We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Contact Probe.
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Contact Probe Product List and Ranking from 39 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. 精研 本社 Tokyo//Electronic Components and Semiconductors
  4. 4 UIGREEN Kanagawa//Machine elements and parts
  5. 5 インクス Tokyo//Machine elements and parts
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Contact Probe Product ranking

Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  4. 4 [Contact Probe Selection Service] We will solve the "contact failure" of contact probes. サンケイエンジニアリング 本社
  5. 5 Screw-mounted contact probe CPM series サンケイエンジニアリング 本社

Contact Probe Product List

121～150 item / All 200 items

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[For those in the semiconductor and electronic equipment industry] Product catalog for short probes and other items.

[For those in the semiconductor and electronic equipment industry] Product catalog for short probes and other items.

We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.

This catalog features probes and other products handled by Rika Electronics. It includes a lineup of products designed primarily for inspecting semiconductor packages, such as the "short probe," as well as "IC sockets" that achieve a short conduction length with low-resistance contacts. You can choose according to your application. [Featured Products] ■ Short Probes ■ IC Sockets ■ Probe Guards for WLCSP ■ Test Fixtures ■ RDK Bonding Tools *For more details, please refer to the PDF document or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board
  • Contact Probe

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Comprehensive Catalog of Spring Contact Probes

Comprehensive Catalog of Spring Contact Probes

We are currently offering a free comprehensive catalog of spring contact probes!

Free catalog of spring contact probes available now!! ★If you are interested, please contact us★ ★Some catalogs can be viewed via download★ 【Overview】 The exclusive distributor in Japan for FEINMETALL, the world's largest manufacturer of wire harness testing probes (Germany). We provide a one-stop solution with a wide range of product lineup. Custom specifications are also accepted. For anything related to probes, including high current, high frequency, rotation, switches, non-magnetic, and heat-resistant... feel free to consult us. 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe capable of handling up to 600A ◆ High frequency probe capable of handling up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles

  • Terminal Blocks
  • Contact Probe

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General-purpose probes (Normal Probes)

General-purpose probes (Normal Probes)

General Probes (Normal Probes)

This series excels in cost-effectiveness and offers various shapes for probe tips and socket colors.

  • Other Connectors
  • Printed Circuit Board
  • Sensors
  • Contact Probe

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High Frequency Probes (Coax Probes)

High Frequency Probes (Coax Probes)

High Frequency Probes (Coax Probes)

This is a contact probe equipped with shielding functionality against external noise, capable of measuring in the high-frequency range.

  • Other Connectors
  • High frequency/microwave parts
  • Sensors
  • Contact Probe

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Completely non-magnetic contact probe

Completely non-magnetic contact probe

Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm or more.

Completely non-magnetic (permeability < 1.01μ). Minimum pitch 0.35mm～

  • probe
  • Contact Probe

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MFP-3D Atomic Force Microscope Conductive AFM Probe Holder

MFP-3D Atomic Force Microscope Conductive AFM Probe Holder

You can evaluate the electrical properties of small conductive samples with AFM!

The ORCA conductive AFM probe holder allows for conductive AFM imaging and I-V measurements with all Asylum MFP-3D AFM/SPM systems. The standard module can measure currents ranging from approximately 1 pA to 20 nA. Models with different current measurement ranges and dual-gain models are also available. This conductive AFM can simultaneously measure the shape of the sample and the current distribution map. It provides valuable measurements across a wide range of material characteristics, including insulating thin films, ferroelectric films, nanotubes, and conductive polymers.

  • others
  • Contact Probe

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[NICOMATIC] CMM Series / DMM Series

[NICOMATIC] CMM Series / DMM Series

Signal pins (LF), coaxial pins (HF), and power pins (HP) can be mixed in layout!

We would like to introduce the NICOMATIC's "CMM Series / DMM Series" that we handle. The "CMM Series" allows for the selection of fixed fittings and enables mixed layouts. We offer the "320/340 Type" and "220 Type" in our lineup. The "DMM Series" includes the "Classic DMM Type" with a maximum of 3 rows, the "My DMM Type" with a maximum of 4 rows, and the "Exclusive DMM Type," which allows for customization of pin count and housing. [CMM Series Features] ■ Mixed layout possible ■ Selection of fixed fittings available ■ 320/340 Type: 3 rows - Maximum 120 pins for LF only / Maximum 64 pins for HF or HP only ■ 220 Type: 2 rows - Maximum 60 pins for LF only / Maximum 15 pins for HF or HP only *For more details, please refer to the PDF document or feel free to contact us.

