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Contact Probe Product List and Ranking from 39 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. 精研 本社 Tokyo//Electronic Components and Semiconductors
  4. 4 UIGREEN Kanagawa//Machine elements and parts
  5. 5 湘南エンジニアリング Kanagawa//Industrial Electrical Equipment
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Contact Probe Product ranking

Last Updated： Aggregation Period:Jul 08, 2026～Aug 04, 2026
This ranking is based on the number of page views on our site.

  1. Connection terminal TA series サンケイエンジニアリング 本社
  2. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  3. Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 Flexible wire サンケイエンジニアリング 本社

Contact Probe Product List

181～201 item / All 201 items

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RF MEMS Probe "TPD50-Vertical Series"

RF MEMS Probe "TPD50-Vertical Series"

Crosstalk (typ. GSGSG-150um pitch) is -35.0dB! Introducing products with a frequency range of DC to 50GHz.

We would like to introduce our RF_MEMS probe, the 'TPD50-Vertical Series.' The connector is 2.4mm/F, and it supports pitches from 50 to 1000um, featuring a low-loss, low-reflection air coplanar probe design. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low-loss, low-reflection air coplanar probe design ■ Small probe footprint ■ Available in probe pitches of 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD67-Angle Series"

RF MEMS Probe "TPD67-Angle Series"

The connector is 1.85mm/F (V/F)! It features a low-loss, low-reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD67-Angle Series.' The crosstalk (GSGSG-150um pitch typ.) is -35.0dB, the characteristic impedance is 50 ohms, and the frequency range is DC to 67GHz. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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Heat-resistant contact probe

Heat-resistant contact probe

Compatible with high temperatures up to 300°C. Minimum pitch of 0.35mm or more.

Compatible with high temperatures up to 300°C. Minimum pitch of 0.35mm or more.

  • probe
  • Contact Probe

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Probe diameter φ0.1 - Pitch contact probe

Probe diameter φ0.1 - Pitch contact probe

The previous process requires a tighter pitch and stable electrical performance compared to the subsequent process. We also accept orders for the production of probe cards!

At Seiken, we offer a lineup of vertical probes compatible with P=150um. The tip is made of a well-regarded alloy known for its contact with solder and is also compatible with crown cuts, allowing for stable contact with bumps. By using a specially shaped spring to maintain a constant load, the contact with bumps is better than that of probes using standard springs with the same pitch. 【Features】 ■ Lineup of vertical probes compatible with P=150um ■ Alloy compatible with crown cuts ■ Stable contact with bumps ■ Maintains a constant load using a specially shaped spring ■ Good contact with bumps *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture
  • Contact Probe

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing tailored to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ▼ Contact Probes We offer not only standard products but also flexible solutions tailored to testing conditions. ▼ Probe Cards and IC Sockets We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suited to the inspection targets at low costs. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: High frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 ▼ Contact Probes - Reduces the hassle of replacement. Durable "rare metal probes." - Revised internal structure. "New bias probes" for stable resistance value measurement. ▼ IC Sockets - Non-magnetic sockets, high heat resistance sockets. ▼ Probe Cards - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other semiconductors
  • Contact Probe

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Custom order for contact probes

Custom order for contact probes

We will design probes according to the measurement temperature as a response to high temperatures. It is also possible to accommodate as a unit.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measuring special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Custom order for contact probes

Custom order for contact probes

We accept the design and manufacturing of custom probes.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Custom order for contact probes compatible with high current.

Custom order for contact probes compatible with high current.

Probes for 300A, 220A, 200A, 150A, and 70A are available.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special residual materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Custom order for contact probes

Custom order for contact probes

Probes made with special materials. Dimension changes for probes. Custom design and manufacturing to suit measurements are available.

We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Contact Probe

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Probe Mounting Adapter Socket (High Pressure Type) AS-S Series

Probe Mounting Adapter Socket (High Pressure Type) AS-S Series

A strong grip adapter socket securely holds the probe. *Measurement jigs can also be manufactured!

【Features】 ○ Easy probe replacement. - Simply pull out the existing probe from the socket pressed into the circuit board and insert a new probe. ○ Easy processing of the mounting board. - A hole diameter that secures the adapter socket is sufficient. ○ Choose your wiring method. - Terminal connection socket for the probe - Solder connection socket for the socket - Terminal connection socket for the socket ○ Stronger holding power than the AS series. If you have questions, such as not knowing the model number of the adapter socket compatible with a specific contact probe model, please contact us. For an overview of the series, please check the catalog. * We also accept the production of fixtures for electrical measurements. No design drawings are needed, and no knowledge of electrical measurements is required! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a "full-service" order. 【Examples of measurement fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.

  • Terminal Blocks
  • Other electronic parts
  • socket
  • Contact Probe

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Flexible electric wire with terminal for connection (custom processing)

Flexible electric wire with terminal for connection (custom processing)

We will create it according to your desired specifications, such as changing the length of the wire for high-temperature environments.

The terminal-equipped flexible wire (custom processing) is a product that comes with a terminal designed to facilitate connections to contact probes, featuring a flexible wire that excels in bendability and flexibility. For terminal-equipped wire part numbers suitable for specific probe models, please contact us through our website. 【Features】 ○ Terminal-equipped wire compatible with contact probes - Easy connection with just the insertion and removal of the terminal. ○ Pre-connected wire eliminates the hassle of wiring. ○ The wire's excellent bendability and flexibility allow the probe to slide smoothly. ○ Available in a total of 8 colors. ○ Can be manufactured for high-temperature environments (up to 180°C). ○ Can be produced in the desired length of wire. ○ Can be manufactured from a single unit. While it is introduced in the catalog, please contact us through our website for detailed specifications. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Other electronic parts
  • Other cable related products
  • Contact Probe

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Four-terminal measurement compatible dual-axis contact probe

Four-terminal measurement compatible dual-axis contact probe

Pitch between terminals is 0.2mm. Supports precise measurement of small components!

