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microscope(afm) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
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microscope Product List

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Atomic Force Microscope (AFM) "Park NX12-Bio"

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Observation of Hair Surface Microstructure by AFM

[Analysis Case] Observation of Hair Surface Microstructure by AFM

Quantitative evaluation with reduced alteration is possible through analysis in the atmosphere.

This case study introduces an analysis of the condition of the cuticle on the hair surface using AFM. AFM is a method for three-dimensional measurement of nanoscale surface roughness. Since the analysis is conducted in the atmosphere, it does not cause degradation or gas release of organic materials, allowing for an evaluation of the sample's original shape. In this case study, we assessed the degree of cuticle opening, the distribution of adhered substances, and the roughness evaluation of different areas through images, as well as quantitatively evaluated the surface roughness through numerical processing. This method is effective for evaluating the condition of hair after shampooing and the application state after applying styling products.

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Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

A model of the Cypher S, which boasts exceptional performance, with fully equipped enhanced environmental control features. It easily achieves temperature control, gas and liquid measurement, and flow management.

The Cypher ES AFM/SPM (Atomic Force Microscope) from Asylum Research is a model that expands the fully equipped environmental control features on the outstanding Cypher S platform. It maintains the same high resolution, speed, and stability as the Cypher S, while allowing for easy operation in controlled gas or liquid environments and harsh chemical conditions within a temperature range of 0 to 250°C. The Cypher ES is the ultimate AFM designed to meet the most demanding experimental requirements, capable of measurements even in environments that could potentially damage other AFMs. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Microscope

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[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.

AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating. Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome. Please take a moment to read the PDF materials. This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials. Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Other polymer materials
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  • Rubber

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VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope)

VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope)

This is an introduction to a scanning tunneling microscope equipped with a cooling and heating system.

VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope) refers to a scanning tunneling microscope equipped with a cooling and heating system. It enables STM measurements across a wide temperature range from low to high temperatures, making it suitable for STM observation and measurement in the nano domain (from low to high temperatures). *For more details, please contact us or download the PDF document.*

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  • Analytical Equipment and Devices

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[Analysis Case] AFM Analysis of Smartphone Protective Films

[Analysis Case] AFM Analysis of Smartphone Protective Films

Quantitative evaluation of the quality of sensory products is possible.

The penetration rate of smartphones is increasing year by year, and along with that, the protective films applied to their surfaces are diversifying in functionality. In this instance, we will introduce a case where two types of films (A and B) with fingerprint prevention and anti-reflection features were quantitatively evaluated in terms of roughness, simulating the sensation of touch through AFM analysis.

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  • LCD display

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Atomic Force Microscope (AFM) "Park NX20"

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

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Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1200

Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1200

✔ More than 10 days of LHe storage, continuous STM measurement, ✔ 1 day, less than 1 liter of LHe consumption

Sample pretreatment and probe cleaning are performed in ultra-high vacuum, allowing STM and AFM to observe with atomic and molecular level resolution at ultra-low temperatures. We are equipped with new probes and auxiliary devices to accommodate the expanding range of applications in recent years.

  • Microscope
  • Analytical Equipment and Devices

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Atomic force microscope

Atomic force microscope

Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.

In addition to functions such as conductive AFM, Kelvin probe force microscopy (KFM), and scanning microwave impedance microscopy (sMIM), it supports samples up to 4 inches. ■ Sample size: Up to 100 mm square ■ Stage travel distance: 100 mm ■ XY scanning range: 100 μm (manufacturing dimensional tolerance +/- 10%) ■ Z scanning range: 9 μm (manufacturing dimensional tolerance +/- 10%) ■ XY scanning resolution: 24-bit control – 0.06 Angstroms ■ Z scanning resolution: 24-bit control – 0.006 Angstroms ■ Noise level: Typ: <0.01 mV RMS

  • Visual Inspection Equipment

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Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

Introduction of atomic force microscopes (AFM) capable of proposing customized solutions for various systems, from research use to production sites.

Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have a lineup of models including the "CoreAFM," which features an active vibration isolation mechanism and supports a variety of measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever replacement using dedicated tools. Customization options are available, ranging from small models for research environments to large stage models for production sites, as well as automated systems for quality control. 【Lineup (excerpt)】 ◎ Desktop Atomic Force Microscope "CoreAFM" 　■ Equipped with active vibration isolation and wind protection 　■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM" 　■ Integrates controller, XY stage, wind protection, and vibration isolation 　■ Equipped with a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we handle. Detailed information can be viewed via "PDF Download."

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

Achieving overwhelming resolution! Measuring previously hidden minute phenomena.

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head can be selected from two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe exchange can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and inline fully automatic machines *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Other microscopes
  • Other measurement, recording and measuring instruments

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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Visualization of structural changes in samples in the atmosphere and in aqueous solutions.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

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[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

Quantifying texture with mechanical property parameters.

Factors that determine texture include various elements such as hardness and adhesion. Generally, the texture of food is evaluated through stress assessment using tools like texture analyzers, but measuring in micro-regions or thin samples is challenging. AFM-MA can measure not only the shape of surface roughness but also the Young's modulus representing mechanical properties like hardness, adhesion parameters related to texture, and energy dissipation data in micro-regions. Therefore, it is effective for evaluating physical properties related to texture and similar characteristics in extremely small areas.

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Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1400

Ultra-high vacuum ultra-low temperature scanning probe microscope system USM1400

Ultra-high vacuum ultra-low temperature SPM with high scalability, expandable to near-field optical/Raman spectroscopy.

This device adopts a newly developed cryostat and is a state-of-the-art low-temperature SPM system equipped with STM and AFM functions, which can be used for entirely new applications such as near-field optical measurements and Raman spectroscopy.

  • Microscope
  • Analytical Equipment and Devices
  • others

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[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Evaluate the shape change of the sample surface in situ.

Polymers can change shape depending on environmental factors such as temperature, humidity, and solvents, and by varying the environmental conditions during evaluation, we can deepen our understanding of their physical properties. In this study, we conducted heating and cooling experiments using polycaprolactone (PCL), which is known for its biodegradability. PCL has a melting point of approximately 60°C, and we continuously observed through video how it changes from a crystalline state to an amorphous state upon heating, and how it recrystallizes upon cooling. Measurement method: AFM Product fields: Biotechnology, Pharmaceuticals, Daily Goods, Food Analysis purpose: Shape evaluation For more details, please download the materials or contact us.

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