  • connector
  • Other Connectors
  • Contact Probe

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SK Probe Spring-type Connector Pin 'AX Series'

SK Probe Spring-type Connector Pin 'AX Series'

The "SK Probe AX Series" allows for slide contact by making the connector pin receiving side flat.

- The receiving side of the spring-type connect pin can be flat, allowing for sliding contact without requiring high positional accuracy. - Attachment and detachment are easy, and it is highly durable. - The small size of the spring-type connect pin enables space-saving, miniaturization, and slim design of the equipment used. - The shape of the resin part can be freely designed, allowing for applications as inter-board connectors. * Custom resin holders can be made according to customer usage, so please consult us separately.

  • Other electronic parts
  • Inspection fixture
  • switch
  • Contact Probe

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Contact revitalizer for slide contacts

Contact revitalizer for slide contacts

A contact revitalizer that can restore contacts and provide rust prevention and lubrication all in one.

The contact revival agent for slide contacts is an electric contact revival and anti-rust lubricant that combines a scientifically stable synthetic oil with special additives. Compared to conventional products, its rust prevention capability has been significantly enhanced. For more details, please contact us.

  • glue
  • Repair Agent
  • Contact Probe

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Connector terminal / Connector pin

Connector terminal / Connector pin

We provide high-quality connector terminals and connector pins! The cross-sectional shape and dimensional accuracy are excellent.

Our company's "connector terminals and connector pins" can be finished into various tip shapes, flattened shapes, bent shapes, and middle collar shapes from metal wire through our unique cold forging and header processing. Pins processed from metal wire exhibit excellent cross-sectional shapes and dimensional accuracy. Additionally, by using tin-lead plating, we suppress the occurrence of whiskers, resulting in a smooth surface that minimizes plating debris, allowing us to provide high-quality connector terminals and connector pins. 【Features】 - Shortened initial lead times, suitable for small-batch production from prototypes - No scrap generated, enabling low-cost supply for mass production - Pins processed from metal wire have superior cross-sectional shapes and dimensional accuracy - Surface treatments other than this, such as gold plating, are also available - Continuous pin specifications and band reel specifications can be supplied on reels *For specifications (wire diameter, length, plating), materials, etc., please consult us separately. *For more details, please download the PDF or feel free to contact us.

  • Other Connectors
  • Contact Probe

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Composite contact "TCI contact"

Composite contact "TCI contact"

"TCI Contact," a composite contact manufactured using advanced technology.

TCI contacts are composite contacts produced by a special manufacturing method developed by Heiden Electric Co., Ltd. They are excellent composite contacts that solve the issues related to the adhesion strength between the contact material (silver alloy) and the contact base material (silver or copper alloy), which have been themes in conventional composite contacts. The contact material and the contact base material are firmly bonded using our unique special processing method. 【Features】 ○ Promotes high quality without variation ○ Unlike conventional soldering or electrical bonding, strength and quality have significantly improved due to atomic diffusion processing ○ The contact resistance at the contact joint is small and comparable to solid rivets ○ Laminated contacts use the same silver alloy as solid contacts ○ Extremely excellent in resistance to welding and wear For more details, please contact us or download the catalog.

  • Other machine elements
  • Contact Probe

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Test socket "W-CSP"

Test socket "W-CSP"

This is a test socket using a coaxial type four-terminal contact probe!

The "W-CSP" is a testing socket that allows for manual measurements using a coaxial four-terminal contact probe (PATENT) after dicing chips from a wafer. It can be used for chip development, sampling inspections, and failure analysis. The socket cover is detachable and can also be used for automatic machine (handler-type) testing. 【Features】 ■ Capable of functional verification testing for BGA, LGA, and bare chips ■ Capable of measuring the on-resistance of MOS-FETs ■ Capable of measuring voltage between terminals *For more details, please download the PDF or feel free to contact us.

  • socket
  • Contact Probe

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Contact Probe Comprehensive Catalog

Contact Probe Comprehensive Catalog

A wide variety of highly rated contact probes from around the world! Over 3,000 types available!

This catalog is the product catalog of Nippon Denshin Co., Ltd., which has contributed to the development of the electronics industry, including contact probes, through years of experience, achievements, and a wealth of accumulated technology. We offer over 3,000 original types in various stock, so please choose products that meet your needs from our wide variety. 【Contents】 ■ND100 ■ND075 ■ND050 ■Wire Probes ■C-0.26, etc. *For details, please request materials or view the PDF data available for download.

