Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 12, 2026～Sep 08, 2026
This ranking is based on the number of page views on our site.
61～90 item / All 120 items
AR/VR/MR Glass Performance Testing System
Non-contact measurement of how the position of the virtual world changes based on the position of the robot. Consistent testing of tracking and latency is possible.
High-precision and automated wafer-level evaluation of photonic chips!
We would like to introduce our "Optoelectronic Wafer Test System." This is an optoelectronic integrated wafer test system designed for the evaluation of silicon photonics and photonic integrated circuit (PIC) devices. By integrating optical measurements and electrical measurements, it enables high-precision and automated wafer-level evaluation of photonic chips. 【Features】 ■ High-precision measurement ■ Automated testing function ■ Flexible testing environment ■ Gratings and edge coupling compatible with different mode field diameters ■ Single die test support *For more details, please download the PDF or feel free to contact us.
Function Test System
We develop and manufacture customer-specific function testers using a PC or microcontroller. The system consists of three functions: control (power supply control, work state control), measurement (measurement and judgment of voltage, current, frequency, etc.), and communication (command transmission, response checking). Additionally, the editing function allows for quick responses to specification and design changes. Debugging has also become easier with standard software.
Horizon Fog Testing System compatible with various methods in the automotive industry.
The "Horizon Fog Testing System" by ThermoFisher Scientific reproduces the phenomenon where volatile components emitted from automotive interior materials (rubber, plastic, textiles) and additives or adhesives used in building interior materials adhere to glass surfaces due to temperature differences, obstructing visibility. By measuring the amount of volatile substances and the reflection angles caused by their adhesion to glass, it is possible to evaluate interior materials.
High reproducibility and stability
This is a device for measuring I-L and I-Vf characteristics by driving a laser diode with high-speed pulsed operation.
This is the latest version of the tester that has been introduced around the world for many years!
The ATS-5000 is a configurable and affordable solution that provides the necessary tests without excess or deficiency. You have the freedom to select new equipment and software or integrate them into your own solutions, and it also supports legacy systems. Even if you are considering replacing a legacy system, we offer a solution based on industry-standard open architecture. 【Features】 ■ Saves time and costs: Complete turnkey solution ■ Easy migration: Utilizes existing TPS from legacy systems ■ Efficient: Streamlined footprint maximizes space at sites and factories ■ Flexible: Based on industry-standard instruments like PXI ■ Support: Dedicated engineering, factory, and field support staff available *For more details, please download the PDF or feel free to contact us.
Optimized DC Test System
Since the release of Japan's first linear tester in 1974, Shibasoku has consistently supplied IC testers that meet the needs of the times to semiconductor manufacturers both domestically and internationally. Today, it boasts a rich product lineup, including the WL25/WL27, which holds the top domestic market share for high-voltage and high-current devices such as linear ICs and automotive applications, as well as the S230, a PDP driver IC tester with the number one global market share. The WL05VZ, released in April 2007, is an innovative optimized DC test system developed by incorporating the latest hardware and software technologies that Shibasoku has cultivated over many years. Shibasoku aims to enter the volume zone IC market with the WL05VZ and achieve the goal of securing the number one market share in the world.
Industry-first: Achieving dynamic characteristic testing of high current in wafer testing.
In power semiconductor wafer testing, not only static characteristics but also dynamic characteristic testing can be achieved at both room temperature and high temperature.
Low heat electromotive version! Ideal for applications that require fewer channels and poles!
The "PXI Low-Density Multiplexer Module" is ideal for applications that require a small number of channels and poles. The switch module utilizing high-quality ruthenium reed relays has a maximum rating of 150V at 1.2A and a maximum power rating of 20W, while the switch module using high-quality mechanical relays has a maximum rating of 300V at 2A and a maximum power rating of 60W. The low thermal offset multiplexer is perfect for applications that connect sensors such as thermocouples. 【Features】 ■ Bank and pole numbers set at factory shipment ■ Low thermal electromotive force version ■ Ruthenium reed relay or mechanical relay ■ Power & Sense MUX for power distribution and regulation circuits ■ Simple and quick detection of relay anomalies on LXI or PXI switch systems For more details, please contact us.
A multiplexer ideal for switching voltages up to 300V.
