We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Contact Probe.
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Contact Probe Product List and Ranking from 39 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. 精研 本社 Tokyo//Electronic Components and Semiconductors
  4. 4 インクス Tokyo//Machine elements and parts
  5. 5 UIGREEN Kanagawa//Machine elements and parts
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Contact Probe Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Contact Probe Long Stroke NCP Series サンケイエンジニアリング 本社
  4. Flexible wire サンケイエンジニアリング 本社
  5. 4 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社

Contact Probe Product List

91～120 item / All 200 items

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Four-terminal measurement compatible coaxial contact probe (separate type)

Four-terminal measurement compatible coaxial contact probe (separate type)

Four-terminal measurement is now possible in limited installation space!

【Overview】 ○ A single probe incorporates two pins, allowing for the connection of terminals for both current and voltage on one probe. 　　→ This makes it possible to accommodate limited installation space. 　　→ Easy probe replacement! ○ The voltage measurement pin is of a separate type. ○ Heat resistance temperature: Below 60°C ○ Safe current: 3–20A 　(Varies by size. Please contact us for details.) Product details can be confirmed in the catalog. We also manufacture probes tailored to the measurement target and conditions. For more information, please contact us through our website. http://www.sankei-engineering.com/

  • Amplifier
  • Oscillator
  • Inductor Coil
  • Contact Probe

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Resin bush contact probe CPD series

Resin bush contact probe CPD series

The use of resin parts in the sliding section ensures smooth movement is maintained.

【Overview】 - The sliding parts are made of resin. - Durability of sliding parts: over 3 million cycles* - Heat resistance temperature: below 60°C - Safe current: 5-7A* - Mounting flange diameter: 2.2-4.0mm - The probe has a low resistance value, enabling precise measurements with an integrated structure. *Durability and safe current values vary depending on the size of the probe. We will suggest a probe that meets your requirements. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Resistors
  • Capacitor
  • Contact Probe

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High-speed sliding compatible contact probe CPSK series

High-speed sliding compatible contact probe CPSK series

High durability even during high-speed sliding and under heavy loads.

【Overview】 ○ The sliding parts are made of high-hardness SK material or stainless steel. ○ Durability of sliding parts: over 5 million cycles* ○ Heat resistance temperature: below 100℃ ○ Safe current: 1–7A* ○ Mounting flange diameter: 1.05–4.0mm ○ The integrated structure allows for low resistance values of the probe, enabling precise measurements. ○ A series that is strong against diagonal impacts and high-speed sliding. *Durability and safe current values vary depending on the size of the probe. We can recommend probes that meet your conditions. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Resistors
  • Capacitor
  • Contact Probe

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Heat-resistant contact probe CPU series

Heat-resistant contact probe CPU series

High-temperature and low-temperature probe

【Overview】 ○ Heat resistance temperature: Below 150–300℃ ○ Durability of sliding parts: Over 200,000 cycles ○ Safe current: 0.8–35A ○ Mounting flange diameter: 0.65–9.0mm ○ Integrated structure with low probe resistance, enabling precise measurements. ○ Probes incorporating heat-resistant springs from the general-purpose CP series. *Durability and safe current values vary depending on the size of the probe. We can suggest a probe that meets your conditions. For more details, please contact us through our website. We also offer contract measurement services for measurements under high and low temperatures (compatible with -180 to 300℃). For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Terminal Blocks
  • Other electronic parts
  • Other Auto Parts
  • Contact Probe

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Insulation resistance voltage test contact probe (supports 3kV!)

Insulation resistance voltage test contact probe (supports 3kV!)

This is a contact probe that can handle high voltage application. *Measurement jigs can also be manufactured!

With 50 years of experience, we have been manufacturing contact probes used for various measurements. They are also used for insulation resistance tests (such as applying 3kV). Based on the material, shape, surface treatment of the workpiece, and measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose products suitable for your usage conditions. Please contact us through our website first. ★http://www.sankei-engineering.com/★ *We also accept orders for the production of fixtures for electrical measurements. No design drawings are necessary, and you don’t need to have knowledge about electrical measurements! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a complete package. 【Examples of measurement fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive components, etc.