  • Processing Jig
  • probe
  • Contact Probe

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Inspection fixtures made by probe manufacturers

Inspection fixtures made by probe manufacturers

A wide variety of probes in stock! Leave the selection of probes to us!

Our company offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types. Since we design in-house, we can also manufacture components, allowing us to meet customer requests in a short delivery time. As a probe manufacturer, we have many inspection fixtures that we can create, so please feel free to consult with us. 【Features】 ■ Low price ■ Support for small quantities of probes ■ Short delivery time with in-house design ■ Components can also be manufactured in-house *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig
  • Contact Probe

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New Switch Pin "ND-SW Series"

New Switch Pin "ND-SW Series"

A switch pin with a single internal contact that significantly improves durability.

The "ND-SW Series" is one of our features, incorporating the know-how of integrated probes that have been used by many customers over the years, into a switch pin. We offer the "ND-SW-2.4 (φ3.0 POM)" and its corresponding socket, which allows the rear end to move when the tip strokes. Additionally, since there is only one internal contact, it excels in durability and cost performance. 【Features】 ■ Incorporates know-how of integrated probes ■ Only one internal contact ■ Excellent durability and cost performance *For more details, please refer to the PDF document or feel free to contact us.

  • switch
  • Contact Probe

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High-frequency (millimeter wave) probe "Precision ultra-short probe"

High-frequency (millimeter wave) probe "Precision ultra-short probe"

Further miniaturization of electronic chip devices! For mounting on high-frequency substrate 50Ω lines!

We provide probes designed with consideration for the conditions of high-frequency measurement, allowing for highly accurate measurements. The measurable frequency range is 7GHz, suitable for 50Ω lines on high-frequency substrates. *For more details, please download the PDF or contact us.*

  • probe
  • Contact Probe

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Features of layered probes

Features of layered probes

Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.

We would like to introduce the features of the Inks' layered probe. The semi-layered probe contacts with a single metal plate, allowing for measurements with structurally stable contact resistance. Additionally, it is resistant to degradation of spring properties due to heat, making it suitable for measuring power semiconductors that apply high current and high voltage. It can make contact with points arranged in narrow pitches, such as semiconductor lead parts and connector contacts, up to a maximum pitch of 0.05. Furthermore, by varying the shape of the probe body and the thickness of the auxiliary V-shaped leaf spring, it is possible to adjust the load from high to low continuously. 【Features】 ■ Stable contact resistance value (demonstrates power in precise measurements) ■ Supports high current and high voltage (contributes to application and measurement of power semiconductors) ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch) ■ Adjustable contact load (contact tailored to the characteristics of the measured object) *For more details, please refer to the external link page or feel free to contact us.

  • probe
  • Contact Probe

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Explained in a video! The mechanism of layered probes [Free case study provided]

Explained in a video! The mechanism of layered probes [Free case study provided]

A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!

In today's world of miniaturization, are you facing difficulties with measurements using conventional probes? With Inks' "Stacked Probes," we can make contact with a single metal plate, allowing us to accommodate a minimum pitch of 0.05 mm. On this page, we present a video showcasing our "Stacked Probes" in action. Please take a look. 【Features】 ■ Stable contact resistance values ■ Supports high current and high voltage ■ Compatible with narrow pitches ■ Adjustable contact load, etc. *For more details, please download the PDF or contact us.

  • probe
  • Contact Probe

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Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

Achieving large current, narrow pitch, and stable contact resistance values! What is a stacked probe?

【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!

The "Layered Probe Brochure" introduces the excellent features of layered probes in comparison to conventional spring probes. Are you facing issues such as "unstable contact resistance," "looking for probes that can handle narrow pitches," "wanting to measure under high current and high temperature," or "seeking probes with superior durability"? With Inks' "Layered Probes," these problems can be resolved! 【Contents】 ■ Structure of Layered Probes ■ Features of Layered Probes ■ Layered Probes Q&A, etc. *For more details, please download the PDF or contact us.

  • probe
  • Contact Probe

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[Example] Stable contact of the stacked probe

[Example] Stable contact of the stacked probe

Introduction to stable contact with the package lead.

The wiping effect of the "stacked probe" removes the oxide film while making contact, achieving stable contact. Additionally, a coating that suppresses tin transfer has been applied to the probe tip, resulting in increased longevity. For magnetic sensor packages, it is also possible to construct the probe unit using only non-magnetic materials. In this case, stable contact was achieved with 2 million cycles of no maintenance. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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[Example] Contact at narrow pitch and multiple points with a stacked probe.

