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Contact Probe Product List and Ranking from 40 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. 精研 本社 Tokyo//Electronic Components and Semiconductors
  4. 4 UIGREEN Kanagawa//Machine elements and parts
  5. 5 日本電針 Saitama//Electronic Components and Semiconductors
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Contact Probe Product ranking

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  4. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社
  5. 5 【Four-terminal measurement compatible】 High current compatible coaxial contact probe サンケイエンジニアリング 本社

Contact Probe Product List

181～191 item / All 191 items

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Flexible electric wire with terminal for connection (custom processing)

Flexible electric wire with terminal for connection (custom processing)

We will create it according to your desired specifications, such as changing the length of the wire for high-temperature environments.

The terminal-equipped flexible wire (custom processing) is a product that comes with a terminal designed to facilitate connections to contact probes, featuring a flexible wire that excels in bendability and flexibility. For terminal-equipped wire part numbers suitable for specific probe models, please contact us through our website. 【Features】 ○ Terminal-equipped wire compatible with contact probes - Easy connection with just the insertion and removal of the terminal. ○ Pre-connected wire eliminates the hassle of wiring. ○ The wire's excellent bendability and flexibility allow the probe to slide smoothly. ○ Available in a total of 8 colors. ○ Can be manufactured for high-temperature environments (up to 180°C). ○ Can be produced in the desired length of wire. ○ Can be manufactured from a single unit. While it is introduced in the catalog, please contact us through our website for detailed specifications. http://www.sankei-engineering.com/

  • Terminal Blocks
  • Other electronic parts
  • Other cable related products
  • Contact Probe

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Four-terminal measurement compatible dual-axis contact probe

Four-terminal measurement compatible dual-axis contact probe

Pitch between terminals is 0.2mm. Supports precise measurement of small components!

【Overview】 ○ A single probe incorporates two pins, allowing for the connection of terminals for both current and voltage on one probe. → This accommodates situations where installation space is limited. → It makes probe replacement easy. ○ Since it is made as a single component from the tip to the connection part, the probe resistance is low and stable. → This enables precise four-terminal measurements. ○ The pitch between terminals is 0.2mm. → This supports four-terminal measurements of fine components. You can check the product overview in the catalog. We also manufacture probes that can accommodate requests for even narrower terminal pitches. For details, please contact us through our website. http://www.sankei-engineering.com/

  • Amplifier
  • Oscillator
  • Inductor Coil
  • Contact Probe

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【Contract Measurement Service】Probe Tip Wear Degree Confirmation Experiment

【Contract Measurement Service】Probe Tip Wear Degree Confirmation Experiment

What changes occur at the probe tip depending on the number of contacts?

"What is actually happening...?" We support quantification and visualization (image acquisition) through experiments. 【Examples of Experiments】 - Durability tests for 1 million cycles - Measurement of contact resistance values every 100,000 cycles - Verification of probe tips using an electron microscope every 50,000 cycles - Conducting durability tests with probes made of various materials - Observation of contact marks on the measured object - Measurement of contact temperatures between the measured object and the probe during continuous current of 300A and more Various measurements are possible through combinations of devices and measuring instruments. We also offer suggestions and fabrication of contact probes based on measurement results. We are always available to respond to requests for tours of experimental equipment and measuring instruments. For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other measurement, recording and measuring instruments
  • Contract measurement
  • Other electronic parts
  • Contact Probe

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Heat-resistant contact probe (suitable for use in constant temperature baths)

Heat-resistant contact probe (suitable for use in constant temperature baths)

Achieve stable measurements even in a constant temperature bath! Please request from the selection of probes.

Founded 40 years ago, we have been manufacturing contact probes used for various measurements. Our standard CPU series (maximum heat resistance temperature of 300°C) achieves stable electrical resistance measurements even within constant temperature baths. After understanding the material, shape, surface treatment of the workpiece, and measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose products suitable for your usage conditions. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Terminal Blocks
  • Other electronic parts
  • probe
  • Contact Probe

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Contracted measurement service: Reproducing the environment where defects occur.

Contracted measurement service: Reproducing the environment where defects occur.

Reproducing the same conditions. You can check what is happening.

With 40 years of experience, we have been manufacturing contact probes that can achieve the desired measurements by measuring various measurement conditions and the electrical contact resistance of workpieces. We replicate conditions equivalent to those in which defects occur and convert the situation into data. Based on this data, we also propose solutions. Please utilize this for identifying causes and developing new products. Please contact us through our website first. ★http://www.sankei-engineering.com/★

  • Contract measurement
  • Contact Probe

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RF MEMS Probe "TP67-Vertical Series"

RF MEMS Probe "TP67-Vertical Series"

Probe repair and tip chip replacement available! Reflection loss (GSG-150um pitch typ.) is -18.0dB.

We would like to introduce our RF_MEMS probe, the 'TP67-Vertical Series'. The frequency range is DC to 67GHz, with a characteristic impedance of 50 ohms. The connector is 1.85mm/F (V/F), and the probe mark size (width) is less than 30um. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe mark ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD50-Angle Series"

RF MEMS Probe "TPD50-Angle Series"

The compatible pitch is 50 to 1000 micrometers! It is a low loss, low reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD50-Angle Series'. The characteristic impedance is 50 ohms, and the frequency range is DC to 50 GHz, with crosstalk (GSGSG-150um pitch typ.) at -35.0 dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000 um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD67-Vertical Series"

RF MEMS Probe "TPD67-Vertical Series"

The dielectric strength is 100V, and the crosstalk (GSGSG-150um pitch typ.) is -35.0dB!

We would like to introduce our RF_MEMS probe, the 'TPD67-Vertical Series'. The frequency range is DC to 67GHz, with an insertion loss (GSGSG-150um pitch typ.) of -1.2dB. Additionally, the probe can be repaired and the tip chip can be replaced. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPWR15"

RF MEMS Probe "TPWR15"

Probe repair and tip chip replacement available! Contact resistance (to gold pad) is 0.05 ohm.

We would like to introduce our RF_MEMS probe 'TPWR15' that we handle. The reflection loss (typ. GSG-150um pitch) is -5.0dB, the power tolerance is 5W, and the probe mark size (width) is less than 30um. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe scars ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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Sensitive Probe (IB/IF Series) *CAD data available

Sensitive Probe (IB/IF Series) *CAD data available

IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!

The "IB series" is an integrated contact probe that achieves low contact resistance, ranging from types below 10 mΩ to types below 50 mΩ, without the need for a socket. The "IF series" enables probing at narrow pitches. Utilizing a structure where tungsten wire moves within a flexible guide tube, the body can be spread out in a fan shape and fixed, allowing the tip to be arranged at a narrow pitch. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract manufacturing
  • probe
  • Contact Probe

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【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

【Patent Obtained Probe】 High Current, Narrow Pitch Compatible Probe 'Stacked Probe'

The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]

In recent years, as products have become smaller, the components used have also been miniaturized year by year. However, isn't it becoming difficult to measure and analyze these miniaturized components with existing probes? The "stacked probe" can handle a minimum pitch of 0.05 mm, which conventional probes cannot accommodate, and it also performs well as a probe for power semiconductors that require high current. This means that even small semiconductors that could not be measured before can now be measured. 【Features】 - Achieves precise measurements due to stable contact resistance - Capable of handling high current and high voltage - Supports narrow pitches of up to 0.05 mm, etc. *For more details, please download the PDF or contact us.

  • probe
  • Contact Probe

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