Industry-first: Achieving dynamic characteristic testing of high current in wafer testing.
In power semiconductor wafer testing, not only static characteristics but also dynamic characteristic testing can be achieved at both room temperature and high temperature.
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basic information
By combining the WL25V and WS58V double-sided probers, it is possible to achieve static and dynamic characteristics of power semiconductors in wafer form under ambient conditions of room temperature and high temperature. Vth (200A) ON resistance 2mΩ L load SW Qg Avalanche measurement VF Trr, Irr, di/dt
Price range
P8
Delivery Time
※Made-to-order production
Applications/Examples of results
IGBT SBD MOSFET FRD IPD IPM chip
Company information
Shibasoku was founded in 1955 as a manufacturer and seller of audio measurement instruments. Since then, it has combined the electronic measurement technology and mechatronics cultivated over half a century to develop businesses such as semiconductor test systems, audio and video measurement instruments, and broadcasting equipment. With the motto of "Quality Improvement" and "Innovation," we have pursued the development and technical capabilities to meet the needs of the times, contributing to the industry with products and quality that satisfy our customers. In the future, Shibasoku will continue to anticipate the increasingly sophisticated needs of the new era and develop, manufacture, and sell high-quality electronic measurement products that contribute to society.
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