[Example] Contact at narrow pitch and multiple points with a stacked probe.

Contributing to reduced inspection time and improved production through simultaneous multi-point contact.

We would like to introduce the narrow pitch and multi-point contact of the "stacked probe" that we handle. By stacking 50 probes with a thickness of 0.1mm in a fan shape at a 0.2mm pitch, we have achieved simultaneous contact at 50 points. This has led to a reduction in inspection time and contributed to increased productivity. 【Features of the Stacked Probe】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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[Example] Probe design tailored to existing equipment (narrow space)

[Example] Probe design tailored to existing equipment (narrow space)

Designed probes to fit within limited space, contributing to cost reduction.

We would like to introduce the probe design (for narrow spaces) tailored to the existing equipment for our "stacked probes." In this case, we used a probe for LED inspection. Since we can design the probe to fit into the limited space of existing equipment, there is no need to purchase new equipment, contributing to cost reduction. 【Features of Stacked Probes】 ■ Stable contact resistance values ■ Excellent for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitch ■ Adjustable contact load *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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Durability of layered probes

Durability of layered probes

Contributed to improved productivity and cost reduction with 1 million to 10 million contact achievements.

The "laminated probe" is made of a single-piece leaf spring structure, which eliminates issues such as component interference from multiple parts, resulting in exceptional durability. When the contact target is tin (Sn), applying a conductive coating to the tip of the probe suppresses tin transfer, enabling stable inspection. Additionally, due to its high sliding properties and very hard membrane, it excels in wear resistance and durability. As a result, the probe is expected to have a longer lifespan. 【Expected Effects】 ■ Prolonged lifespan of the probe ■ Improved test yield ■ Reduced re-inspection ■ Decreased cleaning and maintenance tasks ■ Increased operational rate of evaluation equipment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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TITAN T26D Dual-Type Probe Head (~26GHz)

TITAN T26D Dual-Type Probe Head (~26GHz)

Affordable differential measurements from DC to 26GHz!

The probe chip, thanks to MPI's unique MEMS technology, has very high visibility, making probing easy for anyone. The high-precision and robust chips, which are on par with competitors, offer a long lifespan and affordable pricing, resulting in a high cost-performance ratio. Agent in Japan: Vector Semicon Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • probe
  • Contact Probe

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[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other measurement, recording and measuring instruments
  • Contact Probe

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Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

Semiconductor industry, trench measurement AFM, SPM probes, cantilevers

High aspect ratio SPM/AFM probes that can fit into narrow groove structures!

This product is suitable for quantitative measurements in the depth direction, which are difficult to measure with laser microscopes, such as line & space and trenches. Are you struggling with low surface shape reproducibility with your current probe? Cases where the groove shape is not accurately measured due to the opening angle of the probe tip can be improved by using a probe with a high tip aspect ratio. 【Features】 ■ Well-suited for quantitative measurements in the height direction, which are difficult to measure with laser microscopes ■ Improves cases where the groove shape is not accurately measured due to the opening angle of the probe tip *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes
  • Contact Probe

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Probe for Scanning Probe Microscopy (SPM)

Probe for Scanning Probe Microscopy (SPM)

A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

  • probe
  • Other microscopes
  • Contact Probe

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High voltage (10kV) compatible coaxial probe holder

High voltage (10kV) compatible coaxial probe holder

High voltage measurement, 10kV compatible, coaxial probe holder.

The HVP-CX-10 comes with a 10kV UHV connector and coaxial cable, allowing for measurements of up to 10kV. The needle vice at the tip of the holder securely holds the needle with simple operation. The SP100 positioner with a T-type arm is ideal for the HVP series probe holders. Additionally, micro positioners with a T-type arm, such as "SP-150" and "S-926," can also be used.

  • probe
  • Contact Probe

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List of Contact Probes by Application

List of Contact Probes by Application

As a custom manufacturing company, we develop and produce various contact probes. We will provide optimal proposals based on our accumulated know-how.

Contact Probe Usage List - Z Pin-RF Test Custom Probe Pin - Kelvin Connection Test Probe Pin Pitch ≥ 0.35mm - High Current Test Probe Pin - 30A - H Pin - High Power RF Test Probe Pin - Pogo Tower Probe - Probe for Burn-In Testing - Module Test Power Probe Pin - Module Test Probe Pin and many others *For more details, please feel free to contact us or download the PDF materials.

  • probe
  • Contact Probe

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