  • Terminal Blocks
  • Contact Probe

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[Contact Probe Selection Service] We will solve the "contact failure" of contact probes.

[Contact Probe Selection Service] We will solve the "contact failure" of contact probes.

No more worrying about frequent probe replacements and error handling! We eliminate contact failures, improving inspection accuracy and reducing costs.

Are you troubled by 'poor contact of the probe that cannot be resolved no matter what you do'? At Sankei Engineering, we directly take your work (inspection target) and conduct actual measurements and experiments on our own equipment, such as contact resistance. Based on the objective numerical data obtained, we investigate the root cause of the contact failure and select and propose the optimal contact probe that leads to reliable improvements. The causes of contact failure in electrical measurements include: - Decreased load due to spring deterioration - Adherence of flux or foreign substances - Mismatch between the contact probe and the measurement work and are diverse, making identification not easy. Therefore, we leverage the knowledge we have cultivated as a contact probe manufacturer to uncover the root causes of contact failure through experiments and measurements. Based on actual measurement data, we propose contact probes that lead to improvements, supported by numerical evidence. We aim to eliminate concerns about measurement failures due to contact issues and create a reliable inspection environment that can be used with peace of mind for a long time. Please feel free to consult us first through the inquiry form on our website or by phone.

  • probe
  • Contact Probe

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[Free Support] Selection of Probes for Power Device Power-On Testing

[Free Support] Selection of Probes for Power Device Power-On Testing

To protect expensive devices, selecting the appropriate contact probe is essential!

The selection of high-current probes used for power device conduction tests needs to be done carefully. Incorrect selection can lead to abnormal heating or sparking, potentially resulting in significant losses such as damage to expensive devices or equipment failure. There are mainly two key points to consider when choosing the appropriate probe: 1. Compatibility of specifications: It is important to select a probe that has sufficient margin for the usable current in the limited space due to device miniaturization. 2. Contact resistance between the probe and the workpiece: Even slight contact resistance can cause measurement errors or abnormal heating, so it is crucial to choose a probe that can maintain stable contact with the workpiece. However, many customers are unsure about "what specific criteria to use for judgment." Therefore, Sankei Engineering offers a "Free Probe Selection Service." We will actually take your measurement workpiece, measure the contact resistance with our equipment, and based on the data obtained, we will select and propose the most suitable probe for your usage environment. Inquiries during the comparison and information-gathering stages are also welcome. Please feel free to consult us through the contact form on our website.

  • probe
  • Other electronic parts
  • Contact Probe

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[Free Support] Selection of Probes for Battery Charge and Discharge Testing

[Free Support] Selection of Probes for Battery Charge and Discharge Testing

How to choose high-current contact probes that can withstand long periods of continuous power supply?

The selection of high-current probes used for battery charge and discharge testing must be done carefully. If the selection is incorrect, it can lead to abnormal heating or sparking, potentially causing workpiece welding or equipment failure. There are mainly two key points to consider when choosing the appropriate probe: 1. Specification compatibility: In charge and discharge cycle tests that involve long periods of continuous current flow, it is important to select a probe that has sufficient current capacity relative to the actual usage current value. 2. Contact resistance between the probe and the workpiece: Even slight contact resistance can cause contact heating during current flow, leading to workpiece welding, so it is crucial to choose a probe that can maintain stable contact with the workpiece. However, many customers struggle with "what specific criteria to use for judgment." Therefore, Sankei Engineering offers a **free probe selection service**. We will take your measurement workpiece and measure the contact resistance using our equipment. Based on the data obtained, we will select and propose the most suitable probe for your usage environment. Inquiries during the comparison and information-gathering stage are also welcome. Please feel free to consult us through the contact form on our website.

