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Contact Probe - メーカー・企業40社の製品一覧とランキング

更新日： 集計期間:Nov 19, 2025～Dec 16, 2025
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Contact Probeのメーカー・企業ランキング

更新日： 集計期間:Nov 19, 2025～Dec 16, 2025
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  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
  5. 5 インクス Tokyo//Machine elements and parts
企業ランキングへ

Contact Probeの製品ランキング

更新日： 集計期間:Nov 19, 2025～Dec 16, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社
  5. 5 Probe Mounting Adapter Socket (High Pressure Type) AS-S Series サンケイエンジニアリング 本社

Contact Probeの製品一覧

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[Demo unit available] TFC Spring Separator

[Demo unit available] TFC Spring Separator

Automatically separates without damage! A spring separator that contributes to work efficiency.

The "TFC Spring Separator" is a device that automatically separates entangled springs without damaging them by rotating them. Thanks to our uniquely developed control technology, it can be designed to accommodate various supply conditions, significantly contributing to the efficiency of operations through appropriate processing. 【Features】 ■ The separator demonstrates high-precision separation capabilities regardless of the size, pitch, or shape of the springs. ■ Excellent processing capacity enables speedy spring supply. ■ The variable rotation speed helps to reduce noise. ■ By combining with a standard feeder, it achieves low costs and allows for the selection of controls suitable for the supply conditions. *For more details, please refer to the PDF document or feel free to contact us.

  • Separation device

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Introduction of contact probes | Compatible with tip diameters down to 1μ!

Introduction of contact probes | Compatible with tip diameters down to 1μ!

Contact probe for prototyping and research!

At Seiko Gokou Contact Metal Co., Ltd., we manufacture contact probes tailored to customer specifications for prototyping and research, as well as for small lot production. We specialize particularly in tungsten needles. Additionally, as an agent for various material manufacturers, we can also assist in selecting and proposing materials that match the circuit's requirements. *For more details, please feel free to contact us.*

  • Other machine elements
  • probe

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Selection Guide "Probe Selection Method"

Selection Guide "Probe Selection Method"

We are currently offering a guide that clearly explains the method for selecting probes with illustrations.

Japan Electric Needle offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types, and is distributing a "Probe Selection Method." 【Selection Procedure】 1. Check the pitch 2. Confirm the total length and distance to the target 3. Choose the tip shape 4. Determine the spring pressure We provide clear explanations with illustrations and tables. *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig

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Wire Probe "NW Series"

Wire Probe "NW Series"

Supports a minimum pitch of 0.11mm. Specification changes to match the shape of the device are also acceptable.

The "NW Series" is a wire probe designed for ultra-narrow pitch contacts. We offer three types: Φ0.07mm, Φ0.09mm, and Φ0.11mm. It strokes through "flexibility" and does not have a complex mechanism, enabling contact in narrow pitches that are difficult to achieve with spring probes. We also accommodate specification changes to match the shape of the device. It can be provided as a single unit or as a complete set with fixtures. 【Features】 ■ Compatible with wiring extraction ■ Two types of tip shapes available ■ Wide range of needs addressed from design to manufacturing *For more details, please refer to the documentation. Feel free to contact us with any inquiries.

  • others

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Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

  • probe

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

  • probe

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

  • probe

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

  • probe

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

  • probe

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Layered probe with stable contact resistance value.

Layered probe with stable contact resistance value.

A probe capable of achieving a stable contact resistance value according to the shape of the target object.

The "laminated probe" has been developed with innovative technology and possesses excellent features. Unlike conventional spring probes, which consist of multiple parts, it achieves a structurally stable contact resistance value through contact with a single metal plate. Even when the inspected object is not smooth, the spring properties of each probe allow it to conform to the shape of the object, enabling a stable contact resistance value. 【Features】 ■ Wiping action occurs due to the structure ■ Contact position is displaced ■ Contact can be made while removing oxide films and foreign substances from the object ■ Stable contact can be achieved *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Stable contact with BGA.

Stable contact with BGA.

Introducing examples of layered probes. Coating applied to the probe tip achieves extended lifespan.

We would like to introduce stable contact for BGA "laminated probes" handled by our company. For spherical BGA (solder), contact using needle-type probes, including spring probes, has resulted in slippage, making stable contact difficult. By using laminated probes for Kelvin contact, we achieve stable contact. Additionally, since BGA primarily consists of tin, applying a coating to the probe tip that suppresses tin transfer can also extend its lifespan. 【Features of Laminated Probes】 ■ Stable contact resistance values ■ Effective for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Q&A on Layered Probes

Q&A on Layered Probes

We will answer five representative questions about layered probes.

In this document, we will introduce questions regarding the "stacked probe" of the probe business handled by Inks Corporation. Q: Is non-magnetic compatibility possible? A: Yes, it is possible. The probe is made of non-magnetic beryllium copper, and the holder that holds the probe can also be made of non-magnetic materials such as aluminum or resin. Additionally, we have experience with contacts to magnetic sensor packages. We have answered five questions, including the following: - Is non-magnetic compatibility possible? - Can it be used in the previous process (wafer inspection)? - I would like to install it on the machine I am currently using; is that possible? - How should maintenance be performed? - What would the estimated schedule be until delivery? *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Layered Probe: Response to High Current and High Temperature

Layered Probe: Response to High Current and High Temperature

We have a track record of producing laminated probes compatible with 2000A! Introducing our solutions for handling high current and high temperatures.

The "laminated probe" does not use coil springs and instead utilizes the characteristics of leaf springs for contact, making it resistant to degradation of spring properties due to heat. The insulating film (polyimide) also has a heat resistance rating of 300°C for regular use and long-term heat resistance. It can accommodate measurement environments at high temperatures, allowing contact with power semiconductors including SiC. 【Features】 ■ Utilizes the characteristics of leaf springs ■ Resistant to degradation of spring properties due to heat ■ Can accommodate measurement environments at high temperatures ■ Allows contact with power semiconductors including SiC *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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