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microscope(afm) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
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microscope Product List

61～65 item / All 65 items

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High-performance atomic force microscope DriveAFM

High-performance atomic force microscope DriveAFM

Equipped with the off-resonance measurement mode "WaveMode" using photothermal excitation! Achieves high stability and performance!

"DriveAFM" is a high-performance atomic force microscope that dramatically accelerates research in both material science and life science. It enables high-speed imaging with atomic resolution while covering a very wide scan range of 100μm. It boasts high stability even in liquid environments. With "WaveMode," off-resonance measurements can be performed at speeds over 20 times faster, and the time required for imaging a single field of view is less than one minute. 【Features】 ■ Wide-range and high-resolution scanning using the proprietary "Direct drive" piezo scanner ■ Off-resonance mode "WaveMode" utilizing photothermal excitation developed by Nanosurf ■ WaveMode is useful even for soft samples like polymers ■ Equipped with photothermal excitation for the cantilever called "Clean-Drive" ■ Clearly images the periodic double helix structure of DNA *For more details, please refer to the PDF document or feel free to contact us.

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  • Other microscopes

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope

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[Research Material] Global Market for Surface Measurement Equipment & Tools

[Research Material] Global Market for Surface Measurement Equipment & Tools

World Market for Surface Measurement Instruments & Tools: Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, Light ...

This research report (Global Surface Measurement Equipment and Tools Market) investigates and analyzes the current state and outlook for the global market of surface measurement equipment and tools over the next five years. It includes information on the overview of the global surface measurement equipment and tools market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The market segments by type include Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, and Optical Coordinate Measuring Machines, while the segments by application cover Optical, Automotive, Electrical & Electronics, and Others. The regional segments are divided into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa, to calculate the market size of surface measurement equipment and tools. The report also includes the market share of major companies in surface measurement equipment and tools, product and business overviews, and sales performance.

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Analysis, Measurement, and Analysis Field

Analysis, Measurement, and Analysis Field

Utilizing preprocessing and analysis techniques to solve problems! Supporting development through various material analyses and evaluations.

Our company utilizes data analysis (AI/machine learning, etc.) to support the enhancement of product value and business improvement. Experts in material development, analysis, and data analysis will quickly resolve the challenges and issues at hand. A team of specialists will collaborate on projects to meet your needs in a one-stop manner. Please feel free to contact us when you require assistance. 【Main Equipment We Own】 ■ FE-TEM (3D, precession), FE-SEM, FE-EPMA ■ FT-IR, Raman, NMR, AFM, laser microscope ■ X-ray CT, XPS, XRF, XRD ■ TG/DTA (steam gasification), DSC ■ GC (MS), LC (MS), TOFMS, HPLC, IC, ICP, GPC, DART, AAS ■ Various magnetic measurement devices such as VMS *For more details, please refer to the PDF document or feel free to contact us.

  • Company：KRI
  • Price：Other
  • Analytical Equipment and Devices

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"Analysis Aimitsu.com" Comparison of Contracted Analysis - Leave it all to us!

"Analysis Aimitsu.com" Comparison of Contracted Analysis - Leave it all to us!

Requesting quotes from various companies? That's no longer necessary. Our company, with its extensive knowledge and channels, will propose the best manufacturers for you.

Our company offers a wide range of knowledge and channels to propose manufacturers suitable for your needs through our price comparison site for analysis, "Bunseki Aimitsu.com." There is no longer a need to request quotes from various companies. Please feel free to consult with us first. 【Analytical Methods】 Optical Microscopy / Laser Microscopy / SEM / 3D-SEM / in-situ SEM / TEM (STEM) / 3D-TEM / in-situ TEM / XPS / EPMA / AES / TOF-SIMS / D-SIMS / GD-OES / GD-MS / LA-ICP-MS / XRF / XRD / in-situ XRD / X-ray CT / 3D-X-ray CT / XAFS / Neutron Diffraction / HAXPES / IR / Imaging IR / NMR / Gas Chromatography (GC-MS) / Liquid Chromatography (HPLC) / ICP-MS / ICP-AES / Ion Chromatography (IC) / IC-MS / TG / DTA / AFM / Nanoindentation / FT-IR / Raman Spectroscopy / EBSD / SAT / TMA / IR-OBIRCH / EMS / DSC / GPC, etc. *For more details, please refer to the PDF materials or feel free to contact us.

  • Public Testing/Laboratory

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