Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
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16～24 item / All 24 items
A mid-range model of an ultra-low temperature strong magnetic field compatible SPM, compacted from the USM1300 type.
This is a new type of ultra-low temperature strong magnetic field SPM system with a low overall height, excellent operability, and cost performance. AFM measurements can also be supported as an option.
Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.
"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.
A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.
The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.
High-end model: A top-level micro-Raman spectrometer with high sensitivity, high wavenumber resolution, and high expandability.
【Features】 - High spatial resolution: XY < 300 nm, Z < 600 nm (@532 nm) - High frequency resolution - High-speed imaging mode: Galvano scan 1000x1000 pixels/3 seconds - Automation features: Laser output, beam diameter, pinhole size, grating switching, etc. - High expandability: CARS model, AFM Raman/TERS, fluorescence lifetime measurement, autofocus function, SERS substrates, etc. - Low-frequency Raman measurement option - Brillouin scattering measurement option The device, equipped with a series of optical configurations such as a confocal pinhole, can automatically switch between them, enabling spectral analysis of micro-particles or Raman imaging of macro objects with high spatial resolution. It is a Raman microscope with a rich array of additional options and excellent expandability.
