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Test Systems Product List and Ranking from 38 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Test Systems Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. フクダ Tokyo//Testing, Analysis and Measurement
  2. Semi Next 本社、三重事業所 Tokyo//Electronic Components and Semiconductors
  3. ヘッドアコースティクスジャパン Kanagawa//Testing, Analysis and Measurement
  4. 4 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社 Tokyo//Testing, Analysis and Measurement
  5. 5 ディ・アイジャパン Tokyo//Electronic Components and Semiconductors
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Test Systems Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Tabletop Gross Leak Test System | MSA-0101 series フクダ
  2. sCT9002 Silicon Photonics Wafer Test System Semi Next 本社、三重事業所
  3. Druck 『ADTS 405 MkII』 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社　＆　GEエナジー・ジャパン株式会社
  4. Test Burn-In Tester ディ・アイジャパン
  5. 4 Automatic Glove Leak Test System "AGLTS" ジャパンマシナリー

Test Systems Product List

31～45 item / All 93 items

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Wireless Test System 'Model AMS-8700'

Wireless Test System 'Model AMS-8700'

Complete RF environment simulation! Introducing the MIMO OVER-THE-AIR (OTA) test system!

The "Model AMS-8700" is a wireless test system designed to measure the radiation performance of wireless devices in a highly reproducible simulated multipath environment. It uses a dual-polarization antenna array to connect communication test equipment for a specific technology via a spatial channel emulator within an anechoic chamber. The anechoic chamber isolates the test environment from interference and reflections that exist in the real-world environment, eliminating unwanted reflections in the testing environment. 【Features】 ■ Supports LTE and 802.11n MIMO testing ■ Receive diversity evaluation ■ Complete RF environment simulation ■ Supports single cluster, multi-cluster, and uniform models ■ Supports various AoA, Doppler, and delay spread *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Testing Equipment and Devices
  • Other information systems

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Wireless Test System 'MODEL AMS-7000'

Wireless Test System 'MODEL AMS-7000'

Accelerating exam time! Introduction of the Reverberation Chamber OVER-THE-AIR (OTA) test system.

The "MODEL AMS-7000" is a wireless test system that performs accurate and highly reproducible SISO TRP, TIS, and throughput measurements. It is controlled by EMQuest, an antenna measurement automation software, based on the SMART series and reverberation chamber technology that we have developed over many years. The overmode environment of the reverberation chamber means that precise placement of the DUT is not necessary for reproducibility and accurate measurements, resulting in reduced setup time. 【Features】 ■ Supports SISO TRP, TIS, and throughput measurements ■ Supports MIMO throughput measurements ■ Direct correlation with CATL labs ■ Accelerated testing time ■ Compatible with EMQuest antenna measurement software ■ Standalone and portable with a cart *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Testing Equipment and Devices

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ESD Test System Model 58154

ESD Test System Model 58154

PXI/PCI tester ideal for electrostatic pulse testing of semiconductors and electronic components.

The 58154 is a PXI/PCI control module that simulates electrostatic discharge pulses during testing of semiconductor devices and electronic devices. It complies with ESD STM5.1-2001 Human Body Model (HBM) and ESD STM5.2-1999 Machine Model (MM), and can also be applied to domestic standards such as JEDEC and JEITA ED-4701. The system can be programmed and controlled via software, providing various functions necessary for testing. For example, it offers programmable and flexible features such as wafer sampling tests, ESD models, ESD pulse polarity, intervals between ESD pulses in a sequence, and automatic test functions. The 58154 consists of a control module and an external pulse output box. The high-voltage power supply unit (PSU) and pulse generation circuit produce pulse waveforms compliant with ESD STM. When used with other testers and probers, it serves as an optimal system for a total LED and laser diode testing solution on production lines.

  • Testing Equipment and Devices

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SoC/Analog Test System Model 3650-EX

SoC/Analog Test System Model 3650-EX

A cost-effective SoC/analog test system.

The 3650-EX is a tester specially designed to provide cost-effective solutions for fabless companies, IDMs, and test houses, featuring high throughput and extensive multi-site testing capabilities. With high functionality, precision, powerful software tools, and high reliability, the 3650-EX is an ideal tester for testing consumer devices, high-performance microcontrollers, and SoC devices.

