Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.
61～90 item / All 112 items
Industry-first: Achieving dynamic characteristic testing of high current in wafer testing.
In power semiconductor wafer testing, not only static characteristics but also dynamic characteristic testing can be achieved at both room temperature and high temperature.
Low heat electromotive version! Ideal for applications that require fewer channels and poles!
The "PXI Low-Density Multiplexer Module" is ideal for applications that require a small number of channels and poles. The switch module utilizing high-quality ruthenium reed relays has a maximum rating of 150V at 1.2A and a maximum power rating of 20W, while the switch module using high-quality mechanical relays has a maximum rating of 300V at 2A and a maximum power rating of 60W. The low thermal offset multiplexer is perfect for applications that connect sensors such as thermocouples. 【Features】 ■ Bank and pole numbers set at factory shipment ■ Low thermal electromotive force version ■ Ruthenium reed relay or mechanical relay ■ Power & Sense MUX for power distribution and regulation circuits ■ Simple and quick detection of relay anomalies on LXI or PXI switch systems For more details, please contact us.
A multiplexer ideal for switching voltages up to 300V.
The "PXI High-Density Multiplexer Module" offers products with various combinations of channel counts and pole counts. It includes relays for isolation that can be used to bundle multiple channels together to achieve larger configurations. It is compatible with Pickering's eBIRST switching system test tool, allowing for rapid identification of relay anomalies on LXI and PXI switch systems. 【Features】 ■ Up to 198 channels, 1 to 20 banks, and 1 to 32 poles ■ Solutions for reed relays, mechanical relays, and semiconductor relays ■ Option for screened relays ■ Large-scale BRIC multiplexer ideal for multipole applications ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments For more details, please contact us.
Supports a maximum of 10A/40A switching current! High-power multiplexer module.
The "PXI High-Power Multiplexer Module" includes products that use mechanical relays and semiconductor relays capable of handling switching currents up to 40A. Each module has one input/output terminal and multiple selectable input/output terminals for one or more channels of the multiplexer. It is compatible with the eBIRST switching system test tool, allowing for the rapid detection of relay anomalies on LXI and PXI switch systems. 【Features】 ■ Configurations from 3:1 to 48:1, with 1 to 8 banks, available in single-pole or double-pole versions ■ The switching current for the mechanical relay version is up to 10A ■ The switching current for the semiconductor relay version is up to 40A ■ Power & Sense MUX for power distribution and regulation circuits ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments For more details, please contact us.
Usable for 1000V voltage applications! High voltage multiplexer module.
The "PXI High Voltage Multiplexer Module" is a high voltage module that can be used for switching applications handling voltages up to 1000V. The 40-320 module operates at a maximum voltage of 13mA and is ideal for hot/cold switching applications up to 0.5A. The 40-331 module has a current rating of 5A at 1000V. The high voltage relay module is designed to withstand high common mode voltages. 【Features】 ■ Hot switching up to 750VDC or 750VAC peak ■ Cold switching up to 1000VDC or 1000VAC peak ■ Mechanical relay version available with a maximum opening and closing current of up to 5A for hot/cold switching ■ Compatible with VISA and IVI kernels in PXI environments Compatible with IVI and kernels in LXI environments ■ Compatible with eBIRST switching system test tool For more details, please contact us.
Up to 48 channels! A module with a built-in switchable resistor.
The "PXI Selectable Resistor Module" is manufactured by Pickering and is a cost-effective product tailored for applications with limited required resistance values. It is ideal for adjusting resistance values and emulating sensors that operate at specified values. It incorporates selectable resistors that can be used for necessary offsets and voltage division purposes. 【Features】 ■ Built-in selectable resistors for offset and voltage division purposes ■ User-specified resistors (standard products are not implemented) ■ Resistors specified and implemented at factory shipment ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.
A module for applications requiring a minimum decomposition resistance of 1Ω and a maximum rated power of 15W.
The "PXI Programmable Load Resistor Module" is manufactured by Pickering and is a solution designed for applications requiring a rating of up to 15W in a single PXI slot. By combining two channels, it can be used as a high-power potentiometer. Cables for connecting the module are also provided. Pickering products come with a 3-year warranty. 【Features】 ■ Selectable from a specified range of resistance values via software ■ Resolution of at least 1Ω, with a resistance range of 10Ω to 2.56kΩ ■ Bypassable offset resistor for applications requiring low resistance values ■ Compatible with Visa kernel in PXI environments ■ Compatible with PXI chassis and LXI chassis Please contact us for more details.
An in-circuit test system characterized by easy operability through a GUI.
