【Free Initial Measurement Campaign】Spectroscopic Ellipsometer Auto SE
Thickness and optical constant measurement by Auto SE is free for the first 3 samples!!
■□■□■□■□■□■□■□■□■□■□■□■□■□■□■ Exclusive offer for customers who apply in November!! We will conduct free measurements of spectral ellipsometry (film thickness and optical constant measurement) for up to 3 samples on the first occasion using Auto SE. ■□■□■□■□■□■□■□■□■□■□■□■□■□■□■ Using a newly developed optical model, we will evaluate the quality of DLC films non-destructively and non-contactly. We can perform instant non-destructive measurements from hydrogen-containing DLC films created by various manufacturing methods to hydrogen-free DLC, calculating film thickness and optical constants (refractive index and extinction coefficient). With simple operations, we can measure samples ranging from single-layer films to multilayer films with film thicknesses from 1 nm to 15 μm. Surface analysis using an XYZ electric stage and measurements of micro areas below 100 μm are possible. The imaging system allows for precise confirmation of the sample surface condition and the exact position of the measurement spot. [For more details, please download the catalog or feel free to contact us]
- Company：ナノテック
- Price：Other
