microscope(afm) - メーカー・企業と製品の一覧

[Analysis Case] Surface Shape Analysis of GaN Substrates

Visualization of step-terrace structures by AFM.

Gallium nitride (GaN), a wide bandgap semiconductor, is used in a wide range of fields such as power devices and communication/optical devices. When fabricating devices, the shape and roughness of the wafer surface significantly impact device performance. During the growth of GaN wafers, a step-terrace structure is formed on the surface due to stress effects from lattice mismatch with the supporting substrate. This document introduces a case where the step-terrace structure of the GaN substrate surface was visualized using AFM, and the terrace width, step height, surface roughness, and off-angle were evaluated. Measurement method: AFM Product fields: Power devices, electronic components, lighting Analysis purpose: Shape evaluation, structural evaluation For more details, please download the document or contact us.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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Sienta Omicron Scanning Probe Microscope

We offer a wide variety of microscopes tailored to meet our customers' needs.

When selecting an Omicron microscope, please consider "temperature" and "function." "Temperature" refers to the temperature of the sample being observed. You need to determine whether the sample temperature can be at room temperature, or if it needs to be cooled or heated. Depending on these requirements, the microscopes come equipped with different basic options. "Function" refers to whether you only need a Scanning Tunneling Microscope (STM) or if you need to include an Atomic Force Microscope (AFM). This functionality cannot be upgraded (modified or altered) after delivery; you will have to maintain the initial functionality. While we offer a wide range of options, please note that we do not provide options that change the basic performance. For more details, please contact us or refer to the catalog.

企業：シエンタオミクロン
価格：Other

Other microscopes

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[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors

Clearly observable structure of the diffusion layer including pn junction determination.

It is possible to observe in detail from an overview of the NPN bipolar transistors within commercially available LSI to an enlarged view of the emitter section. This is an example where a cross-section passing through the center of the emitter electrode was exposed, and AFM observation and SCM measurement were conducted. By overlaying the AFM image, the positional relationship with the wiring becomes clear.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Other microscopes

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Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

AFM is a method that scans the surface of a sample with a fine probe and measures nanoscale surface topography in three dimensions. - It can measure a wide range of samples, from insulators to soft organic materials, including metals, semiconductors, and oxides. - By using tapping mode with low contact pressure, it is possible to minimize sample damage.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis
Contract measurement
Contract Inspection

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Multifunctional Compact Atomic Force Microscope CoreAFM

Active vibration isolation built-in! It supports electrochemical measurements and environmental control simply by changing the stage.

"CoreAFM" is a multifunctional compact atomic force microscope that combines high performance with scalability to accommodate any type of measurement. The top-view camera makes it easy to align the measurement target, while the side-view camera allows for visual confirmation of the distance between the cantilever and the sample. Additionally, the cantilever holder can be easily attached and detached from the AFM head unit, allowing for safe cleaning or washing of just the holder. 【Features】 ■ Ready to use with immediate connection of the controller, power supply, and USB cable ■ High-resolution 24-bit ADC/DAC ■ Maximum scan range (X, Y, Z): 100μm, 100μm, 12μm ■ Z noise level: 40pm RMS value ■ Capable of supporting 32 standard measurement modes, including measurements in liquid, as well as various optional modes *For more details, please refer to the PDF document or feel free to contact us.

企業：日本カンタム・デザイン
価格：Other

Other microscopes

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Atomic Force Microscope "Park NX-Wafer"

Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!

The "Park NX-Wafer" is an atomic force microscope that performs defect imaging and analysis fully automatically, improving productivity in defect inspection by 1,000% through AFM measurement techniques. It is a low-noise atomic force profiler for accurate and high-throughput CMP profile measurements. It measures sub-Å surface roughness with extreme accuracy, minimizing variation between chips. 【Features】 ■ Fully automated AFM solution for defect imaging and analysis ■ Up to 1,000% increase in productivity for defect review ■ Achieves accurate and high-throughput CMP measurements with a low-noise atomic force profiler ■ Extremely accurate sub-Å surface roughness measurement, minimizing variation between chip-to-chip ■ Atomic force profiler *For more details, please refer to the PDF document or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Other microscopes
Electron microscope

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Ultra-High Vacuum Scanning Probe Microscope Unit ST100

Super high vacuum room temperature SPM with excellent cost performance.

This is a scanning probe microscope (SPM) system capable of a wide range of applications such as STM, AFM, and SNOM in ultra-high vacuum (below 10^-8 Pa) and at room temperature. Its compact and simple structure, along with an excellent vibration isolation mechanism, makes high-resolution SPM measurements easy to achieve.

企業：ユニソク
価格：Other

Microscope
Analytical Equipment and Devices

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Ultra-high vacuum, ultra-low temperature scanning probe microscope USM1500

A mid-range model of an ultra-low temperature strong magnetic field compatible SPM, compacted from the USM1300 type.

This is a new type of ultra-low temperature strong magnetic field SPM system with a low overall height, excellent operability, and cost performance. AFM measurements can also be supported as an option.

企業：ユニソク
価格：Other

Analytical Equipment and Devices

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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

企業：東陽テクニカ慶應義塾大学理工学部中央試験所・東陽テクニカ産学連携室ナノイメージングセンター
価格：Other

Electron microscope
Other microscopes
Other inspection equipment and devices

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CIQTEK Scanning NV Microscope

CIQTEK CIQTEK Scanning NV Microscope

CIQTEK QDAFM - Diamond III is a magnetic imaging device that combines the diamond NV center with AFM imaging technology. Through quantum control and spin detection using a diamond probe, the magnetic properties of samples can be obtained quantitatively and non-invasively. With nanoscale spatial resolution and ultra-high detection sensitivity, QDAFM is an innovative technology for researching and developing magnetic textures, high-density magnetic storage, and spintronics. The magnetic imaging technology enabled by quantum probes equipped with diamond NV centers provides a new means of measuring magnetic fields with high spatial resolution and excellent sensitivity. This scanning NV center magnetometer not only scans magnetic materials but also extends its applications to important areas such as the study of mechanisms in biomolecules, life sciences, healthcare diagnostics, and disease treatment.

企業：株式会社エルエイシステムズ
価格：50 million yen-100 million yen

Electron microscope
Other microscopes
Other measurement, recording and measuring instruments

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Technical Information Magazine 201910-02 DDS Technology

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, research and development have been focused on drug delivery systems (DDS) aimed at reducing side effects of pharmaceuticals and improving their efficacy. Carriers used in DDS include biomaterials such as liposomes, polymer micelles, inorganic nanoparticles, and drug conjugates (e.g., ADCs). Among these, our company is concentrating on establishing analysis and evaluation techniques for liposomes, introducing case studies of liposome analysis primarily using high-difficulty techniques such as TEM (transmission electron microscopy) and AFM (atomic force microscopy). **Table of Contents** 1. Introduction 2. Fundamental technologies of DDS and characteristics of various carriers 3. Case studies of liposome analysis and evaluation 4. Conclusion

企業：東レリサーチセンター
価格：Less than 10,000 yen

Contract Analysis
Contract measurement
Technical and Reference Books

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Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

企業：パーク・システムズ・ジャパン
価格：Other

Electron microscope
Other microscopes

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Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.