  • probe
  • Secondary Cells/Batteries
  • Contact Probe

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Introduction to PacketMicro products

Introduction to PacketMicro products

Flexible high-frequency probe station! We have over 15 years of experience and achievements in the industry.

We are introducing the 'PacketMicro products' handled by CSI Global Alliance. We offer robust 40 GHz probes (maximum), customizable probe stations, Dino-Lite microscopes, flexible RF cables, and USB Type-C test fixtures. We solve design challenges in high-speed transmission lines that trouble engineers. 【Features】 ■ Affordable and durable ■ Advanced transmission line testing tools for SI analysis ■ Numerous implementations, including Fortune 100 companies ■ Over 15 years of experience and track record in the industry *For more details, please refer to the PDF materials or feel free to contact us.

  • probe
  • Contact Probe

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Contact Revival Agent New Polycall King

Contact Revival Agent New Polycall King

Contact revival and rust prevention/lubrication are all covered with this one product.

Chemically stable, synthetic oil-based rust preventive lubricant for electrical contacts.

  • others
  • Contact Probe

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Dual RF Probe (High-Frequency Probe)

Dual RF Probe (High-Frequency Probe)

Dual RF Probe (High-Frequency Probe)

Dual RF Probe (High Frequency Probe) Features - Completely domestically produced - Needle tip: GSSG, GSGSG - Frequency: DC-40GHz - Insertion loss: less than 2dB - Return loss: more than 12dB - Pitch: 75-600μm - Connector: K connector - High durability - Low cost - Repairable and refreshable - Special use available.

  • Tester
  • Contact Probe

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[Product Listing] Probes Contract Design, Measurement, and Manufacturing

[Product Listing] Probes Contract Design, Measurement, and Manufacturing

Semi-automatic probers and coaxial connector probes! We also introduce our track record in design and manufacturing contracts.

We offer contract design, measurement, and manufacturing of probes. Our semi-automatic prober with automatic calibration function recognizes the probe tip position using electrical and imaging methods. This enables highly reproducible RF probe calibration and DUT measurements. We also have a lineup that includes manual probers, manipulators, coaxial connector probes, and waveguide probes. We have numerous contract achievements in the design and manufacturing of frequency extenders "75 110GHz" and optical component EVBs "DC 110GHz," among others. 【Lineup (excerpt)】 ■ Manual probers and manipulators ■ Coaxial connector probes ■ Waveguide probes ■ Non-magnetic probes ■ High-power probes *For more details, please refer to the PDF materials or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TP26-Vertical Series"

RF MEMS Probe "TP26-Vertical Series"

The needle material is nickel alloy! It features a low loss, low reflection air coplanar probe design!

We would like to introduce our RF_MEMS probe, the 'TP26-Vertical Series.' The connector is 3.5mm/F, and the compatible pitch ranges from 50 to 1000um, with probe configurations available in GS, SG, and GSG. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Available probe pitch options from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the extent of damage) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD26-Angle Series"

RF MEMS Probe "TPD26-Angle Series"

The characteristic impedance is 50 ohms, and the insertion loss (GSGSG-150um pitch typ.) is -0.5dB!

We would like to introduce our RF_MEMS probe, the 'TPD26-Angle Series'. The frequency range is DC to 26.5GHz, and the connector is 3.5mm/F. Additionally, the probe pitch can be selected from 50 to 1,000um. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD26-Vertical Series"

RF MEMS Probe "TPD26-Vertical Series"

Probe repair and tip replacement are possible! The probe configuration is GSSG and GSGSG!

We would like to introduce our RF_MEMS probe, the 'TPD26-Vertical Series'. The frequency range is DC to 26.5GHz, with an insertion loss (GSGSG-150um pitch typ.) of -0.5dB. Additionally, it features a low-loss, low-reflection air coplanar probe design. Please feel free to contact us when you need assistance. 【Features】 ■ Low-loss, low-reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the extent of damage) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "TPD110-Angle Series"

RF MEMS Probe "TPD110-Angle Series"

The probe configuration is GSGSG! It is a low-loss, low-reflection air coplanar probe design.