The Agilent Medalist i3070 is the latest in-circuit test system that combines the high flexibility of the widely used 3070 series with the advanced graphical user interface of the i5000. It is equipped with new features that enhance test throughput and test coverage, enabling further efficiency in board inspection. 【Features】 ○ Easy operability through GUI ○ High test throughput ○ Highly flexible system architecture ○ Compatibility with existing systems For more details, please contact us or download the catalog.
![Laser Diode Test System [LD2920TB]](https://image.mono.ipros.com/public/product/image/929/2000619945/IPROS86506555519922643512.png?w=280&h=280)
Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state.
This is an LD test system that automatically and rapidly measures and sorts the electrical and optical characteristics of long-wavelength laser diodes in bare chip condition. <Features> ■ Fully automated transport from supply to measurement and classification ■ Easy monitoring of operating conditions with up to 13 cameras ■ Capable of measuring at any temperature from +20°C to -100°C ■ Simultaneous IL measurement of FRONT light and BACK light. For more details, please download the PDF or feel free to contact us.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
Laversab, as an audited and approved subcontractor of the U.S. Department of Defense, supplies extremely robust military-grade products to the U.S. Air Force, U.S. Navy, and other government agencies. Our customers include major aircraft manufacturers, airlines, and certified repair facilities worldwide, including the United States. 【Product Lineup】 ■ Multi-functional Avionics Radio System ARTS7000 - WiFi compatible - ■ Pitot Static Testers - Model 6150, Model 6200, Model 6250, Model 6270, Model 6300, Model 6300L, Model 6600, Model 6600, Model 6600-NG, Model 6300-M3, Model 6300-M4, Model 6600-M4 ■ Laboratory Models - 6500 / 6500-HA, Model 6580 / 6580HA *For more details, please refer to the PDF document or feel free to contact us.
By using it in combination with our electronic load products, the parameter testing of solar cells can be completed automatically. Multiple units can be connected, and long-duration automated testing is possible.
Measurable parameters ◆ Short circuit current ◆ Open circuit voltage ◆ Peak power ◆ Voltage at peak power point ◆ Current at peak power point ◆ Resistance at peak power point ◆ Fill factor *For details, please contact us.*
Even without a preliminary test, it can meet the test speed conditions of hundreds of km/h.
The FronTone E-Liner system is a mobile system powered by electricity for performance testing in accordance with FMVSS 226 for release mitigation tests. <Features> ■ The E-Liner EMIT acceleration device is driven by an electronic linear motor, significantly simplifying handling and testing performance. ■ The linear drive is not affected by room temperature or humidity, eliminating the need for a test matrix. Preliminary tests are also a thing of the past for the same reason. ■ Speed can be continuously adjusted from 1 to 27 km/h. ■ With automatic return, the impactor mounting device returns to the starting position immediately after launch. Therefore, the mounting position is outside the rebound area of the release mitigation thread. ■ Another major advantage is that the E-Liner testing system accelerates smoothly without any jerking force. For more details, please contact us or download the catalog.
Semiconductor Test Architects
Semiconductor Parametric Instrument, Parametric Switch Matrix, Integrated Test System
Easy expansion of the tester itself! Strong support for mass production of high-density multi-pin devices.
The "V2048" is a semiconductor tester capable of conducting four simultaneous tests. With its reasonable pricing, it is easy to expand the tester itself. With high fault tolerance and a clear user interface, it helps facilitate efficient mass production. 【Features】 ■ Capable of mounting a 60A high current power supply (HCDPS) ■ Simultaneous measurement of 4 DUTs ■ Equipped with function features that support configuration/information reading via JTAG and other methods *For more details, please refer to the PDF materials or feel free to contact us.
Fully automatic camera testing is now possible with just one click!
The "iQ-Automator Solution" automatically evaluates the image quality of mobile phone cameras by combining the iQ-Automator software and the iQ-Robot, allowing for more efficient and effective feedback. The iQ-Automator Solution is centered around the advanced iQ-Automator software. By using this software, users can design custom workflows and automatically adjust the positioning of the test camera to fit many of Image Engineering's lighting and measurement devices. Additionally, an API for electric devices (iQ-Drive API) is optionally provided for easy integration into users' proprietary control software. *Currently, the iQ-Automator Solution is no longer available. Image Engineering is collaborating with Sofica in Finland as a strategic partnership to develop a new automation testing solution. For inquiries regarding automation testing solutions, please contact us through the inquiry form below.*
Simple positioning operation! It can automatically measure within a specified area on the wafer.
We would like to introduce the "VCSEL Wafer Test System" handled by Fukuhara System. This product can automatically measure the specified area on the wafer with simple positioning operations. It can be utilized for I-L/I-V measurements, spectrum measurements, temperature dependence evaluations of each measurement, and evaluations of optical output/driving current dependence in spectrum measurements. 【The following measurements necessary for VCSEL characteristic evaluation are possible】 (1) I-L/I-V measurement (2) Spectrum measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Optical output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.