The "PXI High-Density Multiplexer Module" offers products with various combinations of channel counts and pole counts. It includes relays for isolation that can be used to bundle multiple channels together to achieve larger configurations. It is compatible with Pickering's eBIRST switching system test tool, allowing for rapid identification of relay anomalies on LXI and PXI switch systems. 【Features】 ■ Up to 198 channels, 1 to 20 banks, and 1 to 32 poles ■ Solutions for reed relays, mechanical relays, and semiconductor relays ■ Option for screened relays ■ Large-scale BRIC multiplexer ideal for multipole applications ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments For more details, please contact us.
Supports a maximum of 10A/40A switching current! High-power multiplexer module.
The "PXI High-Power Multiplexer Module" includes products that use mechanical relays and semiconductor relays capable of handling switching currents up to 40A. Each module has one input/output terminal and multiple selectable input/output terminals for one or more channels of the multiplexer. It is compatible with the eBIRST switching system test tool, allowing for the rapid detection of relay anomalies on LXI and PXI switch systems. 【Features】 ■ Configurations from 3:1 to 48:1, with 1 to 8 banks, available in single-pole or double-pole versions ■ The switching current for the mechanical relay version is up to 10A ■ The switching current for the semiconductor relay version is up to 40A ■ Power & Sense MUX for power distribution and regulation circuits ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments For more details, please contact us.
Usable for 1000V voltage applications! High voltage multiplexer module.
The "PXI High Voltage Multiplexer Module" is a high voltage module that can be used for switching applications handling voltages up to 1000V. The 40-320 module operates at a maximum voltage of 13mA and is ideal for hot/cold switching applications up to 0.5A. The 40-331 module has a current rating of 5A at 1000V. The high voltage relay module is designed to withstand high common mode voltages. 【Features】 ■ Hot switching up to 750VDC or 750VAC peak ■ Cold switching up to 1000VDC or 1000VAC peak ■ Mechanical relay version available with a maximum opening and closing current of up to 5A for hot/cold switching ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments ■ Compatible with eBIRST switching system test tool For more details, please contact us.
Up to 48 channels! A module with a built-in switchable resistor.
The "PXI Selectable Resistor Module" is manufactured by Pickering and is a cost-effective product tailored for applications with limited required resistance values. It is ideal for adjusting resistance values and emulating sensors that operate at specified values. It incorporates selectable resistors that can be used for necessary offsets and voltage division purposes. 【Features】 ■ Built-in selectable resistors for offset and voltage division purposes ■ User-specified resistors (standard products are not implemented) ■ Resistors specified and implemented at factory shipment ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.
A module for applications requiring a minimum decomposition resistance of 1Ω and a maximum rated power of 15W.
The "PXI Programmable Load Resistor Module" is manufactured by Pickering and is a solution designed for applications requiring a rating of up to 15W in a single PXI slot. By combining two channels, it can be used as a high-power potentiometer. Cables for connecting the module are also provided. Pickering products come with a 3-year warranty. 【Features】 ■ Selectable from a specified range of resistance values via software ■ Resolution of at least 1Ω, with a resistance range of 10Ω to 2.56kΩ ■ Bypassable offset resistor for applications requiring low resistance values ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.
An in-circuit test system characterized by easy operability through a GUI.
The Agilent Medalist i3070 is the latest in-circuit test system that combines the high flexibility of the widely used 3070 series with the advanced graphical user interface of the i5000. It is equipped with new features that enhance test throughput and test coverage, enabling further efficiency in board inspection. 【Features】 ○ Easy operability through GUI ○ High test throughput ○ Highly flexible system architecture ○ Compatibility with existing systems For more details, please contact us or download the catalog.
![Laser Diode Test System [LD2920TB]](https://image.mono.ipros.com/public/product/image/929/2000619945/IPROS86506555519922643512.png?w=280&h=280)
Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state.
