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microscope(afm) - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
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microscope Product List

31～56 item / All 56 items

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Atomic Force Microscope "Park NX-Wafer"

Atomic Force Microscope "Park NX-Wafer"

Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!

The "Park NX-Wafer" is an atomic force microscope that performs defect imaging and analysis fully automatically, improving productivity in defect inspection by 1,000% through AFM measurement techniques. It is a low-noise atomic force profiler for accurate and high-throughput CMP profile measurements. It measures sub-Å surface roughness with extreme accuracy, minimizing variation between chips. 【Features】 ■ Fully automated AFM solution for defect imaging and analysis ■ Up to 1,000% increase in productivity for defect review ■ Achieves accurate and high-throughput CMP measurements with a low-noise atomic force profiler ■ Extremely accurate sub-Å surface roughness measurement, minimizing variation between chip-to-chip ■ Atomic force profiler *For more details, please refer to the PDF document or feel free to contact us.

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[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist

[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist

We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!

In addition to our expertise in nano-order surface analysis equipment, we also propose resist solutions and maskless exposure devices for semiconductor processes.

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Ultra-High Vacuum Scanning Probe Microscope Unit ST100

Ultra-High Vacuum Scanning Probe Microscope Unit ST100

Super high vacuum room temperature SPM with excellent cost performance.

This is a scanning probe microscope (SPM) system capable of a wide range of applications such as STM, AFM, and SNOM in ultra-high vacuum (below 10^-8 Pa) and at room temperature. Its compact and simple structure, along with an excellent vibration isolation mechanism, makes high-resolution SPM measurements easy to achieve.

  • Microscope
  • Analytical Equipment and Devices
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Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

A mid-range model of an ultra-low temperature strong magnetic field compatible SPM, compacted from the USM1300 type.

This is a new type of ultra-low temperature strong magnetic field SPM system with a low overall height, excellent operability, and cost performance. AFM measurements can also be supported as an option.

  • Analytical Equipment and Devices
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Atomic Force Microscope 'LiteScope 2.0'

Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

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CIQTEK Scanning NV Microscope

CIQTEK Scanning NV Microscope

CIQTEK CIQTEK Scanning NV Microscope

CIQTEK QDAFM - Diamond III is a magnetic imaging device that combines the diamond NV center with AFM imaging technology. Through quantum control and spin detection using a diamond probe, the magnetic properties of samples can be obtained quantitatively and non-invasively. With nanoscale spatial resolution and ultra-high detection sensitivity, QDAFM is an innovative technology for researching and developing magnetic textures, high-density magnetic storage, and spintronics. The magnetic imaging technology enabled by quantum probes equipped with diamond NV centers provides a new means of measuring magnetic fields with high spatial resolution and excellent sensitivity. This scanning NV center magnetometer not only scans magnetic materials but also extends its applications to important areas such as the study of mechanisms in biomolecules, life sciences, healthcare diagnostics, and disease treatment.

  • Electron microscope
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  • Other measurement, recording and measuring instruments
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Technical Information Magazine 201910-02 DDS Technology

Technical Information Magazine 201910-02 DDS Technology

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, research and development have been focused on drug delivery systems (DDS) aimed at reducing side effects of pharmaceuticals and improving their efficacy. Carriers used in DDS include biomaterials such as liposomes, polymer micelles, inorganic nanoparticles, and drug conjugates (e.g., ADCs). Among these, our company is concentrating on establishing analysis and evaluation techniques for liposomes, introducing case studies of liposome analysis primarily using high-difficulty techniques such as TEM (transmission electron microscopy) and AFM (atomic force microscopy). **Table of Contents** 1. Introduction 2. Fundamental technologies of DDS and characteristics of various carriers 3. Case studies of liposome analysis and evaluation 4. Conclusion

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope
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Compact Type Atomic Force Microscope NaioAFM

Compact Type Atomic Force Microscope NaioAFM

Introducing a low-cost "All-in-one" AFM device that is compact, durable, and easy to operate!

"NaioAFM" is a compact atomic force microscope suitable for users who want to measure surface shapes concisely and quickly in the fields of nanotechnology education at universities and vocational schools, as well as in research and development or quality control. With the product's unique "Flip-over" scan head and dedicated exchange tools, it allows for quick and simple cantilever replacement. Balancing functionality and operability, it is an "All-in-one" AFM device that can be used by anyone, anywhere, and is widely utilized around the world. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera for positioning and side-view observation ■ Additional measurement modes can be added according to needs ■ Simple cantilever replacement: no need to adjust the laser or detector ■ Ready for measurement immediately after installation: just connect the USB cable and launch the software *For more details, please refer to the PDF document or feel free to contact us.

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[PFM] Piezoelectric Response Microscope

[PFM] Piezoelectric Response Microscope

By using a probe coated with a conductive film and applying an alternating voltage to the sample surface, the sample surface is vibrated to obtain electromechanical information.