Portable compact HILS! Achieves easy operation and evaluation.
The "μLC Test System" is a very compact HILS test system, palm-sized, designed for simple verification in control device development. It addresses challenges such as "HILS is very expensive and difficult to handle" and "I don't need a large-scale HILS; I want to perform simple simulations at my desk," allowing for a simple setup. By simulating and outputting the behavior of a vehicle's engine function or any unit, it enables a simplified simulation that replicates the actual device. Furthermore, a user-friendly interface allows for easy operation and evaluation. 【Features】 ■ Compact size and easy setup ■ User-friendly interface ■ Integration of simulations for common automotive interfaces in one unit ■ Highly versatile I/O ports ■ Control via scripts or Simulink is possible *For more details, please refer to the PDF materials or feel free to contact us.
A wide variety of package burn-in test systems are available!
The "Test Burn-In Tester" inherits Ando Electric's burn-in testing and is a package burn-in test system that realizes diverse testing conditions and functions through upgrades tailored to new customer needs. We offer a lineup that includes the "AF8652D6," which provides high power with added Mask-ROM testing capabilities, as well as the "AF8862C7" with a 10MHz, 60-slot specification, and the "DM8827," which allows for individual control operation in 4 zones. 【Lineup】 ■AF8652D6 ■AF8862C7 ■DM8827/DM8857 ■AF8651A5/AF8651A7/AF8655C7 ■AF8610E6 *You can download the English version of the catalog. *For more details, please refer to the PDF materials or feel free to contact us.
Equipped with highly practical and convenient features! We cater to a wide range of needs from jig manufacturing to measurement systems.
Fine Tech Co., Ltd. handles the "Function Test System." We cater to a wide range of needs, from jig manufacturing to measurement systems. You can freely build systems tailored to your applications. Additionally, with remote support, we can promptly respond to issues such as recovery from NG (no good) and urgent specification changes. 【Highly Practical and Convenient Features】 ■ Remote Support ■ Log Analysis Tool ■ Notification Function *For more details, please refer to the PDF materials or feel free to contact us.
Introducing our lineup of fully automatic machines, dedicated machines, and tabletop types! We present a specialized airtight inspection device for small electronic components.
The "MS series" is a leak test system for small electronic components that require airtightness, including: - Crystal devices - Ceramic oscillators - Optical devices - Power semiconductors - CAN devices - Laser diodes - Capacitors Leak testing of sealed products may involve both gross leak and fine leak inspections, depending on product specifications and characteristics. We offer a lineup that includes fully automatic machines capable of performing the entire process in one unit, custom-built dedicated machines, and convenient tabletop types for sampling inspections. 【Lineup (excerpt)】 <Fully Automatic Devices> ■ Gross Leak Test System - MSZ-6200 - MS-6086 ■ Bombing Gross and Fine Leak Test System - MSX-6110 - MSX-6200 - MSX-7000 *For more details, please refer to the PDF document or feel free to contact us.
This is a composite airtightness testing device that completes filling by bombing, gross leak detection through pressure change confirmation, and fine leak detection using mass spectrometry, all in one unit.
The "MSX-0101 series" is a compact leak testing device specifically designed for electronic components such as MEMS, crystal devices, and SMDs. It is fully equipped with helium filling, gross leak testing, and fine leak testing in a single system. By managing the filling time and waiting time, it allows for proper gross and fine leak testing. 【Features】 ■ Ideal for leak testing of electronic components such as MEMS and SMDs ■ Quantifies gross and fine leak amounts while managing filling time and waiting time ■ Capable of performing both gross leak testing and fine leak testing with one device ■ Enables highly accurate fine leak measurement by appropriately setting bonding conditions and gross leak conditions *For more details, please refer to the PDF document or feel free to contact us.
High-sensitivity leak testing for small electronic components! We offer solutions down to ultra-fine leaks [patented technology].
The "MUH-0100 series" is a leak testing device specifically designed for ultra-micro leak measurement that employs the "capsule accumulation method." Our company has developed a high-sensitivity helium leak detection technology called the "capsule accumulation method" for measuring ultra-micro leaks. MEMS components such as angular velocity sensors and infrared image sensors, as well as small electronic components, need to maintain their sealing properties over long periods, requiring high airtightness. 【Capsule Accumulation Method Features】 ■ Capable of measuring up to 4×10⁻¹⁵ Pa·m³/s (He) ■ Significantly reduces background noise ■ Capable of detecting ultra-micro helium leaks ■ Reduces the influence of gases other than helium, which can be sources of error ■ Eliminates the need for heaters or ultra-low temperature pumps, with startup maintenance times comparable to standard helium leak detectors ■ Commercially available standard leaks can be used for calibrating helium accumulation amounts *For more details, please refer to the PDF document or feel free to contact us.