We would like to introduce our RF_MEMS probe, the 'TPD110-Angle Series'. The connector is 1.0mm/F, and it can accommodate pitches from 50 to 150um. The crosstalk (GSGSG-150um pitch typ.) is -20.0 to -30.0dB. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Available in probe pitches from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe 'TPWR6'

RF MEMS Probe 'TPWR6'

Selectable probe pitch from 50 to 1,000 µm! Probe mark size (width) is 30 µm or less.

We would like to introduce our RF_MEMS probe 'TPWR6' that we handle. The needle material is nickel alloy, and the housing material is aluminum alloy, with a recommended needle pressure (overdrive = 20-30um) of 20gf. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF_MEMS Probe "TPWR12"

RF_MEMS Probe "TPWR12"

Selectable probe pitch from 50 to 1,000 µm! The contact resistance (to gold pads) is 0.05 ohms.

We would like to introduce our RF_MEMS probe 'TPWR12' that we handle. The breakdown voltage is 100V, and the rated current is 1A, with a contact life (when using an auto-prober) of 1 million cycles. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch can be selected from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "WR8-Tall Series"

RF MEMS Probe "WR8-Tall Series"

Selectable probe pitch from 50 to 1,000 µm! Probe mark size (width) is 30 µm or less.

We would like to introduce our RF_MEMS probe, the 'WR8-Tall Series'. The reflection loss (GSG-150um pitch typ.) is -10.0dB, and the power handling is 5W, with a recommended needle pressure (overdrive = 20-30um) of 20gf. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Note: Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "WR12-Tall Series"

RF MEMS Probe "WR12-Tall Series"

Probe repair and tip replacement possible! Rated voltage 100V, rated current 1A.

We would like to introduce our RF_MEMS probe, the 'WR12-Tall Series'. The probe's needle material is nickel alloy, and the housing material is aluminum alloy, with a probe mark size (width) of less than 30um. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe scars ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip chip replacement available (Repair may not be possible depending on the damage condition) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF MEMS Probe "WR15-Tall Series"

RF MEMS Probe "WR15-Tall Series"

Low loss, low reflection air coplanar probe design! The needle material is nickel alloy.

We would like to introduce the 'WR15-Tall Series' that we handle. The contact life (when using an auto-prober) is 1 million cycles, with a withstand voltage of 100V, a withstand current of 1A, and a power rating of 5W. Please feel free to contact us when you need assistance. 【Features】 ■ Low loss, low reflection air coplanar probe design ■ Small probe footprint ■ Probe pitch selectable from 50 to 1,000um ■ Probe repair and tip replacement available (Note: Repair may not be possible depending on the condition of damage) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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RF Cantilever Probe "Cantilever Series"

RF Cantilever Probe "Cantilever Series"

Supports up to 10 ports! Flexible probing performance with cantilever structure.

We would like to introduce the RF_Cantilever probe, part of our "Cantilever Series." This probe features a cantilever design optimized for RF probes, allowing for custom configurations and pitch. Additionally, it can be modified for high-power device measurement probes. Please feel free to contact us if you have any inquiries. 【Features】 ■ Low-loss, low-reflection coaxial probe design (up to 67GHz) ■ Custom manufacturing for flexible layouts ■ Supports up to 10 RF ports (additional RF ports can be considered upon request) ■ Custom calibration kits can be manufactured, providing optimized constants ■ Short lead time (2 weeks or more) *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Contact Probe

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[Document] TCS3-100 Calibration Board Instruction Manual

[Document] TCS3-100 Calibration Board Instruction Manual

Equipped with a high-precision load pad with an accuracy of ±0.3%! Introducing the product's applications and the position of the elements.