  • Other inspection equipment and devices

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High-Performance SoC/Analog Test System Model 3680

High-Performance SoC/Analog Test System Model 3680

High-performance SoC/Analog test system enables excellent multimedia audio/video chip testing.

Supports the implementation of 24 digital and analog measurement boards (flexible combinations) Maximum data rate of 150 Mbps Supports up to 512 parallel tests Up to 2048 digital I/O pins Up to 256 MW pattern memory (512 MW option) Up to 64-channel PMU (high-precision DC measurement) Timing measurement/DC measurement (PPMU)/frequency measurement equipped on all pins Maximum 8G/scan (16G option) Timing edge accuracy (EPA): ±150ps Up to 128-channel DPS (device power supply) HDADDA2 (digitizer/arbitrary waveform generator) option High power HCDPS analog option High-frequency measurement HDAVO option Multi-channel HDVI, HDRF analog options* Direct probing system* OS: Microsoft Windows 10 Programming language: C#.NET and GUI Operating system: CRISPro Program support from other testers Test board support for other testers Standard specification STDF support All functions implemented in the test head Space-saving, air-cooled system

  • Semiconductor inspection/test equipment

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Embedded Software Automated Testing System QualityCommander

Embedded Software Automated Testing System QualityCommander

Quality Commander, an embedded software test automation system that automatically operates touch panels and supports smartphone testing.

Quality Commander is a system that automates the testing of embedded software for mobile phones, car navigation systems, touch panels, and digital appliances, which was traditionally done manually. It automates manual operations through reliable robotic actions and accurate image judgments using cameras. Quality Commander features user-friendly operability from the perspective of test personnel, allowing even those without programming experience to easily create test scenarios. By eliminating waste in testing tasks through automated evaluation and preventing test omissions, it achieves "quality improvement," "cost reduction," and "time savings."

  • Testing Equipment and Devices
  • Embedded applications for mobile phones and PDAs
  • Development support tools (ICE, emulators, debuggers, etc.)

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Modular Surge Test System 'PSURGE 30.2'

Modular Surge Test System 'PSURGE 30.2'

Designed to generate various surge pulses! Enables efficient setup and operation.

The "PSURGE 30.2" is a modular surge testing system designed to perform high-energy surge tests. The four included impulse modules can be easily exchanged, allowing this product to be used in various applications. The type of pulse module is recognized by the system software. Additionally, the built-in microprocessor control unit functions as a user interface and controls all internal functions. 【Features】 ■ Modular system supporting up to 4 pulse formats ■ Pulse voltage up to 30kV, pulse current up to 30kA ■ Automatic polarity switching ■ Monitoring of peak voltage and peak current ■ Integrated large test cabin ■ Remote control option * You can download the German version of the catalog. * For more details, please feel free to contact us.

  • Testing Equipment and Devices

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In-Circuit Test System "i1000D"

In-Circuit Test System "i1000D"

You can easily conduct tests on digital devices at a low cost.

By using the Agilent Medalist i1000D In-Circuit Tester (ICT), you can easily and affordably test digital devices, achieving groundbreaking digital testing. 【Features】 ○ The Test Developer GUI is user-friendly, allowing even inexperienced users to create fixtures and programs in just a few days. ○ The graphical interface makes digital debugging simple. ○ Comes with the VTEP v2.0 Powered test suite. ○ Equipped with boundary scan test functionality. For more details, please contact us or download the catalog.

  • Circuit Board Inspection Equipment

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Laser Diode Test System [LD342L/S-LT/NT]

Laser Diode Test System [LD342L/S-LT/NT]

This is a desktop LD test system for research and development purposes that can semi-automatically measure the characteristics of laser diodes.