- Visualization of attraction and repulsion due to the electric dipole effect of piezoelectric samples is possible. - Quantitative evaluation of the sample's expansion and contraction due to piezoelectric response is a reference value. - AFM images can also be obtained simultaneously.

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Microsphere-based super-resolution optical microscope with a resolution of ≦100nm.

Microsphere-based super-resolution optical microscope with a resolution of ≦100nm.

Optical microscope with a resolution of ≦100nm, capable of non-destructive observation in full color.

It is possible to observe beyond the diffraction limit with spatial resolution below 100nm, allowing for non-destructive, full-color observation of nanoscale structures. It can be used for semiconductor research and development, as well as advanced material imaging, or as an alternative to SEM and AFM. The objective lens can also be sold separately.

  • Optical microscope
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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

In recent years, SiC has been attracting attention as a material for high-voltage devices. The trench MOSFET structure is necessary for the high integration of devices, and the application development for SiC devices is progressing. Since the channel region of the trench MOSFET structure is the trench sidewall, the flatness of the trench sidewall is related to the reliability of the device. This document introduces an example of quantitatively evaluating the roughness of the trench sidewall of SiC trench MOSFETs using AFM (Atomic Force Microscopy).

  • Contract Analysis
  • Other semiconductors
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[MFM] Magnetic Force Microscopy Method

[MFM] Magnetic Force Microscopy Method

MFM is a measurement technique that uses a probe coated with a magnetic film to measure the leakage magnetic field occurring near the sample surface and obtain magnetic information.

- Qualitative information on the magnetic properties of the sample can be obtained. - Imaging of attraction and repulsion due to leakage magnetic fields is possible. - A signal of magnetic force proportional to the magnitude of the gradient of the leakage magnetic field can be obtained, but quantitative evaluation is not possible. - AFM images can also be obtained simultaneously.

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[SMM] Scanning Microwave Microscopy Method

[SMM] Scanning Microwave Microscopy Method

Scanning Microwave Microscopy

SMM scans the measurement sample using a conductive probe to observe its surface topography. Simultaneously, microwaves are irradiated from the probe to the sample, and by measuring the reflected response, it is possible to obtain signals correlated with carrier concentration, particularly in the case of semiconductors. The intensity of the SMM signal is linearly correlated with carrier concentration, which is a characteristic feature that provides high quantitativeness. - For Si devices, sensitivity is present for carrier concentrations around 10^15 to 10^20 cm^-3. - Since signals correlated linearly with carrier concentration can be obtained, quantitative evaluation (semi-quantitative) is possible under certain assumptions. - AFM images can also be acquired. - Various semiconductors such as Si, SiC, GaN, InP, and GaAs can be measured. This document introduces application examples, principles, and data examples. For more details, please download the document or contact us.

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[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

Confirming the differences due to variations in annealing conditions after ion implantation.

Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a focus of attention as a material for power devices that can be expected to be high-efficiency and low-cost. Controlling impurity concentration and crystallinity, which influence the characteristics of the devices, is crucial for their development. This document presents the results of observations of the damage layer and changes in surface roughness caused by disturbances in the crystal structure due to ion implantation, under various annealing conditions. Measurement methods: TEM, AFM Product fields: Oxide semiconductors, power devices Analysis objectives: Shape evaluation, structural evaluation For more details, please download the document or contact us.

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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

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[Data] Case Study of Material System Analysis

[Data] Case Study of Material System Analysis

It is possible to prepare sections ranging from 30nm to 5μm! This document introduces several case studies of material analysis!

This document is a collection of case studies summarizing material analysis conducted by Hanai Corporation's Electron Microscope Technology Research Institute. The "Ultra Microtome" is suitable for producing high-quality ultra-thin sections and cross-sections across a wide range of fields, including biological tissues, metal plating layers, inorganic deposition layers, and nanoparticles. Our company has started offering contract analysis services. We will conduct material analysis in collaboration with partner organizations. [Published Cases] - Structural analysis of liposomes - Structural analysis of HIPS - Structural analysis of lens cross-sections - Cross-sectional observation of candy bags - Morphological observation of metal particles using the dispersion method (metal microparticles/metal-supported carbon) *For more details, please refer to the PDF document or feel free to contact us.

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3D Confocal Laser Raman Microscope Confotec NR500

3D Confocal Laser Raman Microscope Confotec NR500

High-end model: A top-level micro-Raman spectrometer with high sensitivity, high wavenumber resolution, and high expandability.

【Features】 - High spatial resolution: XY < 300 nm, Z < 600 nm (@532 nm) - High frequency resolution - High-speed imaging mode: Galvano scan 1000x1000 pixels/3 seconds - Automation features: Laser output, beam diameter, pinhole size, grating switching, etc. - High expandability: CARS model, AFM Raman/TERS, fluorescence lifetime measurement, autofocus function, SERS substrates, etc. - Low-frequency Raman measurement option - Brillouin scattering measurement option The device, equipped with a series of optical configurations such as a confocal pinhole, can automatically switch between them, enabling spectral analysis of micro-particles or Raman imaging of macro objects with high spatial resolution. It is a Raman microscope with a rich array of additional options and excellent expandability.

