communication services utilizing 5G, the development of 5G-compatible devices requires conducting a large number of tests in a short period of time. Our company offers NI's "5G Test Solutions," contributing to the establishment of a high-efficiency and high-reliability testing environment. [Examples of Solutions] ■ "5G mmWave Test System" Combining signal transmission and reception modules compatible with millimeter waves and switches, we build test systems tailored to your needs. It enables high-speed generation and analysis of 5G signals. ■ "OTA Validation Reference System" A test system that leverages the high-speed bus of PXI to accelerate OTA testing. We have a track record of completing tests approximately six times faster than before. ■ Utilization of Developed Software We offer a variety of pre-developed measurement and control software, as well as data analysis software. This significantly shortens the development period for the testing environment. ■ Hardware We provide customizable platform-based test solutions from the PXI series. This allows for smooth integration of multiple testing equipment environments, making it easy to test complex 5G environments.

  • others
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NAVI Coordinated Control Test System NAVI Turn Table

NAVI Coordinated Control Test System NAVI Turn Table

You can obtain output data from the gyro sensor installed in the NAVI system!

The "NAVI Turn Table" is a test system for cooperative control that utilizes navigation information, which is increasingly being adopted to improve fuel efficiency. By inputting the calculated yaw and pitch angles of the NAVI installation position based on customer simulations, it is possible to simulate the yawing and pitching behavior of the NAVI system in real-time during actual driving. Output data from the gyro sensor installed within the NAVI system can be obtained, allowing for the creation of a virtual test environment for NAVI cooperative control. 【Features】 ■ Ability to create a virtual test environment for the development of NAVI cooperative control ■ Reproduces the yawing and pitching behavior of the NAVI unit while driving, and acquires gyro sensor output data from within the NAVI in real-time ■ Yaw range (standard) = ±360 [deg], maximum angular velocity = 30 [deg/s] ■ Pitch range (standard) = ±15 [deg], maximum angular velocity = 30 [deg/s] ■ Compatible with 1DIN/2DIN in-dash type NAVIs *For more details, please refer to the PDF materials or feel free to contact us.

  • Company：AZAPA
  • Price：Other
  • Instrumentation and Control Systems
  • Other information systems
  • Test Systems

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Laser Diode Test System

Laser Diode Test System

We can perform I-L/I-V measurements, FFP (Far Field Pattern) measurements, and polarization ratio measurements.

Introducing the "Laser Diode Test System" handled by Fukuhara System. This product is capable of performing I-L/I-V measurements, spectrum measurements, FFP (Far Field Pattern) measurements, polarization ratio measurements, and more. The operation is interactive with a menu-based system. Additionally, the display section features a 5.6-inch LCD. 【The following measurements are possible】 (1) I-L/I-V measurement (2) FFP (Far Field Pattern) measurement (3) Spectrum measurement *Requires an optical spectrum analyzer (4) Polarization ratio measurement (5) Temperature dependence evaluation for (1) to (4) (6) Light output/driving current dependence evaluation for (2), (3), and (4) *For more details, please refer to the PDF document or feel free to contact us.

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Laser Diode Bar Test System

Laser Diode Bar Test System

For I-L/I-V measurements and wavelength measurements! It automatically measures the LD chip on the bar with simple positioning operations.

We would like to introduce the "Laser Diode Bar Test System" handled by Fukuhara System. With simple positioning operations, it is possible to automatically measure the LD chip on the bar. The display section consists of a 7-segment LED and an LCD, and the operation is interactive through a menu system. For further details, please feel free to contact us. 【The following measurements necessary for the characterization of Laser Diodes (LD) are possible】 (1) I-L/I-V measurement (2) Wavelength measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Light output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
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HTOL system

HTOL system

Supports various levels of integration! Saves customers' costs and time with efficient solutions.

To effectively conduct HTOL testing, it is desirable to test a large number of units simultaneously. This requires a system capable of delivering test signals to multiple channels using high-power signal sources that are employed to overcome significant splitter losses. Our company owns a number of high-power amplifiers and can provide customers with an "HTOL System." We support various levels of integration, from components to complete integrated rack systems, and by proposing efficient solutions, we help customers save on costs and time. 【Features】 - Capable of supporting various levels of integration from components to complete integrated rack systems - A lineup of products that can be addressed with off-the-shelf solutions - Proposing efficient solutions to save on costs and time - Providing strong support *For more details, please refer to the PDF materials or feel free to contact us.

  • Other electronic parts
  • Test Systems

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Helium Leak Test System | HES-2000 series

Helium Leak Test System | HES-2000 series

"Helium Leak Test System" optimal for high-precision and high-pressure measurements, featuring two measurement methods: vacuum chamber method and atmospheric pressure chamber method / gas leak.

By providing a helium inspection device designed as a dedicated machine as a highly flexible standard system, we keep costs down. You can choose from two measurement methods: vacuum chamber method and atmospheric pressure chamber method. Standardization of the main unit makes it easier to select specifications compared to fully customized products. We propose a gas recovery unit that suppresses and controls helium gas consumption. It is also possible to combine a blender that allows inspection with diluted helium gas and a pressurization unit for high-pressure measurements. By combining air leak testing with the helium leak test system, we can significantly improve the accuracy of the large leak confirmation process, which puts a burden on the helium detector and is one of the causes of line stoppages. 【Features】 ■ Supports various workpieces and specifications ■ High precision and fast measurement due to chamber design for workpiece shapes ■ Compatible with diluted helium gas ■ Helium gas recovery pressurization unit available (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Leak Testing Equipment
  • Gas recovery/treatment equipment
  • Gas Detection Sensor
  • Test Systems

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Bombing Gloss Finely Leak Test System | MSX-7000

Bombing Gloss Finely Leak Test System | MSX-7000

This is a leak testing device compatible with ultra-small packages measuring 1.0 × 0.8 mm and 1.2 × 1.0 mm.