This document presents the specifications of the custom calibration board "TCS3-100" that can be manufactured with a dedicated calibration kit in a tabular format. The arrangement is GSGSG, the pad size is 50μm × 50μm, and the pad pitch is 100μm. It is a simple and easy-to-reference booklet. Please take a moment to read it. 【Contents (partial)】 ■ Pattern name ■ Mounted component symbols ■ Applications ■ Component positions *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Document] TCS3-125-2 Calibration Board Manual

[Document] TCS3-125-2 Calibration Board Manual

Manufacturing of a dedicated calibration kit is possible (custom)! Introducing the specifications of TCS3-125-2.

This document includes the pattern names and other details of the calibration board "TCS3-125-2," which is equipped with a high-precision load pad of ±0.3%. It is a SOLT/TRL calibration device with a pad pitch of 125μm. It is a simple and easy-to-reference book. Please take a moment to read it. 【Contents (partial)】 ■ Pattern names ■ Component symbols ■ Applications ■ Component positions *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Document] TCS3-200 Calibration Board Instruction Manual

[Document] TCS3-200 Calibration Board Instruction Manual

Pad pitch 175–225μm! Introducing the element symbols and positions of the TCS3-200.

This document contains the specifications for the calibration board "TCS3-200" handled by Techno Probe Inc. We introduce pattern names such as Loop-Back Thru1 and Cross Thru1. It is a simple and easy-to-reference book. Please take a moment to read it. 【Contents (partial)】 ■ Pattern List ■ Substrate Top View *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Data] TCS4-125/175 Calibration Board Instruction Manual

[Data] TCS4-125/175 Calibration Board Instruction Manual

SOLT/TRL calibrator! Introducing array, pad size, pad pitch, and more.

This document includes the calibration board "TCS4-125/175," which can be used for alignment marks and more. It introduces pattern names, mounted component symbols, and more. It is a simple and easy-to-reference book. Please take a moment to read it. 【Contents (partial)】 ■ Pattern names ■ Mounted component symbols ■ Applications ■ Component positions *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Document] TCS4-200/250 Calibration Board Manual

[Document] TCS4-200/250 Calibration Board Manual

Pad size 65μm × 50μm! Introducing the substrate top view and pattern list.

This document includes the calibration board "TCS4-200/250" handled by Techno Probe Inc. It introduces the arrangement, pad pitch, applications, and positions of the components. It is a simple and easy-to-reference booklet. Please take a moment to read it. 【Contents (partial)】 ■ Pattern Name ■ Mounted Component Symbols ■ Applications ■ Positions of Components *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Document] TCS4-225/275 Calibration Board Instruction Manual

[Document] TCS4-225/275 Calibration Board Instruction Manual

Introducing the TCS4-225/275 calibration board equipped with a high-precision load pad of ±0.3%!

This document features the SOLT/TRL calibration device "TCS4-225/275" provided by Techno Probe Inc. We introduce the substrate top view and pattern list. It is a simple and easy-to-reference book. Please take a moment to read it. 【Contents (partial)】 ■Pattern name ■Component symbol ■Application ■Component position *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Document] TCS4-300 Calibration Board Instruction Manual

[Document] TCS4-300 Calibration Board Instruction Manual

SOLT/TRL calibrator! Introducing the pattern name, mounted element symbols, applications, and the position of the elements.

This document features the SOLT/TRL calibrator "TCS4-300," which is equipped with a ±0.3% high-precision load pad. We introduce the arrangement, pad size, and pad pitch. It is a simple and easy-to-reference booklet. Please take a moment to read it. 【Contents (partial)】 ■ Substrate top view ■ Pattern list *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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【NEW】HP Series/HPD Series (High Power RF Probe)

【NEW】HP Series/HPD Series (High Power RF Probe)

Achieves power handling of up to 40GHz and up to 50W (5A/1000V). Accurate measurement of RF high-power devices is possible.

○ Fusion of the latest high-frequency technology and mechanical performance ○ Adoption of special materials with excellent power handling ○ Design suitable for characteristic evaluation of various high-power devices represented by GaN (gallium nitride) and SiC (silicon carbide) ○ Robust probe tip ○ Uniform flatness and stable contact

  • probe
  • Contact Probe

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