  • Laser microscope
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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

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High-performance atomic force microscope DriveAFM

High-performance atomic force microscope DriveAFM

Equipped with the off-resonance measurement mode "WaveMode" using photothermal excitation! Achieves high stability and performance!

"DriveAFM" is a high-performance atomic force microscope that dramatically accelerates research in both material science and life science. It enables high-speed imaging with atomic resolution while covering a very wide scan range of 100μm. It boasts high stability even in liquid environments. With "WaveMode," off-resonance measurements can be performed at speeds over 20 times faster, and the time required for imaging a single field of view is less than one minute. 【Features】 ■ Wide-range and high-resolution scanning using the proprietary "Direct drive" piezo scanner ■ Off-resonance mode "WaveMode" utilizing photothermal excitation developed by Nanosurf ■ WaveMode is useful even for soft samples like polymers ■ Equipped with photothermal excitation for the cantilever called "Clean-Drive" ■ Clearly images the periodic double helix structure of DNA *For more details, please refer to the PDF document or feel free to contact us.

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope
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[Research Material] Global Market for Surface Measurement Equipment & Tools

[Research Material] Global Market for Surface Measurement Equipment & Tools

World Market for Surface Measurement Instruments & Tools: Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, Light ...

This research report (Global Surface Measurement Equipment and Tools Market) investigates and analyzes the current state and outlook for the global market of surface measurement equipment and tools over the next five years. It includes information on the overview of the global surface measurement equipment and tools market, trends of major companies (sales, selling prices, market share), market size by segment, market size by major regions, and distribution channel analysis. The market segments by type include Atomic Force Microscopes (AFM), Stylus Profilometers, 3D Optical Microscopes, Mechanical Testers, and Optical Coordinate Measuring Machines, while the segments by application cover Optical, Automotive, Electrical & Electronics, and Others. The regional segments are divided into North America, the United States, Europe, Asia-Pacific, Japan, China, India, South Korea, Southeast Asia, South America, the Middle East, and Africa, to calculate the market size of surface measurement equipment and tools. The report also includes the market share of major companies in surface measurement equipment and tools, product and business overviews, and sales performance.

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Analysis, Measurement, and Analysis Field

Analysis, Measurement, and Analysis Field

Utilizing preprocessing and analysis techniques to solve problems! Supporting development through various material analyses and evaluations.

Our company utilizes data analysis (AI/machine learning, etc.) to support the enhancement of product value and business improvement. Experts in material development, analysis, and data analysis will quickly resolve the challenges and issues at hand. A team of specialists will collaborate on projects to meet your needs in a one-stop manner. Please feel free to contact us when you require assistance. 【Main Equipment We Own】 ■ FE-TEM (3D, precession), FE-SEM, FE-EPMA ■ FT-IR, Raman, NMR, AFM, laser microscope ■ X-ray CT, XPS, XRF, XRD ■ TG/DTA (steam gasification), DSC ■ GC (MS), LC (MS), TOFMS, HPLC, IC, ICP, GPC, DART, AAS ■ Various magnetic measurement devices such as VMS *For more details, please refer to the PDF document or feel free to contact us.

  • Company：KRI
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  • Analytical Equipment and Devices
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"Analysis Aimitsu.com" Comparison of Contracted Analysis - Leave it all to us!

"Analysis Aimitsu.com" Comparison of Contracted Analysis - Leave it all to us!

Requesting quotes from various companies? That's no longer necessary. Our company, with its extensive knowledge and channels, will propose the best manufacturers for you.

Our company offers a wide range of knowledge and channels to propose manufacturers suitable for your needs through our price comparison site for analysis, "Bunseki Aimitsu.com." There is no longer a need to request quotes from various companies. Please feel free to consult with us first. 【Analytical Methods】 Optical Microscopy / Laser Microscopy / SEM / 3D-SEM / in-situ SEM / TEM (STEM) / 3D-TEM / in-situ TEM / XPS / EPMA / AES / TOF-SIMS / D-SIMS / GD-OES / GD-MS / LA-ICP-MS / XRF / XRD / in-situ XRD / X-ray CT / 3D-X-ray CT / XAFS / Neutron Diffraction / HAXPES / IR / Imaging IR / NMR / Gas Chromatography (GC-MS) / Liquid Chromatography (HPLC) / ICP-MS / ICP-AES / Ion Chromatography (IC) / IC-MS / TG / DTA / AFM / Nanoindentation / FT-IR / Raman Spectroscopy / EBSD / SAT / TMA / IR-OBIRCH / EMS / DSC / GPC, etc. *For more details, please refer to the PDF materials or feel free to contact us.

  • Public Testing/Laboratory
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