【Overview】 ○ A single probe incorporates two pins, allowing for the connection of terminals for both current and voltage on one probe. → This accommodates situations where installation space is limited. → It makes probe replacement easy. ○ Since it is made as a single component from the tip to the connection part, the probe resistance is low and stable. → This enables precise four-terminal measurements. ○ The pitch between terminals is 0.2mm. → This supports four-terminal measurements of fine components. You can check the product overview in the catalog. We also manufacture probes that can accommodate requests for even narrower terminal pitches. For details, please contact us through our website. http://www.sankei-engineering.com/

  • Amplifier
  • Oscillator
  • Inductor Coil
  • Contact Probe

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【Contract Measurement Service】Probe Tip Wear Degree Confirmation Experiment

【Contract Measurement Service】Probe Tip Wear Degree Confirmation Experiment

What changes occur at the probe tip depending on the number of contacts?

"What is actually happening...?" We support quantification and visualization (image acquisition) through experiments. 【Examples of Experiments】 - Durability tests for 1 million cycles - Measurement of contact resistance values every 100,000 cycles - Verification of probe tips using an electron microscope every 50,000 cycles - Conducting durability tests with probes made of various materials - Observation of contact marks on the measured object - Measurement of contact temperatures between the measured object and the probe during continuous current of 300A and more Various measurements are possible through combinations of devices and measuring instruments. We also offer suggestions and fabrication of contact probes based on measurement results. We are always available to respond to requests for tours of experimental equipment and measuring instruments. For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other measurement, recording and measuring instruments
  • Contract measurement
  • Other electronic parts
  • Contact Probe

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Heat-resistant contact probe (suitable for use in constant temperature baths)

Heat-resistant contact probe (suitable for use in constant temperature baths)

Achieve stable measurements even in a constant temperature bath! Please request from the selection of probes.

Founded 40 years ago, we have been manufacturing contact probes used for various measurements. Our standard CPU series (maximum heat resistance temperature of 300°C) achieves stable electrical resistance measurements even within constant temperature baths. After understanding the material, shape, surface treatment of the workpiece, and measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose products suitable for your usage conditions. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Terminal Blocks
  • Other electronic parts
  • probe
  • Contact Probe

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Contracted measurement service: Reproducing the environment where defects occur.

Contracted measurement service: Reproducing the environment where defects occur.

Reproducing the same conditions. You can check what is happening.

With 40 years of experience, we have been manufacturing contact probes that can achieve the desired measurements by measuring various measurement conditions and the electrical contact resistance of workpieces. We replicate conditions equivalent to those in which defects occur and convert the situation into data. Based on this data, we also propose solutions. Please utilize this for identifying causes and developing new products. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Contract measurement
  • Contact Probe

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RF MEMS Probe "TP67-Vertical Series"

RF MEMS Probe "TP67-Vertical Series"

Probe repair and tip chip replacement available! Reflection loss (GSG-150um pitch typ.) is -18.0dB.

We would like to introduce our RF_MEMS probe, the 'TP67-Vertical Series'. The frequency range is DC to 67GHz, with a characteristic impedance of 50 ohms. The connector is 1.85mm/F (V/F), and the probe mark size (width) is less than 30um. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe mark ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD50-Angle Series"

RF MEMS Probe "TPD50-Angle Series"

The compatible pitch is 50 to 1000 micrometers! It is a low loss, low reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD50-Angle Series'. The characteristic impedance is 50 ohms, and the frequency range is DC to 50 GHz, with crosstalk (GSGSG-150um pitch typ.) at -35.0 dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD67-Vertical Series"

RF MEMS Probe "TPD67-Vertical Series"

The dielectric strength is 100V, and the crosstalk (GSGSG-150um pitch typ.) is -35.0dB!

We would like to introduce our RF_MEMS probe, the 'TPD67-Vertical Series'. The frequency range is DC to 67GHz, with an insertion loss (GSGSG-150um pitch typ.) of -1.2dB. Additionally, the probe can be repaired and the tip chip can be replaced. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPWR15"

RF MEMS Probe "TPWR15"

Probe repair and tip chip replacement available! Contact resistance (to gold pad) is 0.05 ohm.

We would like to introduce our RF_MEMS probe 'TPWR15' that we handle. The reflection loss (typ. GSG-150um pitch) is -5.0dB, the power tolerance is 5W, and the probe mark size (width) is less than 30um. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe scars ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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Sensitive Probe (IB/IF Series) *CAD data available

Sensitive Probe (IB/IF Series) *CAD data available

IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!

The "IB series" is an integrated contact probe that achieves low contact resistance, ranging from types below 10 mΩ to types below 50 mΩ, without the need for a socket. The "IF series" enables probing at narrow pitches. Utilizing a structure where tungsten wire moves within a flexible guide tube, the body can be spread out in a fan shape and fixed, allowing the tip to be arranged at a narrow pitch. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract manufacturing
  • probe
  • Contact Probe

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【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

In recent years, as products have become smaller, the components used have also been miniaturized year by year. However, isn't it becoming difficult to measure and analyze these miniaturized components with existing probes? The "stacked probe" can handle a minimum pitch of 0.05 mm, which conventional probes cannot accommodate, and it also performs well as a probe for power semiconductors that require high current. This means that even small semiconductors that could not be measured before can now be measured. 【Features】 - Achieves precise measurements due to stable contact resistance - Capable of handling high current and high voltage - Supports narrow pitches of up to 0.05 mm, etc. *For more details, please download the PDF or contact us.

  • probe
  • Contact Probe

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