This is an LD test system that automatically and rapidly measures and sorts the electrical and optical characteristics of long-wavelength laser diodes in bare chip condition. <Features> ■ Fully automated transport from supply to measurement and classification ■ Easy monitoring of operating conditions with up to 13 cameras ■ Capable of measuring at any temperature from +20°C to -100°C ■ Simultaneous IL measurement of FRONT light and BACK light. For more details, please download the PDF or feel free to contact us.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
Laversab, as an audited and approved subcontractor of the U.S. Department of Defense, supplies extremely robust military-grade products to the U.S. Air Force, U.S. Navy, and other government agencies. Our customers include major aircraft manufacturers, airlines, and certified repair facilities worldwide, including the United States. 【Product Lineup】 ■ Multi-functional Avionics Radio System ARTS7000 - WiFi compatible - ■ Pitot Static Testers - Model 6150, Model 6200, Model 6250, Model 6270, Model 6300, Model 6300L, Model 6600, Model 6600, Model 6600-NG, Model 6300-M3, Model 6300-M4, Model 6600-M4 ■ Laboratory Models - 6500 / 6500-HA, Model 6580 / 6580HA *For more details, please refer to the PDF document or feel free to contact us.
By using it in combination with our electronic load products, the parameter testing of solar cells can be completed automatically. Multiple units can be connected, and long-duration automated testing is possible.
Measurable parameters ◆ Short circuit current ◆ Open circuit voltage ◆ Peak power ◆ Voltage at peak power point ◆ Current at peak power point ◆ Resistance at peak power point ◆ Fill factor *For details, please contact us.*
Even without a preliminary test, it can meet the test speed conditions of hundreds of km/h.
The FronTone E-Liner system is a mobile system powered by electricity for performance testing in accordance with FMVSS 226 for release mitigation tests. <Features> ■ The E-Liner EMIT acceleration device is driven by an electronic linear motor, significantly simplifying handling and testing performance. ■ The linear drive is not affected by room temperature or humidity, eliminating the need for a test matrix. Preliminary tests are also a thing of the past for the same reason. ■ Speed can be continuously adjusted from 1 to 27 km/h. ■ With automatic return, the impactor mounting device returns to the starting position immediately after launch. Therefore, the mounting position is outside the rebound area of the release mitigation thread. ■ Another major advantage is that the E-Liner testing system accelerates smoothly without any jerking force. For more details, please contact us or download the catalog.
Semiconductor Test Architects
Semiconductor Parametric Instrument, Parametric Switch Matrix, Integrated Test System
Easy expansion of the tester itself! Strong support for mass production of high-density multi-pin devices.
The "V2048" is a semiconductor tester capable of conducting four simultaneous tests. With its reasonable pricing, it is easy to expand the tester itself. With high fault tolerance and a clear user interface, it helps facilitate efficient mass production. 【Features】 ■ Capable of mounting a 60A high current power supply (HCDPS) ■ Simultaneous measurement of 4 DUTs ■ Equipped with function features that support configuration/information reading via JTAG and other methods *For more details, please refer to the PDF materials or feel free to contact us.
Fully automatic camera testing is now possible with just one click!
The "iQ-Automator Solution" automatically evaluates the image quality of mobile phone cameras by combining the iQ-Automator software and the iQ-Robot, allowing for more efficient and effective feedback. The iQ-Automator Solution is centered around the advanced iQ-Automator software. By using this software, users can design custom workflows and automatically adjust the positioning of the test camera to fit many of Image Engineering's lighting and measurement devices. Additionally, an API for electric devices (iQ-Drive API) is optionally provided for easy integration into users' proprietary control software. *Currently, the iQ-Automator Solution is no longer available. Image Engineering is collaborating with Sofica in Finland as a strategic partnership to develop a new automation testing solution. For inquiries regarding automation testing solutions, please contact us through the inquiry form below.*
Simple positioning operation! It can automatically measure within a specified area on the wafer.
We would like to introduce the "VCSEL Wafer Test System" handled by Fukuhara System. This product can automatically measure the specified area on the wafer with simple positioning operations. It can be utilized for I-L/I-V measurements, spectrum measurements, temperature dependence evaluations of each measurement, and evaluations of optical output/driving current dependence in spectrum measurements. 【The following measurements necessary for VCSEL characteristic evaluation are possible】 (1) I-L/I-V measurement (2) Spectrum measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Optical output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.
Portable compact HILS! Achieves easy operation and evaluation.
The "μLC Test System" is a very compact HILS test system, palm-sized, designed for simple verification in control device development. It addresses challenges such as "HILS is very expensive and difficult to handle" and "I don't need a large-scale HILS; I want to perform simple simulations at my desk," allowing for a simple setup. By simulating and outputting the behavior of a vehicle's engine function or any unit, it enables a simplified simulation that replicates the actual device. Furthermore, a user-friendly interface allows for easy operation and evaluation. 【Features】 ■ Compact size and easy setup ■ User-friendly interface ■ Integration of simulations for common automotive interfaces in one unit ■ Highly versatile I/O ports ■ Control via scripts or Simulink is possible *For more details, please refer to the PDF materials or feel free to contact us.