This is a desktop-type LD test system for research purposes. <Features> ■ Dedicated fixtures can be prepared according to the shape of the LD. ■ Measurement items (Front LIV, λ characteristics, FFP H, V) can be automatically measured for one element under specified temperature conditions. ■ There are LD342L for long wavelengths (1200-1650nm) and LD342S for short wavelengths (400-980nm). ■ Options are available for low temperature (from -40°C to +100°C) LT and room temperature (from 20°C to +100°C) NT. ■ The adoption of a focusing lens system eliminates the need for wavelength measurement alignment.

  • Analytical Equipment and Devices

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Laser Diode Test System [LD2920MTB]

Laser Diode Test System [LD2920MTB]

Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state, allowing for high-speed automatic measurement.

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (optical communication) laser diode bare chips at high speed. <Features> ■ LD chips adhered to a blue sheet are supplied and automatically transported at high speed from gripping ring state to measurement and classification. ■ Measurement items (front/back LIV, λ characteristics) can be measured as standard items under two temperature environments. ■ Measurement sorting can be performed at any temperature from -40°C to +95°C. ■ Simultaneous IL measurement of FRONT light and BACK light is possible. ■ The SH gauging method is adopted for chip positioning. ■ The use of a focusing lens system has eliminated the alignment time for wavelength measurement. ■ Up to 13 cameras monitor the presence and condition of LD chips at each position, making it easy to understand operating conditions and adjust various parts. *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices

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Head Impact Test System "E-Liner FMH NG"

Head Impact Test System "E-Liner FMH NG"

It can meet a speed accuracy of +/-0.1 km/h without a preliminary test!

The FronTone E-Liner FMH NG is a head impact system for electronically driven vehicle interiors. <Features> ■ Continuously adjustable up to a test speed of 24.5 km/h ■ Accurate targeting through non-forceful acceleration ■ No test matrix required ■ No preliminary testing required ■ No floor connections needed ■ Convenient and precise positioning using a 6-axis industrial robot ■ Ready for trial in one day (in case of rental) ■ Essentially maintenance-free thanks to a frictionless drive unit ■ No pressure vessel required ■ Safe rebound due to the quick pullback of the head acceleration bar For more details, please contact us or download the catalog.

  • Testing Equipment and Devices

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Electronic Drive Test System "E-Liner PED HEAD"

Electronic Drive Test System "E-Liner PED HEAD"

It can meet the speed condition of accuracy +/-0.1 km/h without a preliminary test.

The FronTone E-Liner PED HEAD is an electronic drive test system for mobile vehicle safety testing performance. It can meet test speed conditions with an accuracy of +/-0.1 km/h without preliminary testing. <Features> ■ No test matrix required ■ No preliminary testing needed ■ Comfortable testing method ■ Easy-to-use operating interface ■ Essentially maintenance-free thanks to a frictionless drive unit ■ Portable ■ Ideal for indoor installation (0℃ to +60℃) ■ Continuously adjustable test speeds from 1 to 42.0 km/h ■ Highest accuracy during dynamic pedestrian protection tests (airbag tests, active hood tests) ■ Trigger accuracy <1ms ■ No pressure vessel required For more details, please contact us or download the catalog.

  • Testing Equipment and Devices

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Test System "E-Liner UNIVERSAL M"

Test System "E-Liner UNIVERSAL M"

E-Liner: The world's first electronic drive test system for mobile vehicle performance testing.

Only Frontone's E-Liner system can meet the test speed condition of accuracy +/-0.1 km/h without a preliminary test.

  • Testing Equipment and Devices

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ITU-T P.1140 eCall Voice Quality Test Narrowband

ITU-T P.1140 eCall Voice Quality Test Narrowband

ITU-T P.1140 is a voice quality testing system for emergency call (eCall) devices (narrowband).

In the event of a car accident, the emergency call system will automatically dial the emergency call center hands-free. To ensure optimal call quality between the car and the response service, the ITU-T specifies a comprehensive testing method for hands-free emergency calls initiated from the car in ITU-T Recommendation P.1140. HEAD acoustics has commercialized tests for narrowband (NB) calls as ACQUA standard P.1140-NB. The ACQUA standard encompasses the narrowband part of ITU-T Recommendation P.1140 (07/2022) and refers to UNECE AECS-02-02-Rev.8, which includes ITU-T Recommendation P.1140 (06/2015).

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