The "MSX-7000 series" is a leak testing device for sealed package products such as small electronic components, crystal oscillators, MEMS and optical devices, and various sensors. With a new mechanism, it has achieved inspection of sizes as small as 1.0 × 0.8 mm for the first time, and the transport accuracy has improved through position correction using image processing. It can perform both bomb testing and gross/fine leak testing in a single unit. 【Features】 ■ Achieved inspection of sizes as small as 1.0 × 0.8 mm for the first time with a new mechanism ■ Improved transport accuracy through position correction using image processing ■ Enhanced gross leak sensitivity to 8.5×10⁻⁸Pa·m³/s *For more details, please refer to the PDF document or feel free to contact us.

  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices
  • Test Systems

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Bombing Gloss Finely Leak Test System | MSX-7003

Bombing Gloss Finely Leak Test System | MSX-7003

Fully automatic airtight inspection device for relatively large electronic devices such as LEDs, optical devices, high-frequency devices, power semiconductors, and IR sensors.

The 【MSX-7003 series】 is a leak testing device designed for relatively large electronic devices ranging from medium to large sizes. It is capable of performing leak tests on electronic devices smaller than 10 mm square, such as LEDs, optical devices, high-frequency devices, power semiconductors, IR sensors, gyro sensors, angular velocity sensors, and electrolytic capacitors. The 【MSX-7003 series】 is the top model in the series and is a composite leak testing device that automatically performs three processes: - Helium bombing - Gross leak test - Fine leak test It is also compatible with inline applications (the pass line height is 940 mm). Additionally, we offer a lineup tailored to customer needs, including: - The 【MSZ-7003 series】, designed solely for gross leak testing - The 【MHX-7003 series】, which performs bombing and fine leak testing - The 【MSH-7003 series】, which does not have a bombing device You can watch a video of the actual device in the YouTube link below.

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  • Leak Testing Equipment
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices
  • Test Systems

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[Development Case] RFID Test System - Solving UHF Band Null Points -

[Development Case] RFID Test System - Solving UHF Band Null Points -

[Development Case] NI Application Contest 2007 Excellence Award RFID Testing that Continues to Evolve by Sharing LabVIEW with Customers

RFID technology has rapidly spread not only in applications such as transportation cards and electronic money IC cards but also in areas like distribution and traceability. However, I heard from a representative of Company T that there is a challenge in finding systems to develop and measure this RFID technology.

  • IC tag
  • Analytical Equipment and Devices
  • Testing Equipment and Devices
  • Test Systems

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AR/VR/MR Glass Performance Testing System

AR/VR/MR Glass Performance Testing System

AR/VR/MR Glass Performance Testing System

Non-contact measurement of how the position of the virtual world changes based on the position of the robot. Consistent testing of tracking and latency is possible.

  • Optical Measuring Instruments
  • Test Systems

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Function Test System

Function Test System

Function Test System

We develop and manufacture customer-specific function testers using a PC or microcontroller. The system consists of three functions: control (power supply control, work state control), measurement (measurement and judgment of voltage, current, frequency, etc.), and communication (command transmission, response checking). Additionally, the editing function allows for quick responses to specification and design changes. Debugging has also become easier with standard software.

  • Testing Equipment and Devices
  • Test Systems

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Fogging Test System

Fogging Test System

Horizon Fog Testing System compatible with various methods in the automotive industry.

The "Horizon Fog Testing System" by ThermoFisher Scientific reproduces the phenomenon where volatile components emitted from automotive interior materials (rubber, plastic, textiles) and additives or adhesives used in building interior materials adhere to glass surfaces due to temperature differences, obstructing visibility. By measuring the amount of volatile substances and the reflection angles caused by their adhesion to glass, it is possible to evaluate interior materials.

  • Testing Equipment and Devices
  • Test Systems

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High-Speed Pulse I-L Test System SEC-PL4000-800

High-Speed Pulse I-L Test System SEC-PL4000-800

High reproducibility and stability

This is a device for measuring I-L and I-Vf characteristics by driving a laser diode with high-speed pulsed operation.

  • Other measurement, recording and measuring instruments
  • Test Systems

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Optimized DC Test System

Optimized DC Test System

Optimized DC Test System

Since the release of Japan's first linear tester in 1974, Shibasoku has consistently supplied IC testers that meet the needs of the times to semiconductor manufacturers both domestically and internationally. Today, it boasts a rich product lineup, including the WL25/WL27, which holds the top domestic market share for high-voltage and high-current devices such as linear ICs and automotive applications, as well as the S230, a PDP driver IC tester with the number one global market share. The WL05VZ, released in April 2007, is an innovative optimized DC test system developed by incorporating the latest hardware and software technologies that Shibasoku has cultivated over many years. Shibasoku aims to enter the volume zone IC market with the WL05VZ and achieve the goal of securing the number one market share in the world.

  • Tester
  • Semiconductor inspection/test equipment
  • Voltage Meter
  • Test Systems

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