A smart test system optimized for mass production screening of silicon photonics.
The Semight sCT9002 is a SiPh wafer testing system that is optimized and integrated in both hardware and software, achieving significant improvements in optical alignment performance and coupling speed. This system adopts a modular structure and supports optical coupling using single-core fibers or fiber arrays. It supports both vertical coupling and edge coupling methods, significantly reducing measurement time through parallel testing configurations and dramatically improving testing efficiency. The high precision and high reliability of the sCT9002's measurement performance provide assured data quality and reproducibility in the research and development as well as mass production verification of silicon photonics wafers.
Simultaneous measurement of 48 pins with an accuracy of 1 pA. Maximizing throughput with parallel measurements.
The WAT6600 is a highly efficient parallel parametric test system that supports DC measurements and capacitance measurements, as well as high-frequency characteristic evaluations such as ring oscillator testing and flash memory testing. It can measure multiple channels simultaneously, significantly improving throughput in wafer processes. With a balance of accuracy and speed, it is ideal for mass production lines and evaluation processes. Key features: - Accurate DC/CV measurements - Support for high-frequency applications (such as ring oscillator measurements) - Capability for functional evaluation of flash memory - Reduced test time due to high parallelism
High-speed operation with an average of 250μs! Highly reliable Pickering Company reed relays.
The "PXI Low-Density General-Purpose Switch Module" is a product suitable for applications that do not require a large number of relays. It can be connected to a test system using a 96-pin male connector. We also offer assembly of the connectors and cables necessary for module connections. The switches for low and medium loads use sputtered ruthenium reed relays, which suppress the dependency of characteristics on very small loads. 【Features】 - 16, 24, or 32 relays per module - SPST, DPST, and SPDT configurations - Switch ratings up to 1500V, 1.2A, and a maximum of 20W - 96-pin front panel connector - Quickly and easily detect relay abnormalities on LXI or PXI switch systems For more details, please contact us.
PFAS-free! Ensuring the airtightness of semiconductor devices with air leak testing.
In the semiconductor industry, the airtightness of encapsulation is crucial for enhancing product reliability. In devices exposed to temperature changes and vibrations, even minor leaks from the encapsulation can lead to performance degradation or failure. The MSA-0101 series addresses these challenges with PFAS-free air leak testing. 【Application Scenarios】 - Airtightness inspection in the encapsulation process of semiconductor devices - Prototype evaluation during the development stage - Random sampling inspection 【Benefits of Implementation】 - Reduction of environmental impact due to PFAS-free materials - Lower running costs through air leak testing - Compatible with small to medium-sized devices
PFAS-free, confirming the waterproofing of electronic devices with air leak tests!
In the electronics industry, the waterproofing of products is a crucial factor that affects reliability. The intrusion of moisture can lead to corrosion and short circuits in circuits, potentially resulting in product failure. Particularly for electronic devices used outdoors or products intended for use around water, high waterproof performance is required. The MSA-0101 series efficiently tests the waterproof performance of electronic devices through PFAS-free air leak testing. 【Usage Scenarios】 - Waterproof testing for smartphones, keyless switches, various small sensors, etc. - Prototype evaluation during the development stage - Random sampling inspection 【Benefits of Implementation】 - Reduced environmental impact due to PFAS-free materials - Lower running costs through air leak testing - Capable of accommodating devices from small to medium sizes
Ensuring long-term airtightness of automotive parts! Detecting ultra-microscopic leaks.
In the automotive industry, high airtightness is essential for components that require long-term durability, such as engines and fuel cell (FC) parts. In harsh environments exposed to temperature changes and vibrations, even slight leaks can lead to performance degradation or failure. The MUH-0100 series contributes to improving the reliability of automotive parts by detecting ultra-micro leaks with high precision. 【Application Scenarios】 - Airtight testing of engine components - Leak testing of FC parts - Quality control of valves and piping 【Benefits of Implementation】 - Improvement in product quality - Assurance of long-term product lifespan - Gaining customer trust
A ultra-micro leakage measurement system that supports reliability in the aerospace field.
In the aerospace industry, high airtightness is required to ensure the safety and reliability of products. Components used in outer space or harsh environments can lead to serious accidents due to even the smallest leaks, making strict leak testing essential. MUH-0100 contributes to improving product reliability in the aerospace field by detecting ultra-micro leaks with high precision. 【Application Scenarios】 - Leak testing of aircraft components - Leak testing of spacecraft components - Leak testing of rocket engines 【Benefits of Implementation】 - Improved product safety - Strengthened quality control - Gaining customer trust