A wide variety of package burn-in test systems are available!
The "Test Burn-In Tester" inherits Ando Electric's burn-in testing and is a package burn-in test system that realizes diverse testing conditions and functions through upgrades tailored to new customer needs. We offer a lineup that includes the "AF8652D6," which provides high power with added Mask-ROM testing capabilities, as well as the "AF8862C7" with a 10MHz, 60-slot specification, and the "DM8827," which allows for individual control operation in 4 zones. 【Lineup】 ■AF8652D6 ■AF8862C7 ■DM8827/DM8857 ■AF8651A5/AF8651A7/AF8655C7 ■AF8610E6 *You can download the English version of the catalog. *For more details, please refer to the PDF materials or feel free to contact us.
Equipped with highly practical and convenient features! We cater to a wide range of needs from jig manufacturing to measurement systems.
Fine Tech Co., Ltd. handles the "Function Test System." We cater to a wide range of needs, from jig manufacturing to measurement systems. You can freely build systems tailored to your applications. Additionally, with remote support, we can promptly respond to issues such as recovery from NG (no good) and urgent specification changes. 【Highly Practical and Convenient Features】 ■ Remote Support ■ Log Analysis Tool ■ Notification Function *For more details, please refer to the PDF materials or feel free to contact us.
Introducing our lineup of fully automatic machines, dedicated machines, and tabletop types! We present a specialized airtight inspection device for small electronic components.
The "MS series" is a leak test system for small electronic components that require airtightness, including: - Crystal devices - Ceramic oscillators - Optical devices - Power semiconductors - CAN devices - Laser diodes - Capacitors Leak testing of sealed products may involve both gross leak and fine leak inspections, depending on product specifications and characteristics. We offer a lineup that includes fully automatic machines capable of performing the entire process in one unit, custom-built dedicated machines, and convenient tabletop types for sampling inspections. 【Lineup (excerpt)】 <Fully Automatic Devices> ■ Gross Leak Test System - MSZ-6200 - MS-6086 ■ Bombing Gross and Fine Leak Test System - MSX-6110 - MSX-6200 - MSX-7000 *For more details, please refer to the PDF document or feel free to contact us.
This is a composite airtightness testing device that completes filling by bombing, gross leak detection through pressure change confirmation, and fine leak detection using mass spectrometry, all in one unit.
The "MSX-0101 series" is a compact leak testing device specifically designed for electronic components such as MEMS, crystal devices, and SMDs. It is fully equipped with helium filling, gross leak testing, and fine leak testing in a single system. By managing the filling time and waiting time, it allows for proper gross and fine leak testing. 【Features】 ■ Ideal for leak testing of electronic components such as MEMS and SMDs ■ Quantifies gross and fine leak amounts while managing filling time and waiting time ■ Capable of performing both gross leak testing and fine leak testing with one device ■ Enables highly accurate fine leak measurement by appropriately setting bonding conditions and gross leak conditions *For more details, please refer to the PDF document or feel free to contact us.
High-sensitivity leak testing for small electronic components! We offer solutions down to ultra-fine leaks [patented technology].
The "MUH-0100 series" is a leak testing device specifically designed for ultra-micro leak measurement that employs the "capsule accumulation method." Our company has developed a high-sensitivity helium leak detection technology called the "capsule accumulation method" for measuring ultra-micro leaks. MEMS components such as angular velocity sensors and infrared image sensors, as well as small electronic components, need to maintain their sealing properties over long periods, requiring high airtightness. 【Capsule Accumulation Method Features】 ■ Capable of measuring up to 4×10⁻¹⁵ Pa·m³/s (He) ■ Significantly reduces background noise ■ Capable of detecting ultra-micro helium leaks ■ Reduces the influence of gases other than helium, which can be sources of error ■ Eliminates the need for heaters or ultra-low temperature pumps, with startup maintenance times comparable to standard helium leak detectors ■ Commercially available standard leaks can be used for calibrating helium accumulation amounts *For more details, please refer to the PDF document or feel free to contact us.
