Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.
"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.
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[Observation and Measurement Mode] ■ Shape Imaging / Surface Roughness ■ Mechanical Properties ■ Electrical Properties / Electromechanical Properties ■ Magnetic Properties *For more details, please refer to the PDF document or feel free to contact us.
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【Application Scope】 ■Material Science ■Nanostructures ■Semiconductors ■Life Sciences *For more details, please refer to the PDF document or feel free to contact us.
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Toyo Technica Co., Ltd. introduces advanced measurement instruments and technologies from overseas in fields such as information communication, machine control/vibration noise, physical properties/energy, EMC/large antennas, marine/special equipment, software development support, nanoimaging, and medical systems. We also provide our own developed products that leverage our many years of accumulated know-how. In the field of nanoimaging, we handle products such as the composite analysis device 'Xe Plasma FIB-SEM System,' which can process and observe specific areas at high speed and over a wide range.